JPH01180773U - - Google Patents

Info

Publication number
JPH01180773U
JPH01180773U JP7453488U JP7453488U JPH01180773U JP H01180773 U JPH01180773 U JP H01180773U JP 7453488 U JP7453488 U JP 7453488U JP 7453488 U JP7453488 U JP 7453488U JP H01180773 U JPH01180773 U JP H01180773U
Authority
JP
Japan
Prior art keywords
terminal
test probe
measurement terminal
measurement
slit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7453488U
Other languages
Japanese (ja)
Other versions
JPH0548131Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988074534U priority Critical patent/JPH0548131Y2/ja
Publication of JPH01180773U publication Critical patent/JPH01180773U/ja
Application granted granted Critical
Publication of JPH0548131Y2 publication Critical patent/JPH0548131Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案に係るテストプローブの正面図
、第2図は第1図の左側面図、第3図は分解した
端子片の一片5aの底面図、第4図は測定時のテ
ストプローブの状態を示す状態図、第5図は測定
試料を測定中の状態を示す全体図、第6図は従来
のテストプローブを示す正面図、第7図は従来の
テストプローブにより測定試料を測定中の状態を
示す全体図である。 1……テストプローブ、2……測定端子、4a
,4b……リード線、5a,5b……端子片、7
……接触面、8……スリツト。
Fig. 1 is a front view of the test probe according to the present invention, Fig. 2 is a left side view of Fig. 1, Fig. 3 is a bottom view of one piece 5a of the disassembled terminal piece, and Fig. 4 is the test probe during measurement. Figure 5 is an overall diagram showing the state in which the test sample is being measured, Figure 6 is a front view showing the conventional test probe, and Figure 7 is the state in which the test sample is being measured with the conventional test probe. FIG. 1... Test probe, 2... Measurement terminal, 4a
, 4b... Lead wire, 5a, 5b... Terminal piece, 7
...Contact surface, 8...Slit.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 測定端子とそれに連結されたリード線とからな
るテストプローブにおいて、前記測定端子を相互
に弾性を持つて接触する一対の端子片で構成し、
該端子片の各接触面にスリツトを設けたことを特
徴とするテストプローブ。
In a test probe consisting of a measurement terminal and a lead wire connected to the measurement terminal, the measurement terminal is composed of a pair of terminal pieces that elastically contact each other,
A test probe characterized in that each contact surface of the terminal piece is provided with a slit.
JP1988074534U 1988-06-03 1988-06-03 Expired - Lifetime JPH0548131Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988074534U JPH0548131Y2 (en) 1988-06-03 1988-06-03

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988074534U JPH0548131Y2 (en) 1988-06-03 1988-06-03

Publications (2)

Publication Number Publication Date
JPH01180773U true JPH01180773U (en) 1989-12-26
JPH0548131Y2 JPH0548131Y2 (en) 1993-12-20

Family

ID=31299644

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988074534U Expired - Lifetime JPH0548131Y2 (en) 1988-06-03 1988-06-03

Country Status (1)

Country Link
JP (1) JPH0548131Y2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0494573U (en) * 1990-12-28 1992-08-17
JP2014038057A (en) * 2012-08-20 2014-02-27 Organ Needle Co Ltd Tip shape of probe for charge/discharge

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55141074U (en) * 1979-03-30 1980-10-08
JPS5826669U (en) * 1981-08-12 1983-02-21 クラリオン株式会社 Tester rod for electronic components without lead wires
JPS6194774U (en) * 1984-11-28 1986-06-18

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5826669B2 (en) * 1975-06-02 1983-06-04 日本電気株式会社 Zetsuengategata FET

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55141074U (en) * 1979-03-30 1980-10-08
JPS5826669U (en) * 1981-08-12 1983-02-21 クラリオン株式会社 Tester rod for electronic components without lead wires
JPS6194774U (en) * 1984-11-28 1986-06-18

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0494573U (en) * 1990-12-28 1992-08-17
JP2014038057A (en) * 2012-08-20 2014-02-27 Organ Needle Co Ltd Tip shape of probe for charge/discharge

Also Published As

Publication number Publication date
JPH0548131Y2 (en) 1993-12-20

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