JPS6043488A - Apparatus for producing thin film - Google Patents

Apparatus for producing thin film

Info

Publication number
JPS6043488A
JPS6043488A JP15148783A JP15148783A JPS6043488A JP S6043488 A JPS6043488 A JP S6043488A JP 15148783 A JP15148783 A JP 15148783A JP 15148783 A JP15148783 A JP 15148783A JP S6043488 A JPS6043488 A JP S6043488A
Authority
JP
Japan
Prior art keywords
thin film
electrode
base body
base
deposition chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15148783A
Other languages
Japanese (ja)
Other versions
JPS6153431B2 (en
Inventor
Yukio Suzuki
幸夫 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP15148783A priority Critical patent/JPS6043488A/en
Publication of JPS6043488A publication Critical patent/JPS6043488A/en
Publication of JPS6153431B2 publication Critical patent/JPS6153431B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/505Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
    • C23C16/509Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
    • C23C16/5093Coaxial electrodes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemical Vapour Deposition (AREA)

Abstract

PURPOSE:To form a thin film having uniform thickness and quality over the entire part of a base body having a large area by disposing coaxially said base body to be formed thereon with the thin film as the 2nd electrode in a cylindrical body of the 1st electrode, introducing a reactive gas into said body while rotating the base body and generating glow discharge between both electrodes. CONSTITUTION:A cylindrical body 4 provided with many reactive gas introducing holes 6 is placed on an electrically insulated O-ring 3. Said body is used as the 1st electrode and a base body 18 having a large area to be formed thereon with a thin film is disposed as the 2nd electrode and is attached to a revolving shaft 17. A shielding member 19 having a cage-shaped construction is attached in proximity to the outside thereof. The body 18 is heated with a heater 2 and a reactive gaseous raw material is introduced through an introducing pipe 9 into the body 4 under vacuum. The body 18 is rotated around the shaft 17 together with the member 19 and a high frequency voltage is impressed between the body 4 and the body 18 by a power source 22 to generate glow discharge between both bodies and to convert the gaseous raw material into plasma, thereby forming uniformly the thin film on the surface of the body 18.

Description

【発明の詳細な説明】 〔発明の技術分野〕 水元明鉢薄膜製造装置に関1更に詳しくは、基体の表面
に各種の薄膜、例えば光導電膜、半導体膜又は絶縁体膜
をグロー放電法で形成する際に、均一な膜特性を有する
大面積の薄膜を高度の再現性及び量産性をもって製造す
ることが可能な新規構造の薄膜製造装置忙関する。
[Detailed Description of the Invention] [Technical Field of the Invention] Regarding the Mizumoto Amorubachi thin film manufacturing apparatus 1, more specifically, various thin films, such as photoconductive films, semiconductor films, or insulating films, are formed on the surface of a substrate by a glow discharge method. The present invention relates to a thin film manufacturing apparatus with a novel structure that can produce large area thin films with uniform film properties with high reproducibility and mass productivity.

〔発明の技術的背景とその問題点〕[Technical background of the invention and its problems]

減圧下の堆積室内で、プラズマ現象を利用して薄膜形成
用の原料ガスを分解し、所定形状(例えばドラム、板)
の基体の表面に所望特性の薄膜を通常のグロー放電法で
形成する場合、とくに電子写真感光体の製造時における
大面積の薄膜を形成する場合、形成した薄膜の全面積に
亘9、ル1厚及び電気的、光学的又は光電的な膜特性を
均一にすることは、極めて困離であった。
In a deposition chamber under reduced pressure, the raw material gas for thin film formation is decomposed using plasma phenomenon, and the material is formed into a predetermined shape (e.g. drum, plate).
When forming a thin film with desired characteristics on the surface of a substrate by a normal glow discharge method, especially when forming a large-area thin film during the production of an electrophotographic photoreceptor, the total area of the formed thin film is 9. It has been extremely difficult to make the thickness and electrical, optical or photoelectric film properties uniform.

例えば、シランガス(Sin−14)に放電エネルギー
を加えて分解し、基体の表面にアモルファス水素化シリ
コン(a−8i:H)の薄膜を形成してこの薄膜の電子
写真特性を活用しようとする場合、該薄膜の特性が薄膜
製造時のプラズマ条件に依存すること大なので、形成し
た薄膜の全面積に亘って均一な電子写真特性を得るため
には、薄pa製造時、薄膜形成域の全域において均一な
プラズマを発生させることが必要である。
For example, when silane gas (Sin-14) is decomposed by applying discharge energy to form a thin film of amorphous hydrogenated silicon (a-8i:H) on the surface of a substrate, and the electrophotographic properties of this thin film are to be utilized. Since the properties of the thin film largely depend on the plasma conditions during thin film production, in order to obtain uniform electrophotographic properties over the entire area of the thin film formed, it is necessary to It is necessary to generate a uniform plasma.

とくに、基体側からa−8t:H薄膜に注入されてくる
電荷の移動を阻止するために基体とa−8t:H薄膜と
の間に電気絶縁性の電荷ブロッキング層を介在せ、しめ
た電子写真感光体にあっては、該電荷ブロッキング層の
厚みが通常約5000λ以下と非常に薄くなる。そのた
め、従来のグロー放電法による薄膜製造装置では膜特性
の均一化、薄膜形成域での均一なプラズマ発生が極めて
困難であった。
In particular, in order to prevent the movement of charges injected into the a-8t:H thin film from the substrate side, an electrically insulating charge blocking layer is interposed between the substrate and the a-8t:H thin film, and the In photographic photoreceptors, the thickness of the charge blocking layer is usually very thin, about 5000λ or less. Therefore, in the conventional thin film manufacturing apparatus using the glow discharge method, it is extremely difficult to make the film characteristics uniform and to uniformly generate plasma in the thin film forming area.

また、該電荷ブロッキング層の厚みが極めて薄いので、
内因室内で発生せしめたプラズマが安定しきらないうち
に、すなわち、短時間でグロー放電を停止せざるを得な
いということも膜特性の均一化が得られない一因である
In addition, since the thickness of the charge blocking layer is extremely thin,
The fact that the glow discharge has to be stopped before the plasma generated in the endogenous chamber is stabilized, that is, within a short period of time, is another reason why the film characteristics cannot be made uniform.

このようなことから、薄膜の形成速度を低下させるこ浜
゛を目的として、堆積室に導入する原料ガスの流量を減
少させること、又は、高周波電力を小さくして放電エネ
ルギーを小にすることなどが検討されている。
For this reason, in order to reduce the rate of thin film formation, it is necessary to reduce the flow rate of the raw material gas introduced into the deposition chamber, or to reduce the discharge energy by reducing the high frequency power. is being considered.

しかしガから、このようなプラズマ条件の検討と選択の
みでは、薄膜製造時における量産性の低下を招くのみな
らず、とくに電子写真感光体の場合のように、その感光
層の帯電、電荷保持特性を左右する電荷ブロッキング層
を基体の表面に大面積に亘って再現性よくかつ均一に形
成することははなはだ困難であった。
However, it has been found that simply considering and selecting such plasma conditions not only leads to a decline in mass productivity during thin film production, but also reduces the charging and charge retention characteristics of the photosensitive layer, especially in the case of electrophotographic photoreceptors. It has been extremely difficult to uniformly form a charge blocking layer on a large area of a substrate surface with good reproducibility.

また、膜厚の均一さ、膜特性の均一さけ、堆積室内での
電極と基体との配叡関係、電極の11す造及び配fMK
よフ大きく影響を受けることが知られている。
In addition, the uniformity of the film thickness, the uniformity of the film properties, the arrangement relationship between the electrode and the substrate in the deposition chamber, the structure of the electrode, and the arrangement fMK
It is known to have a significant impact on

しかしながら、従来の装置はこの点でも必ずしも満足の
いく効果を発揮しておらず、とくに、所定特性を有する
大面積の薄膜製造においては、その再現性、量産性にお
いて不満足なものであった。
However, conventional apparatuses do not necessarily exhibit satisfactory effects in this respect, and are particularly unsatisfactory in terms of reproducibility and mass production in the production of large-area thin films having predetermined characteristics.

〔発明の目的〕[Purpose of the invention]

本発明は、上記した従来装置における問題を解決し、大
面積の薄膜を製造した場合でも、全面費に亘って膜厚及
び膜特性が実質的に均一である薄膜をグロー放電法で再
現性よくかつ高い量産性をもって製造することのできる
薄膜製造装置の提供を目的とする。
The present invention solves the above-mentioned problems with the conventional apparatus, and even when manufacturing a large-area thin film, the glow discharge method can produce a thin film with substantially uniform film thickness and film properties over the entire surface with good reproducibility. The object of the present invention is to provide a thin film manufacturing apparatus that can be manufactured with high mass productivity.

〔発明の概要〕[Summary of the invention]

本発明の装置は、壁面に原料ガス流入口を有する減圧可
能な堆積室;該堆積室に内設された回転自在の基体固定
部材に固定され、表面が該堆積室の内壁と平行になるよ
うに配設された基体;壁面には複数の開口を有し、該基
体と電気的に接続され、かつ該基体を同軸的に被包して
配設された回−5転自在の遮蔽部材;とから成シ、該堆
積室の壁面の少なくとも一部が第1電極で、該基体同定
部材、イ基体又は該遮蔽部材の少なくとも1個が第2電
極であることを特徴とする。
The apparatus of the present invention has a deposition chamber that can be depressurized and has a raw material gas inlet on the wall surface; it is fixed to a rotatable base fixing member installed in the deposition chamber, and the surface thereof is parallel to the inner wall of the deposition chamber. a base body disposed in; a rotatable shielding member having a plurality of openings in the wall surface, electrically connected to the base body, and disposed coaxially surrounding the base body; At least a part of the wall surface of the deposition chamber is a first electrode, and at least one of the substrate identification member, the substrate, or the shielding member is a second electrode.

本発明装置を好適な1実施例として模式的に示した縦断
面図により更に詳細に説明する。
The device of the present invention will be explained in more detail with reference to a longitudinal sectional view schematically showing a preferred embodiment of the device.

図で1は堆積室である。堆積室1は、通常のグロー放電
堆積装置に使用されている構造のベースプレート2の上
に電気絶縁性の0リング3を介して載置された円筒状の
筒体4、更にその上にOす/グ3′を介して載置された
M5によって気密に組立てられている。本発明装置にあ
っては、仁の筒体4が第1電極となる。
In the figure, 1 is a deposition chamber. The deposition chamber 1 has a cylindrical body 4 placed on a base plate 2 with an electrically insulating O ring 3 interposed therebetween, which has a structure used in a normal glow discharge deposition apparatus, and an O ring placed on top of the base plate 2. It is assembled airtight by the M5 mounted through the /g 3'. In the device of the present invention, the cylindrical body 4 serves as the first electrode.

筒体4の側壁面には所定のコンダクタンスを有するガス
流入口6,6′が複数個穿設され、これらの外周には円
環状のガス流入室7が設けられ、該流入室7には流量調
整用のパルプ8を備えたガス導入管9が配設されている
。該ガスお゛1人入管からは、薄膜形成用の原料ガス又
は希釈ガスとの混合ガスが所定流量で尋人される。10
,11.12はいずれも堆積室1内を排気するための排
気管で、それぞれパルプ13,14.15’t(Niえ
ている016は、堆積室1内の略中央位置に立設された
基体固定部材で、堆積室1の外に気密に延びる回転軸1
7′ft介して駆動装置(図示しない)によシ正逆回転
自在となっている。
A plurality of gas inflow ports 6, 6' having a predetermined conductance are bored in the side wall surface of the cylinder 4, and an annular gas inflow chamber 7 is provided on the outer periphery of these ports. A gas introduction pipe 9 provided with a pulp 8 for adjustment is provided. A mixed gas with a raw material gas for forming a thin film or a diluent gas is supplied at a predetermined flow rate from the gas entry tube. 10
, 11 and 12 are exhaust pipes for exhausting the inside of the deposition chamber 1, and the pulp 13, 14, and 15't (Ni) are exhaust pipes, respectively. A rotating shaft 1 that is a fixed member and extends airtightly outside the deposition chamber 1.
It can be rotated in forward and reverse directions by a drive device (not shown) via a 7'ft.

該固定部材16の上には、その表]n1に所望の薄膜を
形成すべき基体18が固定される。このとき、基体18
の表面が円筒4の内壁と平行になるように配設されなけ
ればならない。かくして、基体18は、固定部材16と
同じ回転運動をする。
A base 18 on which a desired thin film is to be formed on the front side n1 of the fixing member 16 is fixed. At this time, the base 18
must be arranged so that its surface is parallel to the inner wall of the cylinder 4. The base body 18 thus undergoes the same rotational movement as the fixed member 16.

19は、壁面に複数の開口(図では規則的に配列するス
リット)を有し、例えば鍛型構造の遮蔽部材で、基体1
8を略完全に同軸的に被包して配設される。この遮蔽部
利け、基体の表面全体に均一な薄膜を形成するために設
けられるものである。
19 is a shielding member having a forged structure, for example, having a plurality of openings (slits arranged regularly in the figure) in the wall surface, and
8 is substantially completely coaxially encased. This shielding portion is provided to form a uniform thin film over the entire surface of the substrate.

遮蔽部材19は回転軸20を介して駆動装置(図示しな
い)に連結されて、正逆の1回転自在になっている。開
口の形状は格別限定されず、円孔、角孔なと適宜に設計
すればよい◇ また、遮蔽部材19で基体18を被包する際には、遮蔽
部利19の内壁と基体18の外壁(薄膜を形成すべき表
面)とを接触させるか又は微小な間隙を置いて近接せし
めるか、いずれかの態様で配設することが好適である。
The shielding member 19 is connected to a drive device (not shown) via a rotating shaft 20, and can freely rotate once in forward and reverse directions. The shape of the opening is not particularly limited, and may be appropriately designed such as a circular hole or a square hole◇ Also, when covering the base 18 with the shielding member 19, the inner wall of the shielding member 19 and the outer wall of the base 18 (the surface on which the thin film is to be formed) are preferably placed in contact with each other or in close proximity to each other with a small gap therebetween.

両者の間隙が大きくなると、基体18の全面積に亘って
均一な薄膜が形成できなくなる傾向が増大して不都合で
ある。
If the gap between the two becomes large, there is a tendency that a uniform thin film cannot be formed over the entire area of the base 18, which is disadvantageous.

この場合、本発明の装置にあって重要なことは基体18
と遮蔽部材19との回転運動によるプラズマ変動を防止
して基体の全面積に亘って均一な薄■を形成するために
、基体18と遮蔽部材19との間は例えばブラシを介在
させて電気的に接続し、両者を同一電位に保持すること
である。
In this case, the important thing in the device of the present invention is that the base 18
In order to prevent plasma fluctuations due to rotational movement between the base body 18 and the shielding member 19 and to form a uniform thin layer over the entire area of the base body, an electrical connection is provided between the base body 18 and the shielding member 19 by using, for example, a brush. , and hold both at the same potential.

本発明にあっては、これら固定部材16、基体18、遮
蔽部材19の少なくともいずれが1つが第2電極として
機能する。
In the present invention, at least one of the fixing member 16, the base 18, and the shielding member 19 functions as the second electrode.

21はヒータであって、薄膜形成時又はその前後におい
て基体18を所定温度に保持するものである。まだ、2
2は同軸ケーブル23を介して筒体(第1電極)4に接
続された高周波電源で、堆積室l内にグロー放電を発生
させる。
A heater 21 maintains the substrate 18 at a predetermined temperature during or before and after forming the thin film. Still 2
Reference numeral 2 denotes a high frequency power source connected to the cylinder (first electrode) 4 via a coaxial cable 23, which generates glow discharge within the deposition chamber l.

本発明の装置uは次のようにして操作される。The device u of the invention operates as follows.

まず、必要に応じて表面に’?i’を浄化処理を施し7
m基体18を固定部材16に載五して固定する。つぎに
、基体18に遮0部材19をかぶせる。このとき両者を
衝接させて電気的に同一電位となるようにする。その後
、0リング3、筒体4.0リング3′を重ね、最後に蓋
5をかぶせて装置を組立てる。
First, 'on the surface' if necessary? Purify i'7
The base body 18 is placed on the fixing member 16 and fixed. Next, the base body 18 is covered with the shielding member 19. At this time, they are brought into contact with each other so that they are at the same electrical potential. Thereafter, the O-ring 3 and the cylindrical body 4.0-ring 3' are stacked on top of each other, and finally the lid 5 is put on to assemble the device.

ついで、全てのパルプを閉にした状態で、まずパルプ1
3を聞いて排気管10から排気して堆積室1内を所定の
真空度にした後パルプ13を閉じる。パルプ14を開き
、かつ、パルプ8を開いて導入管9からガス流入部7へ
原料ガス又は希釈ガスとの混合ガスを流入し、堆積室1
内を所定の内圧にする。
Next, with all pulps closed, first pulp 1.
3 and exhaust the air from the exhaust pipe 10 to bring the inside of the deposition chamber 1 to a predetermined degree of vacuum, and then close the pulp 13. The pulp 14 is opened, and the pulp 8 is opened, and a mixed gas with the raw material gas or diluting gas is flowed from the introduction pipe 9 into the gas inflow part 7, and the mixture gas is poured into the deposition chamber 1.
Bring the internal pressure to the specified level.

ヒータ21で基体18を所定温度に維持し基体18及び
遮蔽部材19を所定の回転数で回転させ、電源22を作
動せしめて、筒体(第1電極)4と基体(第2電極)の
間でグロー放電を起こさせて、原料ガスをプラズマ化す
る。薄膜製造後は、電源をきシガス供給を停止した後、
リークパルプ15を開いて堆積室1内を常圧に戻して操
作の全体を終結せしめる〇 例えば、直径130m!!!高さ340fJの電子写真
感光体用のアルミ脛ドラムの表面に、電荷ブロッキング
と(21,てa−8i:■Iの酸化物薄膜を形成するた
めに、1m 1:lt室1内全シランと酸素との混合ガ
ス(容量比でto:i)でO,1Torrに保持し筒体
4とドラム18の間に13.56MHzの高周波電圧を
印加しながら、ドラムを16 rpm、電型の遮蔽部材
19を7 rpmで逆回転させて約6分間操作したとこ
ろ、ドラムの表面には約t、ooo入の薄膜が形成され
た。成膜速度は160〜努である。この薄膜の厚みをド
ラムの全面積に亘シ測定したところ、厚み誤差±2.O
’Aであシ非常に均一であった。また、得られたドラム
から感光体をつくシその感光体としての特性を測定した
ところ、非常だ良好で、しかも場所による特性のバラツ
キも認められなかった。
The heater 21 maintains the base 18 at a predetermined temperature, the base 18 and the shielding member 19 are rotated at a predetermined number of rotations, and the power supply 22 is activated to connect the cylindrical body (first electrode) 4 and the base (second electrode). The source gas is turned into plasma by causing a glow discharge. After thin film production, turn on the power and stop the gas supply.
Open the leak pulp 15 and return the inside of the deposition chamber 1 to normal pressure to complete the entire operation. For example, the diameter is 130 m! ! ! In order to form an oxide thin film of charge blocking and (21, a-8i:■I) on the surface of an aluminum shin drum for an electrophotographic photoreceptor with a height of 340 fJ, a total of 1 m of silane was added in chamber 1. While maintaining the temperature at O.1 Torr with a gas mixture with oxygen (to:i in volume ratio) and applying a high frequency voltage of 13.56 MHz between the cylinder 4 and the drum 18, the drum was heated at 16 rpm with an electric shielding member. 19 was rotated in the opposite direction at 7 rpm and operated for about 6 minutes, a thin film of about t,ooo thick was formed on the surface of the drum.The film forming rate was 160 to 100 min.The thickness of this thin film was determined by the thickness of the drum. When measured over the entire area, the thickness error was ±2.0
'A was very uniform. Furthermore, when a photoreceptor was made from the obtained drum, its characteristics as a photoreceptor were measured and found to be very good, with no variation in characteristics depending on location.

〔発明の効果〕〔Effect of the invention〕

以上の説明そ明らかなように、本発明の装置は、基体が
大面積の表面を備えていても、その全面積に亘って、均
一な膜厚、膜特性の薄膜を侍ることができ、しかも比較
的大きな成)j〆速度で得ることができるので量産性に
も富み、その工業的価値は大である。
As is clear from the above explanation, even if the substrate has a large surface area, the apparatus of the present invention can provide a thin film with uniform thickness and film properties over the entire surface area, and moreover, Since it can be obtained at a relatively high production speed, it is suitable for mass production and has great industrial value.

【図面の簡単な説明】[Brief explanation of the drawing]

図は本発明装置の1例を示す極式的な図である。 l・・・堆積室、2・・・ペースプレート、3,3′・
・・0リング、4・・・筒体(第1電極)、5・・・l
(,6,6′・・・ガス流入口、7・・・ガー流入室、
8,13,14.15・・パルプ、9・・・ガス導入管
、10,11.12・・・杉ト気ゞ1゛ニス、16・・
・基体固定部材、1.7 、20・・・回転軸、18・
・・基体、19・・・遮蔽部材、21・・・ヒータ、2
2・・・高周波電源、23・・・同軸ケーブル。
The figure is a polar diagram showing one example of the device of the present invention. l...Deposition chamber, 2...Pace plate, 3, 3'.
...0 ring, 4... cylinder (first electrode), 5... l
(, 6, 6'... Gas inlet, 7... Gar inlet chamber,
8,13,14.15...Pulp, 9...Gas introduction pipe, 10,11.12...Cedar gas 1゛varnish, 16...
・Base fixing member, 1.7, 20... Rotating shaft, 18.
... Base body, 19 ... Shielding member, 21 ... Heater, 2
2...High frequency power supply, 23...Coaxial cable.

Claims (1)

【特許請求の範囲】 壁面に原料ガス流入口を有する減圧可能な堆積室; 該堆積室に内設された回転自在の基体固定部材に固定さ
れ、表面が該堆積室の内壁と平行になるように配設され
た基体; 壁面には複数の開口を有し、該基体と電気的に接続され
、かつ、該基体を同軸的に被包して配設された回転自在
の遮蔽部漬とから成り、該堆積室の壁面の少なくとも一
部が第1電極で該基体固定部材、該基体又は該遮蔽部側
の少なくとも1個が第2電極であることを特徴とする薄
膜製造装置。
[Scope of Claims] A depressurizable deposition chamber having a raw material gas inlet on the wall surface; fixed to a rotatable base fixing member installed in the deposition chamber so that the surface thereof is parallel to the inner wall of the deposition chamber. A rotatable shielding part having a plurality of openings in the wall surface, electrically connected to the base body, and coaxially enclosing the base body; A thin film manufacturing apparatus characterized in that at least a part of the wall surface of the deposition chamber is a first electrode, and at least one of the substrate fixing member, the substrate, or the shielding part is a second electrode.
JP15148783A 1983-08-22 1983-08-22 Apparatus for producing thin film Granted JPS6043488A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15148783A JPS6043488A (en) 1983-08-22 1983-08-22 Apparatus for producing thin film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15148783A JPS6043488A (en) 1983-08-22 1983-08-22 Apparatus for producing thin film

Publications (2)

Publication Number Publication Date
JPS6043488A true JPS6043488A (en) 1985-03-08
JPS6153431B2 JPS6153431B2 (en) 1986-11-18

Family

ID=15519570

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15148783A Granted JPS6043488A (en) 1983-08-22 1983-08-22 Apparatus for producing thin film

Country Status (1)

Country Link
JP (1) JPS6043488A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018098980A1 (en) * 2016-11-30 2018-06-07 江苏菲沃泰纳米科技有限公司 Device for forming plasma polymerized coating
US11332829B2 (en) 2016-11-30 2022-05-17 Jiangsu Favored Nanotechnology Co., LTD Plasma polymerization coating with uniformity control
US11339477B2 (en) 2016-11-30 2022-05-24 Jiangsu Favored Nanotechnology Co., LTD Plasma polymerization coating apparatus and process

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63136127U (en) * 1987-02-27 1988-09-07
JPH0430261Y2 (en) * 1987-02-27 1992-07-22
JPS63136125U (en) * 1987-02-27 1988-09-07
JPH0685829U (en) * 1993-05-26 1994-12-13 積水化学工業株式会社 Universal drain

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018098980A1 (en) * 2016-11-30 2018-06-07 江苏菲沃泰纳米科技有限公司 Device for forming plasma polymerized coating
US10424465B2 (en) 2016-11-30 2019-09-24 Jiangsu Favored Nanotechnology Co., LTD Plasma polymerization coating apparatus
US11332829B2 (en) 2016-11-30 2022-05-17 Jiangsu Favored Nanotechnology Co., LTD Plasma polymerization coating with uniformity control
US11339477B2 (en) 2016-11-30 2022-05-24 Jiangsu Favored Nanotechnology Co., LTD Plasma polymerization coating apparatus and process

Also Published As

Publication number Publication date
JPS6153431B2 (en) 1986-11-18

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