JPS5961942A - Thin plate carrier jig - Google Patents

Thin plate carrier jig

Info

Publication number
JPS5961942A
JPS5961942A JP17088182A JP17088182A JPS5961942A JP S5961942 A JPS5961942 A JP S5961942A JP 17088182 A JP17088182 A JP 17088182A JP 17088182 A JP17088182 A JP 17088182A JP S5961942 A JPS5961942 A JP S5961942A
Authority
JP
Japan
Prior art keywords
wafer
carrier jig
thin plate
separating plate
jig
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17088182A
Other languages
Japanese (ja)
Inventor
Toshio Tanabe
敏雄 田辺
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP17088182A priority Critical patent/JPS5961942A/en
Publication of JPS5961942A publication Critical patent/JPS5961942A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/673Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
    • H01L21/67326Horizontal carrier comprising wall type elements whereby the substrates are vertically supported, e.g. comprising sidewalls

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)

Abstract

PURPOSE:To remove external defect of a thin plate to be generated during transportation by giving an inclination to each separating plate so that the one surface of thin plate is not in contact with the separating plate. CONSTITUTION:Each separating plate 4 and a groove 5 are inclined backward by theta from the vertical plane (Y-Y') so that the surface 1A to be worked on which element is formed of wafer 1 is not in contact with the separating plate 4 of jig. In this case, the main surface of separating plate 4 (and groove 5) is formed at a right angle for the upper surface of frame inclined by theta for the horizontal plane X-X'. Thereby, the surface 1A where elements are formed is always locted at the upper side of the inclined surface, the wafer always keeps the constant inclination without contactness with jig. Thereby, any damage by contactness and chipping can be prevented and defect on the appearance can be prevented.

Description

【発明の詳細な説明】 本発明は比較的に脆い材質より成る薄板、例えば半導体
製品の母材である半導体ウェハのためのキャリア(運搬
)用治具に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a carrier jig for a thin plate made of a relatively brittle material, such as a semiconductor wafer, which is the base material of a semiconductor product.

トランジスタやIC等の半導体素子は一般にシリコン単
結晶の5すい円板(ウエノ・)上に光学食刻処理や不純
物拡散処理を繰り返して素子形成を行なうものであり、
したがって素子が加工されるウェハ表面は常に物理的に
他の物体から非接触の状態にあることが望ましい。
Semiconductor devices such as transistors and ICs are generally formed by repeating optical etching and impurity diffusion treatments on a five-sided silicon single crystal disk.
Therefore, it is desirable that the wafer surface on which elements are processed is always physically kept out of contact with other objects.

このウェハに半導体素子を加工する工程間の運搬時にお
いては多数のウェハを縦にして支持するための複数の溝
部と隔板を交互に形成した枠体からなるウェハキャリア
治具が用いられている。第1図は現在使用さしているキ
ャリア治具の一例を横断面図により示し、第2図は一部
を切り欠いて第1図におけるA−X親網断面をあられす
正面図により示すものである。これらの図において、1
は処理されるシリコンウェハ、2は枠体脚部、3は枠体
側板、4は隔板、5はウエノ・を挿入さnる溝部で、こ
の溝部5と隔板4とは前後方向に交互に複数組形成され
ている。
When transporting these wafers between processes for processing semiconductor devices, a wafer carrier jig consisting of a frame body in which a plurality of grooves and partition plates are alternately formed is used to support a large number of wafers vertically. . Figure 1 shows a cross-sectional view of an example of a carrier jig currently in use, and Figure 2 shows a partially cutaway front view of the A-X main net cross section in Figure 1. . In these figures, 1
2 is the silicon wafer to be processed, 2 is the frame leg, 3 is the side plate of the frame, 4 is the partition plate, and 5 is the groove into which the wafer is inserted. Multiple sets have been formed.

ウェハlは枠体の上部から隔板4にそって溝部5に挿入
さ扛、隔板4の一方の面にもたせかける状態で収納され
る。このようなキャリア治具は通常に置かれた状態で隔
板4は水平面に対して直角(垂直方向)に設けであるた
めウェハ製品移動時において振動や軽度の傾きによって
第3図に示すようにウェハ1が破線で示すように傾いて
その加工される面(表面とする)+Aが隔板4の内面に
接触し、そのためウェハの+A面で傷、チッピングが発
生し、これが素子形成面での外観不良を来たすことで問
題となっている。
The wafer 1 is inserted from the top of the frame into the groove 5 along the partition plate 4, and is stored in a state where it is leaning against one surface of the partition plate 4. When such a carrier jig is normally placed, the partition plate 4 is installed at right angles (vertical direction) to the horizontal plane, so when the wafer product is moved, vibrations or slight tilting may cause damage as shown in Figure 3. When the wafer 1 is tilted as shown by the broken line, the surface +A to be processed (referred to as the front surface) comes into contact with the inner surface of the partition plate 4, which causes scratches and chipping on the +A side of the wafer, which causes damage to the element forming surface. This has become a problem due to its poor appearance.

本発明は上記した問題を解決したもので、キャリア治具
の構造を改善し、運搬時に生じる薄板の外観不良をなく
すことを目的とする。以下実施例にそって詳述する。
The present invention solves the above problems, and aims to improve the structure of a carrier jig and eliminate appearance defects of thin plates that occur during transportation. This will be described in detail below with reference to Examples.

第4図は本発明の一実施例であるキャリア治具の原理的
構造を一部切り欠き縦断面図により示すものである。同
図において在来例として示した第2図と共通する構成部
分は同一の指示番号で示している。
FIG. 4 shows the basic structure of a carrier jig, which is an embodiment of the present invention, in a partially cutaway vertical sectional view. Components in this figure that are common to those in FIG. 2 shown as a conventional example are indicated by the same reference numbers.

本発明においては、ウェハ1の素子が形成される被加工
面IAが治具の隔板4と非接触を保つように各隔板4及
び溝部らを垂直面(Y−Y’)より後方−1θだけ傾け
である。この場合、水平面X−Zに対してθだけ傾いた
枠体上面に対して各隔板4(及び溝部5)の主面が直角
方向に形成される。
In the present invention, each partition plate 4 and groove portion are arranged rearwardly from the vertical plane (YY') so that the processed surface IA on which the elements of the wafer 1 are formed does not come into contact with the partition plate 4 of the jig. It is tilted by 1θ. In this case, the main surface of each partition plate 4 (and groove portion 5) is formed in a direction perpendicular to the upper surface of the frame which is inclined by θ with respect to the horizontal plane X-Z.

このためには枠体の本体()、鵬は在来の枠体の本体部
分と同じ形状のものを用い、脚部において前後の高さを
変える構造とすればよい。すなわち、同図に示すように
前脚部2aの高さhl とし、後脚部2bの高さh2と
して、hI>h2 とする。具体的にはhlをh2 よ
りも5〜109程度高(することにより、治具を通常に
設置した場合に隔板に適度の傾きをもたせることができ
る。第6図は本発明によるキャリア治具を全体斜面図に
より示すものである。
To this end, the main body of the frame (2) and the frame may be of the same shape as the main body of a conventional frame, and the heights of the legs may be changed from front to back. That is, as shown in the figure, the height of the front leg portion 2a is hl, and the height of the rear leg portion 2b is h2, so that hI>h2. Specifically, by making hl higher than h2 by about 5 to 109, it is possible to give the partition plate an appropriate inclination when the jig is normally installed. Fig. 6 shows the carrier jig according to the present invention. This is shown in a general slope diagram.

以上実施例で述べた本発明によれば第5図に示すように
キャリア治具の溝部5内にウェハを挿入しウェハの素子
の形成されない裏面IBを隔板4にもたせかけるように
して収納できる構造であるためと素子の形成される表面
IAは常に傾いた面の上側となっており、製品の移動時
の軽度の傾きや振動に対してもウェハが常に一定の向き
を保ち治具(隔板)に接触することがなく、接触による
傷、チッピング等を防止し外観不良が大幅に改善される
According to the present invention described in the embodiments above, the wafer can be stored by inserting the wafer into the groove 5 of the carrier jig and leaning the back side IB on which no elements are formed on the wafer against the partition plate 4, as shown in FIG. Because of the structure, the surface IA on which the elements are formed is always on the upper side of the inclined surface, and the wafer always maintains a constant orientation even when the product is moved by slight tilts or vibrations. This prevents damage, chipping, etc. caused by contact and greatly improves appearance defects.

本発明によれば溝部の開口側となる枠体上面に対して各
溝面な直角方向に形成しであるためにウェハを一つのキ
ャリア治具かも他のキャリア治具に移し替える場合に容
易に行なうことが出来る。
According to the present invention, since each groove surface is formed perpendicularly to the upper surface of the frame which is the opening side of the groove, it is easy to transfer the wafer from one carrier jig to another carrier jig. It can be done.

第7図はキャリア治具I内に収納されたウェハをキャリ
ア治具■に移し替える場合の形態を示すものである。こ
のウェハ移し替えにあたって2つの治具1.lI内でウ
ェハ1が素子形成面IAを上にして水平になるように設
置する。すなわち2つの治具1.lIの前脚部2aが上
に後脚部2bが下になるようにして治具の上面を対向さ
せれば向い合う各治具の隔板は合せ面0−OK対し対称
位置になり、一方から他方ヘウェハを容易に移すことが
できる。
FIG. 7 shows a configuration in which a wafer stored in carrier jig I is transferred to carrier jig II. Two jigs are used to transfer this wafer: 1. The wafer 1 is placed horizontally in II with the element forming surface IA facing upward. That is, two jigs 1. If the upper surfaces of the jigs are placed opposite each other so that the front leg 2a of the lI is on top and the rear leg 2b is on the bottom, the partition plates of the opposing jigs will be in a symmetrical position with respect to the mating surface 0-OK. On the other hand, the wafer can be easily transferred.

本発明は半導体ウェハに限らず、薄いガラスマスクの如
き脆い月質より成る薄板の運搬用キャリア治具として利
用できる。
The present invention can be used not only for semiconductor wafers, but also as a carrier jig for transporting thin plates made of brittle material such as thin glass masks.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこれまでのキャリア治具の例を示す横断面図で
ある。 第2図は第1図の一部A−A縦断面正面図である。 第3図は第2図の一部を拡大した縦断面図である。 第4図は本発明によるキャリア治具の例を示す一部縦断
面正面図である。 第5図は第4図の一部を拡大した縦断面図である。 第6図は本発明によるキャリア治具の全体斜面図である
。 第7図は本発明によるキャリア治具を用いてウェハ移し
替えを行なう場合の正面図である。 1・・・ウェハ、2・・・枠体脚部、3・・・枠体側板
、4・・・隔板、訃・・溝部。 代理人 弁理士  薄 1)利 幸 ・ノ 第  1  図 − A′−2 第  2  図 第  3  図 第  4  図 / γ     、ノ 第  5  図 、、)O
FIG. 1 is a cross-sectional view showing an example of a conventional carrier jig. FIG. 2 is a front view of a longitudinal cross-section taken along the line A-A in FIG. 1. FIG. 3 is an enlarged vertical sectional view of a part of FIG. 2. FIG. 4 is a partially longitudinal cross-sectional front view showing an example of the carrier jig according to the present invention. FIG. 5 is an enlarged vertical sectional view of a part of FIG. 4. FIG. 6 is an overall perspective view of the carrier jig according to the present invention. FIG. 7 is a front view of wafer transfer using the carrier jig according to the present invention. DESCRIPTION OF SYMBOLS 1... Wafer, 2... Frame leg, 3... Frame side plate, 4... Partition plate, butt... Groove. Agent Patent Attorney Susuki 1) Toshiyuki ・No. 1 Figure-A'-2 Figure 2 Figure 3 Figure 4/γ, No. 5,,)O

Claims (1)

【特許請求の範囲】 ■、薄板を立てかけるための溝部と隔板とを交互に有す
る枠体からなる薄板キャリア治具におい−〔、薄板の一
方の面が隔板と非接触となるように各隔板に傾きを持た
せたことを特徴と1″る薄板キャリア治具。 2、各隔板をその開口側となる枠体上面に対して直角に
形成するとともに枠体の脚部の一方を他方より高(する
ことにより隔板に傾きをもたせた特許請求の範囲第1項
に記載の薄板キャリア治具。
[Scope of Claims] (1) A thin plate carrier jig consisting of a frame having alternating grooves and partition plates for leaning the thin plate; 1. A thin plate carrier jig characterized by having a slanted partition plate. 2. Form each partition plate perpendicular to the top surface of the frame body, which is the opening side, and one of the legs of the frame body. The thin plate carrier jig according to claim 1, wherein the diaphragm is tilted by making the diaphragm higher than the other.
JP17088182A 1982-10-01 1982-10-01 Thin plate carrier jig Pending JPS5961942A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17088182A JPS5961942A (en) 1982-10-01 1982-10-01 Thin plate carrier jig

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17088182A JPS5961942A (en) 1982-10-01 1982-10-01 Thin plate carrier jig

Publications (1)

Publication Number Publication Date
JPS5961942A true JPS5961942A (en) 1984-04-09

Family

ID=15913037

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17088182A Pending JPS5961942A (en) 1982-10-01 1982-10-01 Thin plate carrier jig

Country Status (1)

Country Link
JP (1) JPS5961942A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60223111A (en) * 1984-04-20 1985-11-07 Hitachi Ltd Housing case
JPS60245143A (en) * 1984-05-18 1985-12-04 Tokyo Erekutoron Kk Wafer cassette conveying mechanism

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60223111A (en) * 1984-04-20 1985-11-07 Hitachi Ltd Housing case
JPH0462460B2 (en) * 1984-04-20 1992-10-06 Hitachi Ltd
JPS60245143A (en) * 1984-05-18 1985-12-04 Tokyo Erekutoron Kk Wafer cassette conveying mechanism

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