JPS60139241U - Ionization vacuum gauge for charged particle analyzer - Google Patents

Ionization vacuum gauge for charged particle analyzer

Info

Publication number
JPS60139241U
JPS60139241U JP2706584U JP2706584U JPS60139241U JP S60139241 U JPS60139241 U JP S60139241U JP 2706584 U JP2706584 U JP 2706584U JP 2706584 U JP2706584 U JP 2706584U JP S60139241 U JPS60139241 U JP S60139241U
Authority
JP
Japan
Prior art keywords
charged particle
particle analyzer
ionization vacuum
vacuum gauge
ionization
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2706584U
Other languages
Japanese (ja)
Other versions
JPH0338669Y2 (en
Inventor
浩 竹内
好夫 北
Original Assignee
日本原子力研究所
株式会社東芝
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本原子力研究所, 株式会社東芝 filed Critical 日本原子力研究所
Priority to JP2706584U priority Critical patent/JPS60139241U/en
Publication of JPS60139241U publication Critical patent/JPS60139241U/en
Application granted granted Critical
Publication of JPH0338669Y2 publication Critical patent/JPH0338669Y2/ja
Granted legal-status Critical Current

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Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図及び第2図は従来の荷電粒子分析器の電離真空計
を示す概略構成図、第3図は本考案の実施例に係る荷電
粒子分析器の電離真空計を示す概 。 略構成図、第4図、第5図及び第6図は本考案め−他の
実施例に係る荷電粒子分析器の電離真空計を示す概略構
成図、第7図は第6図中の補助電極の讐〒″″’iw;
*ii、2−’I#X’!g+、10−00、容器、1
0a・・・開口部、10b・・・折曲部、11・・・フ
ィラメント、12・・・グリッド、13・・・コレツ 
    □夕、20.20’・・・第1の補助電極、2
1.24・・・直流電源、22・・・筒状部材、22a
・・・開口部、    −23,23’・・・第2の補
助電極。 1’、  1七tj 1.III■、Fji
1 and 2 are schematic configuration diagrams showing an ionization vacuum gauge of a conventional charged particle analyzer, and FIG. 3 is a schematic diagram showing an ionization vacuum gauge of a charged particle analyzer according to an embodiment of the present invention. 4, 5 and 6 are schematic configuration diagrams showing an ionization vacuum gauge of a charged particle analyzer according to another embodiment of the present invention, and FIG. 7 is an auxiliary diagram of FIG. 6. Enemy of the electrode〒″″'iw;
*ii, 2-'I#X'! g+, 10-00, container, 1
0a...Opening part, 10b...Bending part, 11...Filament, 12...Grid, 13...Korets
□Evening, 20.20'...First auxiliary electrode, 2
1.24... DC power supply, 22... Cylindrical member, 22a
...Aperture, -23,23'...Second auxiliary electrode. 1', 17tj 1. III■, Fji

Claims (1)

【実用新案登録請求の範囲】 1 真空系である荷電粒子分析器と連通ずる容器内に陰
極と陽極を収容し、この陰極と陽極で真空系内の気体分
子をイオン化してこれによって生ずる電離重環を測定し
、前記荷電粒子分析器内の真空度を求める荷電粒子分析
器の電離真空前記容器の真空系と連通ずる開口部に、前
記、     陰極に対して所定の電位をもつ補助電極
を配設5、シたことを特徴とする荷電粒子分析器の電離
真−空計。 2 実用新案登録請求の範囲第1項記載の電離真空計に
おいて、前記電離真空計は、熱電子を放出するフィラメ
ントと熱電子を引きだすグリッドとイオンを集めるコレ
クタとを前記容器内に”  収容して構成し−た荷電粒
子分析器の電離真空計。 3 実用新案登録請求の範囲第2項記載の電離真−空計
において、前記補助電極は前記フィラメントに対して、
正の電位をもつ荷電粒子分析器め電離真空計。    
゛ 4°実用新案登録請求の範囲第2項記載の電離真空計に
おいて、前記補助電極は前記フィラメントに対して正の
電位をもつ第1の電極と、前記フィラメントに対して負
の電位をもつ第2の電極とを具えた荷電粒子分析器の電
離真空計。
[Claim for Utility Model Registration] 1. A cathode and an anode are housed in a container that communicates with a charged particle analyzer that is a vacuum system, and the cathode and anode ionize gas molecules in the vacuum system to generate ionized particles. An auxiliary electrode having a predetermined potential with respect to the cathode is disposed at an opening communicating with the vacuum system of the ionization vacuum of the charged particle analyzer, which measures the ring and determines the degree of vacuum within the charged particle analyzer. Design 5. An ionization vacuum meter for a charged particle analyzer characterized by the following features: 2 Utility Model Registration Scope of Claim 1. The ionization vacuum gauge includes a filament that emits thermionic electrons, a grid that extracts thermionic electrons, and a collector that collects ions, which are housed in the container. An ionization vacuum gauge for a charged particle analyzer comprising: 3. In the ionization vacuum gauge according to claim 2 of the registered utility model claim, the auxiliary electrode is configured to
Charged particle analyzer or ionization vacuum gauge with positive potential.
゛4°Registration of Utility Model In the ionization vacuum gauge according to claim 2, the auxiliary electrode includes a first electrode having a positive potential with respect to the filament and a second electrode having a negative potential with respect to the filament. An ionization vacuum gauge for a charged particle analyzer, comprising two electrodes.
JP2706584U 1984-02-27 1984-02-27 Ionization vacuum gauge for charged particle analyzer Granted JPS60139241U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2706584U JPS60139241U (en) 1984-02-27 1984-02-27 Ionization vacuum gauge for charged particle analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2706584U JPS60139241U (en) 1984-02-27 1984-02-27 Ionization vacuum gauge for charged particle analyzer

Publications (2)

Publication Number Publication Date
JPS60139241U true JPS60139241U (en) 1985-09-14
JPH0338669Y2 JPH0338669Y2 (en) 1991-08-15

Family

ID=30523665

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2706584U Granted JPS60139241U (en) 1984-02-27 1984-02-27 Ionization vacuum gauge for charged particle analyzer

Country Status (1)

Country Link
JP (1) JPS60139241U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010511875A (en) * 2006-12-06 2010-04-15 インフィコン ゲゼルシャフト ミット ベシュレンクテル ハフツング Electron source for vacuum pressure measuring device
JP2013072695A (en) * 2011-09-27 2013-04-22 Ulvac Japan Ltd Hot cathode ionization vacuum gauge

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5255575A (en) * 1975-10-31 1977-05-07 Hitachi Ltd Vacuum degree measuring element for vacuum valve
JPS5258590A (en) * 1975-11-10 1977-05-14 Hitachi Ltd Ion number counter device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5255575A (en) * 1975-10-31 1977-05-07 Hitachi Ltd Vacuum degree measuring element for vacuum valve
JPS5258590A (en) * 1975-11-10 1977-05-14 Hitachi Ltd Ion number counter device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010511875A (en) * 2006-12-06 2010-04-15 インフィコン ゲゼルシャフト ミット ベシュレンクテル ハフツング Electron source for vacuum pressure measuring device
JP2013072695A (en) * 2011-09-27 2013-04-22 Ulvac Japan Ltd Hot cathode ionization vacuum gauge

Also Published As

Publication number Publication date
JPH0338669Y2 (en) 1991-08-15

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