JPS60242304A - 大口径平面鏡の表面形状測定用ホログラム干渉計 - Google Patents
大口径平面鏡の表面形状測定用ホログラム干渉計Info
- Publication number
- JPS60242304A JPS60242304A JP9931484A JP9931484A JPS60242304A JP S60242304 A JPS60242304 A JP S60242304A JP 9931484 A JP9931484 A JP 9931484A JP 9931484 A JP9931484 A JP 9931484A JP S60242304 A JPS60242304 A JP S60242304A
- Authority
- JP
- Japan
- Prior art keywords
- hologram
- light
- optical system
- illumination light
- plane mirror
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims abstract description 30
- 238000005286 illumination Methods 0.000 claims description 24
- 238000012360 testing method Methods 0.000 claims description 3
- 238000005259 measurement Methods 0.000 abstract description 5
- 230000004907 flux Effects 0.000 abstract 2
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000011521 glass Substances 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- XKRFYHLGVUSROY-UHFFFAOYSA-N argon Substances [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 238000012549 training Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9931484A JPS60242304A (ja) | 1984-05-17 | 1984-05-17 | 大口径平面鏡の表面形状測定用ホログラム干渉計 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9931484A JPS60242304A (ja) | 1984-05-17 | 1984-05-17 | 大口径平面鏡の表面形状測定用ホログラム干渉計 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60242304A true JPS60242304A (ja) | 1985-12-02 |
JPH0223802B2 JPH0223802B2 (enrdf_load_stackoverflow) | 1990-05-25 |
Family
ID=14244175
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9931484A Granted JPS60242304A (ja) | 1984-05-17 | 1984-05-17 | 大口径平面鏡の表面形状測定用ホログラム干渉計 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60242304A (enrdf_load_stackoverflow) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105300312A (zh) * | 2015-11-30 | 2016-02-03 | 北京航空航天大学 | 一种基于数字全息的高数值孔径半球面形检测系统 |
CN106123793A (zh) * | 2016-06-29 | 2016-11-16 | 北京航天控制仪器研究所 | 一种便携式光学干涉法球径球度快速检测仪 |
CN112525071A (zh) * | 2020-11-27 | 2021-03-19 | 南京理工大学 | 一种抑制大口径干涉仪中光学材料非均匀性影响的方法 |
-
1984
- 1984-05-17 JP JP9931484A patent/JPS60242304A/ja active Granted
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105300312A (zh) * | 2015-11-30 | 2016-02-03 | 北京航空航天大学 | 一种基于数字全息的高数值孔径半球面形检测系统 |
CN106123793A (zh) * | 2016-06-29 | 2016-11-16 | 北京航天控制仪器研究所 | 一种便携式光学干涉法球径球度快速检测仪 |
CN112525071A (zh) * | 2020-11-27 | 2021-03-19 | 南京理工大学 | 一种抑制大口径干涉仪中光学材料非均匀性影响的方法 |
Also Published As
Publication number | Publication date |
---|---|
JPH0223802B2 (enrdf_load_stackoverflow) | 1990-05-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |