JPH0332852B2 - - Google Patents
Info
- Publication number
- JPH0332852B2 JPH0332852B2 JP57197966A JP19796682A JPH0332852B2 JP H0332852 B2 JPH0332852 B2 JP H0332852B2 JP 57197966 A JP57197966 A JP 57197966A JP 19796682 A JP19796682 A JP 19796682A JP H0332852 B2 JPH0332852 B2 JP H0332852B2
- Authority
- JP
- Japan
- Prior art keywords
- lens
- aperture
- magnetic
- sample
- electrostatic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/10—Lenses
- H01J37/145—Combinations of electrostatic and magnetic lenses
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57197966A JPS5987742A (ja) | 1982-11-11 | 1982-11-11 | 荷電粒子用レンズ |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57197966A JPS5987742A (ja) | 1982-11-11 | 1982-11-11 | 荷電粒子用レンズ |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5987742A JPS5987742A (ja) | 1984-05-21 |
JPH0332852B2 true JPH0332852B2 (enrdf_load_stackoverflow) | 1991-05-15 |
Family
ID=16383280
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57197966A Granted JPS5987742A (ja) | 1982-11-11 | 1982-11-11 | 荷電粒子用レンズ |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5987742A (enrdf_load_stackoverflow) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS535962A (en) * | 1976-07-06 | 1978-01-19 | Matsushita Electric Ind Co Ltd | Electron microscope |
-
1982
- 1982-11-11 JP JP57197966A patent/JPS5987742A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5987742A (ja) | 1984-05-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0769799B1 (en) | Scanning electron microscope | |
JP4215282B2 (ja) | 静電対物レンズ及び電気走査装置を装備したsem | |
US4912326A (en) | Direct imaging type SIMS instrument | |
JPS6213789B2 (enrdf_load_stackoverflow) | ||
JP5342728B2 (ja) | 走査電子顕微鏡の対物レンズを通した二次電子の捕集 | |
US5008537A (en) | Composite apparatus with secondary ion mass spectrometry instrument and scanning electron microscope | |
GB2217907A (en) | Direct imaging type sims instrument having tof mass spectrometer mode | |
US4810879A (en) | Charged particle energy analyzer | |
EP0293924B1 (en) | Direct imaging monochromatic electron microscope | |
JP4527289B2 (ja) | オージェ電子の検出を含む粒子光学装置 | |
JP2810797B2 (ja) | 反射電子顕微鏡 | |
US2372422A (en) | Electron microanalyzer | |
JPS5958749A (ja) | 複合対物および放射レンズ | |
EP0084850B1 (en) | Apparatus for irradiation with charged particle beams | |
JPS6180744A (ja) | イオンマイクロビ−ム装置 | |
JP2004513477A (ja) | 静電対物に調整可能な最終電極を設けたsem | |
JP2003504803A (ja) | ターゲット上への材料の蒸着とモニタリングとを同時に行なう方法及び装置 | |
JP2007519194A (ja) | 荷電粒子ビーム用の集束レンズ | |
JPS6334844A (ja) | 絶縁材料のイオン分析方法および装置 | |
JPH08148116A (ja) | 顕微レーザ飛行時間型質量分析計 | |
EP0617452B1 (en) | Charged particle analyser | |
US5920073A (en) | Optical system | |
JPH0332852B2 (enrdf_load_stackoverflow) | ||
JP3712559B2 (ja) | カソードレンズ | |
JP3730041B2 (ja) | 複合放出電子顕微鏡における放出電子加速方法 |