JPS5987742A - 荷電粒子用レンズ - Google Patents
荷電粒子用レンズInfo
- Publication number
- JPS5987742A JPS5987742A JP57197966A JP19796682A JPS5987742A JP S5987742 A JPS5987742 A JP S5987742A JP 57197966 A JP57197966 A JP 57197966A JP 19796682 A JP19796682 A JP 19796682A JP S5987742 A JPS5987742 A JP S5987742A
- Authority
- JP
- Japan
- Prior art keywords
- lens
- iris
- magnetic
- ion
- electrostatic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000002245 particle Substances 0.000 title claims description 5
- 238000004804 winding Methods 0.000 claims abstract description 5
- 239000002131 composite material Substances 0.000 claims 1
- 238000010884 ion-beam technique Methods 0.000 abstract description 11
- 238000010894 electron beam technology Methods 0.000 abstract description 8
- 150000002500 ions Chemical class 0.000 description 7
- 238000004458 analytical method Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 240000001548 Camellia japonica Species 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 235000018597 common camellia Nutrition 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 230000005389 magnetism Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000000682 scanning probe acoustic microscopy Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 238000012876 topography Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/10—Lenses
- H01J37/145—Combinations of electrostatic and magnetic lenses
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57197966A JPS5987742A (ja) | 1982-11-11 | 1982-11-11 | 荷電粒子用レンズ |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57197966A JPS5987742A (ja) | 1982-11-11 | 1982-11-11 | 荷電粒子用レンズ |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5987742A true JPS5987742A (ja) | 1984-05-21 |
JPH0332852B2 JPH0332852B2 (enrdf_load_stackoverflow) | 1991-05-15 |
Family
ID=16383280
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57197966A Granted JPS5987742A (ja) | 1982-11-11 | 1982-11-11 | 荷電粒子用レンズ |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5987742A (enrdf_load_stackoverflow) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS535962A (en) * | 1976-07-06 | 1978-01-19 | Matsushita Electric Ind Co Ltd | Electron microscope |
-
1982
- 1982-11-11 JP JP57197966A patent/JPS5987742A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS535962A (en) * | 1976-07-06 | 1978-01-19 | Matsushita Electric Ind Co Ltd | Electron microscope |
Also Published As
Publication number | Publication date |
---|---|
JPH0332852B2 (enrdf_load_stackoverflow) | 1991-05-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4215282B2 (ja) | 静電対物レンズ及び電気走査装置を装備したsem | |
US4912326A (en) | Direct imaging type SIMS instrument | |
JPH0624106B2 (ja) | 粒子線装置の静電磁気複合レンズ | |
JPS6290839A (ja) | イオンマイクロビ−ム装置 | |
JP2810797B2 (ja) | 反射電子顕微鏡 | |
US4810879A (en) | Charged particle energy analyzer | |
JP4527289B2 (ja) | オージェ電子の検出を含む粒子光学装置 | |
JPS5871545A (ja) | 可変成形ビ−ム電子光学系 | |
JPS61208736A (ja) | 走査粒子顕微鏡 | |
CN108807118A (zh) | 一种扫描电子显微镜系统及样品探测方法 | |
JPS63318052A (ja) | 直接的画像化式の単色光電子顕微鏡 | |
JP2001185066A (ja) | 電子線装置 | |
US2372422A (en) | Electron microanalyzer | |
JP2017517119A (ja) | 2重ウィーンフィルタ単色計を用いる電子ビーム画像化 | |
US2486856A (en) | Electron lens | |
JPS60232653A (ja) | 荷電粒子光学システム | |
JPH0636346B2 (ja) | 荷電粒子線装置及びこれによる試料観察方法 | |
JP2005353429A (ja) | 荷電粒子線色収差補正装置 | |
JPS5987742A (ja) | 荷電粒子用レンズ | |
JP3351647B2 (ja) | 走査電子顕微鏡 | |
US2243403A (en) | Magnetic objective for electron microscopes | |
US2418432A (en) | Magnetic electron lens system | |
US4468563A (en) | Electron lens | |
NL8801163A (nl) | Auger spectrometrie. | |
US3401261A (en) | Apparatus for investigating magnetic regions in thin material layers |