JPS60103638A - 半導体論理集積装置 - Google Patents

半導体論理集積装置

Info

Publication number
JPS60103638A
JPS60103638A JP21178283A JP21178283A JPS60103638A JP S60103638 A JPS60103638 A JP S60103638A JP 21178283 A JP21178283 A JP 21178283A JP 21178283 A JP21178283 A JP 21178283A JP S60103638 A JPS60103638 A JP S60103638A
Authority
JP
Japan
Prior art keywords
circuit section
circuit
oscillation
logic integrated
integrated device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP21178283A
Other languages
English (en)
Japanese (ja)
Other versions
JPS647507B2 (enrdf_load_html_response
Inventor
Masakazu Kaga
加賀　雅和
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP21178283A priority Critical patent/JPS60103638A/ja
Publication of JPS60103638A publication Critical patent/JPS60103638A/ja
Publication of JPS647507B2 publication Critical patent/JPS647507B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP21178283A 1983-11-11 1983-11-11 半導体論理集積装置 Granted JPS60103638A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21178283A JPS60103638A (ja) 1983-11-11 1983-11-11 半導体論理集積装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21178283A JPS60103638A (ja) 1983-11-11 1983-11-11 半導体論理集積装置

Publications (2)

Publication Number Publication Date
JPS60103638A true JPS60103638A (ja) 1985-06-07
JPS647507B2 JPS647507B2 (enrdf_load_html_response) 1989-02-09

Family

ID=16611506

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21178283A Granted JPS60103638A (ja) 1983-11-11 1983-11-11 半導体論理集積装置

Country Status (1)

Country Link
JP (1) JPS60103638A (enrdf_load_html_response)

Also Published As

Publication number Publication date
JPS647507B2 (enrdf_load_html_response) 1989-02-09

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