JPS61104309U - - Google Patents

Info

Publication number
JPS61104309U
JPS61104309U JP18976084U JP18976084U JPS61104309U JP S61104309 U JPS61104309 U JP S61104309U JP 18976084 U JP18976084 U JP 18976084U JP 18976084 U JP18976084 U JP 18976084U JP S61104309 U JPS61104309 U JP S61104309U
Authority
JP
Japan
Prior art keywords
sample
thin film
work function
air counter
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18976084U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP18976084U priority Critical patent/JPS61104309U/ja
Publication of JPS61104309U publication Critical patent/JPS61104309U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
JP18976084U 1984-12-14 1984-12-14 Pending JPS61104309U (cg-RX-API-DMAC7.html)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18976084U JPS61104309U (cg-RX-API-DMAC7.html) 1984-12-14 1984-12-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18976084U JPS61104309U (cg-RX-API-DMAC7.html) 1984-12-14 1984-12-14

Publications (1)

Publication Number Publication Date
JPS61104309U true JPS61104309U (cg-RX-API-DMAC7.html) 1986-07-02

Family

ID=30747208

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18976084U Pending JPS61104309U (cg-RX-API-DMAC7.html) 1984-12-14 1984-12-14

Country Status (1)

Country Link
JP (1) JPS61104309U (cg-RX-API-DMAC7.html)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60262005A (ja) * 1984-06-09 1985-12-25 Rikagaku Kenkyusho 膜厚計測方法
JPS6339603U (cg-RX-API-DMAC7.html) * 1986-09-01 1988-03-15

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60262005A (ja) * 1984-06-09 1985-12-25 Rikagaku Kenkyusho 膜厚計測方法
JPS6339603U (cg-RX-API-DMAC7.html) * 1986-09-01 1988-03-15

Similar Documents

Publication Publication Date Title
MX9206230A (es) Mejoras en un contador de energia electrica activay metodos para el uso del mismo.
GB2065300A (en) Eccentricity measurement
JPS61104309U (cg-RX-API-DMAC7.html)
JPH0198985A (ja) 粒子線測定用モニタ装置
JPH057581Y2 (cg-RX-API-DMAC7.html)
JPS60207083A (ja) 粒子線等の2次元計測装置
SU691786A1 (ru) Устройство дл измерени поверхностного электростатического потенциала
JPS6387548U (cg-RX-API-DMAC7.html)
Davis A cathode ray oscillograph apparatus for the psychological laboratory
IE45698L (en) Tomography scanning
JPS57139679A (en) Electrode for measuring exo-electron emission
US4514633A (en) Ionization chamber for measuring the profile of a radiation field of electron or X-ray radiation
JPS62116354U (cg-RX-API-DMAC7.html)
JPS6335362Y2 (cg-RX-API-DMAC7.html)
JPS60262084A (ja) 放射線一次元アレイセンサ特性測定装置
SU607119A1 (ru) Измеритель внешней динамической нагрузки
JPH02712Y2 (cg-RX-API-DMAC7.html)
JPS60213808A (ja) 太陽電池を用いた面積の測定方法
Morgan A Photoelectron Counter Using Spectracon and Diode Array
JPS59103260U (ja) 放射線応用測定装置
JPS60123681U (ja) 放射線測定器
JPS62117507U (cg-RX-API-DMAC7.html)
FI910578A0 (fi) Anordning foer maetning av straolning.
JPS58101113U (ja) 螢光x線膜厚計に於ける測定点検出装置
JPH04161864A (ja) 帯電測定装置及びその方法