JPS60247143A - 接点の外観検査方法 - Google Patents

接点の外観検査方法

Info

Publication number
JPS60247143A
JPS60247143A JP60084479A JP8447985A JPS60247143A JP S60247143 A JPS60247143 A JP S60247143A JP 60084479 A JP60084479 A JP 60084479A JP 8447985 A JP8447985 A JP 8447985A JP S60247143 A JPS60247143 A JP S60247143A
Authority
JP
Japan
Prior art keywords
signal
contact
circuit
frame
outer frame
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60084479A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6214775B2 (enrdf_load_stackoverflow
Inventor
Tomohiro Kuji
久迩　朝広
Nobuyuki Akiyama
秋山　伸幸
Yoshimasa Oshima
良正 大島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP60084479A priority Critical patent/JPS60247143A/ja
Publication of JPS60247143A publication Critical patent/JPS60247143A/ja
Publication of JPS6214775B2 publication Critical patent/JPS6214775B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/28—Measuring arrangements characterised by the use of optical techniques for measuring areas
    • G01B11/285—Measuring arrangements characterised by the use of optical techniques for measuring areas using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Image Analysis (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
JP60084479A 1985-04-22 1985-04-22 接点の外観検査方法 Granted JPS60247143A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60084479A JPS60247143A (ja) 1985-04-22 1985-04-22 接点の外観検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60084479A JPS60247143A (ja) 1985-04-22 1985-04-22 接点の外観検査方法

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP14332976A Division JPS5368847A (en) 1976-12-01 1976-12-01 Automatic appearance inspecting device

Publications (2)

Publication Number Publication Date
JPS60247143A true JPS60247143A (ja) 1985-12-06
JPS6214775B2 JPS6214775B2 (enrdf_load_stackoverflow) 1987-04-03

Family

ID=13831775

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60084479A Granted JPS60247143A (ja) 1985-04-22 1985-04-22 接点の外観検査方法

Country Status (1)

Country Link
JP (1) JPS60247143A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4253945A1 (en) * 2022-03-04 2023-10-04 Kikusui Seisakusho Ltd. Inspection device and molded product processing system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4253945A1 (en) * 2022-03-04 2023-10-04 Kikusui Seisakusho Ltd. Inspection device and molded product processing system

Also Published As

Publication number Publication date
JPS6214775B2 (enrdf_load_stackoverflow) 1987-04-03

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