JPS6068718A - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

Info

Publication number
JPS6068718A
JPS6068718A JP59110725A JP11072584A JPS6068718A JP S6068718 A JPS6068718 A JP S6068718A JP 59110725 A JP59110725 A JP 59110725A JP 11072584 A JP11072584 A JP 11072584A JP S6068718 A JPS6068718 A JP S6068718A
Authority
JP
Japan
Prior art keywords
circuit
signal
channel
transistor
chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP59110725A
Other languages
Japanese (ja)
Inventor
Osamu Minato
湊 修
Toshiaki Masuhara
増原 利明
Toshio Sasaki
敏夫 佐々木
Seiji Kubo
征治 久保
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP59110725A priority Critical patent/JPS6068718A/en
Publication of JPS6068718A publication Critical patent/JPS6068718A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/02Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
    • H03K19/08Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices
    • H03K19/094Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using field-effect transistors
    • H03K19/09425Multistate logic
    • H03K19/09429Multistate logic one of the states being the high impedance or floating state
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/02Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
    • H03K19/08Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices
    • H03K19/094Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using field-effect transistors
    • H03K19/0944Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using field-effect transistors using MOSFET or insulated gate field-effect transistors, i.e. IGFET
    • H03K19/09448Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using field-effect transistors using MOSFET or insulated gate field-effect transistors, i.e. IGFET in combination with bipolar transistors [BIMOS]

Abstract

PURPOSE:To obtain a tri-state type drive circuit with high speed and small chip area by using mainly MOSFETs and combining bipolar transistors (TRs) to them. CONSTITUTION:NOR circuits 5, 6 inputting an enable signal (INE)CS selecting one of plural IC chips and a signal 1 from a chip are provided, and since N- MOSFETs 52, 62 are turned on when the INESC is at high level, a TR8 and an N-MOSFET9 are turned off and an output terminal 2 is in the floating state. Since the INECS is at L level, since P-MOSFETs 51, 61 are turned on, any of the N-MOSFET9 and the TR8 is turned on in response to the level H/L of the signal 1 and the output terminal goes to L/H.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は、絶縁ゲート型電界効果トランジスタ(以下、
MOS−F’BTと略す)を基本としてバイポーラ・ト
ランジスタをさらに組み合わせた、従来より高速な半導
体集積回路に関するものである。
[Detailed Description of the Invention] [Field of Application of the Invention] The present invention relates to an insulated gate field effect transistor (hereinafter referred to as
This invention relates to a semiconductor integrated circuit that is faster than conventional semiconductor integrated circuits, which is based on a MOS-F'BT (abbreviated as MOS-F'BT) and is further combined with bipolar transistors.

〔発明の背景〕[Background of the invention]

従来、エンハンスメント形PチャンネルMO8−FET
とエンハンスメン)形N−1−ヤンネルMO8−FET
を同一チップに同時に集積したO−MOS(Oompl
ementary−MOS )回路においては、第1図
に示すような駆動回路が用いられる。同図で、。
Conventionally, enhancement type P channel MO8-FET
and Enhancement Men) Type N-1-Yannel MO8-FET
O-MOS (Oompl
In the elementary-MOS) circuit, a drive circuit as shown in FIG. 1 is used. In the same figure.

1は入力端子、2は負荷容量3を伴なう出力端子、4は
電源端子、PIはPチャンネルMO5−FET。
1 is an input terminal, 2 is an output terminal with a load capacitance 3, 4 is a power supply terminal, and PI is a P-channel MO5-FET.

N1はNチャンネルMO8−FET、VDDは正電源電
圧である。この(Pi、Nl)で構成されるC!−MO
8llK動回路の欠点は、負荷容量3が大きく、これを
高速で充電する場合にPlの寸法(例えばチャンネル幅
W)を大きくしなければならないことである。したがっ
て、この駆動回路の占有面積が大きくなり、集積度の点
で大きな損失となる。
N1 is an N-channel MO8-FET, and VDD is a positive power supply voltage. C! composed of this (Pi, Nl)! -M.O.
The disadvantage of the 8llK dynamic circuit is that the load capacitance 3 is large, and when charging this at high speed, the dimension of Pl (for example, channel width W) must be increased. Therefore, this drive circuit occupies a large area, resulting in a large loss in terms of integration.

そこで、本願発明者等は、特願昭52−1490号にお
いて、第2図に示す改良された駆動回路を提供した。同
図において、P2はn形半導体装置に形成したp形高濃
度不純物層をドレイン、ソースとするPチャンネルMO
8−FET、N2、N3は基板表面に設けたp形不純物
層のウェル内に形成したn形高濃度不純物層をドレイン
、ソースとするNチャンネルMO8−FET、Blは基
板表面領域に設けたp形不純物層をベースとし、該基板
をコレクタとし、p形不純物層ベース内に設けたn形高
濃度不純物層をエミッタとするプレーナ形バイポーラ、
トランジスタである。同図において特徴的なことは、上
記バイポーラ・トランジスタを同一チップ上に集積し、
第2図で示した結線で駆動回路を構成することにあシ、
入力端子1が接地電位にある時、N2、N3は遮断され
、B2は導通状態で電源端子4から81のベースに電流
が流れてB1が導通状態になるため、出力端子2は高電
位となる。
Therefore, the inventors of the present application provided an improved drive circuit shown in FIG. 2 in Japanese Patent Application No. 52-1490. In the figure, P2 is a P-channel MO whose drain and source are p-type high concentration impurity layers formed in an n-type semiconductor device.
8-FETs, N2 and N3 are N-channel MO8-FETs whose drain and source are n-type high concentration impurity layers formed in wells of p-type impurity layers provided on the substrate surface, and Bl is p-type impurity layers provided on the substrate surface region. a planar type bipolar type impurity layer as a base, the substrate as a collector, and an n-type high concentration impurity layer provided in the p-type impurity layer base as an emitter;
It is a transistor. What is distinctive about this figure is that the above bipolar transistors are integrated on the same chip.
It is recommended to configure the drive circuit with the wiring shown in Figure 2.
When input terminal 1 is at ground potential, N2 and N3 are cut off, B2 is conductive, current flows from power supply terminal 4 to the base of 81, and B1 is conductive, so output terminal 2 is at a high potential. .

又、入力端子1が高電位にある時、B2は遮断されてB
1も遮断され、N2が導通状態になるため、出力端子は
接地電位となる。1が高電位から接地電位に遷移する際
には、4からB1を介して大電流が流れ、大きな負荷3
を高速に充電することができる。
Also, when input terminal 1 is at a high potential, B2 is cut off and B
1 is also cut off and N2 becomes conductive, so the output terminal becomes the ground potential. When 1 transitions from high potential to ground potential, a large current flows from 4 through B1, and a large load 3
can be charged quickly.

なお、トランジスタP2はトランジスタB1のベースと
コレクタで形成される接合容量を充電するに足る駆動能
力を備えていればよい。結果としてB2の寸法は小さく
なり、駆動回路の占有面積が低減される。また、B1の
エミッタとなるn形の高濃度不純物層の拡散深さを、通
常のNチャンネルMO8−FETのソース、ドレインと
なるn形高濃度不純物層の拡散深さよシも深くして、バ
イポーラ・トランジスタのベース幅を小さくすることが
できる。この場合バイポーラ・トランジスタB1は、そ
のベース幅が小さくなhFEが大きくなるため、本駆動
回路の高速化にさらに大きく寄与する。
Note that the transistor P2 only needs to have a driving ability sufficient to charge the junction capacitance formed by the base and collector of the transistor B1. As a result, the dimensions of B2 are reduced, and the area occupied by the drive circuit is reduced. In addition, the diffusion depth of the n-type high concentration impurity layer that becomes the emitter of B1 is made deeper than the diffusion depth of the n-type high concentration impurity layer that becomes the source and drain of a normal N-channel MO8-FET. - The base width of the transistor can be reduced. In this case, since the bipolar transistor B1 has a small base width and a large hFE, it contributes even more to speeding up the present drive circuit.

NチャンネルMO8−FET、N3は入力端子1の電位
が接地電位から高電位への遷移時にバイポーラ・トラン
ジスタB1のベースの電位を急激にN3を介して接地電
位に下げるだめのものであシ、高速化、低消費電力の点
で有利になる。
The N-channel MO8-FET, N3, is designed to rapidly lower the potential of the base of the bipolar transistor B1 to the ground potential via N3 when the potential of the input terminal 1 transitions from the ground potential to the high potential. It is advantageous in terms of power consumption and low power consumption.

第3図は、第2図の駆動回路の変形例の回路結線図であ
る。B3なるPチャンネルMO8−FETは、入力端子
1の電位が接地電位にある時、出力端子2の電位を電源
電圧vDDまで引き上げることができ、出力端子2に接
続される次段の回路の動作性能を向上させる。
FIG. 3 is a circuit connection diagram of a modification of the drive circuit shown in FIG. 2. The P-channel MO8-FET B3 can raise the potential of the output terminal 2 to the power supply voltage vDD when the potential of the input terminal 1 is at the ground potential, which improves the operating performance of the next stage circuit connected to the output terminal 2. improve.

以上の第2図、第3図に示す駆動回路によって占有面積
が小さく高速性能を有する駆動回路を提供できる。しか
しながら、上記の駆動回路の欠点は、出力バッファ回路
等として用いる場合、いわゆる論理”0”、”1′、“
フロート”の三値をとるトライ・ステート又はスリー・
ステート(three 5tate)形として使用でき
ないことである。
The drive circuits shown in FIGS. 2 and 3 described above can provide a drive circuit that occupies a small area and has high-speed performance. However, the drawback of the above drive circuit is that when used as an output buffer circuit etc., the so-called logic "0", "1'", "
Tri-state or three-value float
It cannot be used as a state (three 5-state) type.

すなわち、限定されたワード構成のICメモリを多数用
いて、大容量化する場合、実装スペースや価格の点で各
ICメモリからの読出し情報の0几をとる必要があるが
、ただ出力端子を電線で接続するだけでO几機能が実現
できるいわゆるワイアドOR,が構成できるには、各メ
モ1.I I Oのデータ出力回路が、上記トライ・ス
テートと呼ばれる方式で構成されなければならない。つ
まりチップ・イネーブル信号によって選択されたICメ
モリ・チップだけがデータ・ノくスと接続、その他のも
のはデータ・バスと切シ放され、フロート(Float
)もしくは高インピーダy 7. (Hi ghImp
edance )状態にならなければならない。
In other words, when increasing the capacity by using a large number of IC memories with a limited word structure, it is necessary to eliminate the amount of information read from each IC memory in terms of mounting space and cost. In order to configure a so-called wired OR, which can realize the O-OR function just by connecting, each memo 1. The IIO data output circuit must be configured in the above-mentioned tri-state method. In other words, only the IC memory chip selected by the chip enable signal is connected to the data bus, and the others are disconnected from the data bus and left floating.
) or high impedance 7. (HighImp
edance ) state.

更にトライステート形駆動回路の一例を写しだものとし
て、 ROA−0087MO8−Lntegrated Oi
rcuitsManual 1972 、 Techn
ical 5eries OMS −271、P、20
9があシ、 出力にバイポーラトランジスタを用いた例としては、特
公昭50−40977号公報が存在する。
Further, as an example of a tri-state drive circuit, ROA-0087MO8-Lntegrated Oi
rcuitsManual 1972, Techn.
ical 5eries OMS-271, P, 20
As an example of using a bipolar transistor for the output, there is Japanese Patent Publication No. 50-40977.

〔発明の目的〕[Purpose of the invention]

本発明は、出力端子(又は出力ピン)に大きな負荷を半
なっても高速で出力信号の確定するトライ・ステート形
の駆動回路を提供することを目的とするものである。
SUMMARY OF THE INVENTION An object of the present invention is to provide a tri-state drive circuit that can quickly determine an output signal even when a large load is applied to the output terminal (or output pin) by half.

〔発明の実施例〕[Embodiments of the invention]

以下、本発明を実施例を参照して詳細に説明する0 第4図は本発明の第1の実施例を示す図である。 Hereinafter, the present invention will be explained in detail with reference to Examples. FIG. 4 is a diagram showing a first embodiment of the present invention.

8.9よ)成る出力インバータ回路の前段に5.6の0
−Mo8で構成した回路を設け、端子4゜へ印加される
チップ・イネーブル信号丁「と入力信号とに対するNO
R回路を形成している。これによシC8がHighレベ
ル(・1・すなわチ(51,52)、(61,62)の
各0−Mo8回路(7)しきい値以上の正電圧、例えば
電源電圧VDDレベルの電圧)のときは、Pチャンネル
MO8)ランジスタ51,61はオフ状態で、Nチャン
ネルMOSトランジスタ52.62はオン状態であシ、
バイポーラ・トランジスタ8のベース81およびNチャ
ンネルMOSトランジスタ9のゲート91は常に接地電
位に設定され、トランジスタ8.9は常にカット・オフ
状態となって出力端子2はフロートの状態となる。また
、O8がLowレベル(”0″すなわち(51,52)
、(61,62)の各0−Mo8回路のしきい値電圧よ
シ低電圧、例えば接地電位又は0電圧)のときは、トラ
ンジスタ51.61はオン状態であシ、トランジスタ5
2.62はオフ状態であシ、回路は入力信号例えば端子
1の信号に応じた出力をする。すなわち、入力端子lの
信号が”0”低レベル信号、すなわち(53,54)、
(63,64)の各0−M08回路のしきい電圧よシ低
電圧、例えば接地電位または0ボ四・ト)の時出力端子
2には”1”信号(高レベルすなわち電源電圧VDD)
が現われる。
5.6 in the front stage of the output inverter circuit consisting of
- A circuit composed of Mo8 is provided, and a NO signal for the chip enable signal D applied to terminal 4 and the input signal is provided.
It forms an R circuit. As a result, C8 is set to High level (.1. That is, each 0-Mo8 circuit (7) of (51, 52), (61, 62)) has a positive voltage above the threshold, for example, a voltage at the power supply voltage VDD level. ), the P-channel MOS transistors 51 and 61 are in the off state, and the N-channel MOS transistors 52 and 62 are in the on state.
Base 81 of bipolar transistor 8 and gate 91 of N-channel MOS transistor 9 are always set to ground potential, transistors 8.9 are always cut off, and output terminal 2 is in a floating state. Also, O8 is at a low level (“0”, i.e. (51, 52)
, (61, 62), when the voltage is lower than the threshold voltage of each 0-Mo8 circuit (for example, ground potential or 0 voltage), the transistors 51 and 61 are on, and the transistors 5 and 5 are in the on state.
2.62 is in the off state, and the circuit outputs according to the input signal, for example, the signal at terminal 1. That is, the signal at the input terminal l is a "0" low level signal, that is, (53, 54),
When the threshold voltage of each 0-M08 circuit (63, 64) is low (e.g., ground potential or 0-4), the output terminal 2 receives a "1" signal (high level, that is, the power supply voltage VDD).
appears.

又、入力端子信号が“1”(高レベルすなわち(53,
54)(63,64)の各0−Mo8回路のしきい値以
上の正電圧信号、例えばvDDレベル)の時出力端子2
には“0“(低レベル、すなわち接地電圧または0電圧
)の信号が現われる。
Also, the input terminal signal is “1” (high level, that is, (53,
54) Output terminal 2 when the positive voltage signal is higher than the threshold value of each 0-Mo8 circuit (63, 64), e.g. vDD level)
A signal of "0" (low level, ie, ground voltage or 0 voltage) appears.

以上の様にして、第4図の回路は高速動作を維持しなが
ら出力端子が三値をとシ得るよマうにできる。しかも回
路の占有面積をできるだけ小さく保っている。
In the manner described above, the circuit of FIG. 4 can maintain high-speed operation while allowing the output terminal to obtain all three values. Furthermore, the area occupied by the circuit is kept as small as possible.

なお、第4図において、7はPチャンネルMOSトラン
ジスタ71、NチャンネルMO’Sトランジスタ72に
よって構成される0−Mo Sインバータである。さら
に第4図において、PチャンネルMO8)ランジスタ5
3,63は第2図の回路のトランジスタP2に、Nチャ
ンネルトランジスタ54は第2図の回路のトランジスタ
N3にそれぞれに対応するものである。
In FIG. 4, 7 is an 0-Mo S inverter constituted by a P-channel MOS transistor 71 and an N-channel MO'S transistor 72. Further, in FIG. 4, P channel MO8) transistor 5
3 and 63 correspond to the transistor P2 of the circuit of FIG. 2, and the N-channel transistor 54 corresponds to the transistor N3 of the circuit of FIG. 2, respectively.

一方、出力端子2にさらに大きな負荷を伴ない、高速で
駆動する必要がある場合、必然的に5.60回路におい
て縦属接続されたPチャンネルMO8−FET51.5
3あるいは61.63の形状(例えばチャンネル幅)を
大きくしなければならず、回路自体の占有面積が大きく
なる。第5図は、8.9の出力インバータ回路と12.
13の論理回路の間に、】0.11なる0−MOSイン
バータ回路をバッファとして設けたもので、これにより
、占有面積の小さい、高速で駆動しえるトライ・ステー
暑・形の出力バッファ回路をえることができる。
On the other hand, if the output terminal 2 is accompanied by a larger load and needs to be driven at high speed, it is necessary to use a P-channel MO8-FET51.5 cascade-connected in a 5.60 circuit.
3 or 61.63 (for example, channel width) must be increased, and the area occupied by the circuit itself increases. FIG. 5 shows the output inverter circuit of 8.9 and 12.
A 0-MOS inverter circuit of 0.11 is provided as a buffer between the 13 logic circuits, and this creates a tri-stage output buffer circuit that occupies a small area and can be driven at high speed. You can get it.

第5図の回路において、71.101.111.121
、】31.123.133はエンノ1ンスメント形Pチ
ャンネルMO8−FET、72.102.112.12
2.132.124.134はエンハンスメント形Nチ
ャンネルMO8−FETであり、(71,72)、(1
01,102)、(111,112)、(121,12
2)、(123、工24)、(131,132)、(1
33,134)の各C−MO8回路を構成している。こ
れにより、チップ・イネーブル信号O8が高レベル(C
8と同じ)の時トランジスタ121,131はオフ状態
、122.132はオン状態となり、入力信号はトラン
ジスタ8のベース81へは2組の0−MOSインバータ
(123,124)、(101,102)を通して伝達
され、トランジスタ9のゲート91へは3組の(、−M
OSインバータ(71,72)、(133,134)、
(101,102)を通して伝達され、回路は入力信号
に応じた出力をする。
In the circuit of Fig. 5, 71.101.111.121
, ]31.123.133 is an ennouncment type P-channel MO8-FET, 72.102.112.12
2.132.124.134 is an enhancement type N-channel MO8-FET, (71, 72), (1
01,102), (111,112), (121,12
2), (123, Engineering 24), (131, 132), (1
33, 134) constitutes each C-MO8 circuit. This causes the chip enable signal O8 to go high (C
8), transistors 121 and 131 are off, transistors 122 and 132 are on, and the input signal is sent to the base 81 of transistor 8 through two sets of 0-MOS inverters (123, 124) and (101, 102). and is transmitted to the gate 91 of the transistor 9 through three sets of (, -M
OS inverter (71, 72), (133, 134),
(101, 102), and the circuit outputs according to the input signal.

すなわち、入力信号が”0”ならば出力信号はO1入力
信号が”1”ならば出力信号は1”となる。
That is, if the input signal is "0", the output signal is "1", and if the O1 input signal is "1", the output signal is "1".

一方、チップ、イネーブル信号O8がLowレベル(C
8と同じ)の時は、トランジスタ121.131はオン
状態、トランジスタ122.123はオフ状態となシ、
(121,122)、(131゜132)の各0−MO
8回路の出力は常に”1′′に設定され、トランジスタ
8のベース81とトランジスタ9のゲート91は常に接
地電位に設定され、トランジスタ8.9は常にカット・
オフ状態となって、出力端子9はフロートの状態となる
On the other hand, the chip enable signal O8 is at a low level (C
8), transistors 121 and 131 are on and transistors 122 and 123 are off.
(121, 122), (131°132) each 0-MO
The output of the 8 circuit is always set to "1", the base 81 of the transistor 8 and the gate 91 of the transistor 9 are always set to the ground potential, and the transistors 8 and 9 are always cut off.
In the off state, the output terminal 9 becomes in a floating state.

以上において、正電圧電源を用いて、PチャンネルMO
8−FETを負荷、NチャンネルMO8−FETをドラ
イバとした0−MO8回路を用いた。しかし、負電圧電
源を用いて、負荷としてNチャンネルMO8−FET、
ドライバとしてPチャンネルMO8−FETを用いた0
−MO8回路で本発明を構成しても良い。(すなわち第
4〜6図のNチャンネルMO8−FETをPチャンネル
に、PチャンネルMO8−FI8TをNチャンネルに変
える)この場合、トランジスタ8としてPNPバイポー
ラ・トランジスタを使用し、信号の極性も逆にして用い
れば良い。
In the above, using a positive voltage power supply, the P-channel MO
An 0-MO8 circuit was used in which an 8-FET was used as a load and an N-channel MO8-FET was used as a driver. However, using a negative voltage power supply, an N-channel MO8-FET as a load,
0 using P-channel MO8-FET as driver
- The present invention may be configured with an MO8 circuit. (That is, change the N-channel MO8-FET in Figures 4 to 6 to P-channel, and the P-channel MO8-FI8T to N-channel.) In this case, a PNP bipolar transistor is used as transistor 8, and the polarity of the signal is also reversed. Just use it.

【図面の簡単な説明】[Brief explanation of drawings]

第1図、第2図、第3図は従来の0−MO8駆動回路を
示す図、第4゛図、第5図は本発明の駆動回路の実施例
を示す図である。 51.53.61.63.71・・・エンノ1ンスメン
ト形PチャンネルMO8−FET、9.52.54.6
2.64.72・・・エンハンスメント形Nチャンネル
MO8−FET、8・・NPNパイボーシ・トランジス
タ。 81 図 第 2 凹 第 4 図
1, 2 and 3 are diagrams showing a conventional 0-MO8 drive circuit, and FIGS. 4 and 5 are diagrams showing an embodiment of the drive circuit of the present invention. 51.53.61.63.71...Ennomination type P channel MO8-FET, 9.52.54.6
2.64.72...Enhancement type N-channel MO8-FET, 8...NPN pibosi transistor. 81 Figure 2 Concave Figure 4

Claims (1)

【特許請求の範囲】[Claims] 1、複数の10チツプと、該チップを選択するチップイ
ネーブル信号と、上記チップからの信号とを入力とする
第1のNOR回路と、上記チップからの信号を反転した
信号と、上記チップを選択するチップイネーブル信号と
を入力とする第2のNOR回路とを有し、上記第1のN
OR回路の出力信号を、負荷としてのバイポーラトラン
ジスタのベース電極へ入力し、上記第2のNOR回路の
出力信号を、ドライバとしてのMOSFETのゲート電
極へ入力することを特徴とする半導体集積回路。
1. A first NOR circuit that receives a plurality of 10 chips, a chip enable signal for selecting the chip, a signal from the chip, a signal obtained by inverting the signal from the chip, and a signal that selects the chip. a second NOR circuit which receives as input a chip enable signal of the first NOR circuit;
A semiconductor integrated circuit characterized in that an output signal of the OR circuit is input to a base electrode of a bipolar transistor as a load, and an output signal of the second NOR circuit is input to a gate electrode of a MOSFET as a driver.
JP59110725A 1984-06-01 1984-06-01 Semiconductor integrated circuit Pending JPS6068718A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59110725A JPS6068718A (en) 1984-06-01 1984-06-01 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59110725A JPS6068718A (en) 1984-06-01 1984-06-01 Semiconductor integrated circuit

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP17583380A Division JPS5696530A (en) 1980-12-15 1980-12-15 Driving circuit of tri-state type

Publications (1)

Publication Number Publication Date
JPS6068718A true JPS6068718A (en) 1985-04-19

Family

ID=14542906

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59110725A Pending JPS6068718A (en) 1984-06-01 1984-06-01 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS6068718A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01158693A (en) * 1987-08-31 1989-06-21 Samsung Semiconductor & Teleommun Co Ltd Data output buffer of static ram using high impedance
US5075577A (en) * 1987-06-23 1991-12-24 Mitsubishi Denki Kabushiki Kaisha Tristate output circuit with input protection
US6141269A (en) * 1991-08-30 2000-10-31 Mitsubishi Denki Kabushiki Kaisha Semiconductor integrated circuit device using BiCMOS technology

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5040977A (en) * 1973-08-14 1975-04-15

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5040977A (en) * 1973-08-14 1975-04-15

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5075577A (en) * 1987-06-23 1991-12-24 Mitsubishi Denki Kabushiki Kaisha Tristate output circuit with input protection
JPH01158693A (en) * 1987-08-31 1989-06-21 Samsung Semiconductor & Teleommun Co Ltd Data output buffer of static ram using high impedance
US6141269A (en) * 1991-08-30 2000-10-31 Mitsubishi Denki Kabushiki Kaisha Semiconductor integrated circuit device using BiCMOS technology
US6314037B1 (en) 1991-08-30 2001-11-06 Mitsubishi Denki Kabushiki Kaisha Semiconductor integrated circuit device using BiCMOS technology

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