JPS6031171A - 電子写真の液体現像における乾燥方法 - Google Patents
電子写真の液体現像における乾燥方法Info
- Publication number
- JPS6031171A JPS6031171A JP58139499A JP13949983A JPS6031171A JP S6031171 A JPS6031171 A JP S6031171A JP 58139499 A JP58139499 A JP 58139499A JP 13949983 A JP13949983 A JP 13949983A JP S6031171 A JPS6031171 A JP S6031171A
- Authority
- JP
- Japan
- Prior art keywords
- liquid
- developing
- drying
- liquid developer
- chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000007788 liquid Substances 0.000 title claims abstract description 60
- 238000001035 drying Methods 0.000 title claims abstract description 40
- 239000000463 material Substances 0.000 claims abstract description 42
- 238000000034 method Methods 0.000 description 11
- 238000007664 blowing Methods 0.000 description 6
- 239000002904 solvent Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 108091008695 photoreceptors Proteins 0.000 description 2
- 229910052724 xenon Inorganic materials 0.000 description 2
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 2
- 235000010724 Wisteria floribunda Nutrition 0.000 description 1
- 230000035571 calor Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000001454 recorded image Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 238000009941 weaving Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G15/00—Apparatus for electrographic processes using a charge pattern
- G03G15/06—Apparatus for electrographic processes using a charge pattern for developing
- G03G15/10—Apparatus for electrographic processes using a charge pattern for developing using a liquid developer
- G03G15/101—Apparatus for electrographic processes using a charge pattern for developing using a liquid developer for wetting the recording material
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Wet Developing In Electrophotography (AREA)
- Combination Of More Than One Step In Electrophotography (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58139499A JPS6031171A (ja) | 1983-08-01 | 1983-08-01 | 電子写真の液体現像における乾燥方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58139499A JPS6031171A (ja) | 1983-08-01 | 1983-08-01 | 電子写真の液体現像における乾燥方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6031171A true JPS6031171A (ja) | 1985-02-16 |
| JPH0447832B2 JPH0447832B2 (enrdf_load_stackoverflow) | 1992-08-05 |
Family
ID=15246696
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58139499A Granted JPS6031171A (ja) | 1983-08-01 | 1983-08-01 | 電子写真の液体現像における乾燥方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6031171A (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6779159B2 (en) | 2001-06-08 | 2004-08-17 | Sumitomo Mitsubishi Silicon Corporation | Defect inspection method and defect inspection apparatus |
-
1983
- 1983-08-01 JP JP58139499A patent/JPS6031171A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6779159B2 (en) | 2001-06-08 | 2004-08-17 | Sumitomo Mitsubishi Silicon Corporation | Defect inspection method and defect inspection apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0447832B2 (enrdf_load_stackoverflow) | 1992-08-05 |
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