JPS60142531A - 回路基板等の検査装置 - Google Patents

回路基板等の検査装置

Info

Publication number
JPS60142531A
JPS60142531A JP58250156A JP25015683A JPS60142531A JP S60142531 A JPS60142531 A JP S60142531A JP 58250156 A JP58250156 A JP 58250156A JP 25015683 A JP25015683 A JP 25015683A JP S60142531 A JPS60142531 A JP S60142531A
Authority
JP
Japan
Prior art keywords
contact
probe
contact probe
support plate
tip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58250156A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0249536B2 (OSRAM
Inventor
Ko Nakajima
中島　鋼
Katsutoshi Saida
斉田　勝利
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokowo Co Ltd
Original Assignee
Yokowo Mfg Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokowo Mfg Co Ltd filed Critical Yokowo Mfg Co Ltd
Priority to JP58250156A priority Critical patent/JPS60142531A/ja
Publication of JPS60142531A publication Critical patent/JPS60142531A/ja
Publication of JPH0249536B2 publication Critical patent/JPH0249536B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H10P74/00—

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP58250156A 1983-12-28 1983-12-28 回路基板等の検査装置 Granted JPS60142531A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58250156A JPS60142531A (ja) 1983-12-28 1983-12-28 回路基板等の検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58250156A JPS60142531A (ja) 1983-12-28 1983-12-28 回路基板等の検査装置

Publications (2)

Publication Number Publication Date
JPS60142531A true JPS60142531A (ja) 1985-07-27
JPH0249536B2 JPH0249536B2 (OSRAM) 1990-10-30

Family

ID=17203652

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58250156A Granted JPS60142531A (ja) 1983-12-28 1983-12-28 回路基板等の検査装置

Country Status (1)

Country Link
JP (1) JPS60142531A (OSRAM)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56148071A (en) * 1980-04-21 1981-11-17 Nippon Denshi Zairyo Kk Multiple needle type probe
JPS587835A (ja) * 1981-06-30 1983-01-17 インタ−ナシヨナル・ビジネス・マシ−ンズ・コ−ポレ−シヨン プロ−ブ・アツセンブリ−
JPS5880847A (ja) * 1981-11-02 1983-05-16 ジヨセフ・クバトロニツク マトリクス・テスト・ヘッド装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56148071A (en) * 1980-04-21 1981-11-17 Nippon Denshi Zairyo Kk Multiple needle type probe
JPS587835A (ja) * 1981-06-30 1983-01-17 インタ−ナシヨナル・ビジネス・マシ−ンズ・コ−ポレ−シヨン プロ−ブ・アツセンブリ−
JPS5880847A (ja) * 1981-11-02 1983-05-16 ジヨセフ・クバトロニツク マトリクス・テスト・ヘッド装置

Also Published As

Publication number Publication date
JPH0249536B2 (OSRAM) 1990-10-30

Similar Documents

Publication Publication Date Title
KR860000227B1 (ko) 소형회로 프로세싱 장치 및 이 장치에 사용하기 위한 매트릭스 테스트 헤드(matrix test head)
JP3124762B2 (ja) 検査治具
US20210123950A1 (en) Probe card for high frequency applications
US9940859B2 (en) Testing apparatus for testing display apparatus and method of testing the same
KR101164011B1 (ko) 프로브 카드
JP3849948B1 (ja) 基板検査用治具及び検査用プローブ
KR100540434B1 (ko) 접촉자
US4177425A (en) Multiple contact electrical test probe assembly
JPS587835A (ja) プロ−ブ・アツセンブリ−
JPH0731211B2 (ja) 回路試験用探針装置
EP2859361B1 (en) Probe card for an apparatus for testing electronic devices
JP2012181096A (ja) 接触子及び電気的接続装置
US11585832B2 (en) Probe card and probe module thereof
US6917212B2 (en) Test fixture for printed circuit board assembly
US5084672A (en) Multi-point probe assembly for testing electronic device
US6130547A (en) Test apparatus for printed circuit board and assembly kit therefor
JP4863466B2 (ja) 基板検査用治具の製造方法
JPH01143977A (ja) 印刷回路基板の電子検査装置用アダプタ
JP7511325B2 (ja) 垂直プローブと垂直プローブ用治具
US20060192264A1 (en) Contact assembly and socket for use with semiconductor packages
JPS60142531A (ja) 回路基板等の検査装置
US20050083071A1 (en) Electronic circuit assembly test apparatus
KR200406312Y1 (ko) 다양한 전기적 특성들 및 미세 테스트 포인트를 테스트하는모듈
CN217181009U (zh) 一种电路板一体式检测装置
EP2060922A1 (en) Microstructure testing head