JPS60113939A - ハンドリング装置 - Google Patents

ハンドリング装置

Info

Publication number
JPS60113939A
JPS60113939A JP22147583A JP22147583A JPS60113939A JP S60113939 A JPS60113939 A JP S60113939A JP 22147583 A JP22147583 A JP 22147583A JP 22147583 A JP22147583 A JP 22147583A JP S60113939 A JPS60113939 A JP S60113939A
Authority
JP
Japan
Prior art keywords
drum
devices
block
defective
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP22147583A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0248140B2 (enrdf_load_stackoverflow
Inventor
Naoto Kimura
直人 木村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Kyushu Ltd
Original Assignee
NEC Kyushu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Kyushu Ltd filed Critical NEC Kyushu Ltd
Priority to JP22147583A priority Critical patent/JPS60113939A/ja
Publication of JPS60113939A publication Critical patent/JPS60113939A/ja
Publication of JPH0248140B2 publication Critical patent/JPH0248140B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP22147583A 1983-11-25 1983-11-25 ハンドリング装置 Granted JPS60113939A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22147583A JPS60113939A (ja) 1983-11-25 1983-11-25 ハンドリング装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22147583A JPS60113939A (ja) 1983-11-25 1983-11-25 ハンドリング装置

Publications (2)

Publication Number Publication Date
JPS60113939A true JPS60113939A (ja) 1985-06-20
JPH0248140B2 JPH0248140B2 (enrdf_load_stackoverflow) 1990-10-24

Family

ID=16767295

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22147583A Granted JPS60113939A (ja) 1983-11-25 1983-11-25 ハンドリング装置

Country Status (1)

Country Link
JP (1) JPS60113939A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61236135A (ja) * 1985-04-12 1986-10-21 Internatl Rectifier Corp Japan Ltd 電子部品の検査装置
JPS62186814U (enrdf_load_stackoverflow) * 1986-05-19 1987-11-27

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5568649A (en) * 1978-11-20 1980-05-23 Hitachi Ltd Automatic sorter for diode pellet

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5568649A (en) * 1978-11-20 1980-05-23 Hitachi Ltd Automatic sorter for diode pellet

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61236135A (ja) * 1985-04-12 1986-10-21 Internatl Rectifier Corp Japan Ltd 電子部品の検査装置
JPS62186814U (enrdf_load_stackoverflow) * 1986-05-19 1987-11-27

Also Published As

Publication number Publication date
JPH0248140B2 (enrdf_load_stackoverflow) 1990-10-24

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