JPS60163375U - circuit check probe - Google Patents
circuit check probeInfo
- Publication number
- JPS60163375U JPS60163375U JP4964684U JP4964684U JPS60163375U JP S60163375 U JPS60163375 U JP S60163375U JP 4964684 U JP4964684 U JP 4964684U JP 4964684 U JP4964684 U JP 4964684U JP S60163375 U JPS60163375 U JP S60163375U
- Authority
- JP
- Japan
- Prior art keywords
- thin
- tip
- circuit check
- check probe
- walled
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
図面は本考案の一実施例を示し、第1図は平面図、第2
図は側面図、第゛3図は使用状態説明図である。
1・・・支持アーム部、2・・・プリント基板、3・・
・回路パターン、4・・・薄肉先端部、5・・・被測定
物、6・・・接触端、7・・・チップ電極、8・・・保
持部材、9・・・幹部、10・・・捻子、11・・・ハ
ンダ付は部、12・・・凹部。The drawings show one embodiment of the present invention, and the first figure is a plan view and the second figure is a plan view.
The figure is a side view, and FIG. 3 is an explanatory view of the state of use. 1...Support arm part, 2...Printed circuit board, 3...
・Circuit pattern, 4... Thin tip, 5... Measured object, 6... Contact end, 7... Chip electrode, 8... Holding member, 9... Trunk, 10...・Screw, 11...Soldered part, 12...Concave part.
Claims (1)
アーム部の一端部に薄肉先端部を形成し、該薄肉先端部
に被測定物に接触するチップ電極を着脱可能に導通連結
し、ざらに前記薄肉先端部を上下に変位可能としたこと
を特徴とす、 る回路チェックプローブ。 2 前記チップ電極を弾性を有する導電性金属材料にて
形成したものである実用新案登録請求の範囲第1項記載
の回路チェックプローブ。 3 前記支持アーム部と薄肉先端部を上下に変位させ、
この変位部に捻子を設け、該捻子の立退とともに前記薄
肉先端部を上下に変位可能たらしめたものである実用新
案登録請求の範囲第1項又は第2項記載の回路チェック
プローブ。[Claims for Utility Model Registration] 1. A thin tip is formed at one end of a conductive support arm that can be connected to a required pattern for checking, and a tip electrode that contacts the object to be measured can be attached and detached to the thin tip. 1. A circuit check probe, characterized in that the thin-walled tip portion is electrically connected to and can be roughly displaced up and down. 2. The circuit check probe according to claim 1, wherein the tip electrode is made of an elastic conductive metal material. 3 vertically displacing the support arm portion and the thin-walled tip portion;
The circuit check probe according to claim 1 or 2, wherein the displacement portion is provided with a screw, and the thin-walled tip portion can be vertically displaced as the screw is withdrawn.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4964684U JPS60163375U (en) | 1984-04-06 | 1984-04-06 | circuit check probe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4964684U JPS60163375U (en) | 1984-04-06 | 1984-04-06 | circuit check probe |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS60163375U true JPS60163375U (en) | 1985-10-30 |
Family
ID=30567041
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4964684U Pending JPS60163375U (en) | 1984-04-06 | 1984-04-06 | circuit check probe |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60163375U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6484729A (en) * | 1987-09-28 | 1989-03-30 | Tokyo Electron Ltd | Probing card |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS49135162A (en) * | 1973-05-02 | 1974-12-26 | ||
JPS52122480A (en) * | 1976-04-07 | 1977-10-14 | Hitachi Ltd | Probe head for probe card |
-
1984
- 1984-04-06 JP JP4964684U patent/JPS60163375U/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS49135162A (en) * | 1973-05-02 | 1974-12-26 | ||
JPS52122480A (en) * | 1976-04-07 | 1977-10-14 | Hitachi Ltd | Probe head for probe card |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6484729A (en) * | 1987-09-28 | 1989-03-30 | Tokyo Electron Ltd | Probing card |
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