JPS6071969A - 群遅延測定装置 - Google Patents

群遅延測定装置

Info

Publication number
JPS6071969A
JPS6071969A JP18164483A JP18164483A JPS6071969A JP S6071969 A JPS6071969 A JP S6071969A JP 18164483 A JP18164483 A JP 18164483A JP 18164483 A JP18164483 A JP 18164483A JP S6071969 A JPS6071969 A JP S6071969A
Authority
JP
Japan
Prior art keywords
phase
frequency
group delay
difference
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18164483A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0426066B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Takahiro Yamaguchi
隆弘 山口
Norio Arakawa
則雄 荒川
Hiromi Ozawa
小澤　広美
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Takeda Riken Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp, Takeda Riken Industries Co Ltd filed Critical Advantest Corp
Priority to JP18164483A priority Critical patent/JPS6071969A/ja
Publication of JPS6071969A publication Critical patent/JPS6071969A/ja
Publication of JPH0426066B2 publication Critical patent/JPH0426066B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measurement Of Resistance Or Impedance (AREA)
JP18164483A 1983-09-28 1983-09-28 群遅延測定装置 Granted JPS6071969A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18164483A JPS6071969A (ja) 1983-09-28 1983-09-28 群遅延測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18164483A JPS6071969A (ja) 1983-09-28 1983-09-28 群遅延測定装置

Publications (2)

Publication Number Publication Date
JPS6071969A true JPS6071969A (ja) 1985-04-23
JPH0426066B2 JPH0426066B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1992-05-06

Family

ID=16104349

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18164483A Granted JPS6071969A (ja) 1983-09-28 1983-09-28 群遅延測定装置

Country Status (1)

Country Link
JP (1) JPS6071969A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2413855A (en) * 2004-05-04 2005-11-09 Agilent Technologies Inc System and method for analyzing an electrial network
WO2009022697A1 (ja) * 2007-08-15 2009-02-19 Advantest Corporation 測定装置、試験装置および測定方法

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2413855A (en) * 2004-05-04 2005-11-09 Agilent Technologies Inc System and method for analyzing an electrial network
WO2009022697A1 (ja) * 2007-08-15 2009-02-19 Advantest Corporation 測定装置、試験装置および測定方法
JP5225994B2 (ja) * 2007-08-15 2013-07-03 株式会社アドバンテスト 測定装置、試験装置および測定方法
US8581571B2 (en) 2007-08-15 2013-11-12 Advantest Corporation Measuring apparatus, testing apparatus and measuring method

Also Published As

Publication number Publication date
JPH0426066B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1992-05-06

Similar Documents

Publication Publication Date Title
US4774454A (en) Distortion measuring system method utilizing signal suppression
JPH04230871A (ja) 周波数測定方法
US4686457A (en) Method for measuring a signal's frequency components
US5420501A (en) Frequency spectrum analyzer
US3344349A (en) Apparatus for analyzing the spectra of complex waves
JPS6071969A (ja) 群遅延測定装置
US5703797A (en) Method and apparatus for testing acoustical devices, including hearing aids and the like
JPS62227342A (ja) クワドラチヤ−検波装置
US6590510B2 (en) Sample rate converter
US4995006A (en) Apparatus and method for low-pass equivalent processing
JPH0915273A (ja) 基本波成分周波数の測定方法及び測定装置
JPH01151400A (ja) スピーカの高調波歪測定方法
US20030154225A1 (en) Method for determining Hopf bifurcation points of a periodic state description of a technical system; computer program and computer program product executing the method; storage medium, computer memory, electric carrier signal, and data carrier storing the computer program; and method for downloading a computer program containing the method
JPH055505Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP3352423B2 (ja) 水晶振動子測定装置
Lessard Error in Random Data Estimate Analysis (Information Is Paraphrased from Bendat & Piersol)
JPH01257274A (ja) 周波数推定方式
Khilchenko et al. An improved technique based on discrete Fourier transform for demodulating the plasma-induced phase shift in a dispersion interferometer
Li et al. A Group Delay Measurement Method for GNSS Receiver Based on BOC Signal
JPS63302841A (ja) 核磁気共鳴映像装置の計測デ−タ誤差補償方法
Kaneko Time-Frequency Analysis in Health Informatics
Burian et al. 1-D direct phase retrieval
Hocaoglu et al. Using bilinear and quadratic forms for frequency estimation
SU800965A1 (ru) Анализатор частотных характеристик
Shanmuga Sundaram et al. Numerically stable algorithm for computing Wigner–Ville distribution