JPS57139679A - Electrode for measuring exo-electron emission - Google Patents
Electrode for measuring exo-electron emissionInfo
- Publication number
- JPS57139679A JPS57139679A JP2562881A JP2562881A JPS57139679A JP S57139679 A JPS57139679 A JP S57139679A JP 2562881 A JP2562881 A JP 2562881A JP 2562881 A JP2562881 A JP 2562881A JP S57139679 A JPS57139679 A JP S57139679A
- Authority
- JP
- Japan
- Prior art keywords
- measurement
- electrode
- sample
- collector
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/08—Measuring current density
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Measurement Of Current Or Voltage (AREA)
- Measurement Of Radiation (AREA)
Abstract
PURPOSE:To improve the accuracy of measurement by using an electrode prepared by covering up a collector formed of a metal wire through the intermediary of an insulator and providing a through-hole for measurement in a part thereof, when the emission of an exoelectron is measured by a microammeter. CONSTITUTION:Ultraviolet rays are applied to a sample having earth potential and exo-electrons released therefrom are collected to the collector whereon a positive voltage is impressed and are measured by the microammeter. On the occasion, the collector 1 formed of a metal wire is covered up closely with an earth pole 2 through the intermediary of an electrical insulating plate 3 to be monolithic and the through hole 4 for measurement is provided in the central part thereof, whereby the electrode is formed. And, the part of the sample to be measured is made to contact with the through hole 4 and ultraviolet rays are applied from the side opposite thereto for measurement. Accordingly, the thickness of the electrode is made to be thin, thereby distances between the sample and the collector 1 and between the sample and an ultraviolet-ray generating source can be shortened, and thus the accuracy of measurement and the efficiency of measurement can be improved.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2562881A JPS57139679A (en) | 1981-02-24 | 1981-02-24 | Electrode for measuring exo-electron emission |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2562881A JPS57139679A (en) | 1981-02-24 | 1981-02-24 | Electrode for measuring exo-electron emission |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57139679A true JPS57139679A (en) | 1982-08-28 |
| JPS6118145B2 JPS6118145B2 (en) | 1986-05-10 |
Family
ID=12171126
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2562881A Granted JPS57139679A (en) | 1981-02-24 | 1981-02-24 | Electrode for measuring exo-electron emission |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57139679A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60257343A (en) * | 1984-05-30 | 1985-12-19 | フオト アキユーステイツク テクノロジー インコーポレイテツド | Quality assurance inspection method and device |
| JPH03108648A (en) * | 1989-09-22 | 1991-05-08 | Hitachi Ltd | Method and apparatus for evaluating surface condition |
-
1981
- 1981-02-24 JP JP2562881A patent/JPS57139679A/en active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60257343A (en) * | 1984-05-30 | 1985-12-19 | フオト アキユーステイツク テクノロジー インコーポレイテツド | Quality assurance inspection method and device |
| JPH03108648A (en) * | 1989-09-22 | 1991-05-08 | Hitachi Ltd | Method and apparatus for evaluating surface condition |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6118145B2 (en) | 1986-05-10 |
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