GB2154019A - Double-beam interferometer arrangement particularly for fourier-transform spectrometers - Google Patents
Double-beam interferometer arrangement particularly for fourier-transform spectrometers Download PDFInfo
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- GB2154019A GB2154019A GB08403506A GB8403506A GB2154019A GB 2154019 A GB2154019 A GB 2154019A GB 08403506 A GB08403506 A GB 08403506A GB 8403506 A GB8403506 A GB 8403506A GB 2154019 A GB2154019 A GB 2154019A
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- 238000004611 spectroscopical analysis Methods 0.000 claims abstract 2
- 230000000694 effects Effects 0.000 claims description 7
- 230000002452 interceptive effect Effects 0.000 claims description 6
- 238000003780 insertion Methods 0.000 claims description 4
- 230000037431 insertion Effects 0.000 claims description 4
- 230000003287 optical effect Effects 0.000 description 12
- 239000000523 sample Substances 0.000 description 8
- 230000003595 spectral effect Effects 0.000 description 6
- 238000010008 shearing Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- 230000001133 acceleration Effects 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 239000012780 transparent material Substances 0.000 description 2
- 241000282326 Felis catus Species 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000002277 temperature effect Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/45—Interferometric spectrometry
- G01J3/453—Interferometric spectrometry by correlation of the amplitudes
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- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
Abstract
A double-beam interferometer arrangement, particularly for use in Fourier transform spectrometry having an angular reflector unit (2,3,4) and a double reflector unit (7), both arranged in an elongate rectangular housing, with the reflecting faces (5,6) of the double reflector unit (7) disposed in opposition to the respective reflecting faces (2,3) of the angular reflector unit. The double reflector unit (7) is mounted for rotation for varying the path lengths of the beams. A beam splitter (1) is inserted between the units (2,3,4 and 7) for splitting a beam into two portions which are brought into interference after reflection at the opposing reflecting faces. The beam splitter is disposed parallel to the bisecting plane of the angular reflector unit (2,3,4). <IMAGE>
Description
SPECIFICATION
Double-beam interferometer arrangement particularly for fourier-transform spectrometers
The invention relates to an optical doublebeam interferometer arrangement for Fourier spectrometers, particularly for use in the investigation of sample materials in the visible up to the far IR range of the spectrum.
In a known interferometer as disclosed in
Dorenwendt, Grunert: "Ein Zahlendes Interferometer Zur Bestimmung von Winkeln", in
Feinwerktechni, und MeBtechnik 84 (1976) 7, page 344, an incident bundle of light is split into two parallel partial bundles by means of a Koester prism. The resulting partial beams are reflected and simultaneously staggered parallel to themselves at two edge roof reflectors which are fixed upon a rotational table equally spaced from the axis of rotation of the table and where the connection line of the edge roofs intersects the axis of rotation, and subsequently impinge upon a non-displaceably arranged plane reflector and are back reflected via the edge roof reflectors to the Koester prism where they interfere with one another. A rotation of the table effects a countermovement of the edge roof reflectors from which a phase difference results.
In another known interferometer arrangement ((2) Davis, Larson, Williams, Michel and
Gonnes: Infrared Fourier spectrometers for airborne and ground-based astronomy; Applied
Optics, Vol. 19. No.24, December 15, 1980) a light bundle is split into two parallel partial bundles by a beam splitter arranged between two plane reflectors which include an obtuse angle.
Interferometers for use in the infrared spectral range are conventionally so constructed that only transmission occurs at the beam splitter, whereas only reflection occurs at the reflecting faces. This has the advantage that when changing the spectral range, for example, from the near infrared to the medium infrared, only the beam splitter has to be exchanged.
When using an interferometer with a Koester prism, the latter has to be exchanged with each change of the spectral range. A further disadvantage is the considerably larger dimensions of a Koester prism at a same aperture as a beam splitter made of planoparallel plates. In addition, the prism has to be produced of IR-transparent material for the infrared medium, such as KBr which is technologically difficult to handle, apart from the fact that there are no suitable IR-transparent materials for the far infrared.
For these reasons, the use of a Koester prism in an interferometer for the infrared spectral range is only conditionally feasible.
An exchange of the beam splitter has to be excluded for practical reasons.
In the second interferometer arrangement mentioned above, the disadvantages resulting from the use of the Koester prism are obviated by employing a beam splitting plate and two plane reflectors for producing parallel partial bundles. The beam splitter is nondisplaceably arranged and the two plane reflectors are adjustable independently of one another. The parallel partial bundles are reflected at displaceable cats eyes.
The sequence for adjusting such an interferometer is described in detail in reference (2) above. The elimination alone of the sheer effect by adjustment operations carried out on the two plane reflectors is an iterative operation and, hence, cumbersome procedure. In the event that a so constructed interferometer is provided with an exchangeable beam splitter, the latter procedure has to be repeated with each beam splitter exchange, whereas the method described in reference (2) is not applicable for beam splitters which operate in the infrared range, that is, which do not have a beam splitting layer for the visible range of the spectrum so that the adjustment of such an interferometer is very complicated.
An erroneous adjustment affects the position of the interference image on the detector, too. Hence it is easily possible that the centre of the Hydinger ring system, which generally results at the output of a detector by means of an imaging optical system, is not central relative to the detector. This leads to a considerable reduction of the modulation depth in an interferogram measured and, hence, to a nonacceptable reduction of the signal-independent signal-to-noise ratio and to the phase difference errors, respectively, in the interferogram and, hence, to errors in the spectrum to be evaluated.
For the reasons mentioned, the latter interferometer arrangement cannot be recommended as a basis for an interferometer with an exchangeable beam splitter and a beam splitter without a splitting layer for the visible spectral range, respectively, for the adjustment of the interferometer.
It is an object of the present invention to obviate the above disadvantages.
In accordance with the present invention, there is provided an interferometer arrangement in which two parallel partial bundles of radiation produced by a beam splitter and two plane reflector faces are each directed upon a reflector arrangement, the latter being mounted upon a common supporting body as a double reflector unit, the supporting body being seated for rotation about an axis so that the reflector arrangement is countermoved in the direction of the parallel partial bundles.
The two plane reflector faces are attached to a rigid mounting body, the two plane reflectors being in opposition and including a non-variable angle, with the rigid mounting body and the two plane reflectors forming an angular reflector unit such as to eliminate relative movement between the plane reflector faces.
The beam splitter is embodied as an exchangeable unit which is arranged substantially parallel to the bisecting plane of the angular reflector unit. The angular reflector unit is pivotally embodied to eliminate shearing effects by adjustment, the axis of pivot being at right angles to a plane containing the two partial parallel bundles. The axis of pivot and the axis of inertia of the angular reflector unit coincide.
The beam splitter unit is tiltably arranged for adjustment about an axis which is parallel to the parallel partial bundles. The base body of the interferometer arrangement preferably has a configuration in the form of an oblong case with one or a plurality of central cross pieces; the double reflector unit is journalled via two shaft journals in a seating each in the top bar and the bottom bar of the oblong case at one end of the oblong case; the angular reflector unit is arranged at the opposite end of the oblong case; and the beam splitter and the central cross piece are arranged between the double reflector unit and the angular reflector unit. An opening is provided in the top bar and in the bottom bar, respectively, for insertion of the beam splitter into the oblong case.
A particular advantage of the arrangement according to the invention consists in maintaining constant the angle between any two beams of the two partial bundles in the interferometer at an angular reflector unit, which is in itself a rigid component, when pivoting the angular reflectors. Hence, the parallel beams remain parallel even when pivoted. This means that there is for two parallel beams produced by beam splitting and reflection at the angular reflector unit only one position of the angular reflector which eliminates the shearing effect.
Only the use of an angular reflector which is in itself rigid has the advantage that the
Heydingerring-system, which is present in the detector plane, has always the same position relative to the detector in a shear-free state.
This is a necessary condition for a simple beam splitter change since the centre of the
Heydingerring-system has always to impinge upon the detector. Such a setup permits adjustment of the optical components outside of the interferometer in the visible spectral range, for example, the imaging optical components for the detector and the detector itself.
A further advantage of the arrangement is that pitching movements which are produced by pushes, vibrations, and temperature effects are without affect on the adjustment state of the interferometer and on the optical path differences since, due to the rigid arrangement of the angular reflector unit, pitch movements affect the reflection angle of the partial bundles of radiation on the plane reflecting faces in the same direction.
A translatory movement of the in itself rigid angular reflector in the direction of the parallel partial bundles caused by external interference is without any affect in relation to the optical path difference, the adjustment state and the shearing effect in this arrangement.
Due to the selected coincidence of pivot axis and inertia axis of the angular reflector unit in the present arrangement, rotatory acceleration components of the angular reflector per se, caused by acceleration forces due to pushing and vibration and which lead to nondesired shearing effects and optical path differences, respectively, are eliminated.
A further particular advantage of the present solution results when the case body has an oblong configuration, with one or a plurality of central cross pieces for receipt of the double reflector unit, of the beam splitter and the angular reflector unit.
The optical components are mechanically connected on the shortest possible path.
The oblong case configuration with the central cross pieces is very rigid to bending and twisting so that a high positional stability of the optical components is achieved at a comparatively low mass.
The symmetry of the configuration results in that a varying ambient temperature has substantially no influence on sensitive relative position variations. The top and bottom bar of the oblong case serve to receive the seating locations for the double reflector unit for direct mounting upon a spectrometer plate and for mounting of adjustment members, respectively, and for a drive means for the double reflector unit.
The insertion of the beam splitter through the opening in the top bar and in the bottom bar, respectively, can be easily performed and permits a quick exchange of the beam splitter.
In all, a technologically simple, very stable and effective arrangement results from the selection of the oblong case configuration.
The invention is described further hereinafter, by way of example only, with reference to the accompanying drawings, in which:
Fig.1 is a schematical perspective side view of one embodiment of an interferometer arrangement in accordance with the present invention, in an oblong case; and
Fig.2 is a schematic, partially sectional top view of the interferometer arrangement of Fig.1.
The drawings show an elongate rectangular case 12, having a top portion 14 and a bottom portion 15, in which a light bundle A produced by a light source (not shown) impinges upon a beam splitter 1. The beam splitter 1 is arranged between two plane reflector faces 2 and 3 which are attached to an angular reflector support 4. The beam splitter 1 is exchangeable by means (not shown) and stands substantially parallel to the bisecting plane of the angle included by the reflecting faces 2 and 3. By splitting the light bundle A in the beam splitter 1 and a subsequent reflection on the reflecting faces 2 and 3, the light bundle A is split up into two parallel partial light bundles B and G which subsequently impinge upon 90 edge roof reflectors 5 and 6, respectively.
The edge roof reflectors 5 and 6 are mounted on a common base 7, thus forming a double reflector unit 7.
The base 7 is provided with two mutually aligned journals 8 and 9, which have a common perpendicular axis. Alternatively, a continuous shaft may be provided. The shaft journals 8 and 9, or the continuous shaft, respectively, are centrally seated between the edge roof reflectors 5 and 6. The seating locations 10 and 11 of the shaft journals 8 and 9, or the continuous shaft, respectively, are in the top portion 1 4 and in the bottom portion 15, also in mutual alignment. A rotational movement for generating an optical path difference is produced by a suitable drive means (not shown) on one of the journal shafts 8 or 9, or on the continuous shaft, respectively.
The partial bundles B and C reflected at the 90 edge roof reflectors 5 and 6, respectively, are always parallel and impinge upon the beam splitter 1 where they recombine. The interfering bundles B' and C' leave the case 1 2 via an exit side, whereas the interfering bundles B" and C" leave the case via the entry side.
The optical path difference x is produced by rotation of the double reflector unit 7 about angle (t) which is calculated from the distance of the edge roofs D to x = 2 D sin+.
Q = O when the parallel partial bundles B and C impinge at right angles upon a connection line between the edge roofs 5' and 6'.
The optical components of the interferometer, namely the angular reflector unit 4, the beam splitter 1, and the double reflector unit 7, are located in the interior space of the oblong case 12, which has a central cross piece 13.
The parallel bundles B and C propagate in directions parallel to the top portion 1 4 and the bottom portion 1 5 of the case 12, the central cross piece 1 3 being provided between the beams B and.C. The top portion 14 and the bottom portion 1 5 serve for direct mounting of the case upon a spectrometer stage and for mounting the adjustment elements and the drive means for the double reflector unit 7.
The beam splitter 1 is provided with a mount (not shown) which is fitted into the case 1 2 or is removed therefrom through an opening in the top portion 14.
In Fig.2 a top view of Fig.1 is shown with the top portion 14 removed. The reflecting faces 2 and 3 of the angular reflector unit 4 are mounted upon a seating means 4' having a pivot shaft 4" (only partially visible) which enables rotation of the angular reflector unit 4 at right angles to the plane of the drawing. In the bisecting plane of the angle included by the reflecting faces 2 and 3 the beam splitter 1 is arranged adjacent to the angular reflector unit 4.
The beam splitter 1 has a partially reflective and partially transmissive layer 1', disposed substantially parallel to the bisecting plane.
The beam splitter 1 is provided with a pivotable shaft 101 which is coincident with a horizontally located axis y-y in the transmissive layer 1'. The shaft is attached to and seated in a receptacle (not shown) which permits removal and insertion, respectively, of the entire beam splitter 1 from out of or into the oblong case 1 2. In spaced relation and in opposition to the angular reflector unit 4 the double reflector unit 7 is arranged via the edge roof reflectors 5 and 6 which have roofs 5' and 6', respectively.
A connection line between the edge roofs 5' and 6' is designated 5'-6'. The axis of rotation 9 of the double reflector unit 7, the layer 1', the axis of pivot 4', and the tilt shaft 101 occupy a common plane which is at right angles to the plane of the drawing.
The double reflector unit 7 permits rotation about the perpendicular axis 9 by an angle .
To this end, the shaft 9 is connected to a gear means (not shown) which, in turn, is provided with a micrometer screw for rotating the double reflector unit 7 about the angle .
The angular reflector unit 4 is also provided with an adjustment screw (not visible) which is connected to the pivot shaft 4' in the bottom portion 1 5 of the oblong case 1 2 (only partially visible).
The receptacle (not shown) for the beam splitter 1 and the seating of the latter via the tilt shaft 101 in a bearing of said receptacle is also omitted for the sake of clarity.
In operation, a light beam A from a light source (not shown) which emits, for example, infrared light, passes through the open side of the case 12 and impinges upon the layer 1' of the beam splitter 1 where a portion C of the beam A passes the layer 1' and impinges upon the reflecting face 2 of the angular reflector unit 4, and is reflected there to the edge roof reflector 5 of the double reflector unit 7. In the drawing, the beam C is shown to impinge upon the edge roof 5', the beam portion C is reflected in itself and returns to the reflecting face 2 from where it is directed to the beam splitter 1. One portion of C passes the latter as C" and leaves the interferometer via the entry side (light loss).
Another portion of C is reflected at the layer
1' of the beam splitter 1 and leaves the interferometer as C' via the exit side to a sample cell (not shown), arranged in a likewise not shown sample plane.
Another portion of the entry beam A is reflected at the layer 1' of the beam splitter 1 and impinges upon the reflecting face 3 of the angular reflector unit 4 and propagates from there as a beam portion B to the edge roof reflector 6 where it is reflected in an analogous manner to beam C.
The beam portion B, after reflection at the reflecting face 3, impinges upon the layer 1' where one portion is reflected as B" and directed out of the interferometer via the entry side. Another portion B' passes the layer 1' and interferes with the beam portion C", both
C',B' leaving the interferometer via the exit side to the (not shown) sample.
The beam propagation as described hereinabeove is accompanied by rotating the double reflector unit 7 by the rotation means (servomotor) with a frequency of about 0.5 HZ, where f sweeps an angle of from 1" to 40 .
Accordingly, the interfering beam portions B',
C' undergo a variation of the interference patterns (not shown) in a detector plane (not shown) subsequent to the sample cell (not shown). The variation is due to the varying path length between the reflectors 5 and 6, on the one hand, and the reflectors 2 and 3, respectively, on the other hand. The detector (not shown) feeds the varying interference pattern (not shown) into a conventional evaluation unit. The detection of the interference pattern is only performed when qS is rotated in the direction of a circular arrow A which indicates the forward direction indicated by the plus sign. No measurement is performed when the unit 7 is on the return movement.
A sample to be evaluated is inserted into the sample cell (not shown) and. hence, the interference pattern is subject to a typical variation indicative of the sample material, which is evaluated by Fourier analysis in the evaluation unit (not shown). The angular reflector unit is adjusted by operation of the adjustment means (not shown) attached to the shaft 4". The shaft 101 serves to adjust the beam splitter 1. Any vibrations of the entire device will not result in undesired variations of the path lengths of the beams A to B'C, due to the particular construction of the double reflector unit 7 and hence, no falsification of the measuring results will be incurred.
Claims (9)
1. A double-beam interferometer arrangement in which two parallel partial bundles produced by a beam splitter and two plane reflector faces are each directed upon a reflector arrangement arranged as a double reflector unit on a common, rigid supporting body, and wherein (a) the two plane reflector faces are non-displaceably arranged as an angular reflector unit for eliminating relative movement between the plane reflector faces, (b) the beam splitter is embodied as an exchangeable unit which is disposed substantially parallel to the bisecting plane of the angular reflector unit, (c) the angular reflector unit is pivotably seated for eliminating shear effects, the axis of pivot being at right angles to the plane containing said partial parallel bundles, (d) the axis of pivot and the axis of inertia of the angular reflector unit coincide, and (e) the beam splitter unit is tiltably arranged for adjustment about an axis parallel to the parallel partial bundles.
2. A supporting body for a double beam interferometer arrangement as claimed in claim 1, wherein the supporting body of the interferometer arrangement comprises a rectangular housing having at least one central cross piece, the double reflector unit being rotatably journalled via two shaft journals in seatings, one in a top beam of the housing and one in a bottom beam and adjacent one end of the housing, the angular reflector unit being arranged adjacent the other end of the housing, the beam splitter and said central cross piece being arranged between the double reflector unit and the angular reflector unit, an opening being provided in said top beam and said bottom beam, respectively, for insertion and removal, respectively, of the beam splitter from the housing.
3. A double-beam interferometer, particularly for use in Fourier transform spectrometry, comprising an elongate rectangular housing having a bottom portion and a top portion in spaced relation to the former, a right side portion and a left side portion in spaced relation to one another, and a rectangular open space having an entry side and an exit side,
said open space being framed by said top portion and bottom portion, said left side portion and said right side portion,
an angular reflector unit adjacent to said right side portion, composed of an angular base body having two wings substantially at right angles to said bottom portion, said wings including an angle therebetween,
a first reflector being attached to the one wing,
a second reflector being attached to the other wing,
a path length varying means having a third and a fourth reflector substantially at right angles to said bottom portion,
said first reflector being in spaced opposition to said third reflector, and said second reflector being in spaced opposition to said fourth reflector,
said third and said fourth reflector being each composed of two edge roof reflectors having the edge roofs adjacent said left side
portion,
a beam splitter adjacent said angular reflec
tor unit having a beam splitting layer, said
beam splitting layer being substantially in a
plane constituted of a bisecting plane of the
angle included by said first and said second reflector, said path varying means including a shaft which is substantially at right angles to said bottom portion and is arranged in the
intersection of a plane defined by said bisect
ing plane and a connection plane between
said edge roofs,
said shaft being seated for rotation in said too portion via one end and in said bottom portion via the other end,
means for rotating said shaft via said one end portion and, hence, said path varying
means about an angle of rotation +, a light source for emitting a light beam and directing the same into said interferometer via said entry side,
said light beam including an angle with said beam splitting layer and being substantially in parallel to said bottom portion,
said beam splitter being for splitting said light beam into a first (reflected) portion and into a second (transmitted) portion,
said first and said third reflector being for reflecting said first portion and directing the same via said beam splitter and to said exit side along an exit path, said second and fourth reflector being for reflecting said second portion via said beam splitter to said exit side along said exit path,
said first and said second beam portion being for interfering with one another along said exit path,
a detector means,
said detector means being for detecting the interfering first and second beam portions,
said interfering first and second beam portions being for producing an interference pattern in said detector, said path varying means, when rotated, being for varying said interference pattern in said detector.
4. An interferometer as claimed in claim 3, wherein means are provided for adjusting said angular reflecting unit.
5. An interferometer as claimed in claim 4, wherein said means for adjusting comprise a shaft for rotationally seating said angular reflector unit at least in said bottom portion, gear means and operation means for adjusting said angular reflector unit in that said bisecting plane is substantially at right angles to said right and left side portions.
6. An interferometer as claimed in claim 5, wherein said top portion is provided with an opening adjacent said beam splitter for removing and inserting, respectively, said beam splitter.
7. An interferometer as claimed in claims 3 to 6, wherein said angle of rotation f is varied between 1" and 40 via said means for rotating said path varying unit.
8. An interferometer as claimed in claim 7, wherein said means for rotating is a servomotor.
9. An interferometer substantially as hereinbefore described with reference to and as illustrated in the accompanying drawings.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB08403506A GB2154019B (en) | 1984-02-10 | 1984-02-10 | Double-beam interferometer arrangement particularly for fourier-transform spectrometers |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB08403506A GB2154019B (en) | 1984-02-10 | 1984-02-10 | Double-beam interferometer arrangement particularly for fourier-transform spectrometers |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| GB8403506D0 GB8403506D0 (en) | 1984-03-14 |
| GB2154019A true GB2154019A (en) | 1985-08-29 |
| GB2154019B GB2154019B (en) | 1988-01-13 |
Family
ID=10556380
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB08403506A Expired GB2154019B (en) | 1984-02-10 | 1984-02-10 | Double-beam interferometer arrangement particularly for fourier-transform spectrometers |
Country Status (1)
| Country | Link |
|---|---|
| GB (1) | GB2154019B (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0501833A2 (en) * | 1991-03-01 | 1992-09-02 | Research-Cottrell Technologies Inc. | Three-dimensional refractively scanning interferometer structure having removable optical cartridge |
| WO1993007442A1 (en) * | 1991-10-09 | 1993-04-15 | Advanced Fuel Research, Inc. | Two-beam interferometer apparatus and method and spectrometer utilizing the same |
| DE19756936C1 (en) * | 1997-12-20 | 1999-03-11 | Deutsch Zentr Luft & Raumfahrt | Michelson interferometer has rotating reflector and retro-reflectors |
| DE10115911A1 (en) * | 2001-01-31 | 2002-08-22 | Deutsch Zentr Luft & Raumfahrt | Michelson interferometer for optical spectroscopy, has two optical units, one rotating about an axis parallel to a plane defined by the components of the other |
| DE10115977C1 (en) * | 2001-01-31 | 2002-10-31 | Deutsch Zentr Luft & Raumfahrt | Optical path difference determination device for Michelson interferometer uses calculation of path difference from measured rotation angle of second optical device relative to first optical device |
| DE102008016905B3 (en) * | 2008-04-02 | 2009-07-09 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Interferometer e.g. Michelson interferometer, has optical plate movably supported by solid body joints so that beam splitter and reflection mirrors are movable relatively to each other with solid geometrical adjustment of reflection mirrors |
| CN101382608B (en) * | 2008-10-23 | 2010-06-02 | 中国兵器工业第二〇五研究所 | Method for making 180 degree big span second grade optical axis parallelism angle mirror |
| DE102012023248A1 (en) | 2012-10-29 | 2014-04-30 | Universität Stuttgart | Method and arrangement for FT spectroscopy, in particular also for imaging radiation source and substance analysis as well as tumor tissue diagnostics |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2997883A1 (en) | 2014-09-17 | 2016-03-23 | Universität Stuttgart | Method and system for optical absorption measurement |
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|---|---|---|---|---|
| GB1108214A (en) * | 1965-07-29 | 1968-04-03 | Kearney & Trecker Corp | Interferometric measuring system |
| GB1301626A (en) * | 1970-06-29 | 1973-01-04 | ||
| GB1493918A (en) * | 1973-11-14 | 1977-11-30 | Street G | Apparatus for deflecting a light beam |
| GB2014754A (en) * | 1978-02-17 | 1979-08-30 | Polska Akademia Nauk Instytut | Interferometer |
-
1984
- 1984-02-10 GB GB08403506A patent/GB2154019B/en not_active Expired
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1108214A (en) * | 1965-07-29 | 1968-04-03 | Kearney & Trecker Corp | Interferometric measuring system |
| GB1301626A (en) * | 1970-06-29 | 1973-01-04 | ||
| GB1493918A (en) * | 1973-11-14 | 1977-11-30 | Street G | Apparatus for deflecting a light beam |
| GB2014754A (en) * | 1978-02-17 | 1979-08-30 | Polska Akademia Nauk Instytut | Interferometer |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0501833A2 (en) * | 1991-03-01 | 1992-09-02 | Research-Cottrell Technologies Inc. | Three-dimensional refractively scanning interferometer structure having removable optical cartridge |
| EP0501833A3 (en) * | 1991-03-01 | 1993-06-16 | Research-Cottrell Technologies Inc. | Three-dimensional refractively scanning interferometer structure having removable optical cartridge |
| WO1993007442A1 (en) * | 1991-10-09 | 1993-04-15 | Advanced Fuel Research, Inc. | Two-beam interferometer apparatus and method and spectrometer utilizing the same |
| DE19756936C1 (en) * | 1997-12-20 | 1999-03-11 | Deutsch Zentr Luft & Raumfahrt | Michelson interferometer has rotating reflector and retro-reflectors |
| DE10115911A1 (en) * | 2001-01-31 | 2002-08-22 | Deutsch Zentr Luft & Raumfahrt | Michelson interferometer for optical spectroscopy, has two optical units, one rotating about an axis parallel to a plane defined by the components of the other |
| DE10115977C1 (en) * | 2001-01-31 | 2002-10-31 | Deutsch Zentr Luft & Raumfahrt | Optical path difference determination device for Michelson interferometer uses calculation of path difference from measured rotation angle of second optical device relative to first optical device |
| DE10115911C2 (en) * | 2001-01-31 | 2002-12-05 | Deutsch Zentr Luft & Raumfahrt | Michelson interferometer setup |
| DE102008016905B3 (en) * | 2008-04-02 | 2009-07-09 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Interferometer e.g. Michelson interferometer, has optical plate movably supported by solid body joints so that beam splitter and reflection mirrors are movable relatively to each other with solid geometrical adjustment of reflection mirrors |
| CN101382608B (en) * | 2008-10-23 | 2010-06-02 | 中国兵器工业第二〇五研究所 | Method for making 180 degree big span second grade optical axis parallelism angle mirror |
| DE102012023248A1 (en) | 2012-10-29 | 2014-04-30 | Universität Stuttgart | Method and arrangement for FT spectroscopy, in particular also for imaging radiation source and substance analysis as well as tumor tissue diagnostics |
| WO2014067651A1 (en) | 2012-10-29 | 2014-05-08 | Universität Stuttgart | Method and arrangement, in particular also for imaging fourier transformation spectroscopy in mobile use |
Also Published As
| Publication number | Publication date |
|---|---|
| GB2154019B (en) | 1988-01-13 |
| GB8403506D0 (en) | 1984-03-14 |
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