JPS6049442A - マイクロ診断方式 - Google Patents

マイクロ診断方式

Info

Publication number
JPS6049442A
JPS6049442A JP58157353A JP15735383A JPS6049442A JP S6049442 A JPS6049442 A JP S6049442A JP 58157353 A JP58157353 A JP 58157353A JP 15735383 A JP15735383 A JP 15735383A JP S6049442 A JPS6049442 A JP S6049442A
Authority
JP
Japan
Prior art keywords
micro
diagnostic
microprogram
diagnosis
storage means
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58157353A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6326416B2 (enrdf_load_stackoverflow
Inventor
Kyoichi Tabata
田端　享一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP58157353A priority Critical patent/JPS6049442A/ja
Publication of JPS6049442A publication Critical patent/JPS6049442A/ja
Publication of JPS6326416B2 publication Critical patent/JPS6326416B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP58157353A 1983-08-29 1983-08-29 マイクロ診断方式 Granted JPS6049442A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58157353A JPS6049442A (ja) 1983-08-29 1983-08-29 マイクロ診断方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58157353A JPS6049442A (ja) 1983-08-29 1983-08-29 マイクロ診断方式

Publications (2)

Publication Number Publication Date
JPS6049442A true JPS6049442A (ja) 1985-03-18
JPS6326416B2 JPS6326416B2 (enrdf_load_stackoverflow) 1988-05-30

Family

ID=15647816

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58157353A Granted JPS6049442A (ja) 1983-08-29 1983-08-29 マイクロ診断方式

Country Status (1)

Country Link
JP (1) JPS6049442A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0556826A3 (en) * 1992-02-19 1995-09-13 Nec Corp Microprocessor with self-diagnostic test function

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0556826A3 (en) * 1992-02-19 1995-09-13 Nec Corp Microprocessor with self-diagnostic test function

Also Published As

Publication number Publication date
JPS6326416B2 (enrdf_load_stackoverflow) 1988-05-30

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