JPS6041182A - Method for measuring distribution of generation frequency of matter to be measured - Google Patents

Abstract

PURPOSE:To obtain the distribution of generation frequency of a matter to be measured by accumulating the generated matters to be measured in an address indicated by an addressing circuit, initializing the addressing circuit by the generated matters and repeating said operation for a prescribed measuring time. CONSTITUTION:If the matter to be measured is generated on a line 2 during the update of a counted value, the generation is detected by a differentiation circuit 1 and the detected signal is supplied to a write enable input 6d of a storage device 6. At that time, data are read out from an address in the device 6 which is indicated by the counted value of the counter 3 and data counted up by +1 are sent to an input 6c of the device 6. Therefore, data causing the update are written in the address indicated by the value of the counter 3. Simultaneously, the detecting signal applied for the update is supplied to an input part 3a of the counter 3 to initialize the counter 3. When the succeeding matter is generated, similar operation is generated and the measurement is repeated for the prescribed measuring time.

Description

Detailed Description of the Invention (a) Technical Field of the Invention The present invention relates to a method for measuring the frequency distribution of a measurement event, and particularly relates to a method capable of measuring the frequency distribution of a measurement event regardless of the manner in which the event occurs. .

<a> Background of the Technology Some events that occur in electronic computers and the like occur randomly, while others occur at predetermined intervals. Regardless of the nature of such an event, there is a demand for measuring its occurrence frequency distribution. This comes from, for example, the purpose of measuring computer performance and efficiently operating a computer system.

However, the conventional measurement methods do not have a technique that can fully meet this requirement, and are inconvenient because they cannot meet the above requirements, and there is a demand for the development of technical means that can solve this problem.

(C) Prior art and problems The conventional technique for measuring the performance of a computer is to measure the number of occurrences and time of a specific event. However, the frequency distribution of events within the measurement time could not be determined.

Therefore, the above-mentioned problems still remain.

The present invention was devised in view of the drawbacks of the conventional techniques as described above, and its purpose is to provide a measurement method that can measure the frequency distribution of measurement events and contribute to performance measurement of computers, etc. The object of the present invention is to provide a method for measuring the frequency distribution of events.

g) Structure of the Invention In order to achieve this object, the method of the present invention updates the address indicated by the addressing means of the storage device, which is being updated at a predetermined period, immediately before the addressing means of the storage device is initialized by the occurrence of a measurement event. The process of integrating the measurement events that have occurred and initializing the addressing means using the measurement events that have occurred is repeated for a predetermined measurement time.

(f) Examples of the invention Hereinafter, the present invention will be described in detail with reference to the accompanying drawings.

The accompanying drawings illustrate one embodiment of the invention. In this diagram,
1 is a differentiating circuit which receives a measurement event via line 2, and its output is connected to the input section 3a of the counter 3 and the write enable input 6d of the storage device. The counter 3 is updated by a +1 count up circuit 3b, and is configured such that when receiving a signal from the differentiating circuit 1, the initial value given on the line 5 is sent to the counter 3.

The count value of the counter 3 is connected to the addressing section 6a of the storage device 6 as an address. The read output 6b of the memory device 6 is connected to the write input 6c of the memory device 6 via a +1 power up circuit 7.

Next, a measurement aspect of the present invention using the above-mentioned configuration circuit will be explained.

For convenience of explanation, it is assumed that the circuit is in an operating state and that the counter 3 is reset to its initial value due to an output signal from the differentiating circuit 1 due to a measurement event, for example, the occurrence of a processing request from a computer.

The count value of the counter 3 continues to be counted up by +1 every predetermined period by the +1 count up circuit 3b.

When a measurement event occurs on the line 2 during updating of this count value, the occurrence of the event is detected by the differentiating circuit 1, and a detection signal representing this is supplied to the write permission input 6d of the storage device. At that time, data is read from the address of the storage device 6 indicated by the count value of the counter 3, and the updated data is incremented by +1 in the +1 count up circuit 7 and sent to the write input 6C of the storage device 6. Then, the updated data is written to the address of the storage device 6 from which the data on which the updated data is based was read, that is, the address indicated by the count value of the counter 3, that is, the data is updated.

Meanwhile, simultaneously with this updating operation, the above-mentioned detection signal used for the updating is supplied to the input section 3a of the counter 3, and the counter 3 is again initialized, that is, the initial value is set in the counter 3.

In this way, the next measurement event is waited for to occur, and when it occurs, the same actions as described above occur. Such measurements are performed for a predetermined measurement time.

As is clear from the above, each address is an integer multiple of the update cycle of counter 3, so the value of that address is calculated by multiplying the update cycle by the initial value, the number of updates that caused the address, and the next event. This is the time interval between events. Therefore, by correlating and reading out the address of the storage device and the data, it is possible to obtain the occurrence frequency distribution of the measured event, which indicates how many times the event occurs during the above-mentioned winter time interval. For example, the performance of a computer can be measured from this distribution.

Note that the above-mentioned initial value and period may be made variable as necessary. Further, the differentiating circuit may be replaced with a circuit capable of determining the time of occurrence of another event depending on the nature of the measured event signal.

(G) Effects of the Invention As described above, according to the present invention, it is possible to obtain the frequency distribution of measurement events, and use this to contribute to a tool for evaluating the performance of computers, etc. The effect of this can be obtained.

[Brief explanation of the drawing]

The accompanying drawings illustrate one embodiment of the invention. In the figure, 1 is a differential circuit, 3 is a counter, 3a is a +1 count up circuit, 4 is an AND gate, 6 is a storage device, 6a
is an addressing section, and 7 is a +1 current up circuit. Patent applicant Fujitsu Limited

Claims (1)

[Claims] Immediately before the addressing means of the storage device, which is being updated at a predetermined period, is initialized by the occurrence of a measurement event, the measurement events that have occurred at the address indicated by the addressing means are integrated, and the addressing means is updated based on the measurement event that has occurred. 1. A method for measuring occurrence frequency distribution of measurement events, characterized in that a process of initializing is repeated for a predetermined measurement period.