JPS6041182A - Method for measuring distribution of generation frequency of matter to be measured - Google Patents
Method for measuring distribution of generation frequency of matter to be measuredInfo
- Publication number
- JPS6041182A JPS6041182A JP14985083A JP14985083A JPS6041182A JP S6041182 A JPS6041182 A JP S6041182A JP 14985083 A JP14985083 A JP 14985083A JP 14985083 A JP14985083 A JP 14985083A JP S6041182 A JPS6041182 A JP S6041182A
- Authority
- JP
- Japan
- Prior art keywords
- counter
- measured
- generated
- matter
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06M—COUNTING MECHANISMS; COUNTING OF OBJECTS NOT OTHERWISE PROVIDED FOR
- G06M11/00—Counting of objects distributed at random, e.g. on a surface
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Measuring Frequencies, Analyzing Spectra (AREA)
Abstract
Description
【発明の詳細な説明】
(イ)発明の技術分野
本発明は測定事象の発生頻度分布測定方法に係り、特に
測定事象の発生態様とは無関係にその事象の発生頻度分
布を測定し得る方法に関する。Detailed Description of the Invention (a) Technical Field of the Invention The present invention relates to a method for measuring the frequency distribution of a measurement event, and particularly relates to a method capable of measuring the frequency distribution of a measurement event regardless of the manner in which the event occurs. .
<a>技術の背景
電子計算機等において生ずる事象にはランダムに発生す
る性質のものや、予め決められた周期で生ずるものがあ
る。このような事象の性質如何を問わず、その発生頻度
分布を測定したいという要求がある。これは例えば、計
算機の性能測定や計算機システムの効率的な運用に供せ
んとすることから由来するものである。<a> Background of the Technology Some events that occur in electronic computers and the like occur randomly, while others occur at predetermined intervals. Regardless of the nature of such an event, there is a demand for measuring its occurrence frequency distribution. This comes from, for example, the purpose of measuring computer performance and efficiently operating a computer system.
しかしながら、従来測定方法には、これに十分応え得る
技法はなく、上述のような要求を満たしきれず不都合を
来しており、これを解決し得る技術手段の開発が要望さ
れている。However, the conventional measurement methods do not have a technique that can fully meet this requirement, and are inconvenient because they cannot meet the above requirements, and there is a demand for the development of technical means that can solve this problem.
(ハ)従来技術と問題点
従来における計算機の性能測定における従来技法は成る
特定の事象の発生回数及び時間を測定する場合、成る任
意の時間内での事象発生総数及びその総時間長を測定し
得ても、事象の測定時間内での発生頻度分布は測定し得
ないものであった。(C) Prior art and problems The conventional technique for measuring the performance of a computer is to measure the number of occurrences and time of a specific event. However, the frequency distribution of events within the measurement time could not be determined.
これがため、上述のような不具合はなお残存されたまま
にある。Therefore, the above-mentioned problems still remain.
仁)発明の目的
本発明は上述したような従来技法の有する欠点に鑑みて
創案されたもので、その目的は測定事象の発生頻度分布
を測定し得て計算機等の性能測定に寄与し得る測定事象
の発生頻度分布測定方法を提供することにある。The present invention was devised in view of the drawbacks of the conventional techniques as described above, and its purpose is to provide a measurement method that can measure the frequency distribution of measurement events and contribute to performance measurement of computers, etc. The object of the present invention is to provide a method for measuring the frequency distribution of events.
け)発明の構成
そして、この目的達成のため、本発明方法は予め決めら
れた周期で更新されつつある記憶装置のアドレッシング
手段を測定事象の発生によって初期化する直前に上記ア
ドレッシング手段が示すアドレスに発生した測定事象を
積算し、該発生した測定事象で上記アドレッシング手段
を初期化する過程を所定の測定時間繰り返すようにした
ものである。g) Structure of the Invention In order to achieve this object, the method of the present invention updates the address indicated by the addressing means of the storage device, which is being updated at a predetermined period, immediately before the addressing means of the storage device is initialized by the occurrence of a measurement event. The process of integrating the measurement events that have occurred and initializing the addressing means using the measurement events that have occurred is repeated for a predetermined measurement time.
(へ)発明の実施例 以下、添付図面を参照して本発明の詳細な説明する。(f) Examples of the invention Hereinafter, the present invention will be described in detail with reference to the accompanying drawings.
添付図面は本発明の一実施例を示す。この図において、
1は線2を経て測定事象を受ける微分回路であり、その
出力はカウンタ3の入力部3a及び記憶装置の書込み許
可人力6dに接続されている。カウンタ3は+1カウン
トアツプ回路3bによって更新され、且つ微分回路1か
らの信号を受けたとき、線5上に与えられている初期値
がカウンタ3ヘセントされるように構成されている。The accompanying drawings illustrate one embodiment of the invention. In this diagram,
1 is a differentiating circuit which receives a measurement event via line 2, and its output is connected to the input section 3a of the counter 3 and the write enable input 6d of the storage device. The counter 3 is updated by a +1 count up circuit 3b, and is configured such that when receiving a signal from the differentiating circuit 1, the initial value given on the line 5 is sent to the counter 3.
そのカウンタ3のカウント値はアドレスとして、記憶装
置6のアドレッシング部6aへ接続されている。記憶装
置6の読み出し出力6bは+1力ウン上アツプ回路7を
経て記憶装置6の書込み入力6cへ接続されている。The count value of the counter 3 is connected to the addressing section 6a of the storage device 6 as an address. The read output 6b of the memory device 6 is connected to the write input 6c of the memory device 6 via a +1 power up circuit 7.
次に、上述構成回路での本発明測定態様を説明する。Next, a measurement aspect of the present invention using the above-mentioned configuration circuit will be explained.
説明の都合上、回路が動作状態にあり、且つ測定事象例
えば、計算機の処理要求の発生で微分回路1から出力信
号があってカウンタ3が初期値に再設定されたものとす
る。For convenience of explanation, it is assumed that the circuit is in an operating state and that the counter 3 is reset to its initial value due to an output signal from the differentiating circuit 1 due to a measurement event, for example, the occurrence of a processing request from a computer.
そのカウンタ3のカウント値は予め決められた周期毎に
+1カウントアツプ回路3bにより+1だけカウントア
ツプされ続ける。The count value of the counter 3 continues to be counted up by +1 every predetermined period by the +1 count up circuit 3b.
このカウント値の更新中に線2上に測定事象が発生する
と、その事象の発生が微分回路1で検出され、これを表
わす検出信号が記憶装置の書込み許可人力6dへ供給さ
れる。その時にカウンタ3のカウント値が示す記憶装置
6のアドレスからデータが読み出さ れ、そのデータが
+1カウントアツプ回路7で+1だけカウントアツプさ
れたその更新データが記憶装置6の書込み入力6Cへ送
り込まれて来て、更新データの基になったデータを読み
出した記憶装置6のアドレス、即ちカウンタ3のカウン
ト値が示すアドレスに書き込まれる、即ちデータの更新
が行なわれる。When a measurement event occurs on the line 2 during updating of this count value, the occurrence of the event is detected by the differentiating circuit 1, and a detection signal representing this is supplied to the write permission input 6d of the storage device. At that time, data is read from the address of the storage device 6 indicated by the count value of the counter 3, and the updated data is incremented by +1 in the +1 count up circuit 7 and sent to the write input 6C of the storage device 6. Then, the updated data is written to the address of the storage device 6 from which the data on which the updated data is based was read, that is, the address indicated by the count value of the counter 3, that is, the data is updated.
一方、この更新動作と同時的に、その更新に供された上
述検出信号がカウンタ3の入力部3aへ供給され、再び
カウンタ3の初期化、即ち初期値のカウンタ3への設定
が行なわれる。Meanwhile, simultaneously with this updating operation, the above-mentioned detection signal used for the updating is supplied to the input section 3a of the counter 3, and the counter 3 is again initialized, that is, the initial value is set in the counter 3.
こうして、次の測定事象の発生を待ち、その発生があっ
たとき上述と同様の動作が生ぜしめられる。このような
測定が所定の測定時間について行なわれる。In this way, the next measurement event is waited for to occur, and when it occurs, the same actions as described above occur. Such measurements are performed for a predetermined measurement time.
上述したところから明らかなように、各アドレスはカウ
ンタ3の更新周期の整数倍になっているから、そのアド
レスの値は更新周期×初期値からそのアドレスを発生さ
せた更新回数つまり成る事象と次の事象との間の時間間
隔となっている。従って、記憶装置のアドレスとデータ
とを関連付けて読み出せば、上述冬時間間隔に何回事象
が発生しているかという測定事象の発生頻度分布を得る
ことが出来る。この分布から例えば、計算機の性能測定
を行なうことが出来る。As is clear from the above, each address is an integer multiple of the update cycle of counter 3, so the value of that address is calculated by multiplying the update cycle by the initial value, the number of updates that caused the address, and the next event. This is the time interval between events. Therefore, by correlating and reading out the address of the storage device and the data, it is possible to obtain the occurrence frequency distribution of the measured event, which indicates how many times the event occurs during the above-mentioned winter time interval. For example, the performance of a computer can be measured from this distribution.
なお、上述初期値及び周期を必要に応じて可変にしても
よい。又、測定事象信号の性質に応じて微分回路を他の
事象発生時刻を決定し得る回路で代替してもよい。Note that the above-mentioned initial value and period may be made variable as necessary. Further, the differentiating circuit may be replaced with a circuit capable of determining the time of occurrence of another event depending on the nature of the measured event signal.
(ト)発明の効果
以上述べたように、本発明によれば、
■測定事象の発生頻度分布を得ることが出来、■これを
用いて計算機等の性能評価のトゥールに資することが出
来る、等の効果が得られる。(G) Effects of the Invention As described above, according to the present invention, it is possible to obtain the frequency distribution of measurement events, and use this to contribute to a tool for evaluating the performance of computers, etc. The effect of this can be obtained.
添付図面は本発明の一実施例を示す図である。
図中、1は微分回路、3はカウンタ、3aは+1カウン
トアツプ回路、4はアンドゲート、6は記憶装置、6a
はアドレッシング部、7は+1カラントアップ回路であ
る。
特許出願人 富士通株式会社The accompanying drawings illustrate one embodiment of the invention. In the figure, 1 is a differential circuit, 3 is a counter, 3a is a +1 count up circuit, 4 is an AND gate, 6 is a storage device, 6a
is an addressing section, and 7 is a +1 current up circuit. Patent applicant Fujitsu Limited
Claims (1)
レッシング手段を測定事象の発生によって初期化する直
前に上記アドレッシング手段が示すアドレスに発生した
測定事象を積算し、該発生した測定事象で上記アドレッ
シング手段を初期化する過程を所定の測定時間繰り返す
ことを特徴とする測定事象の発生頻度分布測定方法。Immediately before the addressing means of the storage device, which is being updated at a predetermined period, is initialized by the occurrence of a measurement event, the measurement events that have occurred at the address indicated by the addressing means are integrated, and the addressing means is updated based on the measurement event that has occurred. 1. A method for measuring occurrence frequency distribution of measurement events, characterized in that a process of initializing is repeated for a predetermined measurement period.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14985083A JPS6041182A (en) | 1983-08-17 | 1983-08-17 | Method for measuring distribution of generation frequency of matter to be measured |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14985083A JPS6041182A (en) | 1983-08-17 | 1983-08-17 | Method for measuring distribution of generation frequency of matter to be measured |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6041182A true JPS6041182A (en) | 1985-03-04 |
Family
ID=15484012
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14985083A Pending JPS6041182A (en) | 1983-08-17 | 1983-08-17 | Method for measuring distribution of generation frequency of matter to be measured |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6041182A (en) |
-
1983
- 1983-08-17 JP JP14985083A patent/JPS6041182A/en active Pending
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