JPS5368847A - Automatic appearance inspecting device - Google Patents

Automatic appearance inspecting device

Info

Publication number
JPS5368847A
JPS5368847A JP14332976A JP14332976A JPS5368847A JP S5368847 A JPS5368847 A JP S5368847A JP 14332976 A JP14332976 A JP 14332976A JP 14332976 A JP14332976 A JP 14332976A JP S5368847 A JPS5368847 A JP S5368847A
Authority
JP
Japan
Prior art keywords
inspecting device
automatic appearance
appearance inspecting
automatic
inspecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14332976A
Other languages
Japanese (ja)
Other versions
JPS6113177B2 (en
Inventor
Tomohiro Kuji
Nobuyuki Akiyama
Yoshimasa Ooshima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP14332976A priority Critical patent/JPS5368847A/en
Priority to US05/856,097 priority patent/US4242702A/en
Priority to DE2753593A priority patent/DE2753593C2/en
Publication of JPS5368847A publication Critical patent/JPS5368847A/en
Publication of JPS6113177B2 publication Critical patent/JPS6113177B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
JP14332976A 1976-12-01 1976-12-01 Automatic appearance inspecting device Granted JPS5368847A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP14332976A JPS5368847A (en) 1976-12-01 1976-12-01 Automatic appearance inspecting device
US05/856,097 US4242702A (en) 1976-12-01 1977-11-30 Apparatus for automatically checking external appearance of object
DE2753593A DE2753593C2 (en) 1976-12-01 1977-12-01 Optical testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14332976A JPS5368847A (en) 1976-12-01 1976-12-01 Automatic appearance inspecting device

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP60084479A Division JPS60247143A (en) 1985-04-22 1985-04-22 Appearance inspection of contact point

Publications (2)

Publication Number Publication Date
JPS5368847A true JPS5368847A (en) 1978-06-19
JPS6113177B2 JPS6113177B2 (en) 1986-04-11

Family

ID=15336239

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14332976A Granted JPS5368847A (en) 1976-12-01 1976-12-01 Automatic appearance inspecting device

Country Status (1)

Country Link
JP (1) JPS5368847A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55117944A (en) * 1979-03-05 1980-09-10 Daihen Corp Pattern automatic check method
JPS56164545A (en) * 1980-05-21 1981-12-17 Hitachi Ltd Pellet bonding inspection and device therefor
JPS5861448A (en) * 1981-10-09 1983-04-12 Hitachi Ltd Pattern check system
JPS60125547A (en) * 1983-12-09 1985-07-04 Fujitsu Ltd Checking device
JPS62284267A (en) * 1986-06-03 1987-12-10 Anritsu Corp Spectrum analyzer
JPS6315141A (en) * 1986-07-07 1988-01-22 Kyodo Printing Co Ltd Method and apparatus for inspecting article having repeating pattern
JP2005345386A (en) * 2004-06-04 2005-12-15 Tdk Corp Inspection method for chip component, and inspection device therefor

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55117944A (en) * 1979-03-05 1980-09-10 Daihen Corp Pattern automatic check method
JPS56164545A (en) * 1980-05-21 1981-12-17 Hitachi Ltd Pellet bonding inspection and device therefor
JPS5861448A (en) * 1981-10-09 1983-04-12 Hitachi Ltd Pattern check system
JPS60125547A (en) * 1983-12-09 1985-07-04 Fujitsu Ltd Checking device
JPH0578176B2 (en) * 1983-12-09 1993-10-28 Fujitsu Ltd
JPS62284267A (en) * 1986-06-03 1987-12-10 Anritsu Corp Spectrum analyzer
JPH0569384B2 (en) * 1986-06-03 1993-09-30 Anritsu Corp
JPS6315141A (en) * 1986-07-07 1988-01-22 Kyodo Printing Co Ltd Method and apparatus for inspecting article having repeating pattern
JPH0676969B2 (en) * 1986-07-07 1994-09-28 共同印刷株式会社 Method and apparatus for inspecting articles having repetitive patterns
JP2005345386A (en) * 2004-06-04 2005-12-15 Tdk Corp Inspection method for chip component, and inspection device therefor

Also Published As

Publication number Publication date
JPS6113177B2 (en) 1986-04-11

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