JPS597224A - 偏光解析モニタの調整方法 - Google Patents
偏光解析モニタの調整方法Info
- Publication number
- JPS597224A JPS597224A JP11534782A JP11534782A JPS597224A JP S597224 A JPS597224 A JP S597224A JP 11534782 A JP11534782 A JP 11534782A JP 11534782 A JP11534782 A JP 11534782A JP S597224 A JPS597224 A JP S597224A
- Authority
- JP
- Japan
- Prior art keywords
- section
- laser beam
- prism
- angle
- reflected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims description 17
- 230000010287 polarization Effects 0.000 title claims description 9
- 238000004458 analytical method Methods 0.000 claims description 5
- 230000003287 optical effect Effects 0.000 abstract description 8
- 238000000572 ellipsometry Methods 0.000 description 5
- 238000001479 atomic absorption spectroscopy Methods 0.000 description 1
- 238000001636 atomic emission spectroscopy Methods 0.000 description 1
- 230000000887 hydrating effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11534782A JPS597224A (ja) | 1982-07-05 | 1982-07-05 | 偏光解析モニタの調整方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11534782A JPS597224A (ja) | 1982-07-05 | 1982-07-05 | 偏光解析モニタの調整方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS597224A true JPS597224A (ja) | 1984-01-14 |
| JPS6237330B2 JPS6237330B2 (enExample) | 1987-08-12 |
Family
ID=14660273
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11534782A Granted JPS597224A (ja) | 1982-07-05 | 1982-07-05 | 偏光解析モニタの調整方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS597224A (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01112271A (ja) * | 1987-07-04 | 1989-04-28 | Ricoh Co Ltd | レーザプリンタ等の光走査装置 |
-
1982
- 1982-07-05 JP JP11534782A patent/JPS597224A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6237330B2 (enExample) | 1987-08-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5106196A (en) | Single adjustment specular reflection accessory for spectroscopy | |
| US5510619A (en) | Method for the routine identification of plastics | |
| US5048970A (en) | Optical attachment for variable angle reflection spectroscopy | |
| EP1103784A2 (en) | Elliposometer, sample positioning mechanism, and polarization angular adjusting mechanism, used in the elliposometer | |
| US5278413A (en) | Infrared microscopic spectrometer | |
| US5381234A (en) | Method and apparatus for real-time film surface detection for large area wafers | |
| JP4270648B2 (ja) | スペクトロメーターにおけるatr測定のための分光測定用付属装置 | |
| US4810872A (en) | Optical property measuring device | |
| US7251035B2 (en) | Optical cell measurement apparatus | |
| JP2672563B2 (ja) | 観察方向の関数としてデイスプレイスクリーンのコントラストを測定する装置 | |
| US5210418A (en) | Ultra-small sample analyzer for internal reflection spectroscopy | |
| JPS597224A (ja) | 偏光解析モニタの調整方法 | |
| US4802760A (en) | Raman microprobe apparatus for determining crystal orientation | |
| JPS6017340A (ja) | 紙の光学的な特性を測定する装置 | |
| US5214286A (en) | Horizontal multiple internal reflection accessory for internal reflection spectroscopy | |
| EP1498690A1 (en) | Thickness measuring device | |
| JPH057555A (ja) | 皮膚表面解析方法 | |
| GB2154019A (en) | Double-beam interferometer arrangement particularly for fourier-transform spectrometers | |
| EP0436338A2 (en) | A non-pressure dependency infrared absorption spectra recording, sample cell | |
| JP3101707B2 (ja) | ラマン散乱光増強装置 | |
| JP2505083Y2 (ja) | 偏光解消板 | |
| US20060261274A1 (en) | Spectrometer apparatus | |
| JPS597225A (ja) | 偏光解析モニタの調整方法 | |
| US3369446A (en) | Reflectance accessory | |
| US7164135B2 (en) | Image intensifier camera |