JPS61104380U - - Google Patents
Info
- Publication number
- JPS61104380U JPS61104380U JP19095184U JP19095184U JPS61104380U JP S61104380 U JPS61104380 U JP S61104380U JP 19095184 U JP19095184 U JP 19095184U JP 19095184 U JP19095184 U JP 19095184U JP S61104380 U JPS61104380 U JP S61104380U
- Authority
- JP
- Japan
- Prior art keywords
- probe
- electric circuit
- probes
- force
- sense
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 10
- 238000010586 diagram Methods 0.000 description 3
- 238000007689 inspection Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第１図は第２図における要部の拡大図、第２図
は本考案の一実施例の構成図、第３図は従来の電
気回路検査装置の構成図、第４図は第３図におけ
る要部の拡来図である。
５……フオースプローブ、６……センスプロー
ブ、１０，１６……検査装置、１１……検査部位
としてのパツド、１２……電気回路配線。
Fig. 1 is an enlarged view of the main parts in Fig. 2, Fig. 2 is a block diagram of an embodiment of the present invention, Fig. 3 is a block diagram of a conventional electric circuit testing device, and Fig. 4 is a block diagram of the main part in Fig. 3. This is an enlarged view of the main part. 5... Force probe, 6... Sense probe, 10, 16... Inspection device, 11... Pad as inspection site, 12... Electric circuit wiring.
Claims (1)
前記両プローブの各先端を検査対象電気回路の検
査部位に当接させた状態で前記フオースプローブ
によつて前記電気回路に給電し前記センスプロー
ブによつて電気信号を検出するようにした電気回
路検査装置において、前記フオースプローブと前
記センスプローブとの間を絶縁しかつ前記両プロ
ーブを一体的に固定したことを特徴とする電気回
路検査装置。 Equipped with a force probe and a sense probe,
An electric circuit in which power is supplied to the electric circuit by the force probe and an electric signal is detected by the sense probe with each tip of the probes in contact with a test portion of the electric circuit to be inspected. An electric circuit testing device characterized in that the force probe and the sense probe are insulated and both probes are fixed integrally.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19095184U JPS61104380U (en) | 1984-12-17 | 1984-12-17 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19095184U JPS61104380U (en) | 1984-12-17 | 1984-12-17 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61104380U true JPS61104380U (en) | 1986-07-02 |
Family
ID=30748404
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19095184U Pending JPS61104380U (en) | 1984-12-17 | 1984-12-17 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61104380U (en) |
-
1984
- 1984-12-17 JP JP19095184U patent/JPS61104380U/ja active Pending
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