JPS5986243A - 電子素子マトリツクスの製造方法 - Google Patents

電子素子マトリツクスの製造方法

Info

Publication number
JPS5986243A
JPS5986243A JP58154222A JP15422283A JPS5986243A JP S5986243 A JPS5986243 A JP S5986243A JP 58154222 A JP58154222 A JP 58154222A JP 15422283 A JP15422283 A JP 15422283A JP S5986243 A JPS5986243 A JP S5986243A
Authority
JP
Japan
Prior art keywords
matrix
submatrices
electronic
manufacturing
row
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58154222A
Other languages
English (en)
Japanese (ja)
Inventor
ザ−ク・デイユシエン
ザ−ク・ラク−ル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Publication of JPS5986243A publication Critical patent/JPS5986243A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/006Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation at wafer scale level, i.e. wafer scale integration [WSI]

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)
JP58154222A 1982-08-25 1983-08-25 電子素子マトリツクスの製造方法 Pending JPS5986243A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8214582A FR2532512A1 (fr) 1982-08-25 1982-08-25 Procede de fabrication d'une matrice de composants electroniques
FR8214582 1982-08-25

Publications (1)

Publication Number Publication Date
JPS5986243A true JPS5986243A (ja) 1984-05-18

Family

ID=9277048

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58154222A Pending JPS5986243A (ja) 1982-08-25 1983-08-25 電子素子マトリツクスの製造方法

Country Status (5)

Country Link
EP (1) EP0102296B1 (en:Method)
JP (1) JPS5986243A (en:Method)
CA (1) CA1195783A (en:Method)
DE (1) DE3368128D1 (en:Method)
FR (1) FR2532512A1 (en:Method)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4733393A (en) * 1985-12-12 1988-03-22 Itt Corporation Test method and apparatus for cellular array processor chip
JPH04351972A (ja) * 1990-04-26 1992-12-07 Genrad Inc フラットパネルディスプレイ用制御マトリックスの試験方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3835530A (en) * 1967-06-05 1974-09-17 Texas Instruments Inc Method of making semiconductor devices
JPS4823385A (en:Method) * 1971-07-28 1973-03-26
DE2409280A1 (de) * 1974-02-27 1975-08-28 Grundig Emv Verfahren zur schnellen ueberpruefung und fehlereingrenzung an umfangreichen schaltungsanordnungen
US4191996A (en) * 1977-07-22 1980-03-04 Chesley Gilman D Self-configurable computer and memory system
DE2739952C2 (de) * 1977-09-05 1983-10-13 Computer Gesellschaft Konstanz Mbh, 7750 Konstanz Großintegrierter Halbleiter-Speicherbaustein in Form einer unzerteilten Halbleiterscheibe

Also Published As

Publication number Publication date
EP0102296A1 (fr) 1984-03-07
DE3368128D1 (en) 1987-01-15
EP0102296B1 (fr) 1986-12-03
FR2532512A1 (fr) 1984-03-02
FR2532512B1 (en:Method) 1985-02-08
CA1195783A (en) 1985-10-22

Similar Documents

Publication Publication Date Title
US4676761A (en) Process for producing a matrix of electronic components
US5475695A (en) Automatic failure analysis system
US4241307A (en) Module interconnection testing scheme
JPS6114539B2 (en:Method)
JPH055866A (ja) アクテイブマトリクス基板の検査方法
DE69330042D1 (de) Elektronische Steuerschaltungen für ein aktives Matrix-Bauelement und Verfahren zur Selbstprüfung und Programmierung solcher Schaltungen
JPS6259325B2 (en:Method)
CN114333580A (zh) 显示面板及显示装置
JPS5986243A (ja) 電子素子マトリツクスの製造方法
JP3470586B2 (ja) 表示用マトリクス基板の製造方法
JP4353171B2 (ja) 電子機器、光学パネル、検査プローブ、光学パネルの検査装置、光学パネルの検査方法
JPH027188B2 (en:Method)
JPH05341246A (ja) マトリクス型表示素子の製造方法
JP2583891B2 (ja) アクテイブマトリクス表示装置の製造方法
JP3031527B2 (ja) 液晶表示装置
CA1121045A (en) Selection method for a cid sensor matrix
CN115050295A (zh) 测试电路、测试方法及显示装置
JPH0614088B2 (ja) コネクタ検査方法
JPH0259727A (ja) アクティブマトリックス基板
JPS59119743A (ja) 集積回路の冗長構成方式
JP2002341377A (ja) 薄膜トランジスタアレイ基板
KR20070118461A (ko) 공용 프로브 장치
JP2882300B2 (ja) アクティブマトリクスパネルの製造方法
JPH09203759A (ja) 液晶表示装置検査方法、その装置および液晶表示装置
JP2723517B2 (ja) 検査用アクティブマトリクスアレー基板及びアクティブマトリクス表示装置の製造方法