JPS598282Y2 - 電子ビ−ムマクロアナライザ - Google Patents

電子ビ−ムマクロアナライザ

Info

Publication number
JPS598282Y2
JPS598282Y2 JP9385779U JP9385779U JPS598282Y2 JP S598282 Y2 JPS598282 Y2 JP S598282Y2 JP 9385779 U JP9385779 U JP 9385779U JP 9385779 U JP9385779 U JP 9385779U JP S598282 Y2 JPS598282 Y2 JP S598282Y2
Authority
JP
Japan
Prior art keywords
sample
electron beam
slab
height
band
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP9385779U
Other languages
English (en)
Japanese (ja)
Other versions
JPS5628155U (en, 2012
Inventor
弘 曾我
公一 北村
光義 佐藤
博史 石島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP9385779U priority Critical patent/JPS598282Y2/ja
Publication of JPS5628155U publication Critical patent/JPS5628155U/ja
Application granted granted Critical
Publication of JPS598282Y2 publication Critical patent/JPS598282Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP9385779U 1979-07-06 1979-07-06 電子ビ−ムマクロアナライザ Expired JPS598282Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9385779U JPS598282Y2 (ja) 1979-07-06 1979-07-06 電子ビ−ムマクロアナライザ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9385779U JPS598282Y2 (ja) 1979-07-06 1979-07-06 電子ビ−ムマクロアナライザ

Publications (2)

Publication Number Publication Date
JPS5628155U JPS5628155U (en, 2012) 1981-03-16
JPS598282Y2 true JPS598282Y2 (ja) 1984-03-14

Family

ID=29326756

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9385779U Expired JPS598282Y2 (ja) 1979-07-06 1979-07-06 電子ビ−ムマクロアナライザ

Country Status (1)

Country Link
JP (1) JPS598282Y2 (en, 2012)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63194176U (en, 2012) * 1987-05-30 1988-12-14

Also Published As

Publication number Publication date
JPS5628155U (en, 2012) 1981-03-16

Similar Documents

Publication Publication Date Title
KR100669845B1 (ko) 표면 상의 이상을 검사하기 위한 스캐닝 방법 및 시스템
US8891729B2 (en) X-ray analyzer and X-ray analysis method
JP2011159483A (ja) 電子顕微鏡及び試料分析方法
JPS598282Y2 (ja) 電子ビ−ムマクロアナライザ
US4331872A (en) Method for measurement of distribution of inclusions in a slab by electron beam irradiation
JP3950642B2 (ja) 電子励起によるｘ線分析装置
JPH0124619Y2 (en, 2012)
JP4349146B2 (ja) Ｘ線分析装置
GB1454013A (en) Method and apparatus for testing luminescent materials
EP0127279B1 (en) Strip profile gauge
JPH08152378A (ja) 光ファイバーの検査方法および装置
US3585385A (en) Method and apparatus for heat treating a material and monitoring the material content x-ray spectrographically
JPS56128443A (en) Grain size measuring method of granulous substance
JPH06162987A (ja) 試料処理装置
JP5878960B2 (ja) 電子顕微鏡
JP2006177752A (ja) Ｘ線分析装置
JPH028199Y2 (en, 2012)
JP2017122591A (ja) 測定方法
JPS61240146A (ja) Ｘ線による被測定物の組成分析方法
JP2698696B2 (ja) 表面疵検査方法
JPH0134113Y2 (en, 2012)
JP2008286735A (ja) 蛍光ｘ線分析装置のｅｄｓヘッド保護方法及び保護機構
JP4365687B2 (ja) 分析方法及び分析装置
JP2961384B2 (ja) 螢光ｘ線による膜厚測定方法
JPS6235055B2 (en, 2012)