JPS6017479A - Electric circuit substrate - Google Patents

Electric circuit substrate

Info

Publication number
JPS6017479A
JPS6017479A JP58124084A JP12408483A JPS6017479A JP S6017479 A JPS6017479 A JP S6017479A JP 58124084 A JP58124084 A JP 58124084A JP 12408483 A JP12408483 A JP 12408483A JP S6017479 A JPS6017479 A JP S6017479A
Authority
JP
Japan
Prior art keywords
insulating layer
liquid crystal
layer
display device
crystal display
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58124084A
Other languages
Japanese (ja)
Other versions
JPH0762743B2 (en
Inventor
北原 信子
修 高松
哲也 金子
菅田 正夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP58124084A priority Critical patent/JPH0762743B2/en
Priority to US06/628,276 priority patent/US4636038A/en
Publication of JPS6017479A publication Critical patent/JPS6017479A/en
Publication of JPH0762743B2 publication Critical patent/JPH0762743B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 [技術分野] 本発明は薄膜トランジスタ(T P T)アレイを有す
る電気的回路基板に関する。
TECHNICAL FIELD The present invention relates to electrical circuit boards having thin film transistor (TPT) arrays.

[従来技術] 従来、電気的回路基板は表示装置等において広く利用さ
れている。 この様な表示装置としてたとえば液晶表示
装置が例示される。 液晶表示装置は一般に2枚の基板
により液晶をはさみ込んだ構造を有する。 この基板の
液晶側には電極その他の素子が形成されており、該素子
により液晶の状態を制御することにより表示が行なわれ
る。
[Prior Art] Conventionally, electric circuit boards have been widely used in display devices and the like. An example of such a display device is a liquid crystal display device. A liquid crystal display device generally has a structure in which a liquid crystal is sandwiched between two substrates. Electrodes and other elements are formed on the liquid crystal side of this substrate, and display is performed by controlling the state of the liquid crystal with these elements.

2枚の基板のうちの一方にはその表面上に一様に電極が
形成され、他方にはその表面上側と適宜の形状をもつ小
ブロツクパターン(画素)の電極カー複数個形成される
。 近年、画素電極側の基板表面」二に各画素毎のスイ
ッチングのためのTFTアレイを付属せしめることが行
なわれる。 第1図C±この様なTFTアレイを有する
液晶表示装置の断面概略図であり、ここでS及びS′は
ガラス等の透明基板であり、l及び1′はゲート電極で
あり、2及び2′は絶縁層であり、3及び3′は半導体
層であり、4及び4′はソース電極であり、5及び5′
はドレイン電極であり、6は絶縁及び配向層であり、7
は液晶であり、8は透明電極である。
Electrodes are uniformly formed on the surface of one of the two substrates, and a plurality of electrode cars of small block patterns (pixels) having appropriate shapes are formed on the upper surface of the other substrate. In recent years, a TFT array for switching each pixel has been attached to the surface of the substrate on the pixel electrode side. FIG. 1 C± is a schematic cross-sectional view of a liquid crystal display device having such a TFT array, where S and S' are transparent substrates such as glass, l and 1' are gate electrodes, and 2 and 2 ' is an insulating layer, 3 and 3' are semiconductor layers, 4 and 4' are source electrodes, and 5 and 5'
is a drain electrode, 6 is an insulating and alignment layer, and 7 is a drain electrode.
is a liquid crystal, and 8 is a transparent electrode.

半導体として光導電性を有するものが用1.Nられる場
合には、できるだけ光をあてない様にしてスイッチング
特性の安定化をはかるのが好ましl、N。
1. A semiconductor with photoconductivity is used. If N is used, it is preferable to stabilize the switching characteristics by avoiding exposure to light as much as possible.

このため、第2図に断面概略図で示される様な液晶表示
装置が用いられる。 即ち、ここで【土、第1図に示さ
れる装置においてTFTアレイを覆っている絶縁及び配
向R6の上に更に半導体層に対応する位置に遮光層9及
び9′が形成されている。 遮光層には一般に金属が用
いられる。
For this purpose, a liquid crystal display device as shown in a schematic cross-sectional view in FIG. 2 is used. That is, in the device shown in FIG. 1, light shielding layers 9 and 9' are further formed at positions corresponding to the semiconductor layers on the insulation and orientation R6 covering the TFT array. Metal is generally used for the light shielding layer.

以上の如き液晶表示装置において、絶縁層としては従来
無機材料たとえばアルミナ、酸化チタン等の金属酸化物
、窒化シリコン、二酸化シリコン等のシリコン化合物が
用いられていた。 しかしながら、TPTを覆うために
はある程度以上の膜厚が必要であり、これら無機材料の
薄膜は膜厚が厚くなると膜歪みが大きくなってクラ・ン
ク等が入り易いという欠点があった。 この様なりラッ
クが生ずると、同時にTPTも破壊されてしまうためT
PTの保護が行われず、特性の悪化をまねいてしまう。
In the above liquid crystal display devices, inorganic materials such as alumina, metal oxides such as titanium oxide, and silicon compounds such as silicon nitride and silicon dioxide have conventionally been used as the insulating layer. However, in order to cover the TPT, a certain level of film thickness is required, and these thin films of inorganic materials have the disadvantage that as the film thickness increases, film distortion increases and cracks and the like are likely to occur. If a rack occurs like this, the TPT will also be destroyed at the same time, so the T
PT is not protected, resulting in deterioration of characteristics.

 そこで無機材料の代わりにクラックの生じない有機材
料たとえばシリコン樹脂、アクリル樹脂、環化ポリイソ
プレン等を絶縁層として用いることが提案されている。
Therefore, it has been proposed to use organic materials that do not cause cracks, such as silicone resin, acrylic resin, cyclized polyisoprene, etc., as the insulating layer instead of inorganic materials.

 ところが、これら有機材料の薄膜からなる絶縁層は保
護層としての性能が十分ではなくTPT特性が不安定に
なるという欠点があった。
However, the insulating layer made of a thin film of these organic materials does not have sufficient performance as a protective layer and has the disadvantage that the TPT characteristics become unstable.

[本発明の目的] 本発明は、以上の如き従来技術に鑑み、TPTの絶縁層
が長期にわたって十分満足できる性能を発揮し得る、改
良された電気的回路基板を提供することを目的とする。
[Object of the present invention] In view of the above-mentioned prior art, an object of the present invention is to provide an improved electrical circuit board in which a TPT insulating layer can exhibit sufficiently satisfactory performance over a long period of time.

し本発明の実施例] 第3図は本発明電気的回路基板の好適な一実施例を示す
断面概略図である。 図において電気的回路基板は液晶
表示装置の構成要素として用いられている。
Embodiment of the present invention] FIG. 3 is a schematic cross-sectional view showing a preferred embodiment of the electrical circuit board of the present invention. In the figure, an electrical circuit board is used as a component of a liquid crystal display device.

TPTを構成する半導体層3及び3′としてはたとえば
Si、CdS、CdSe、CdTe、Te等が用いられ
、特に非晶質、多結晶又は微品質のStが好適に用いら
れる。 非晶質StはH原子又はハロゲン原子(特にF
原子)を含むことができる。 H原子又は/\ロゲン原
子はそれぞれ単独で含まれてもよいし双方が含まれても
よい。
For example, Si, CdS, CdSe, CdTe, Te, etc. are used as the semiconductor layers 3 and 3' constituting the TPT, and amorphous, polycrystalline, or fine-quality St is particularly preferably used. Amorphous St contains H atoms or halogen atoms (especially F
atoms). The H atom or the /\rogen atom may be contained alone or both may be contained.

その含有量は好ましくは全体で0.01〜40原子%、
より好ましくは0.01〜30原子%である。
The content is preferably 0.01 to 40 at% in total,
More preferably, it is 0.01 to 30 at%.

この実施例においては、TFTアレイを覆っている絶縁
層が2層(即ち6a及び6b)からなる。
In this embodiment, the insulating layer covering the TFT array consists of two layers (ie 6a and 6b).

6aは無機絶縁層であり、金属酸化物たとえば酸化チタ
ン、アルミナ、又はシリコン化合物たとえば二酸化シリ
コン、窒化シリコン等の無機材料を用いて蒸着法、スパ
ッタ法、CVD法等により形成することができる。 無
機絶縁層の層厚はすくなくともTPTのチャネル部分を
保護する程度であるのが良く、好ましくは500〜30
00A程度である。
Reference numeral 6a is an inorganic insulating layer, which can be formed using an inorganic material such as a metal oxide such as titanium oxide or alumina, or a silicon compound such as silicon dioxide or silicon nitride by a vapor deposition method, a sputtering method, a CVD method, or the like. The thickness of the inorganic insulating layer should be at least enough to protect the channel portion of the TPT, and preferably 500 to 30 mm.
It is about 00A.

6bは有機絶縁層である。 有機絶縁層を形成する材料
としては熱硬化性樹脂、熱可塑性樹脂あるいは合成ゴム
系樹脂が好適に用いられるが、実質的に完全硬化させる
ことが可能であり、モの状態において実質的に可視光に
対して透明な材料で且つ配向処理が可能である材料であ
ればよい。
6b is an organic insulating layer. Thermosetting resins, thermoplastic resins, or synthetic rubber-based resins are preferably used as materials for forming the organic insulating layer, but they can be substantially completely cured, and in this state they are substantially transparent to visible light. Any material may be used as long as it is transparent and can be subjected to alignment treatment.

熱硬化性樹脂としてはたとえばフェノール樹脂、ポリエ
ステル樹脂、シリコン樹脂、アクリル樹脂、ウレタン樹
脂等をあげることができる。 これらの熱硬化性樹脂中
には必要に応じて架橋剤。
Examples of the thermosetting resin include phenol resin, polyester resin, silicone resin, acrylic resin, and urethane resin. A crosslinking agent is added to these thermosetting resins as necessary.

重合剤、増感剤等を添加してもよい。 熱可塑性樹脂と
してはたとえばポリカーボネート、ポリエチレン、ポリ
スチレン等をあげることができる。
A polymerizing agent, a sensitizer, etc. may be added. Examples of thermoplastic resins include polycarbonate, polyethylene, and polystyrene.

この場合も必要に応じて安定剤等を添加してもよい。 
合成ゴム系樹脂としてはたとえば環化ポリイソプレン、
環化ポリブタジェン等をあげることができる。 この場
合も必要に応じて架橋剤、増感剤等を訟加してもよい。
Also in this case, a stabilizer or the like may be added if necessary.
Examples of synthetic rubber resins include cyclized polyisoprene,
Examples include cyclized polybutadiene. Also in this case, a crosslinking agent, a sensitizer, etc. may be added as necessary.

有機絶縁層はたとえば熱硬化性樹脂あるいは合成ゴム系
樹脂を溶剤に溶解した後に前記の無機絶縁層上に塗布し
、加熱や紫外線、放射線等の電磁波の照射を単独で又は
これらを併用して樹脂を架橋、重合、硬化させることに
より形成される。
The organic insulating layer is formed by dissolving a thermosetting resin or a synthetic rubber resin in a solvent and then coating it on the inorganic insulating layer, and applying heat or irradiation of electromagnetic waves such as ultraviolet rays or radiation to the resin either alone or in combination. It is formed by crosslinking, polymerizing, and curing.

熱可塑性樹脂を用いた場合には、たとえば該樹脂に熱を
加えて溶融して前記無機絶縁層上に塗布した後に冷却、
硬化させることにより有機絶縁層が形成される。 有機
絶縁層の層厚は1、無機絶縁層の層厚とも関係するが、
好ましくは500〜3000人とされる。 尚、無機絶
縁層と有機絶縁層の層厚の和はあまり大きな値であると
表示に悪影響を及ぼすこともあるので適当な層厚に決定
される。 加熱温度はTPTを構成する半導体層に非晶
質Stを用い4た場合には300°C以下の温度とする
ことが好ましい。 これは、300°C以上の温度にな
ると非晶質St層が熱的な影響を受けてTPTの特性が
変化したり悪化したりする場合もあり得るからである。
When a thermoplastic resin is used, for example, the resin is heated to melt and coated on the inorganic insulating layer, and then cooled.
An organic insulating layer is formed by curing. The thickness of the organic insulating layer is 1, which is also related to the thickness of the inorganic insulating layer,
Preferably, the number is 500 to 3000 people. Note that if the sum of the layer thicknesses of the inorganic insulating layer and the organic insulating layer is too large, it may adversely affect the display, so the layer thickness is determined to be an appropriate layer thickness. The heating temperature is preferably 300° C. or lower when amorphous St is used for the semiconductor layer constituting the TPT. This is because when the temperature reaches 300° C. or higher, the amorphous St layer may be thermally affected and the characteristics of TPT may change or deteriorate.

遮光層9及び9′はAt等の金属を蒸着法等によって有
機絶縁層上に形成した後に、その金属層をフォトリソエ
ツチング等により所望の形状及び大きさに残すことによ
り形成される。
The light shielding layers 9 and 9' are formed by forming a metal such as At on the organic insulating layer by vapor deposition or the like, and then leaving the metal layer in a desired shape and size by photolithography or the like.

以上においては本発明電気的回路基板が液晶表示装置の
構成要素として利用されている例を示したが、本発明の
電気的回路基板はその他EL又はEC等の表示装置、更
にはその他の装置の構成要素として利用することができ
る。
In the above, an example has been shown in which the electrical circuit board of the present invention is used as a component of a liquid crystal display device, but the electrical circuit board of the present invention can be used in other display devices such as EL or EC, and furthermore, in other devices. It can be used as a component.

以下に本発明の実施例を示す。Examples of the present invention are shown below.

実施例1: TFTアレイを形成した基板表面上に更にプラズマCV
D法を用いて窒化シリコン層(2000人厚)人厚成し
た。 次に、この窒化シリコン層上にキシレンに溶解し
た環化ポリイソプレン系レジスト(東京応化社製 0D
UR−110WR:18cp)を300Orpmでスピ
ンナー塗tar L高圧水銀灯で2秒間硬化させ更に1
50’0で20分間ベーキングを行った。 その結果、
約1gm厚の無色透明な有機絶縁層が形成された。 更
にその上に金属アルミニウムを蒸着し所要部分以外をエ
ツチングにより除去して遮光層を形成した。
Example 1: Plasma CV was further applied on the surface of the substrate on which the TFT array was formed.
A silicon nitride layer (2000 layers thick) was formed using the D method. Next, on this silicon nitride layer, a cyclized polyisoprene resist (0D manufactured by Tokyo Ohka Co., Ltd.) dissolved in xylene was applied.
UR-110WR: 18 cp) was cured for 2 seconds with a spinner coating tar L high pressure mercury lamp at 300 rpm, and then
Baking was performed at 50'0 for 20 minutes. the result,
A colorless and transparent organic insulating layer with a thickness of about 1 gm was formed. Furthermore, metallic aluminum was deposited on top of the layer and removed by etching other than the required portions to form a light-shielding layer.

続いてその上から配向処理を行った後に1通常の工程を
経て液晶表示装置を作製した。
Subsequently, an alignment treatment was performed thereon, followed by one normal process to produce a liquid crystal display device.

かくして得られた液晶表示装置を高温多湿雰囲気(90
’0190%RH)中で1000時間連続動作させたと
ころ、動作中良好な表示特性を示した。
The thus obtained liquid crystal display device was placed in a high temperature and humid atmosphere (90℃
When the display was operated continuously for 1000 hours at 190% RH, it exhibited good display characteristics during operation.

実施例2: TFTアレイを形成した基板表面上にスパッタ法を用い
て二酸化シリコンfi(3000人厚)全形成した。 
次にこの基板をウレタン樹脂(東亜ペイント社製デルボ
MAX)のlO重景%トルエン溶液に浸漬し100mI
l/分で引き上げた後50°Cの温度雰囲気中で20分
間乾燥させた。 続いて、高圧水銀灯を40分間照射し
てウレタン樹脂を硬化させた。 その結果、約1.5p
m厚の無色透明な有機絶縁層が形成された。 更に、そ
の上に金属アルミニウムを蒸着し所要部分以外をエツチ
ングにより除去して遮光層を形成した。
Example 2: On the surface of the substrate on which the TFT array was formed, silicon dioxide fi (3000 wafer thickness) was entirely formed using a sputtering method.
Next, this substrate was immersed in a 10% toluene solution of urethane resin (Delvo MAX manufactured by Toa Paint Co., Ltd.) at 100 mI.
After being pulled up at a rate of 1/min, it was dried for 20 minutes in an atmosphere at a temperature of 50°C. Subsequently, the urethane resin was cured by irradiation with a high-pressure mercury lamp for 40 minutes. As a result, about 1.5p
A colorless and transparent organic insulating layer having a thickness of m was formed. Furthermore, metallic aluminum was deposited on top of the layer and removed by etching to form a light-shielding layer.

その上から配向処理を行なった後に、通常の工程を経て
液晶表示装置を作製した。
After performing alignment treatment thereon, a liquid crystal display device was produced through normal steps.

かくして得られた液晶表示装置において実施例1と同様
の特性評価を行ったところ、実施例1と同様に良好な表
示特性を示した。
When the characteristics of the thus obtained liquid crystal display device were evaluated in the same manner as in Example 1, it showed good display characteristics as in Example 1.

[本発明の効果] 以上の如き本発明によれば、無機絶縁層」二に更に有機
絶縁層を形成することによって、無機絶縁層によりTP
Tの保護及び特性の安定化が実現されるとともに、従来
の無機絶縁層が有していた欠点であるクラックの発生が
生じても、有機絶縁層があるために、装置に与えられる
悪影響が防止されピンホールの発生はほぼ完全に防1F
できる。
[Effects of the present invention] According to the present invention as described above, by further forming an organic insulating layer on the inorganic insulating layer, TP
In addition to protecting the T and stabilizing its properties, even if cracks occur, which is a drawback of conventional inorganic insulating layers, the presence of the organic insulating layer prevents any negative effects on the device. The occurrence of pinholes is almost completely prevented.
can.

また、長期にわたって安定した性能を有する電気的回路
基板が提供される。
Furthermore, an electrical circuit board having stable performance over a long period of time is provided.

【図面の簡単な説明】[Brief explanation of drawings]

第1図及び第2図は従来の液晶表示装置の断面図であり
、第3図は本発明による電気的回路基板を用いた液晶表
示装置の断面図である。 l:ゲート電極 2:絶縁層 3:半導体層 4:ソース電極 5ニドレイン電極 6:絶縁層 6a:無機絶縁層 6b:有機絶縁層 7:液晶 8:透・明電極 9:遮光層 S二基板 第2輛 51 第3図 q′
1 and 2 are cross-sectional views of a conventional liquid crystal display device, and FIG. 3 is a cross-sectional view of a liquid crystal display device using an electric circuit board according to the present invention. l: Gate electrode 2: Insulating layer 3: Semiconductor layer 4: Source electrode 5 Nidrain electrode 6: Insulating layer 6a: Inorganic insulating layer 6b: Organic insulating layer 7: Liquid crystal 8: Transparent/bright electrode 9: Light shielding layer S second substrate 2 cars 51 Figure 3 q'

Claims (1)

【特許請求の範囲】[Claims] (1)基板表面上に薄膜トランジスタアレイを有する電
気的回路基板において、薄膜トランジスタアレイが無機
絶縁層に覆われており、該無機絶縁層が有機絶縁層に覆
われていることを特徴とする、電気的回路基板。
(1) An electrical circuit board having a thin film transistor array on the surface of the substrate, characterized in that the thin film transistor array is covered with an inorganic insulating layer, and the inorganic insulating layer is covered with an organic insulating layer. circuit board.
JP58124084A 1983-07-09 1983-07-09 Liquid crystal device Expired - Lifetime JPH0762743B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP58124084A JPH0762743B2 (en) 1983-07-09 1983-07-09 Liquid crystal device
US06/628,276 US4636038A (en) 1983-07-09 1984-07-06 Electric circuit member and liquid crystal display device using said member

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58124084A JPH0762743B2 (en) 1983-07-09 1983-07-09 Liquid crystal device

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP33493092A Division JP2622484B2 (en) 1992-11-24 1992-11-24 Electric circuit board and liquid crystal device using the same

Publications (2)

Publication Number Publication Date
JPS6017479A true JPS6017479A (en) 1985-01-29
JPH0762743B2 JPH0762743B2 (en) 1995-07-05

Family

ID=14876531

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58124084A Expired - Lifetime JPH0762743B2 (en) 1983-07-09 1983-07-09 Liquid crystal device

Country Status (1)

Country Link
JP (1) JPH0762743B2 (en)

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* Cited by examiner, † Cited by third party
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JPH01254629A (en) * 1988-04-05 1989-10-11 Shiseido Co Ltd Agent for raising consciousness level
JPH02137826A (en) * 1988-11-18 1990-05-28 Sharp Corp Active matrix substrate
US5874326A (en) * 1996-07-27 1999-02-23 Lg Electronics Inc. Method for fabricating thin film transistor
JP2004046209A (en) * 1997-08-21 2004-02-12 Seiko Epson Corp Display device
JP2004146388A (en) * 1997-08-21 2004-05-20 Seiko Epson Corp Method for forming organic semiconductor film, and method for manufacturing active matrix substrate
JP2004171007A (en) * 1997-08-21 2004-06-17 Seiko Epson Corp Active matrix substrate and display device
JP2004177972A (en) * 1997-08-21 2004-06-24 Seiko Epson Corp Active matrix substrate and display device
JP2004356108A (en) * 1997-08-21 2004-12-16 Seiko Epson Corp Organic electroluminescent device
US6885148B2 (en) 1997-08-21 2005-04-26 Seiko Epson Corporation Active matrix display device
US8310476B2 (en) 1997-07-02 2012-11-13 Seiko Epson Corporation Display apparatus

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Cited By (16)

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JPH01254628A (en) * 1988-04-05 1989-10-11 Shiseido Co Ltd Agent for depressing consciousness level
JPH01254629A (en) * 1988-04-05 1989-10-11 Shiseido Co Ltd Agent for raising consciousness level
JP2652552B2 (en) * 1988-04-05 1997-09-10 株式会社資生堂 Composition for inhalation administration to calm the consciousness level
JPH02137826A (en) * 1988-11-18 1990-05-28 Sharp Corp Active matrix substrate
US5874326A (en) * 1996-07-27 1999-02-23 Lg Electronics Inc. Method for fabricating thin film transistor
US8334858B2 (en) 1997-07-02 2012-12-18 Seiko Epson Corporation Display apparatus
US8310475B2 (en) 1997-07-02 2012-11-13 Seiko Epson Corporation Display apparatus
US8310476B2 (en) 1997-07-02 2012-11-13 Seiko Epson Corporation Display apparatus
JP2004177972A (en) * 1997-08-21 2004-06-24 Seiko Epson Corp Active matrix substrate and display device
JP2004356108A (en) * 1997-08-21 2004-12-16 Seiko Epson Corp Organic electroluminescent device
US6885148B2 (en) 1997-08-21 2005-04-26 Seiko Epson Corporation Active matrix display device
US7364939B2 (en) 1997-08-21 2008-04-29 Seiko Epson Corporation Active matrix display device
US8159124B2 (en) 1997-08-21 2012-04-17 Seiko Epson Corporation Active matrix display device
JP2004171007A (en) * 1997-08-21 2004-06-17 Seiko Epson Corp Active matrix substrate and display device
JP2004146388A (en) * 1997-08-21 2004-05-20 Seiko Epson Corp Method for forming organic semiconductor film, and method for manufacturing active matrix substrate
JP2004046209A (en) * 1997-08-21 2004-02-12 Seiko Epson Corp Display device

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