JPH0548131Y2 - - Google Patents

Description

[Detailed description of the invention] (Field of industrial application) This invention relates to a test probe that is used in contact with the terminals of a measurement sample in order to measure the electronic characteristics of electronic components such as ICs and relays. It is.

(Prior Art) Conventionally, this type of test probe, as shown in FIG. 6, consists of a measuring terminal 22 and a lead wire 26 connected to the measuring terminal 22, and the measuring terminal 22 is made up of a plurality of needle-like objects bundled together. The tip of the needle is brought into contact with the measurement site 28 of the measurement sample 27 (see FIG. 7). Also, a main body support part 2 for fixing the test probe to the support stand 29 is provided.
1 has a needle-like tip terminal 22 and a measurement site 2.
A spring 23 that provides elasticity is provided to improve contact with the measuring terminal 2 during measurement.
By sliding the shaft 24 connected to the main body support part 21, the contact can be made resilient.

(Problem to be solved by the invention) However, in the test probe with the structure described above, if there is insulating material such as a film or dust attached to the measurement part of the measurement sample, it is difficult to use a spring to firmly connect the measurement terminal. Even if the product is brought into contact with the measurement site, accurate measurements cannot be taken because of the attached insulator, and the product is considered defective even though it should be an acceptable product.

In addition, a spring is installed at the rear of the test probe to improve the contact between the measurement sample and the measurement terminal, but the expansion and contraction of this spring causes the lead wire connected to the rear to swing during measurement. There is a drawback that the lead wire breaks during use.

(Means for Solving the Problems) The present invention aims to solve the above-mentioned problems, and as a means to do so, a plate spring is used to connect the measurement terminals to each other on parallel surfaces with elasticity. It consists of a pair of terminal pieces made by a method of manufacturing, and a plurality of slits are provided in each parallel contact surface of the terminal piece in the longitudinal direction (vertical direction).

(Example) Hereinafter, an example of the present invention will be described based on the drawings.

FIG. 1 is a front view of a test probe according to the present invention, FIG. 2 is a left side view of FIG. 1, and FIG. 3 is an exploded bottom view of one terminal piece 5a.

As shown in FIGS. 1 and 2, the test probe 1 consists of a measurement terminal 2 and two lead wires 4a and 4b connected thereto. The measurement terminal 2 that comes into contact with the measurement sample consists of a pair of terminal pieces 5a and 5b made of a leaf spring and elastically in contact with each other, and these terminal pieces 5a and 5b are stepped at their rear ends. They are connected by a connecting cover 6, which also serves as the main body support part 3.
As shown in FIG. 3, each of the pair of terminal pieces 5a, 5b is provided with a plurality of finer slits 8 in the longitudinal direction on their mutual contact surfaces 7.

Next, the operation of this embodiment will be explained.

As shown in FIG. 5, the main body support part 3 of the test probe 1 is attached to the test probe support stand 9,
A plurality of test probes 1 are set to a measurement state. A measuring portion 11 such as a terminal of the measuring sample 10 is slidably inserted between the terminal pieces 5a and 5b of the test probe 1 set in this way and brought into contact with them.

At that time, as shown in FIGS. 4 and 5, by slidingly inserting the measurement site 11 of the measurement sample 10 between the pair of terminal pieces 5a, 5b of the test probe 1 and bringing them into contact, the terminal pieces 5a, The slits 8 provided on each contact surface 7 of the measurement sample 27 automatically remove insulators such as films and dust adhering to the measurement site 28 of the measurement sample 27.

In the above embodiment, the connecting cover 6 is used as the main body support part 3 and is attached to the test probe support stand 9. However, this is not necessarily limited to this, and the connecting cover is omitted and the terminal The rear end portions of the pieces 5a and 5b may be directly attached and fixed to the test probe support stand 9. In addition, in the above embodiment, the pair of terminal pieces 5a and 5b are composed of two separate terminal pieces, but the present invention is not limited to this. It is also possible to use one with a hollow tip.

(Effects of the invention) As described above, in the present invention, the measurement terminal is composed of a pair of terminal pieces made of leaf springs that contact each other on parallel surfaces, so that the measurement sample can be securely held in contact over a wide range. It has the excellent effect of being able to obtain accurate measurement data without errors.

In addition, since multiple slits are provided in each parallel contact surface of the measurement terminal piece in the longitudinal direction (vertical direction), it is possible to insert the sample terminal etc. while maintaining sliding properties, making it easy to insert. At the same time, the film attached by the slit can be held between the
It has the excellent effect of automatically removing insulating materials such as dust.

[Brief explanation of the drawing]

Fig. 1 is a front view of the test probe according to the present invention, Fig. 2 is a left side view of Fig. 1, Fig. 3 is a bottom view of one piece 5a of the disassembled terminal piece, and Fig. 4 is the test probe during measurement. Figure 5 is an overall diagram showing the state in which the test sample is being measured, Figure 6 is a front view showing the conventional test probe, and Figure 7 is the state in which the test sample is being measured with the conventional test probe. FIG. 1...Test probe, 2...Measurement terminal, 4
a, 4b...Lead wire, 5a, 5b...Terminal piece,
7...Contact surface, 8...Slit.

Claims (1)

[Scope of utility model registration request] In a test probe consisting of a measuring terminal and a lead wire connected to the measuring terminal, the measuring terminal is composed of a pair of terminal pieces made of leaf springs that are elastic and contact each other on parallel surfaces, and the terminal piece A test probe characterized in that each parallel contact surface of the test probe is provided with a plurality of slits extending in the longitudinal direction.