JPS611033A - Bonding method - Google Patents
Bonding methodInfo
- Publication number
- JPS611033A JPS611033A JP60019686A JP1968685A JPS611033A JP S611033 A JPS611033 A JP S611033A JP 60019686 A JP60019686 A JP 60019686A JP 1968685 A JP1968685 A JP 1968685A JP S611033 A JPS611033 A JP S611033A
- Authority
- JP
- Japan
- Prior art keywords
- chip
- electrode
- tool
- distance
- bonding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/78—Apparatus for connecting with wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/78—Apparatus for connecting with wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/78—Apparatus for connecting with wire connectors
- H01L2224/7825—Means for applying energy, e.g. heating means
- H01L2224/783—Means for applying energy, e.g. heating means by means of pressure
- H01L2224/78313—Wedge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
Abstract
Description
【発明の詳細な説明】
本発明は半導体集積回路等の超小形電子装置の組立方法
に関し 半導体集積回路素子(以下チップと称する)上
の複数個の電極と外部リードとを金線、アルミ腺等で接
続するボンディングの方法に関するものでめる。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for assembling microelectronic devices such as semiconductor integrated circuits. Contains information on bonding methods for connection.
半導体集積回路の分野においても最近人件費の高騰が激
しく、人手會要する作業をなくす事が解決しなければな
らないN要な問題になってきた。In the field of semiconductor integrated circuits, labor costs have been rising sharply recently, and eliminating work that requires labor has become an important problem to be solved.
特にチップの電極と外部リード金納ぶいわゆるホンディ
ング工程の省力化が大きくクローズアップされている。In particular, the labor-saving process of the so-called honding process, which involves mounting chip electrodes and external lead metals, is attracting a great deal of attention.
本ホンディング工程に2いていまたに主流を占めるワイ
ヤボンディングのボンディング装置(以下、ボンダーと
称す)もマイクロコンピー−ター等の応用によって従来
の手作業に代って最初のスタート点のみを位置決めする
だけで彼は自動的にボンディングできるものが一般的に
なっている。The bonding equipment for wire bonding (hereinafter referred to as bonder), which is also the mainstream in this bonding process, also uses microcomputers to position only the first starting point instead of the conventional manual work. Things that can be bonded automatically have become commonplace.
これらのいわゆる自動ボンダーは最初のスタート点の位
置決め用としてチップのスタート電極に微小点照射装置
(以下スポットライトと称す)から光音照射する。これ
らのスポットライトはあらかじめボンデインクツール(
以下ツールと称す)がチップ電極にボンディングする時
にズレがない様にツールの降下点の位置とスポットライ
トの照射位置とを一致させている。These so-called automatic bonders irradiate a starting electrode of a chip with light sound from a minute point irradiation device (hereinafter referred to as a spotlight) for positioning the initial starting point. These spotlights were created using the Bonde Ink tool (
The position of the drop point of the tool and the irradiation position of the spotlight are made to match so that there is no deviation when the tool (hereinafter referred to as the tool) is bonded to the chip electrode.
この時、従来までの自動ボンタ゛−におけるツールはボ
ンティングすべき電極の真上にめる為に上゛記スポット
ライトはチップに垂直でりるツールに対して何度か傾け
てとシつけざるを得ない現状でおる0
その為に4L、チップの昼さがはらついているとオペレ
ータがスポットライトで位置決めしたと判断しても実際
にはその高さのバラツキ分だけツールとスポットライト
がずれた位置を示している事になる。At this time, in order to place the tool in conventional automatic bonding just above the electrode to be bonded, the spotlight has to be tilted several times with respect to the tool that is perpendicular to the chip. Therefore, even if the operator determines that the height of the 4L tip is uneven and the operator has positioned it using the spotlight, the tool and spotlight are actually shifted by the amount of the height variation. It shows the position.
一般に自動ボンダーは最初の位置決め時にボンダーにと
りつけられたセンサがそのチップのマウント位置ずれ量
を検出し、その検出量にもとすいて補正側算式によシ、
演算し、得られる出力値は上記マウント位置すれかbっ
でも正しくボンティングできるものである。In general, with an automatic bonder, a sensor attached to the bonder detects the amount of deviation in the mounting position of the chip during initial positioning, and based on that detected amount, a correction formula is used.
The output value obtained by the calculation is such that correct bonding can be performed even at the above-mentioned mount position.
しかし、それが上述の様に実際のツールとずれた量を検
出量として計算するから実際のチップ上の電極ではボン
ティングすれが生ずる問題があった0特に最近ウェハー
1枚当たシのテップ取得枚数を多くする為にチップ面積
を極力不埒くする墨からそのチップの電極も必然的に小
さくな9、少しのボンディングずれでも不良になる事が
多い。However, as mentioned above, since the detection amount is calculated based on the amount of deviation from the actual tool, there is a problem that bonding errors occur with the electrodes on the actual chip. In order to increase the number of chips, the chip area is made as unsophisticated as possible, and the electrodes of the chips are also inevitably small.9 Even the slightest bonding misalignment often causes defects.
又、超音波(以下USと称す)の自動ボンダは熱圧宥(
以下NTCと称す)自動ボンダーに比べ機械的に回転要
素が入ってくる為にボンティングf#度が不利になるの
に加え、このUSボンディングの適用素子はセラミック
やガラスタイプのパッケージCケース)に刺入されるの
が普通で、これらはパッケージ自体の高さのばらつきが
大きく、前述のスポットライトと実際のツールとの位置
ずれが大きくなると言った欠点がわりUSボンダーの自
動化の遅nた一因にもなっている。In addition, the ultrasonic (hereinafter referred to as US) automatic bonder uses heat and pressure toleration (hereinafter referred to as US).
(hereinafter referred to as NTC) Compared to an automatic bonder, mechanically rotating elements are introduced, so the bonding f# degree is disadvantageous. In addition, the applicable elements of this US bonding are ceramic and glass type packages (C case). These devices have disadvantages such as large variations in the height of the package itself and a large misalignment between the spotlight and the actual tool mentioned above, which is one of the reasons why the automation of US bonders has been slow. It has also become
そこで本発明の目的はこれらの問題を解決すべくパッケ
ージの種類やNTC、USボンディングにかかわらずボ
ンディング時のチップの高さのはらつきがあっても正し
くツールの位置を認識し、かつ効率のよいボンディング
の方法を提供することでりる。Therefore, the purpose of the present invention is to solve these problems by correctly recognizing the tool position even when there is variation in the height of the chip during bonding, regardless of the package type, NTC bonding, or US bonding. By providing a bonding method.
本発明の特徴は、半導体集積回路チップと外部リードと
全接続するボンディングの方法において。The present invention is characterized by a bonding method for fully connecting a semiconductor integrated circuit chip and external leads.
微小点照射装置からの光が該チップの第1の電極に垂直
方向から照射さnてここに微小点照射を形成しこれによ
り位置定めを行い、該第1の電極と該チップの第2の電
極との間の距離は前記光の垂直方向軸とツールの軸との
間の距離と等しく、かつ前記微小点照射を行っていると
きに該第2の電極の真上に該ツールが位置しているボン
ディングの方法にある。Light from the micro-point irradiation device is irradiated vertically onto the first electrode of the chip to form a micro-point irradiation therefor positioning, and the first electrode and the second electrode of the chip are the distance between the electrodes is equal to the distance between the vertical axis of the light and the axis of the tool, and the tool is located directly above the second electrode when performing the micropoint irradiation. There is a method of bonding.
この方法によれば上記従来技術の欠点は除去される。し
かも照射によシ位置出し金行った後、ツールを第1の電
袷上にもってきてここをスタート点とすることはなく、
ツールをそのまま降下させて第2の電極にボンディング
を行いここをスタート点として作業ができるから、時間
が節約でき効率的な作業となる。This method eliminates the drawbacks of the prior art described above. Moreover, after performing the irradiation and dispensing the position, there is no need to bring the tool onto the first wire and use this as the starting point.
Since the tool can be lowered as it is and bonded to the second electrode, the work can be started from this point, which saves time and makes the work more efficient.
次に図面を用いて本iVを詳細に説明する〇第1図は従
来の自動ボンダでボンディング部ヶ示す概略図であるが
図の株にツール1がチップ面2の垂直上にある為にスポ
ット2イト3は顯微鏡4の方からみてツールに対して手
前方向(第1図はこの例)やz=t+方向にろる角度5
(約10〜20°)だけどうしても傾けて*、aつけさ
るを侍ない。その為に第3図に示す:iIiシ、ある任
意のチップ面6の電極にオペレーターがスポットライト
を位置決゛めしたとしても次のチップ面7が来ると取り
つけ角度5に対するチップ面6.7の高さの誤差分9が
出る事が明らかであり、又他のチップ面8がくると上と
同様に誤差分10が出る事になる。Next, I will explain this IV in detail using drawings.〇Figure 1 is a schematic diagram showing the bonding part with a conventional automatic bonder. 2 and 3 are angles 5 that are tilted towards the tool when viewed from the mirror 4 (Figure 1 is an example of this) and in the z=t+ direction.
If you have to tilt it by about 10 to 20 degrees*, you will not be able to attend the monkey. For this reason, as shown in FIG. It is clear that there will be an error of 9 in the height of , and when another chip surface 8 comes, an error of 10 will appear as above.
−例を示すと、lをその誤差量、Hを高さのばらつき量
、θをスポットの取シつけ角度とすると誤差量lは次式
であられされる。- To give an example, if l is the amount of error, H is the amount of variation in height, and θ is the positioning angle of the spot, then the amount of error l is calculated by the following equation.
ノ=±HXtanθ
ここで実際値としてH−±01(セラミックパッケージ
の場会)、θ=20°程度であるから、!−±0.IX
tan20°−±0.IXo、364=±0.0364
即ちパッケージの高さのばらつさ分だけで±40μ位の
誤差が出る事になシチップ電極の大きさは100〜12
0μ角ゆえその他の機械的誤差入間自身が目で位置決め
する為の誤差等を堝えるとセラミックパッケージ等を使
用するUSボンディング等は実用上、大きな問題がある
。そこで本発明に用いる装置は第2図に示す様にスポッ
トライト3をチア1面2上よシ垂直の位置に設置し、ツ
ール1はポンディング而よシ一定距離11だけ離したと
ころに設ける事にしたものである。ノ=±HXtanθ Here, the actual value is H-±01 (for ceramic packages) and θ=about 20°, so! −±0. IX
tan20°-±0. IXo, 364=±0.0364
In other words, there will be an error of about ±40 μ due to the variation in package height, and the size of the chip electrode should be 100 to 12
Because of the 0μ angle, other mechanical errors and errors caused by visual positioning by the input member themselves pose a major problem in practice with US bonding using ceramic packages, etc. Therefore, in the apparatus used in the present invention, as shown in FIG. 2, a spotlight 3 is installed in a vertical position above the surface 2 of the chia 1, and the tool 1 is installed at a certain distance 11 away from the surface of the chia 1. This is what I did.
かかる構成によシ、第3図でわかる様に従来の取シつけ
角度で発生したチップ尚さのばらつきによる誤差分9,
10等は生じないことは明らかである0
又第4図は本発明の実施例を示すもので、第1の電極1
5、第2の電極16間のツールの前進、後退の運動を省
略することができ、位置合せ後ツールをその′−1ま降
下させて第2の電極16にそのままボンディングできる
。尚、第4図で他の図と同じ機能のところは同じ符号で
示している。With this configuration, as can be seen in Fig. 3, the error due to variations in chip height caused by the conventional mounting angle is reduced by 9.
It is clear that 10 etc. do not occur.0 Also, FIG. 4 shows an embodiment of the present invention, in which the first electrode 1
5. The forward and backward movement of the tool between the second electrodes 16 can be omitted, and after alignment, the tool can be lowered to '-1' and bonded to the second electrode 16 as it is. In FIG. 4, the same functions as in other figures are indicated by the same reference numerals.
即ち、LSI等の様に大きいチップの場合、オペレータ
ーに向かってたとえば手前側に位置決め用の電極15を
選びツールをこれと反対側の電極16にセットできる様
にスポットとツールの距離11をチップ2の相対する2
辺の電極の距離と一致させておけはよい。That is, in the case of a large chip such as an LSI, the distance 11 between the spot and the tool is set on the chip 2 so that the operator can select the positioning electrode 15 on the front side and set the tool on the electrode 16 on the opposite side. opposite of 2
It is a good idea to match the distance between the side electrodes.
以上の様に本特訂による方法によれは以下の様な特徴を
有するものである。As mentioned above, the method according to this special edition has the following characteristics.
、l’l」ち、パッケージの種類を問わず、チップの高
さがばらついていてもこれが位置決め精度に影響しない
ので特にUSボンティング等において高精度の位置決め
が要求されるものに有効である。又顕微鏡やカメラの取
付角度を垂直あるいはそれに近くできるから焦点深度の
問題が小さくなシ、必然的にオペレーターの位置決めが
やシやすくなり精度が上がシ疲労軸減にも役立つ。そし
て、位置決め精度の向上と作業能率の向上が計れる。, l'l'' Regardless of the type of package, even if the height of the chip varies, it does not affect the positioning accuracy, so it is particularly effective for applications that require high-precision positioning, such as in US bonding. In addition, since the mounting angle of the microscope and camera can be vertical or close to vertical, the problem of depth of focus is reduced, which naturally makes positioning of the operator easier, which improves accuracy and helps reduce the axis of fatigue. In addition, it is possible to improve positioning accuracy and work efficiency.
第1図は従来の自動ボンダの概略図、第2図は本発明の
実施例に用いる装置、の概略図、第3図はスポットライ
トの取付角度がチップの高さの差によって位置ずれが生
ずる。4!全説明する概略図、第4図は本発明の一実施
例によるツールの前進・後退を省W@する方法を示す概
略図である。
1・・・・・・ツール、2・・・・・・チップ、3・・
・・・・スポットライト、4・・・・・・顕微鏡、11
・旧・・ツール・スポットライト取付距離、および第1
.第2の電極間の距離、12.13・・・・・・顕微鏡
取付角度、15・・団・電1の電極、16・・・・・・
第2の電極。
aFig. 1 is a schematic diagram of a conventional automatic bonder, Fig. 2 is a schematic diagram of an apparatus used in an embodiment of the present invention, and Fig. 3 is a schematic diagram of the installation angle of a spotlight, which causes misalignment due to the difference in chip height. . 4! FIG. 4 is a schematic diagram illustrating a method of eliminating tool advancement and retraction according to an embodiment of the present invention. 1...tool, 2...chip, 3...
...Spotlight, 4...Microscope, 11
・Old...tool/spotlight installation distance, and 1st
.. Distance between second electrodes, 12.13...Microscope installation angle, 15...Gun/Electrode 1, 16...
Second electrode. a
Claims (1)
ィングの方法において、微小点照射装置からの光が該チ
ップの第1の電極に垂直方向から照射されてここに微小
点照射を形成しこれにより位置決めを行い、該第1の電
極と該チップの第2の電極との間の距離は前記光の垂直
方向軸とボンディングツールの軸との間の距離と等しく
、かつ前記微小点照射を行っているときに該第2の電極
の真上に該ボンディングツールが位置していることを特
徴とするボンディングの方法。In a bonding method for connecting a semiconductor integrated circuit chip and an external lead, light from a micropoint irradiation device is irradiated from a vertical direction onto a first electrode of the chip to form a micropoint irradiation here, thereby positioning the chip. and the distance between the first electrode and the second electrode of the chip is equal to the distance between the vertical axis of the light and the axis of the bonding tool, and when performing the micropoint irradiation. The bonding method is characterized in that the bonding tool is located directly above the second electrode.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60019686A JPS611033A (en) | 1985-02-04 | 1985-02-04 | Bonding method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60019686A JPS611033A (en) | 1985-02-04 | 1985-02-04 | Bonding method |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12673676A Division JPS5351968A (en) | 1976-10-21 | 1976-10-21 | Bonding unit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS611033A true JPS611033A (en) | 1986-01-07 |
JPS6120138B2 JPS6120138B2 (en) | 1986-05-21 |
Family
ID=12006118
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60019686A Granted JPS611033A (en) | 1985-02-04 | 1985-02-04 | Bonding method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS611033A (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100390863B1 (en) * | 2000-10-16 | 2003-07-10 | 이국재 | suction instrument for Ink-cartridge and Refill Device |
-
1985
- 1985-02-04 JP JP60019686A patent/JPS611033A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6120138B2 (en) | 1986-05-21 |
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