JPS5919463B2 - wire bonding method - Google Patents

wire bonding method

Info

Publication number
JPS5919463B2
JPS5919463B2 JP55044068A JP4406880A JPS5919463B2 JP S5919463 B2 JPS5919463 B2 JP S5919463B2 JP 55044068 A JP55044068 A JP 55044068A JP 4406880 A JP4406880 A JP 4406880A JP S5919463 B2 JPS5919463 B2 JP S5919463B2
Authority
JP
Japan
Prior art keywords
bonding
wire
oscillation output
horn
tail
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55044068A
Other languages
Japanese (ja)
Other versions
JPS56142647A (en
Inventor
猛 長谷川
信人 山崎
満 鏡原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shinkawa Ltd
Original Assignee
Shinkawa Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinkawa Ltd filed Critical Shinkawa Ltd
Priority to JP55044068A priority Critical patent/JPS5919463B2/en
Publication of JPS56142647A publication Critical patent/JPS56142647A/en
Publication of JPS5919463B2 publication Critical patent/JPS5919463B2/en
Expired legal-status Critical Current

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/78Apparatus for connecting with wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/0555Shape
    • H01L2224/05552Shape in top view
    • H01L2224/05554Shape in top view being square
    • HELECTRICITY
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    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/4847Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond
    • H01L2224/48472Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond the other connecting portion not on the bonding area also being a wedge bond, i.e. wedge-to-wedge
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49171Fan-out arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • H01L2224/7825Means for applying energy, e.g. heating means
    • H01L2224/783Means for applying energy, e.g. heating means by means of pressure
    • H01L2224/78301Capillary
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/8512Aligning
    • H01L2224/85148Aligning involving movement of a part of the bonding apparatus
    • H01L2224/85169Aligning involving movement of a part of the bonding apparatus being the upper part of the bonding apparatus, i.e. bonding head, e.g. capillary or wedge
    • H01L2224/8518Translational movements
    • H01L2224/85181Translational movements connecting first on the semiconductor or solid-state body, i.e. on-chip, regular stitch
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/852Applying energy for connecting
    • H01L2224/85201Compression bonding
    • H01L2224/85205Ultrasonic bonding
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
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    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01039Yttrium [Y]
    • HELECTRICITY
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    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/1015Shape
    • H01L2924/1016Shape being a cuboid
    • H01L2924/10162Shape being a cuboid with a square active surface

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Wire Bonding (AREA)

Abstract

PURPOSE:To bond a wire in the best condition while calculating the supersonic wave output values of respective bonding points by inputting the optimum values of the supersonic oscillation outputs for driving the vibrating direction of the horn of a supersonic pressing device into a microcomputer. CONSTITUTION:A ratio of a reference oscillation output value for bonding a wire in the best condition when the bending direction of the tail of the wire at the time of bonding is matched to a Y-axis direction to a reference oscillation output value for bonding the wire in the best condition when the bending direction of the tail is matched to an X-axis direction is prepared, the best oscillation output value of the bonding point at a certain position is prepared as a predetermined function, and they are stored in a computer beforehand. The oscillation output of the best bonding calculated by the computer 11 is outputted by a supersonic oscillator 12 to vibrate a horn 5. Since it is a supersonic vibration calculated by the computer, uniform bonding can be performed.

Description

【発明の詳細な説明】 本発明はワイヤボンディング方法に関するものである。[Detailed description of the invention] The present invention relates to a wire bonding method.

半導体、集積回路装置等の製造においては、ペレット上
のパッドと外部リードとをワイヤで接続する作業があり
、このワイヤ接続の方法として超音波ワイヤボンディン
グ方法及び超音波熱圧着ワイヤボンディング方法が知ら
れている。
In the manufacture of semiconductors, integrated circuit devices, etc., there is work to connect pads on pellets and external leads with wires, and ultrasonic wire bonding methods and ultrasonic thermocompression wire bonding methods are known as methods for this wire connection. ing.

この方法においては、ワイヤをボンド点に押付けるため
のウェッジ下端よりワイヤが逃げないようにワイヤの延
在する方向とウェッジの振動方向を一致させることを必
要とする。そこで最近、このような方向性を考慮しなく
てもよいように、ウェッジに代えて筒状のキャピラリに
ワイヤを挿通して用いることが行なわれている。
In this method, it is necessary to match the direction in which the wire extends and the direction in which the wedge vibrates so that the wire does not escape from the lower end of the wedge used to press the wire against the bonding point. Therefore, recently, in order to eliminate the need to consider such directionality, a wire has been inserted into a cylindrical capillary instead of a wedge.

第1図はキャピラリを使用したワイヤボンディング装置
の概略側面図、第2図はボンディング状態を示す平面図
及び側面図である。第1図に示すように、試料1を位置
決め載置する試料台2の上方にはキャピラリ3が配設さ
れている。キャピラリ3はボンディングヘッド4により
上下駆動されるホーン5の先端に取付けられ、前記ボン
ディングヘッド4はXYテーブル6によりXY平面上を
移動させられる。またワイヤTはスプール8よりホーン
5と共に上下動するクランパー9、キャピラリ3の案内
孔を通してキャピラリ3の先端下面に案内されている。
そこで、チエスマン10を操作してXYテーブル6を移
動させ、ボンディングヘッド4上に固定された図示しな
いカメラにより試料1上の任意の定点と、図示しないモ
ニター上に写し出されたマークを合せると、試料1のず
れ量からボンディング位置を図示しないマイクロコンピ
ューターにより自動的に算出し、以後第2図に示す動作
に従つて全てのボンディング点が自動的にボンディング
される。即ち、XYテーブル6が移動してキャピラリ3
が第1ボンド点a4の上方に位置し、ボンディングヘッ
ド4の駆動によりキャピラリ3が下降して第1ボンド点
a4に接地し、ホーン5が超音波発振して第1ボンド点
a、にワイヤTの先端をボンディングし、同時にクラン
バー9が開く。
FIG. 1 is a schematic side view of a wire bonding apparatus using a capillary, and FIG. 2 is a plan view and a side view showing a bonding state. As shown in FIG. 1, a capillary 3 is disposed above a sample stage 2 on which a sample 1 is positioned and mounted. The capillary 3 is attached to the tip of a horn 5 that is driven up and down by a bonding head 4, and the bonding head 4 is moved on the XY plane by an XY table 6. Further, the wire T is guided from the spool 8 to the lower surface of the tip of the capillary 3 through a clamper 9 that moves up and down with the horn 5 and a guide hole of the capillary 3.
Therefore, by operating the Chessman 10 to move the XY table 6 and aligning an arbitrary fixed point on the sample 1 with a mark projected on the monitor (not shown) using a camera (not shown) fixed on the bonding head 4, the sample A microcomputer (not shown) automatically calculates the bonding position from the amount of deviation of 1, and thereafter all bonding points are automatically bonded according to the operation shown in FIG. That is, the XY table 6 moves and the capillary 3
is located above the first bond point a4, the capillary 3 is lowered by the drive of the bonding head 4 and is grounded at the first bond point a4, and the horn 5 oscillates ultrasonic waves to connect the wire T to the first bond point a. At the same time, the clamper 9 opens.

次にボンディングヘッド4の駆動によりキャピラリ3が
上昇し、XYテーブル6の移動によつて第2ボンド点b
1の上方に位置する。続いてボンデイングヘツド4の駆
動によりキヤピラリ3とクランパ−9が下降して第2ボ
ンド点B,に接地し、ホーン5が超音波発振して第2ボ
ンド点B,にボンデイングする。次にキヤピラリ3がわ
ずか上昇し、その後クランパ−9によりワイヤ7を保持
し、XYテーブル6をワイヤ7により形成されたルーブ
の後方に移動させ、ワイヤ7を第2ボンド点b1の近傍
でカツトさせる。これによりキヤピラリ3の先端下面下
にはキヤビラリ3の下面の方向に折曲げられたワイヤ7
のテールが延在する。最後にボンデイングヘツド4の駆
動によりキヤビラリ3が上昇し、更にXYテーブル6の
駆動によりキヤピラリ3は次の第1ボンド点に移動する
。この動作を繰り返してボンデイングが完了する。この
ように、キヤピラリ3を用いると、試料台2を回転させ
なくても超音波によるボンデイングができる。
Next, the capillary 3 is raised by the drive of the bonding head 4, and the second bond point b is moved by the movement of the XY table 6.
Located above 1. Subsequently, the capillary 3 and clamper 9 are lowered by driving the bonding head 4 and grounded at the second bond point B, and the horn 5 oscillates ultrasonic waves to bond to the second bond point B. Next, the capillary 3 rises slightly, and then the wire 7 is held by the clamper 9, the XY table 6 is moved to the rear of the lube formed by the wire 7, and the wire 7 is cut near the second bond point b1. . As a result, under the bottom surface of the tip of the capillary 3, a wire 7 is bent in the direction of the bottom surface of the capillary 3.
The tail of is extended. Finally, the bonding head 4 is driven to raise the capillary 3, and the XY table 6 is further driven to move the capillary 3 to the next first bonding point. This operation is repeated to complete bonding. In this way, by using the capillary 3, bonding can be performed using ultrasonic waves without rotating the sample stage 2.

さて、超音波の振動方向はホーン5の軸線、即ちY方向
であり、このY方向にテールの曲げ方向及びワイヤ接続
される第1ボンド点aと第2ボンド点bを結ぶループ方
向が一致していれば第1ボンドaへの第1ポンド及び第
2ボンド点bへの第2ボンドは、超音波発振出力が有効
にワイヤ7のボンド部に伝達され、良好なボンデイング
が行なわれる。しかしながら、第2図aより明らかな如
く、ループ方向は種々様々であり、またテール曲げ方向
はできるだけループ方向に近似するように曲げた方がよ
く、その曲げ方向も種々様様であるので、従来のように
一定の基準発振出力でボンデイングした場合は、テール
の曲げ方向及びループ方向によつて良好にボンデイング
できない場合が生じる。このため、キヤピラリを用いた
従来の方法は限られた試料にしか適用できない欠点があ
つた。本発明は上記従来技術の欠点に鑑みなされたもの
で、如何なるテールの曲げ方向及びループ方向において
も最良のボンデイングを行なうことができるワイヤボン
デイング方法を提供することを目的とする。
Now, the vibration direction of the ultrasonic wave is the axis of the horn 5, that is, the Y direction, and the bending direction of the tail and the loop direction connecting the first bond point a and the second bond point b to which the wire is connected coincide with this Y direction. If this is the case, the ultrasonic oscillation output will be effectively transmitted to the bond portion of the wire 7 for the first pound to the first bond a and the second bond to the second bond point b, and good bonding will be performed. However, as is clear from Fig. 2a, there are various loop directions, and it is better to bend the tail so that it approximates the loop direction as much as possible. When bonding is performed with a constant reference oscillation output as shown in FIG. For this reason, the conventional method using a capillary has the disadvantage that it can only be applied to a limited number of samples. The present invention has been made in view of the above-mentioned drawbacks of the prior art, and it is an object of the present invention to provide a wire bonding method that can perform the best bonding in any tail bending direction or loop direction.

以下、本発明を図示の実施例により説明する。Hereinafter, the present invention will be explained with reference to illustrated embodiments.

第3図は本発明の方法に用いる超音波発振装置の概略説
明図、第4図は本発明の方法で用いる計算式の一例を説
明するための線図である。第3図において、11はマイ
クロコンピユータ、12はマイクロコンピユータ11の
指令により超音波発振出力をホーン5に出力する超音波
発振器である。今、第2図aに示す第1ボンド点A,、
第2ボンド点b1にボンデイングする場合について説明
する。第4図に示すように試料1の中心点を原点0にと
り、Y軸に対する第1ポンド点a1にボンデイングする
時のテールの曲り方向をα;とする。このテールの曲り
方向α;はワイヤカツト時にキヤピラリをどの方向に移
動させてカツトするか、即ちキヤピラリの移動方向によ
つて自動的にコンピユータにより算出される。また他の
方法として、テールが垂直になるようにカツトした場合
においては、試料を押えている試料押え等のエツジ部分
にテールが当るようにキヤピラリを移動させる等の手段
によつてテールの曲りは形成され、このテール曲げ形成
のためにキヤピラリをどの方向に移動させたかによつて
判明する。そして、テール曲り方向くが零、即ちY方向
に一致する場合に最良のボンデイングが行なえる基準発
振出力値をPYlテール曲り方向α;が9σ、即ちX方
向に一致する場合に最良のボンデイングが行なえる発振
出力値をPxとし、両者の比をAとすると、次式が成立
する。
FIG. 3 is a schematic explanatory diagram of an ultrasonic oscillator used in the method of the present invention, and FIG. 4 is a diagram for explaining an example of a calculation formula used in the method of the present invention. In FIG. 3, 11 is a microcomputer, and 12 is an ultrasonic oscillator that outputs ultrasonic oscillation output to the horn 5 according to instructions from the microcomputer 11. Now, the first bond point A shown in FIG. 2a,
The case of bonding to the second bond point b1 will be explained. As shown in FIG. 4, the center point of the sample 1 is taken as the origin 0, and the bending direction of the tail when bonding to the first pound point a1 with respect to the Y axis is α;. The bending direction α of the tail is automatically calculated by a computer according to the direction in which the capillary is moved to cut the wire, that is, the direction in which the capillary is moved. Alternatively, if the tail is cut vertically, the bending of the tail can be avoided by moving the capillary so that the tail touches the edge of a sample holder, etc. that is holding the sample. This is determined by the direction in which the capillary is moved to create this tail bend. Then, the reference oscillation output value that allows the best bonding to be performed when the tail bending direction is zero, that is, coincides with the Y direction, is the reference oscillation output value that allows the best bonding to be performed when the tail bending direction α is 9σ, that is, coincides with the X direction. Assuming that the oscillation output value is Px and the ratio of the two is A, the following equation holds true.

前記の如くPY,PXは実験値によつて定められた値で
あるので、定数Aは自ずと判明する。
As mentioned above, since PY and PX are values determined by experimental values, the constant A is naturally determined.

そこで、第1ボンド点a1における最良の発振出力値P
a,は、次式のようになる。
Therefore, the best oscillation output value P at the first bond point a1
a, is as shown in the following equation.

(2成に(1成を代入して整理すると、 となる。(Substituting (1st) into 2nd and rearranging, becomes.

このようにPalは(3成より明らかな如く、α;の関
数として表わされる。
In this way, Pal is expressed as a function of α; as is clear from the three components.

そこで、定数PY,A(又はPx)のlを予めコンピユ
ータ内に記憶させておくと、あとはテール曲げ方向α1
こよつて(3成に基いて第3図に示すマイクロコンピユ
ータ11で算出されて最良のボンデイングの発振出力が
超音波発振器12により出力され、ホーン5が振動する
。テール曲げ方向α;は前記した如く、予めマイクロコ
ンピユータに記憶された値によつてキヤピラリ3が動く
方向で6るので、どの点をボンデイングするかによつて
自と判明している。このようにして第1ボンド点a1に
おいては最良のボンデイングの発振出力でボンデイング
される。次に第2ボンド点b1における最良のボンデイ
ングの発振出力Pblは、第1ボンド点a1と第2ボン
ド点b1を結ぶ方向、即ちルーブ方向をβ1とすると、
上喧3成と全く同じ次式のようになる。
Therefore, if l of the constant PY, A (or Px) is stored in advance in the computer, all that is left is the tail bending direction α1.
As a result, the best bonding oscillation output calculated by the microcomputer 11 shown in FIG. 3 based on the three components is outputted by the ultrasonic oscillator 12, and the horn 5 vibrates. , the direction in which the capillary 3 moves is determined by the value stored in advance in the microcomputer, so it is determined which point is to be bonded.In this way, the best bonding point is determined at the first bonding point a1. Next, the best bonding oscillation output Pbl at the second bond point b1 is given by β1 in the direction connecting the first bond point a1 and the second bond point b1, that is, the lube direction.
The following equation is exactly the same as that of the third generation.

ここでβ1まa1とb1との座標によつて決り、予めマ
イクロコンピユータに記憶されている値であるので、前
記と同様に(4成に基いてマイクロコンピユータ11で
Pblは算出される。ここで、テール曲げ方向α;及び
ループ方向β;を角度の関数として、θとして表わすと
、ボンド点における最良の発振出力Pは次式のような一
般式で与えられる。
Here, β1 is determined by the coordinates of a1 and b1, and is a value stored in the microcomputer in advance, so Pbl is calculated by the microcomputer 11 based on the 4 components as described above. , tail bending direction α; and loop direction β; are expressed as θ as a function of angle, then the best oscillation output P at the bond point is given by the following general formula.

また『ボンデイング点A2′A3l\B29b3l6に
おいても上式で与えられる。
Furthermore, the bonding point A2'A3l\B29b3l6 is also given by the above equation.

以上の説明から明らかな如く、キヤピラリより延在した
ワイヤの方向がホーンの振動方向及びこれに直角な方向
の場合において最良のボンデイング状態を示す超音波発
振出力値を予めマイクロコンピユータに入力しておくと
、マイクロコンピユータの指令で決められたテールの方
向及びループ方向により、各ボンド点の最良のボンデイ
ングの超音波発振出力値をマイクロコンピユータで算出
し、この算出された値によつてホーンが振動してボンデ
イングするので、均一なボンデイングを得ることができ
る。
As is clear from the above explanation, the ultrasonic oscillation output value that indicates the best bonding state when the direction of the wire extending from the capillary is the vibration direction of the horn and the direction perpendicular to this is input into the microcomputer in advance. Then, the microcomputer calculates the ultrasonic oscillation output value for the best bonding at each bond point based on the tail direction and loop direction determined by the microcomputer's instructions, and the horn vibrates based on this calculated value. Since the bonding is carried out using the same method, uniform bonding can be obtained.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はワイヤボンデイング装置の概略側面図、第2図
はボンデイング状態を示し、aは平面図、bは側面図、
第3図は本発明の方法に用いる超音波発振装置の概略説
明図、第4図は本発明の方法で用いる計算式の一例を説
明するための線図である。 1:試料、3:キヤピラリ、5:ホーン、7リワイヤ、
11:マイクロコンピユータ、12:超音波発振器、A
l,a2,a3・・・:第1ボンド点、B,,b2,b
3・・・:第2ボンド点、α1,α2,α3・・・:テ
ール曲げ方向、β1,β2,β3・・・:ルーブ方向。
Fig. 1 is a schematic side view of the wire bonding device, Fig. 2 shows the bonding state, a is a plan view, b is a side view,
FIG. 3 is a schematic explanatory diagram of an ultrasonic oscillator used in the method of the present invention, and FIG. 4 is a diagram for explaining an example of a calculation formula used in the method of the present invention. 1: Sample, 3: Capillary, 5: Horn, 7 Rewire,
11: Microcomputer, 12: Ultrasonic oscillator, A
l, a2, a3...: first bond point, B,, b2, b
3...: second bond point, α1, α2, α3...: tail bending direction, β1, β2, β3...: lube direction.

Claims (1)

【特許請求の範囲】[Claims] 1 キャピラリ先端下面より延在したワイヤの方向がホ
ーンの振動方向及びこれに直角な方向のそれぞれの場合
において最良のボンディング状態となるそれぞれの超音
波発振出力値を予めマイクロコンピュータに入力するこ
とにより、マイクロコンピュータの指令で予め決められ
たテール曲り方向及びループ方向により、各ボンド点の
ボンディングの超音波発振出力値をマイクロコンピュー
タで算出し、この算出された値によつてホーンが振動し
て各ボンド点をボンディングすることを特徴とするワイ
ヤボンディング方法。
1. By inputting in advance into the microcomputer the respective ultrasonic oscillation output values that provide the best bonding state in each case where the direction of the wire extending from the lower surface of the capillary tip is the vibration direction of the horn and the direction perpendicular to this, The microcomputer calculates the bonding ultrasonic oscillation output value at each bond point according to the tail bending direction and loop direction predetermined by the microcomputer's instructions, and the horn vibrates according to the calculated value to A wire bonding method characterized by bonding points.
JP55044068A 1980-04-05 1980-04-05 wire bonding method Expired JPS5919463B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55044068A JPS5919463B2 (en) 1980-04-05 1980-04-05 wire bonding method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55044068A JPS5919463B2 (en) 1980-04-05 1980-04-05 wire bonding method

Publications (2)

Publication Number Publication Date
JPS56142647A JPS56142647A (en) 1981-11-07
JPS5919463B2 true JPS5919463B2 (en) 1984-05-07

Family

ID=12681305

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55044068A Expired JPS5919463B2 (en) 1980-04-05 1980-04-05 wire bonding method

Country Status (1)

Country Link
JP (1) JPS5919463B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0225360U (en) * 1988-08-08 1990-02-20

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4606490A (en) * 1982-08-24 1986-08-19 Asm Assembly Automation Limited Apparatus and method for automatic evaluation of a bond created by an ultrasonic transducer
JPS61152029A (en) * 1984-12-26 1986-07-10 Hitachi Ltd Wire bonding device
JPH05321537A (en) * 1992-05-19 1993-12-07 Y K K Architect Prod Kk Single sliding sound insulation sash

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0225360U (en) * 1988-08-08 1990-02-20

Also Published As

Publication number Publication date
JPS56142647A (en) 1981-11-07

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