JPS5986194A - Thin film electroluminescent element - Google Patents

Thin film electroluminescent element

Info

Publication number
JPS5986194A
JPS5986194A JP57196522A JP19652282A JPS5986194A JP S5986194 A JPS5986194 A JP S5986194A JP 57196522 A JP57196522 A JP 57196522A JP 19652282 A JP19652282 A JP 19652282A JP S5986194 A JPS5986194 A JP S5986194A
Authority
JP
Japan
Prior art keywords
thin film
transparent
substrate
insulating layer
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57196522A
Other languages
Japanese (ja)
Inventor
武志 長廻
友司 正治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Noritake Itron Corp
Original Assignee
Ise Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ise Electronics Corp filed Critical Ise Electronics Corp
Priority to JP57196522A priority Critical patent/JPS5986194A/en
Publication of JPS5986194A publication Critical patent/JPS5986194A/en
Pending legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 本発明は透明な絶縁基板の一面に発光層および電極層な
らびに絶縁層を含む多数の薄膜を積層してなる薄膜エレ
クトロルミネッセンス素子に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a thin film electroluminescent device formed by laminating a large number of thin films including a light emitting layer, an electrode layer and an insulating layer on one surface of a transparent insulating substrate.

従来この種の薄膜エレクトロルミネッセンス素子は、一
般に透明な絶縁基板としてのガラス基板上に11次、透
明電極、絶縁層9発光層、絶縁層。
Conventionally, this type of thin film electroluminescent device generally has 11 layers, a transparent electrode, an insulating layer, 9 light-emitting layers, and an insulating layer on a glass substrate as a transparent insulating substrate.

背面電極を積層した基本構成を有する。発光層としては
、通常発光中心としてマンガンや7ツ化テルビウムを添
加した硫化亜鉛膜が用いられ、膜形成後、結晶化と発光
中心の活性化のために熱処理が施される。
It has a basic configuration of laminated back electrodes. A zinc sulfide film doped with manganese or terbium heptadide as a luminescent center is usually used as the luminescent layer, and after the film is formed, heat treatment is performed for crystallization and activation of the luminescent center.

このようにして得られた薄膜エレクトロルミネッセンス
素子の輝度は、上記熱処理時の温度に強く依存し、第1
図に示すように温度が高いほど高い輝度が得られる。(
第1図は100Hz、50μBの交流パルスを印加した
場合の測定結果を示す。)ところが上記温度は、熱によ
るガラス基板の反りの発生の為に制限を受ける。例えば
、薄膜エレクトロルミネッセンス素子用ガラス基板とし
て通常用いられるコーニング社のす7o59ガラス基板
においては最高熱処理温度は590’Cであシ、こ繰上
の温度になると反りが発生してエレクトロルミネッセン
ス素子としての品位と性能が低下する。
The brightness of the thin film electroluminescent device obtained in this way strongly depends on the temperature during the heat treatment, and
As shown in the figure, the higher the temperature, the higher the brightness. (
FIG. 1 shows the measurement results when an AC pulse of 100 Hz and 50 μB was applied. ) However, the above temperature is limited because the glass substrate warps due to heat. For example, the maximum heat treatment temperature for Corning's S7O59 glass substrate, which is commonly used as a glass substrate for thin-film electroluminescent devices, is 590'C, and at higher temperatures, warping occurs and the quality of the electroluminescent device is compromised. and performance deteriorates.

本発明はこのような事情に鑑みてなされたもので、その
目的は基板の反シの発生を抑えて熱処理温度を上げ、高
い輝度を得ることが可能な薄膜エレクトロルミネッセン
ス素子を提供することにある。
The present invention was made in view of the above circumstances, and its purpose is to provide a thin film electroluminescent element that can suppress the occurrence of scratches on the substrate, increase the heat treatment temperature, and obtain high brightness. .

このような目的を達成するために、本発明は、基板の他
面に1−面に形成された多層膜のうち少なくとも透明電
極を介して上記基板上に形成された絶縁層が基板に与え
る応力とほぼ同一の応力を有する透明薄膜を被着形成し
たものである。
In order to achieve such an object, the present invention aims to reduce the stress exerted on the substrate by an insulating layer formed on the substrate through at least a transparent electrode of a multilayer film formed on one side of the other surface of the substrate. A transparent thin film having approximately the same stress as that is deposited.

すなわち、上述したようなガラス基板の反ルは、主とし
て、真空蒸着やスパッタリングによシ形成された各薄膜
、特に、透明電極を介してガラス基板上に形成された窒
化シリコン膜や酸化アルミニウム膜からなる絶縁層に起
因することが判明した。
In other words, the above-mentioned warping of the glass substrate is mainly caused by thin films formed by vacuum evaporation or sputtering, especially silicon nitride films and aluminum oxide films formed on the glass substrate via transparent electrodes. It was found that this was caused by the insulating layer.

例えば、窒化シリコン膜の場合で、ガラス基板の厚みを
1.2mm5上記窒化シリコン膜の厚みを0.3AWL
として5 X 10’ dyn/crnの圧縮応力が生
じる。
For example, in the case of a silicon nitride film, the thickness of the glass substrate is 1.2 mm, and the thickness of the silicon nitride film is 0.3 AWL.
As a result, a compressive stress of 5 x 10' dyn/crn is generated.

そこで、基板の他面に少なくとも上記絶縁層と同一の膜
応力を有する薄膜を形成することによシ、上記応力をほ
ぼ相殺し、基板の反りを有効に防止することができる。
Therefore, by forming a thin film having at least the same film stress as the insulating layer on the other surface of the substrate, it is possible to substantially cancel out the stress and effectively prevent warpage of the substrate.

この場合、基板側が表示面側となるため上記薄膜は透明
であるととを要する。
In this case, since the substrate side is the display surface side, the thin film needs to be transparent.

以下、実施例を用いて本発明の詳細な説BIJする。Hereinafter, the present invention will be explained in detail using examples.

第2 一図は、本発明の一実施例を示す断面図である。Second FIG. 1 is a sectional view showing an embodiment of the present invention.

図において、透明な絶縁基板としてのガラス基板(コー
ニング社寺7059)1の上に、ITO膜からなるスト
ライプ状の透lJ1′]電極2.5i3NJからなる絶
縁層3、Z nS @ M nからなる発光層4.81
.N。
In the figure, on a glass substrate (Corning Shrine 7059) 1 as a transparent insulating substrate, an insulating layer 3 consisting of a striped transparent ITO electrode 2.5i3NJ, a light emitting layer 3 consisting of ZnS@Mn Layer 4.81
.. N.

膜からなる絶縁層5およびAL膜からなるストライプ状
の背面電極6を順次積層した構成は、従来一般に用いら
れている二重絶縁構造薄膜エレクトロルミネッセントパ
ネルと呼ばれるものの基本構成と同様である。ストライ
プ状の透明N枦2と背面電極6とは互いに直交しており
マトリックスタイプとなっている。
The structure in which the insulating layer 5 made of a film and the striped back electrode 6 made of an AL film are sequentially laminated is the same as the basic structure of what is commonly used in the past and is called a double insulation structure thin film electroluminescent panel. The striped transparent N-shaped grid 2 and the back electrode 6 are orthogonal to each other, forming a matrix type.

これに対し図ではさらに、ガラス基板1の他面に、SS
、N4膜からなる透明薄膜7が設けである。
On the other hand, in the figure, SS is further added to the other surface of the glass substrate 1.
, a transparent thin film 7 made of N4 film is provided.

この透明薄膜7は、上記絶縁層3と同一の材質からなシ
、絶縁層3とほぼ同一の膜応力を有する膜であシ、発光
層4の熱処理工程の前に形成されたものである。
This transparent thin film 7 is made of the same material as the insulating layer 3 and has almost the same film stress as the insulating layer 3, and is formed before the heat treatment process of the light emitting layer 4.

上記構成を有する薄膜エレクトロルミネッセンス素子は
、発光層4の熱処理時において絶縁層3と透明薄膜7の
膜ストレスが有効に相殺され、従来の最高熱処理温度の
590℃よシ高い温度での熱処理が可能となる。この結
果、素子の輝度は例えば650℃で熱処理したもので従
来の1.4倍と大幅に向上させることができた。
In the thin film electroluminescent element having the above configuration, the film stress of the insulating layer 3 and the transparent thin film 7 is effectively offset during heat treatment of the light emitting layer 4, and heat treatment can be performed at a temperature higher than the conventional maximum heat treatment temperature of 590°C. becomes. As a result, the brightness of the device heat-treated at, for example, 650° C. was able to be significantly improved to 1.4 times that of the conventional device.

以上説明したように、本発明によれば、多層膜を形成し
た透明力絶縁基板の他面に、上記多層膜のうち少なくと
も透Elllt極を介して上記基板上に形成された絶縁
層とほぼ同一の応力を有する透明薄膜を被着形成したこ
とによシ、上記多層膜の膜応力による基板の反シを抑え
て熱処理温度を上げることができる結果、高輝度の表示
を得るととが可能となる。
As explained above, according to the present invention, an insulating layer that is substantially the same as the insulating layer formed on the substrate through at least the transparent electrode of the multilayer film is provided on the other surface of the transparent insulating substrate on which the multilayer film is formed. By depositing and forming a transparent thin film having a stress of Become.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は輝度の熱処理温度依存性を示す図、第2図は本
発明の一実施例を示す断面図である。 1・・・−ガラス基板(透明な絶縁基板)、2e・・拳
透明電極、3・・・・絶縁層、7拳・・−透明薄膜。 特許出願人 伊勢1t、子工業株式会社代理人 山川数
構(ほか1名) 第1図 第2図
FIG. 1 is a diagram showing the dependence of brightness on heat treatment temperature, and FIG. 2 is a sectional view showing an embodiment of the present invention. 1...-glass substrate (transparent insulating substrate), 2e... fist transparent electrode, 3... insulating layer, 7 fist...-transparent thin film. Patent applicant: Ise 1T, Kokogyo Co., Ltd. agent: Kazuko Yamakawa (and 1 other person) Figure 1 Figure 2

Claims (1)

【特許請求の範囲】[Claims] 透明な絶縁基板と一面に発行層および電極層ならびに絶
縁層を含む多数の薄膜を積層してなる薄膜エレクトロル
ミネッセンス素子において、上記絶縁基板の他面に、少
なくとも透aA電極を介して絶縁基板上に形成された絶
縁層が絶縁基板に与える応力とはぼ同一の応力を有する
透明薄膜を被着形成したことを特徴とする薄膜エレクト
ロルミネッセンス素子。
In a thin-film electroluminescent element formed by laminating a transparent insulating substrate and a number of thin films including an emitting layer, an electrode layer, and an insulating layer on one side, the insulating substrate is coated on the other side of the insulating substrate through at least a transparent aA electrode. 1. A thin film electroluminescent device comprising a transparent thin film having approximately the same stress as that applied to an insulating substrate by the formed insulating layer.
JP57196522A 1982-11-09 1982-11-09 Thin film electroluminescent element Pending JPS5986194A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57196522A JPS5986194A (en) 1982-11-09 1982-11-09 Thin film electroluminescent element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57196522A JPS5986194A (en) 1982-11-09 1982-11-09 Thin film electroluminescent element

Publications (1)

Publication Number Publication Date
JPS5986194A true JPS5986194A (en) 1984-05-18

Family

ID=16359134

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57196522A Pending JPS5986194A (en) 1982-11-09 1982-11-09 Thin film electroluminescent element

Country Status (1)

Country Link
JP (1) JPS5986194A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62110987U (en) * 1985-12-27 1987-07-15
JPS63171996U (en) * 1987-04-27 1988-11-09
JPS63194498U (en) * 1987-05-30 1988-12-14
JPS6434793U (en) * 1987-08-25 1989-03-02

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62110987U (en) * 1985-12-27 1987-07-15
JPS63171996U (en) * 1987-04-27 1988-11-09
JPS63194498U (en) * 1987-05-30 1988-12-14
JPS6434793U (en) * 1987-08-25 1989-03-02

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