JPH0236133Y2 - - Google Patents

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Publication number
JPH0236133Y2
JPH0236133Y2 JP1983160740U JP16074083U JPH0236133Y2 JP H0236133 Y2 JPH0236133 Y2 JP H0236133Y2 JP 1983160740 U JP1983160740 U JP 1983160740U JP 16074083 U JP16074083 U JP 16074083U JP H0236133 Y2 JPH0236133 Y2 JP H0236133Y2
Authority
JP
Japan
Prior art keywords
contact
spring
coil spring
support block
leaf spring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1983160740U
Other languages
Japanese (ja)
Other versions
JPS6068475U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16074083U priority Critical patent/JPS6068475U/en
Publication of JPS6068475U publication Critical patent/JPS6068475U/en
Application granted granted Critical
Publication of JPH0236133Y2 publication Critical patent/JPH0236133Y2/ja
Granted legal-status Critical Current

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  • Measuring Leads Or Probes (AREA)

Description

【考案の詳細な説明】 本考案は測定時に電気的導通を正確に、かつ長
期的に安定して維持できるリードレス型電子部品
の測定端子に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a measurement terminal for a leadless electronic component that can maintain electrical continuity accurately and stably over a long period of time during measurement.

従来、電子部品測定の電気的導通を得る為には
一般に第1図〜第3図の如きプローブと呼ばれる
測定端子が用いられていた。
Conventionally, measurement terminals called probes as shown in FIGS. 1 to 3 have generally been used to obtain electrical continuity for measuring electronic components.

しかし、第1図のプローブでは、頭部に弾性摺
動する接触部4とリード線接続部5との間にバネ
6による間接的通電部があり、長時間の使用によ
るメツキの摩耗及びゴミの付着による接触抵抗の
増加が問題になつている。また第2図のプローブ
では、接触部4とリード線接続部5とが一体化さ
れているため、圧接する毎にリード線も同時に動
き、長時間の使用により、リード線が断線し易い
という欠点があつた。
However, in the probe shown in Fig. 1, there is an indirect current-carrying part by a spring 6 between the contact part 4 that slides elastically on the head and the lead wire connection part 5, and the plating is worn out and dust is removed due to long-term use. Increased contact resistance due to adhesion has become a problem. In addition, in the probe shown in Fig. 2, since the contact part 4 and the lead wire connection part 5 are integrated, the lead wire also moves at the same time each time it is pressed, and the lead wire is likely to break due to long-term use. It was hot.

一方、第3図のプローブでは、第1図、第2図
に示したプローブの欠点は改良されているが、リ
ードレス型の電子部品の特性測定時に、先端の針
状部7により被測定個所に傷などの痕跡を付け易
い。また針状部7の接触圧の均一化が図りにくい
ため接触圧の違いで特性測定結果に誤差を生じる
欠点があつた。
On the other hand, the probe shown in Fig. 3 has improved the drawbacks of the probes shown in Figs. It is easy to leave marks such as scratches on the surface. Furthermore, since it is difficult to equalize the contact pressure of the needle-shaped portion 7, there is a drawback that the difference in contact pressure causes errors in the characteristic measurement results.

本考案の目的は上記従来プローブの欠点を改良
したリードレス型電子部品の測定端子を提供する
ことにある。
An object of the present invention is to provide a measurement terminal for a leadless electronic component that overcomes the drawbacks of the conventional probes.

本考案によれば、導電性板バネの先端部の下面
に導電性接触子を突設し、かつその上面に棒状体
が植立しさらに棒状体の外周を囲繞するコイルバ
ネとを有する接触ユニツト部と、上記棒状体の一
部が挿通する切欠き部を一端に有し、かつ上記板
バネの下端部を他端に固着させた絶縁性支持ブロ
ツク部とを有することを特徴とするリードレス型
電子部品の測定端子が得られる。
According to the present invention, a contact unit portion includes a conductive contact protruding from the lower surface of the tip of a conductive plate spring, a rod-shaped body planted on the upper surface of the conductive contact, and a coil spring surrounding the outer periphery of the rod-shaped body. and an insulating support block portion having a notch portion at one end through which a portion of the rod-shaped body is inserted, and an insulating support block portion having a lower end portion of the leaf spring fixed to the other end. Measurement terminals for electronic components can be obtained.

以下、本考案の一実施例を第4図を参照して説
明する。
Hereinafter, one embodiment of the present invention will be described with reference to FIG.

第4図において絶縁性支持ブロツク2の下面に
取付けられた導電性を有する板バネ1bの一端に
底部に円板状の接触導電性部を付設した棒状のア
ーム部1dが植立状に固着され、さらに植立した
アーム部1dの外周にコイルバネ1cが配置さ
れ、接触ユニツト1が構成される。
In FIG. 4, a bar-shaped arm part 1d having a disc-shaped contact conductive part attached to the bottom is fixed to one end of a conductive plate spring 1b attached to the lower surface of the insulating support block 2. Further, a coil spring 1c is arranged around the outer periphery of the upright arm portion 1d, thereby forming the contact unit 1.

また支持ブロツク2は下面に段差状の切欠き部
を設けた略L字状に構成されており、左端の先端
部に接触ユニツト1のアーム部1dを案内して自
在に摺動挾持する溝部2aを設ける。
The support block 2 has a substantially L-shape with a step-like notch on its lower surface, and has a groove 2a at its left tip that guides and freely slides the arm 1d of the contact unit 1. will be established.

したがつてコイルバネ1cは溝部2aと板バネ
1bの一端との間に挾持されることとなる。
Therefore, the coil spring 1c is held between the groove 2a and one end of the leaf spring 1b.

さらに接触ユニツト1の板バネの付け根1eは
支持ブロツク2の右端部近傍の下面にネジ止めな
どで固着し、板バネの付根1eに測定用のリード
線3接続される。
Further, the base 1e of the leaf spring of the contact unit 1 is fixed to the lower surface near the right end of the support block 2 by screws or the like, and a lead wire 3 for measurement is connected to the base 1e of the leaf spring.

さらに支持ブロツク2の右に前後および上下に
貫通する孔を十字状に設け、被測定物圧接の支点
とする取付孔2bとする。
Further, a cross-shaped hole is provided on the right side of the support block 2, passing through the support block 2 in the front and back and up and down directions, and serves as a mounting hole 2b which serves as a fulcrum for press-welding the object to be measured.

次に本考案によるリードレス型電子部品の測定
端子の機能を説明する。
Next, the function of the measurement terminal of the leadless electronic component according to the present invention will be explained.

第4図において接触ユニツト1は電子部品の被
測定個所に対して接触部1aが機械的に圧接さ
れ、その接触圧は板バネ1bとコイルバネ1cに
て保持される。この時板バネ1bのバネ圧力はコ
イルバネ1c接触部1aおよびアーム部1dの重
量を支えるだけの条件に設定すれば接触圧はコイ
ルバネ1cのみの変位によつてのみ与えられる。
また電気的導通は接触部1aより板バネ1bを径
由し板バネの付け根1eに接続されたリード線3
との直接接続により与えられる。
In FIG. 4, a contact unit 1 has a contact portion 1a mechanically pressed against a portion to be measured of an electronic component, and the contact pressure is maintained by a plate spring 1b and a coil spring 1c. At this time, if the spring pressure of the leaf spring 1b is set to only support the weight of the coil spring 1c contact portion 1a and the arm portion 1d, the contact pressure will be applied only by the displacement of the coil spring 1c.
Further, electrical continuity is established through the contact portion 1a through the leaf spring 1b and a lead wire 3 connected to the base 1e of the leaf spring.
given by a direct connection with

以上、本考案により(i)電気的導通は被測定個所
から接触部を介して直接リード線に接続されるの
で、接触時の不安定が軽減される。(ii)また、接触
圧支持ブロツク部2の取付孔2bを支点として被
測定物に圧接を行なえるので接続リード線の曲が
り、及び移動の負荷が軽減され、断線が少なくな
る。(iii)被測定物との接触圧はコイルバネの交換に
より自在に設定することが出来る。
As described above, according to the present invention, (i) electrical continuity is directly connected from the measurement point to the lead wire via the contact portion, so instability at the time of contact is reduced. (ii) In addition, since the object to be measured can be pressed against the mounting hole 2b of the contact pressure support block portion 2 as a fulcrum, the load of bending and movement of the connecting lead wire is reduced, and breakage of the wire is reduced. (iii) The contact pressure with the object to be measured can be freely set by replacing the coil spring.

したがつて接触圧のわずかな違いで破損し易い
リードレス型電子部品の破損や傷を減少出来る利
点がある。
Therefore, there is an advantage that damage and scratches on leadless electronic components, which are easily damaged due to slight differences in contact pressure, can be reduced.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図〜第3図は従来プローブの一部断面図を
含む側面図、第4図は本考案一実施例の斜視図で
ある。 1……接触ユニツト、1a……接触部、1b…
…板バネ、1c……コイルバネ、1d……アーム
部、1e……板バネの付け根、2……支持ブロツ
ク、2a……溝部、2b……板付孔、3……リー
ド線、4……接触部、5……リード線接続部、6
……バネ、7……針状部。
1 to 3 are side views including a partial sectional view of a conventional probe, and FIG. 4 is a perspective view of an embodiment of the present invention. 1...Contact unit, 1a...Contact part, 1b...
...Plate spring, 1c...Coil spring, 1d...Arm part, 1e...Flat spring base, 2...Support block, 2a...Groove, 2b...Plate hole, 3...Lead wire, 4...Contact Part, 5...Lead wire connection part, 6
...Spring, 7... Needle-like part.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 導電性板バネの先端部の下面に導電性接触子を
突設し、かつその上面に棒状体が植立し、さらに
棒状体の外周を囲繞するコイルバネとを有する接
触ユニツト部と、前記棒状体の一部を挿通し、前
記板バネと協働して前記コイルバネを挾持する切
欠き部を一端に有し残る他端に前記板バネの付け
根を固着する固定部を有する絶縁性支持ブロツク
部とを有することを特徴とするリードレス型電子
部品の測定端子。
a contact unit portion having a conductive contact protruding from the lower surface of the tip of a conductive plate spring, a rod-shaped body planted on the upper surface thereof, and a coil spring surrounding the outer periphery of the rod-shaped body; an insulating support block part having a notch part at one end for inserting a part of the coil spring and clamping the coil spring in cooperation with the leaf spring, and a fixing part for fixing the base of the leaf spring at the other end; A measurement terminal for a leadless electronic component, characterized by having the following characteristics:
JP16074083U 1983-10-18 1983-10-18 Measuring terminals for leadless electronic components Granted JPS6068475U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16074083U JPS6068475U (en) 1983-10-18 1983-10-18 Measuring terminals for leadless electronic components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16074083U JPS6068475U (en) 1983-10-18 1983-10-18 Measuring terminals for leadless electronic components

Publications (2)

Publication Number Publication Date
JPS6068475U JPS6068475U (en) 1985-05-15
JPH0236133Y2 true JPH0236133Y2 (en) 1990-10-02

Family

ID=30353459

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16074083U Granted JPS6068475U (en) 1983-10-18 1983-10-18 Measuring terminals for leadless electronic components

Country Status (1)

Country Link
JP (1) JPS6068475U (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52122480A (en) * 1976-04-07 1977-10-14 Hitachi Ltd Probe head for probe card

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52122480A (en) * 1976-04-07 1977-10-14 Hitachi Ltd Probe head for probe card

Also Published As

Publication number Publication date
JPS6068475U (en) 1985-05-15

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