JPS6028634B2 - Double-sided polishing device - Google Patents

Double-sided polishing device

Info

Publication number
JPS6028634B2
JPS6028634B2 JP51125167A JP12516776A JPS6028634B2 JP S6028634 B2 JPS6028634 B2 JP S6028634B2 JP 51125167 A JP51125167 A JP 51125167A JP 12516776 A JP12516776 A JP 12516776A JP S6028634 B2 JPS6028634 B2 JP S6028634B2
Authority
JP
Japan
Prior art keywords
polishing
carrier
double
container
sided
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP51125167A
Other languages
Japanese (ja)
Other versions
JPS5349396A (en
Inventor
通夫 石川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP51125167A priority Critical patent/JPS6028634B2/en
Publication of JPS5349396A publication Critical patent/JPS5349396A/en
Publication of JPS6028634B2 publication Critical patent/JPS6028634B2/en
Expired legal-status Critical Current

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  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Description

【発明の詳細な説明】 本発明は、エレクトロニクス工業に広く用いられている
単結晶材料などのウェハの両面を同時にェピタキシャル
成長基板として有効な加工変質層のない平滑な表面(無
歪鏡面)に仕上げることができる両面研摩装置に関する
ものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention provides a method for simultaneously forming both sides of a wafer, such as a single-crystal material widely used in the electronics industry, into a smooth surface (undistorted mirror surface) without a processed layer that is effective as an epitaxial growth substrate. The present invention relates to a double-sided polishing device that can perform finishing.

第1図は従来の両面研摩装置の一例を説明するための図
でaは研摩液を除去した状態の平面図「bはA−B−C
−D断面図である。
Figure 1 is a diagram for explaining an example of a conventional double-sided polishing device, in which a is a plan view with the polishing liquid removed;
-D sectional view.

第1図において1は被研摩試料である円形状のウェハ、
2はウェハ1を数個同時に保持できる孔が同心円上に設
けられ、ウェハ1の厚さ寸法より薄い円板状のキャリア
、3,4はキャリア2の外周部分を両側からはさみ数個
のねじ5により縦付けてキャリア2を平坦に保持するた
めのIJング状ホルダー、6はモータなどにより一定速
度で回転される円板状の下受皿、7は下受皿6と同様に
回転される円板状の上受皿、8は上下受皿6,7の表面
に接着された研摩布、9はウェハ1をエッチングする薬
品中に超微粒子の砥粒を混合した液体の研摩液、10は
キャリア2とりング状ホルダー3,4から成る集合体を
保持し、モータなどにより駆動されるつばを有する摩擦
車、11は摩擦車10と同様な形状を有し、摩擦車10
との三点でキャリア2およびリング状ホルダー3,4か
ら成る集合体を保持する案内ローラーでキャリア2が上
下の研摩布8に接触しないように組立てられている。1
2は基板13に固定されウェハ1、キャリア2、上下受
皿6,7などを浸潰するに十分な研摩液9を貯えること
ができる円筒状容器で下受皿6と摩擦車1川ま研摩液が
漏れないように○リング14を介して保持され案内ロー
ラー11の軸は容器12に固定されている。
In FIG. 1, 1 is a circular wafer which is a sample to be polished;
2 is a disk-shaped carrier that is thinner than the thickness of the wafer 1 and has concentric holes that can hold several wafers 1 at the same time; 3 and 4 are screws 5 that sandwich the outer circumference of the carrier 2 from both sides; 6 is a disc-shaped lower tray that is rotated at a constant speed by a motor or the like, and 7 is a disc-shaped holder that is rotated in the same way as the lower tray 6. 8 is an abrasive cloth adhered to the surfaces of the upper and lower receivers 6 and 7; 9 is a liquid polishing liquid containing ultrafine abrasive particles mixed with a chemical for etching the wafer 1; 10 is a ring-shaped plate attached to the carrier 2; A friction wheel 11 having a collar that holds an assembly consisting of holders 3 and 4 and is driven by a motor etc. has a similar shape to the friction wheel 10;
The carrier 2 is assembled so that it does not come into contact with the upper and lower abrasive cloths 8 by guide rollers that hold the assembly consisting of the carrier 2 and ring-shaped holders 3 and 4 at three points. 1
Reference numeral 2 is a cylindrical container fixed to the substrate 13 and capable of storing enough polishing liquid 9 to submerge the wafer 1, carrier 2, upper and lower trays 6 and 7, etc., and the lower tray 6 and the friction wheel 1 are filled with polishing liquid. The shaft of the guide roller 11 is fixed to the container 12, and is held via a ring 14 to prevent leakage.

なお上下受皿6,7の回転中心は容器12の中心と一致
しているがキャリア2の回転中心は偏心した位置に組立
てられている。
Note that the rotation centers of the upper and lower trays 6 and 7 coincide with the center of the container 12, but the rotation center of the carrier 2 is assembled at an eccentric position.

上下受皿6,7と摩擦車10を同方向にある速度差で回
転させたり、上受皿7と摩擦車10を同方向に下受皿6
を逆方向に回転させるかあるいは上下受皿6,7を同方
向に摩擦車10を逆方向に回転させたりすることによっ
てゥェハ1が上下受皿上の研摩布8の間で摺動運動をし
、研摩液9がウェハーの両面に供給されて両面研摩が行
なわれる。
The upper and lower trays 6, 7 and the friction wheel 10 may be rotated in the same direction with a certain speed difference, or the upper tray 7 and the friction wheel 10 may be rotated in the same direction with the lower tray 6.
The wafer 1 slides between the polishing cloths 8 on the upper and lower trays by rotating them in opposite directions, or by rotating the upper and lower trays 6 and 7 in the same direction and the friction wheel 10 in the opposite direction. Liquid 9 is supplied to both sides of the wafer to perform double-sided polishing.

しかしながら第1図のような両面研摩装置は、容器が固
定されているため研摩液の出し入れや容器内面の洗浄が
不便であると共に研摩液が回転しないので研摩液自体に
遠心力が作用せず、研摩液中に混入している異物や大き
な砥粒が研摩布面上に存在し加工面が鱒歪鏡面とならな
いこと、研摩液中に摩擦車や案内ローラーがあるためそ
の材質は耐食性材料を用いる必要があると同時に上下受
皿やキャリアの回転によって生ずる研摩液の回転が阻止
されることおよびキャリアの駆動にスリップを生じ均一
な回転を伝達できないこと、キャリアや研摩布を交換す
る場合、薬品である研摩液に手が触れるため作業性が悪
くキャリアを保持している摩擦車と案内ローラーのうち
の一つを分解しなければならないこと、容器と下受皿軸
および摩擦車軸との研摩液の漏れを完全に防止すること
が困難であることなどの欠点を有する。
However, in the double-sided polishing device as shown in Fig. 1, since the container is fixed, it is inconvenient to put in and take out the polishing liquid and to clean the inner surface of the container, and since the polishing liquid does not rotate, centrifugal force does not act on the polishing liquid itself. Foreign matter and large abrasive grains mixed in the polishing solution are present on the surface of the polishing cloth, so the machined surface does not become a distorted mirror surface, and since there are friction wheels and guide rollers in the polishing solution, corrosion-resistant materials are used. At the same time, it is necessary to prevent the rotation of the polishing liquid caused by the rotation of the upper and lower saucers and the carrier, to prevent uniform rotation due to slippage in the drive of the carrier, and to avoid chemicals when replacing the carrier or polishing cloth. It is difficult to work because the abrasive liquid comes into contact with the hands, and one of the friction wheels and guide rollers that hold the carrier must be disassembled, and the abrasive liquid leaks between the container, the lower pan shaft, and the friction axle. It has the disadvantage that it is difficult to completely prevent it.

本発明の目的は良好な無歪鏡面加工が達成されると共に
容器、キャリア、上下の研摩盤の交換、洗浄が容易にで
きる作業能率の向上を目指した両面研摩装置を提供する
ことにある。
An object of the present invention is to provide a double-sided polishing device that achieves good distortion-free mirror finishing and is capable of improving work efficiency by making it easy to replace and clean the container, carrier, and upper and lower polishers.

すなわち本発明は研摩液の外部から支持して駆動できる
ように構成したホルダーと、このホルダーで外周部を固
定され被研摩試料を保持する孔を有するキャリアと、こ
のキャリアを挟んで上下に設けた2つの研摩盤と「 こ
れらを収納しかつ回転可能な容器とを備えて成り、前記
キャリアに被研摩試料を設置し、前記容器に研摩液を注
入して前記キャリア、被研摩試料及び2つの研摩盤を浸
潰し、これらキャリア、研摩盤及び容器に回転を与えて
両面研摩を行なう両面研摩装置である。
That is, the present invention has a holder configured to be able to support and drive the polishing liquid from the outside, a carrier whose outer peripheral portion is fixed by the holder and has a hole for holding the sample to be polished, and a carrier provided above and below with the carrier in between. It is equipped with two polishing machines and a rotatable container that accommodates these, a sample to be polished is placed in the carrier, and a polishing liquid is poured into the container to remove the carrier, the sample to be polished, and the two polishers. This is a double-sided polishing device that polishes both sides by immersing the disc and rotating the carrier, polishing disc, and container.

本発明によれば研摩液を貯える容器が回転するための研
摩液に均一な遠心力作用が生じ研摩液中にある異物や大
さな砥粒は外周部には排除され研摩盤上では均一な微粒
子砥粒による加工が行なわれること、容器や下の研摩盤
が着脱できるため洗浄が容易であると共に交換も簡単で
あること、およびキャリアの着脱が研摩液の外から行な
えるので作業しやすいことなどの利点がある。第2図は
本発明の両面研摩装置の一実施例を説明するための図で
、aは研摩液を除去した状態の平面図、bはA−○−A
断面図である。
According to the present invention, a uniform centrifugal force is applied to the polishing liquid due to the rotation of the container storing the polishing liquid, and foreign matter and large abrasive grains in the polishing liquid are removed to the outer periphery and are uniformly distributed on the polishing machine. Processing is performed using fine particle abrasive grains, the container and lower polishing machine are removable, making cleaning and replacement easy, and the carrier can be attached and removed from outside the polishing solution, making work easier. There are advantages such as FIG. 2 is a diagram for explaining an embodiment of the double-sided polishing apparatus of the present invention, in which a is a plan view with the polishing liquid removed, and b is a plan view of A-○-A.
FIG.

第2図において1′はウエハ、2′はキヤリア、3′,
4′はリング状ホルダー「 7′は上受皿、8′は研摩
布、9′は研摩液、15はリング状ホルダー4′の三等
分された位置においてねじ5′で結合されキャリア2′
とりング状ホルダー3′,4′から成る集合体を吊して
上下の研摩布8′の表面に触れないように保持するため
の3本の支柱、16は3本の支柱15をねじ17で固定
するための3本の腕18を有する上面板、igは上面板
16と蝶ねじ20で固定され上面板16の外周部分の三
等分された位置で上面板16を保持する支持棒、21は
支持榛19を取付け固定するための円板とプーリーから
なる下面板、22は下面板21を回転できるようにベア
リング23を介して保持するための中間軸受、24は下
面板21をVベルト25を経て駆動するためのベルト車
で、モータなどにより一定速度で回転される。26は基
台、27はモータなどにより回転される構造で先端に円
板を有しかつ円板の中心に丸い突起と隅心した位置にピ
ン28がある下側、29は下甑27に載遣され着脱でき
るように組立てられた円筒状の回転容器、301ま回転
容器29の中央部にある突起と偏心した位置にあるピン
28′により一体化されて取付けられた円状の着脱でき
る下受皿で、上受皿7′と下受皿30および回転容器2
9の三者の回転中心は一致しているがキャリア2′の回
転中心は偏心した位置に組立てられておりキャリア2′
の回転によってキャリア内のウェハ1′は研摩布8′の
間で摺動する構造となっている。
In Figure 2, 1' is the wafer, 2' is the carrier, 3',
4' is a ring-shaped holder; 7' is an upper tray; 8' is an abrasive cloth; 9' is a polishing liquid;
Three supports 16 are used to hang the assembly consisting of the ring-shaped holders 3' and 4' and hold it so that it does not touch the surface of the upper and lower polishing cloths 8'. A top plate ig having three arms 18 for fixing is a support rod 21 that is fixed to the top plate 16 with a thumbscrew 20 and holds the top plate 16 at a position divided into three equal parts on the outer circumference of the top plate 16; 22 is an intermediate bearing for holding the bottom plate 21 via a bearing 23 so that the bottom plate 21 can be rotated; 24 is a V-belt 25 that connects the bottom plate 21; It is a belt pulley that is driven by a motor, and is rotated at a constant speed by a motor or the like. 26 is a base, 27 is a structure that is rotated by a motor or the like and has a disk at the tip, and the lower side has a round protrusion in the center of the disk and a pin 28 at a corner position, and 29 is placed on the lower moat 27. 301 is a circular removable lower saucer which is integrally attached by a protrusion in the center of the rotary container 29 and a pin 28' located at an eccentric position. , the upper saucer 7', the lower saucer 30, and the rotating container 2
The rotation centers of the three parts 9 are aligned, but the rotation center of the carrier 2' is assembled at an eccentric position, and the rotation center of the carrier 2'
The wafer 1' in the carrier slides between the polishing cloths 8' by the rotation of the carrier.

なおキャリア2′は偏心回転運動の代りに往復運動、揺
動円孤運動などを行なってもウェハ1′は研摩布8′の
間で港勤可能である。第2図における両面研摩は、第1
図の場合と同様に上受皿7′、ベルト車24、下麹27
の三者を各々図中の矢印の方向にある速度差で回転させ
たり、上受皿7′とベルト車24を同方向に下軸27を
逆方向に回転させるかあるいは上受皿7′と下甑27を
同方向にベルト車24を逆方向に回転させることにより
行なわれるが、本発明の場合容器が回転すること、下軸
と容器と下受皿が着脱できること、キャリアを研摩液の
外から駆動する構造であることなどにより前記従来装置
の問題点をすべて解消でき、良好な無歪両面研摩が達成
されると共に研摩液の付着による汚れの洗浄、研摩布や
キャリアの交換、研摩液やゥェハの出し入れなど作業性
の優れた無歪両面研摩装置として極めて有効である。こ
の実施例のように研摩盤を受皿に研摩布を設けた構造に
することにより、被研摩試料に与える歪がより少ない態
歪両面研摩が達成される。
The wafer 1' can be moved between the polishing cloths 8' even if the carrier 2' performs a reciprocating motion, an oscillating arc motion, etc. instead of an eccentric rotation motion. The double-sided polishing in Figure 2 is the first
As in the case of the figure, upper saucer 7', belt wheel 24, lower koji 27
The three parts may be rotated at a speed difference in the directions of the arrows in the figure, or the upper tray 7' and the belt pulley 24 may be rotated in the same direction and the lower shaft 27 in opposite directions, or the upper tray 7' and the lower tray 27 may be rotated in the same direction and the lower shaft 27 in opposite directions. This is done by rotating the belt pulley 24 in the same direction in the opposite direction, but in the present invention, the container rotates, the lower shaft, the container, and the lower tray are detachable, and the carrier is driven from outside of the polishing liquid. As a result, all of the problems of the conventional device mentioned above can be solved, and excellent distortion-free double-sided polishing can be achieved, as well as cleaning of dirt caused by adhesion of polishing liquid, replacing polishing cloth and carrier, and loading and unloading of polishing liquid and wafer. It is extremely effective as a distortion-free double-sided polishing device with excellent workability. By configuring the polishing machine as in this embodiment, in which the polishing cloth is provided on the tray, double-sided polishing with less strain on the sample to be polished can be achieved.

なお前記実施例において、キャリア2′とりング状ホル
ダー3′,4′から成る集合体を3本の支柱15で吊し
た構造と上面板16を3本の支持榛19で保持した構造
を例示したが数本の支柱あるいは穴や切欠き部を有する
円筒ljングで製作した構造でも同様な効果が得られる
。さらに前記実施例においては上受皿7′を回転させる
方法について例示したが上受皿7′を固定し下軸27と
ベルト車24をある速度差で同方向に又は逆方向に回転
させても研摩が可能である。
In the above embodiments, a structure in which the assembly consisting of the carrier 2' and the ring-shaped holders 3' and 4' is suspended by three supports 15, and a structure in which the top plate 16 is held by three support rods 19 are exemplified. A similar effect can be obtained with a structure made of several pillars or a cylindrical ljing having holes or notches. Further, in the above embodiment, the method of rotating the upper tray 7' was illustrated, but polishing can also be achieved by fixing the upper tray 7' and rotating the lower shaft 27 and the belt pulley 24 in the same direction or in opposite directions at a certain speed difference. It is possible.

以上述べたように本発明によれば装置の製作が容易にで
き、機能的にも何ら問題がない耐久性を有する無歪両面
研摩装置が可能であり取扱いも便利になる。
As described above, according to the present invention, it is possible to easily manufacture the device, and it is possible to create a strain-free double-sided polishing device that has no functional problems and has durability, and is also convenient to handle.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の無歪両面研摩装置の一例を示す説明図で
aは研摩液を除去し上受皿の一部と研摩布の一部を切り
欠いた状態の平面図、bはA−8一C−D断面図であり
、第2図は本発明の無歪両面研摩装置の一実施例を説明
するための図でaは研摩液を取り除き上受皿の一部と研
摩布の一部を切り欠いた状態の平面図、bはA−○−A
断面図である。 図中、1,1′はウェハ、2,2′はキャリア、3,3
′,4,4′はリンク状ホルダー、5,5′17はねじ
、6は下受皿、7,7′は上受皿、8,8′は研摩布、
9,9′は研摩液、10は摩擦車、11は案内ローフー
、12は固定された容器、13は基板、14は○リング
、15は支柱、16は3本の腕18を有する上面板、1
9は支持榛、20は蝶ねじ、21は下面板、22は中空
軸受、23はベアリング、24はベルト車、25はVベ
ルト、26は基台、27は下軸、28,28′はピン、
29は回転容器、30は着脱できる下受皿である。才2
図 汁l図 才2図
Figure 1 is an explanatory diagram showing an example of a conventional strain-free double-sided polishing device, in which a is a plan view with the polishing liquid removed and a part of the upper tray and part of the polishing cloth cut away, and b is a plan view of A-8. FIG. 2 is a cross-sectional view taken along the line C-D, and FIG. Plan view of cutaway state, b is A-○-A
FIG. In the figure, 1 and 1' are wafers, 2 and 2' are carriers, and 3 and 3
', 4, 4' are link-shaped holders, 5, 5', 17 are screws, 6 is a lower saucer, 7, 7' are upper saucers, 8, 8' are abrasive cloths,
9 and 9' are abrasive liquid, 10 is a friction wheel, 11 is a guide loft, 12 is a fixed container, 13 is a base plate, 14 is a ○ ring, 15 is a column, 16 is a top plate having three arms 18, 1
9 is a support rod, 20 is a thumbscrew, 21 is a bottom plate, 22 is a hollow bearing, 23 is a bearing, 24 is a belt pulley, 25 is a V-belt, 26 is a base, 27 is a lower shaft, 28, 28' are pins. ,
29 is a rotating container, and 30 is a removable lower tray. Sai 2
Illustration soup l illustration 2 illustration

Claims (1)

【特許請求の範囲】 1 研摩液の外部から支持して駆動できるように構成し
たホルダーと、このホルダーで外周部を固定され被研摩
試料を保持する孔を有するキヤリアと、このキヤリアを
挾んで上下に設けた2つの研摩盤と、これらを収納しか
つ回転可能な容器とを備えて成り、前記キヤリアに被研
摩試料を設置し、前記容器に研摩液を注入して前記キヤ
リア、被研摩試料及び2つの研摩盤を浸漬し、これらキ
ヤリア、研摩盤及び容器に回転を与えて両面研摩を行な
うことを特徴とする両面研摩装置。 2 2つの研摩盤が受皿の表面に研摩布を設けた構造で
ある特許請求の範囲第1項記載の両面研摩装置。
[Scope of Claims] 1. A holder configured to be able to support and drive the polishing liquid from the outside, a carrier whose outer periphery is fixed by the holder and has a hole for holding the sample to be polished, and a carrier that is held in the upper and lower portions with this carrier in between. It is equipped with two polishing machines installed in the carrier, and a rotatable container that accommodates the polishing machines.The sample to be polished is placed in the carrier, and the polishing liquid is injected into the container. A double-sided polishing device characterized in that two polishing discs are immersed, and these carriers, polishing discs, and container are rotated to perform double-sided polishing. 2. The double-sided polishing apparatus according to claim 1, wherein the two polishing machines have a structure in which a polishing cloth is provided on the surface of a saucer.
JP51125167A 1976-10-18 1976-10-18 Double-sided polishing device Expired JPS6028634B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP51125167A JPS6028634B2 (en) 1976-10-18 1976-10-18 Double-sided polishing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP51125167A JPS6028634B2 (en) 1976-10-18 1976-10-18 Double-sided polishing device

Publications (2)

Publication Number Publication Date
JPS5349396A JPS5349396A (en) 1978-05-04
JPS6028634B2 true JPS6028634B2 (en) 1985-07-05

Family

ID=14903531

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51125167A Expired JPS6028634B2 (en) 1976-10-18 1976-10-18 Double-sided polishing device

Country Status (1)

Country Link
JP (1) JPS6028634B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2552305B2 (en) * 1987-09-30 1996-11-13 東芝機械株式会社 Double side polishing machine

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS501313U (en) * 1973-04-27 1975-01-08
JPS5415293B2 (en) * 1974-04-25 1979-06-13

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5147270Y2 (en) * 1971-09-30 1976-11-15
JPS5738873Y2 (en) * 1977-07-05 1982-08-26

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS501313U (en) * 1973-04-27 1975-01-08
JPS5415293B2 (en) * 1974-04-25 1979-06-13

Also Published As

Publication number Publication date
JPS5349396A (en) 1978-05-04

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