JPS60139276U - プロ−ブカ−ド - Google Patents

プロ−ブカ−ド

Info

Publication number
JPS60139276U
JPS60139276U JP2657684U JP2657684U JPS60139276U JP S60139276 U JPS60139276 U JP S60139276U JP 2657684 U JP2657684 U JP 2657684U JP 2657684 U JP2657684 U JP 2657684U JP S60139276 U JPS60139276 U JP S60139276U
Authority
JP
Japan
Prior art keywords
probe card
inclined surface
central opening
probes
integrated circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2657684U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0432616Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
昌男 大久保
吉光　康良
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Electronic Materials Corp
Original Assignee
Japan Electronic Materials Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Electronic Materials Corp filed Critical Japan Electronic Materials Corp
Priority to JP2657684U priority Critical patent/JPS60139276U/ja
Publication of JPS60139276U publication Critical patent/JPS60139276U/ja
Application granted granted Critical
Publication of JPH0432616Y2 publication Critical patent/JPH0432616Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP2657684U 1984-02-24 1984-02-24 プロ−ブカ−ド Granted JPS60139276U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2657684U JPS60139276U (ja) 1984-02-24 1984-02-24 プロ−ブカ−ド

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2657684U JPS60139276U (ja) 1984-02-24 1984-02-24 プロ−ブカ−ド

Publications (2)

Publication Number Publication Date
JPS60139276U true JPS60139276U (ja) 1985-09-14
JPH0432616Y2 JPH0432616Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1992-08-05

Family

ID=30522710

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2657684U Granted JPS60139276U (ja) 1984-02-24 1984-02-24 プロ−ブカ−ド

Country Status (1)

Country Link
JP (1) JPS60139276U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0363932U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1987-10-13 1991-06-21
JP2013250145A (ja) * 2012-05-31 2013-12-12 Tokyo Cathode Laboratory Co Ltd プローブカード

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5574047U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1978-11-13 1980-05-21
JPS5853762A (ja) * 1981-09-28 1983-03-30 Seiichiro Sogo テストプロ−ブ組立体

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5574047U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1978-11-13 1980-05-21
JPS5853762A (ja) * 1981-09-28 1983-03-30 Seiichiro Sogo テストプロ−ブ組立体

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0363932U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1987-10-13 1991-06-21
JP2013250145A (ja) * 2012-05-31 2013-12-12 Tokyo Cathode Laboratory Co Ltd プローブカード
TWI572865B (zh) * 2012-05-31 2017-03-01 Ｓｖ探針私人有限公司 探針卡

Also Published As

Publication number Publication date
JPH0432616Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1992-08-05

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