JPS60167416A - Processing apparatus - Google Patents

Processing apparatus

Info

Publication number
JPS60167416A
JPS60167416A JP2162984A JP2162984A JPS60167416A JP S60167416 A JPS60167416 A JP S60167416A JP 2162984 A JP2162984 A JP 2162984A JP 2162984 A JP2162984 A JP 2162984A JP S60167416 A JPS60167416 A JP S60167416A
Authority
JP
Japan
Prior art keywords
reaction
small holes
reaction gas
furnace
jig
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2162984A
Other languages
Japanese (ja)
Inventor
Hideo Sakai
秀男 坂井
Takeo Yoshimi
吉見 武夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP2162984A priority Critical patent/JPS60167416A/en
Publication of JPS60167416A publication Critical patent/JPS60167416A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02612Formation types
    • H01L21/02617Deposition types
    • H01L21/0262Reduction or decomposition of gaseous compounds, e.g. CVD
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02518Deposited layers
    • H01L21/02521Materials
    • H01L21/02524Group 14 semiconducting materials
    • H01L21/02532Silicon, silicon germanium, germanium

Abstract

PURPOSE:To increase a rate of effective processing part by accommodating a reaction box to which the reaction gas is supplied within a reaction furnace. CONSTITUTION:A wafer 15 as the processing object is held under the condition as being arranged standing on a jig 14. After a cover 5 is closed, a reaction box 3 accommodating the jig 14 is inserted and positioned within a reaction furnace 1. Thereafter, the inside of reaction furnace 1 is heated. When the inside the furnace is stabilized at the predetermined temperature, the reaction gas is supplied to the reaction box 3. The reaction gas supplied diffuses at the inside of cover 5 from the supply hole 12 and uniformly injected into the side of body 4 from many small holes 11 in the form of shower. Simultaneously, since the exhaustion path 9 is attracted by a negative pressure source like a vacuum pump, etc., the reaction gas injected from small holes 11 passes straight between the wafers 15 as the flow of layer in such a way as being absorbed into small holes 7 of the bottom plate 6. The reaction gas absorbed by the small holes 7 for absorption is collected to the exhaustion hole 6 and is exhausted passing an exhaustion path 9.

Description

【発明の詳細な説明】 〔技術分野〕 本発明は、処理技術、特にCVD反応を利用して被処理
物を処理する技術に関し、たとえば、半導体装置の製造
l?:、おいて、ウェハに薄膜を形成するのに使用して
有効な技術に関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field] The present invention relates to a processing technology, particularly a technology for processing a workpiece using a CVD reaction, and relates to, for example, the manufacturing of semiconductor devices. , relates to techniques effective for use in forming thin films on wafers.

〔背景技術〕[Background technology]

半導体装置の製造において、ウエハ−ヒにポリシリコン
膜やナイトライド膜を形成するCVD装置として、反応
炉内で回転するサセプタ上にウェハを載せて均一な膜を
形成するようlこ構成されたものや、複数枚のウェハを
治具上に立てて並べ、治具を長い筒状の反応炉に収容し
てバッチ処理するように構成されたもの、が考えられる
A CVD device that forms polysilicon films or nitride films on wafers in the manufacture of semiconductor devices, and is configured to place the wafer on a susceptor that rotates in a reactor to form a uniform film. Another conceivable method is one in which a plurality of wafers are arranged vertically on a jig, and the jig is housed in a long cylindrical reactor for batch processing.

しかし、かかるCVD装置においては、ウェハ処理部分
が反応炉の大きさに比べて少なく、装置床面積が大きく
なるという問題点があることが、本発明者によって明ら
かにされた。
However, the present inventor has found that such a CVD apparatus has a problem in that the wafer processing portion is small compared to the size of the reactor, and the apparatus floor area becomes large.

〔発明の目的〕[Purpose of the invention]

本発明の目的は、有効処理部分の割合を大きくすること
ができる処理技術を提供することにある。
An object of the present invention is to provide a processing technique that can increase the ratio of effective processing portions.

本発明の前記ならびにその他の目的と新規な特徴は、本
明細書の記述および添付図面から明らかになるであろう
The above and other objects and novel features of the present invention will become apparent from the description of this specification and the accompanying drawings.

〔発明の概要〕[Summary of the invention]

本願において開示される発明のうち代表的なものの概要
を簡単に説明すれば、次の通りである。
A brief overview of typical inventions disclosed in this application is as follows.

すなわち、反応ガスが流される反応ボックスを反応炉に
収容することlこより、反応ボックス内で反応処理が効
果的に行われるようにしたものである。
That is, by housing a reaction box into which a reaction gas is flowed in a reaction furnace, reaction processing is effectively performed within the reaction box.

〔実施例〕〔Example〕

第1図は本発明の一実施例である(4D装置を示す縦断
面図、第2図は第1図■−■線に沿う断面図、第3図は
反応ボックスの斜視図である。
FIG. 1 shows an embodiment of the present invention (a longitudinal cross-sectional view showing a 4D apparatus, FIG. 2 is a cross-sectional view taken along the line ■--■ in FIG. 1, and FIG. 3 is a perspective view of a reaction box.

本実施例において、このCVD装置は反応炉1を備えて
おり、反応炉1は石英ガラスによりほぼ円筒形状に形成
されている。反応炉1の一端面は後記の反応ボックスを
出し入れし得るように開閉自在に構成されており、反応
炉1の外部にはヒータ2が外周に近接されて設備されて
いる。反応炉l内に収容される反応ボックス3はいずれ
も石英ガラスで形成された本体4と蓋体5とから構成さ
れている。本体4は上面が開放されたほぼ直方体の箱形
状に形成されており、本体4の底部には底板6が適当な
間隔を置いて敷設され、底板6には吸込口としての多数
の小孔7が穿設されている。
In this embodiment, this CVD apparatus is equipped with a reaction furnace 1, and the reaction furnace 1 is formed of quartz glass into a substantially cylindrical shape. One end surface of the reactor 1 is configured to be openable and closable so that a reaction box (to be described later) can be taken in and taken out, and a heater 2 is installed outside the reactor 1 close to the outer periphery. The reaction box 3 housed in the reactor l is composed of a main body 4 and a lid 5 both made of quartz glass. The main body 4 is formed in the shape of a substantially rectangular parallelepiped box with an open top surface, and a bottom plate 6 is placed on the bottom of the main body 4 at appropriate intervals, and the bottom plate 6 has a large number of small holes 7 as suction ports. is drilled.

本体4の底壁の中央部には排出口8が開設されており、
排出口8には排出路9が接続されている。
A discharge port 8 is provided in the center of the bottom wall of the main body 4.
A discharge path 9 is connected to the discharge port 8 .

蓋体5は本体4の上面開口を閉塞し得る中空のほぼ平盤
形状に形成されており、蓋体5の下部壁10には吹出口
としての多数の小孔11が穿設されている。蓋体5の上
部壁の中央部には供給口12が開設されており、吹出口
12には供給路13が接続されている。
The lid 5 is formed into a hollow, substantially flat plate shape capable of closing the upper opening of the main body 4, and a lower wall 10 of the lid 5 is provided with a number of small holes 11 as air outlets. A supply port 12 is provided in the center of the upper wall of the lid 5, and a supply path 13 is connected to the outlet 12.

反応ボックス3はその内部に石英ガラスで形成された治
具14を収容し得るように構成されており、治具14は
複数枚のウェハ15を平行に立てて並べ保持し得るよう
に構成されている。
The reaction box 3 is configured to accommodate therein a jig 14 made of quartz glass, and the jig 14 is configured to hold a plurality of wafers 15 in parallel. There is.

次に使用方法および作用を説明する。Next, the method of use and effect will be explained.

被処理物としてのウェハ15は治具14に立てて並べら
れた状態で保持される。この治具14は、反応ボックス
3の本体4の内部に蓋体5が開けられた上面開口から収
容される。治具14を収容した反応ボックス3は蓋体5
を閉じた後、反応炉1の内部に挿入され位置決めされる
Wafers 15 as objects to be processed are held on a jig 14 in an upright and lined-up state. This jig 14 is housed inside the main body 4 of the reaction box 3 through the top opening of the lid 5 . The reaction box 3 containing the jig 14 has a lid 5
After closing, it is inserted and positioned inside the reactor 1.

続いて、ヒータ21こより反応炉1内が加熱され、炉内
が所定温度に安定すると、供給路13からモノシラン(
SiH4)や四塩化シリコン(SiC^)等の反応ガス
が反応ボックス3の内部に供給される。供給された反応
ガスは、供給口12から蓋体5の内部に拡散し、多数の
小孔11から本体4の内部にシャワーのように均一に吹
き出される。同時に、排出路9が真空ポンプ等の負圧源
ζこより吸引されるため、小孔11から吹き出された反
応ガスは対向する底板6の小孔7に吹い込まれるように
層流状態となって各ウェハ15間を通って直進する。吸
込用小孔7から吸い込まれた反応ガスは排出口6に集合
され排出路9を通って排出される。
Next, the inside of the reactor 1 is heated by the heater 21, and when the inside of the furnace is stabilized at a predetermined temperature, monosilane (
A reaction gas such as SiH4) or silicon tetrachloride (SiC^) is supplied into the reaction box 3. The supplied reaction gas is diffused into the interior of the lid body 5 through the supply port 12 and uniformly blown out into the interior of the main body 4 through the numerous small holes 11 like a shower. At the same time, since the exhaust passage 9 is sucked from a negative pressure source ζ such as a vacuum pump, the reaction gas blown out from the small hole 11 becomes a laminar flow state so that it is blown into the small hole 7 of the opposing bottom plate 6. It passes between each wafer 15 and advances straight. The reaction gas sucked through the small suction hole 7 is collected at the discharge port 6 and discharged through the discharge passage 9.

反応ガスが層流状態でウェハ15の表面に沿って流れる
間に、ウェハ15の表面にCVD膜が形成されて行くが
、反応ガスが各ウエノ1に均等に供給されるため、CV
D膜は膜厚、膜質ともに均一になり、また、同一ウェハ
における膜厚、膜質も殆ど均一になる。
While the reactive gas flows along the surface of the wafer 15 in a laminar flow state, a CVD film is formed on the surface of the wafer 15, but since the reactive gas is evenly supplied to each wafer 1, the CVD film is
The film D has a uniform thickness and quality, and the thickness and quality of the film on the same wafer are also almost uniform.

〔効 果〕〔effect〕

(1) 複数の被処理物を収容した反応ボックスを反応
炉lこ置き、反応ガスを反応ボックス内に流すようにし
たことにより、反応を反応ボックス内に限定させて起さ
せることができるため、炉内の不必要な部分を減少させ
ることによって炉内における有効部分の割合を増加させ
ることができ、床面積を減少させることができる。
(1) By placing a reaction box containing a plurality of objects to be treated in a reactor and allowing the reaction gas to flow into the reaction box, the reaction can be caused to occur only within the reaction box. By reducing unnecessary parts in the furnace, the proportion of useful parts in the furnace can be increased and the floor space can be reduced.

(2) 反応ボックス内において反応ガスを多数の小孔
からなる吹出口から多数の小孔からなる吸込口に向けて
流すことにより、反応ガスが均一かつ層流状態で被処理
物に供給されるため、処理状態が全体的に均一化され、
処理の質を向上させることができる。
(2) By flowing the reaction gas from the outlet made of many small holes toward the suction port made of many small holes in the reaction box, the reaction gas is supplied to the object to be processed in a uniform and laminar flow state. As a result, the processing conditions are uniform throughout, and
The quality of processing can be improved.

(3] 反応ボックスを石英ガラスで形成することによ
り、反応ボックスから不純物が発生することを防止でき
るため、処理への悪影響が回避できる。
(3) By forming the reaction box from quartz glass, it is possible to prevent impurities from being generated from the reaction box, thereby avoiding adverse effects on the process.

以上本発明者によってなされた発明を実施例に基づき具
体的に説明したが、本発明は前記実施例に限定されるも
のではなく、その要旨を逸脱しない範囲で種々変更可能
であることはいうまでもない。
Although the invention made by the present inventor has been specifically explained above based on Examples, it goes without saying that the present invention is not limited to the Examples and can be modified in various ways without departing from the gist thereof. Nor.

たとえば、反応ボックスの開閉構造および反応炉の出し
入れ構造は前記実施例に限定されない。
For example, the opening/closing structure of the reaction box and the structure for taking in and out of the reactor are not limited to the above embodiments.

吹出口、吹込口は多数の小孔で構成するに限らず、長孔
や網目等で構成してもよい。
The air outlet and the air inlet are not limited to being composed of a large number of small holes, but may be composed of elongated holes, a mesh, or the like.

〔利用分野〕[Application field]

以上の説明では主として本発明者によってなされた発明
をその背景となった利用分野であるCVD装置に適用し
た場合について説明したが、それに限定されるものでは
なく、たとえば、エピタキシャル装置や酸化炉等にも適
用できる。
In the above explanation, the invention made by the present inventor was mainly applied to a CVD apparatus, which is the background field of application. can also be applied.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を示す縦断面図、第2図は第
1図■−■線に沿う断面図、第3図は反応ボックスの斜
視図である。
FIG. 1 is a longitudinal cross-sectional view showing an embodiment of the present invention, FIG. 2 is a cross-sectional view taken along line 1--2 in FIG. 1, and FIG. 3 is a perspective view of a reaction box.

Claims (1)

【特許請求の範囲】 1、被処理物を複敗北べて保持する治具と、この治具を
収容し、反応ガスを一方向に流すように吹出口と吹込口
とが開設されている反応ボックスと、この反応ボックス
を収容する反応炉とを備えている処理装置。 2 反応ボックスが、石英ガラスで形成されていること
を特徴とする特許請求の範囲第1項記載の処理装置。 8、吹出口と吹込口とが、多数の小孔から構成されてい
ることを特徴とする特許請求の範囲第1項または第2項
記載の処理装置。
[Scope of Claims] 1. A reaction device that includes a jig for holding the object to be treated in multiple folds, and a blow-off port and a blow-in port for accommodating the jig and allowing the reaction gas to flow in one direction. A processing device comprising a box and a reactor containing the reaction box. 2. The processing apparatus according to claim 1, wherein the reaction box is made of quartz glass. 8. The processing device according to claim 1 or 2, wherein the blow-off port and the blow-in port are composed of a large number of small holes.
JP2162984A 1984-02-10 1984-02-10 Processing apparatus Pending JPS60167416A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2162984A JPS60167416A (en) 1984-02-10 1984-02-10 Processing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2162984A JPS60167416A (en) 1984-02-10 1984-02-10 Processing apparatus

Publications (1)

Publication Number Publication Date
JPS60167416A true JPS60167416A (en) 1985-08-30

Family

ID=12060353

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2162984A Pending JPS60167416A (en) 1984-02-10 1984-02-10 Processing apparatus

Country Status (1)

Country Link
JP (1) JPS60167416A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7980003B2 (en) * 2006-01-25 2011-07-19 Tokyo Electron Limited Heat processing apparatus and heat processing method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7980003B2 (en) * 2006-01-25 2011-07-19 Tokyo Electron Limited Heat processing apparatus and heat processing method

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