JPS595722A - 酸化亜鉛薄膜の電極構造 - Google Patents
酸化亜鉛薄膜の電極構造Info
- Publication number
- JPS595722A JPS595722A JP11444782A JP11444782A JPS595722A JP S595722 A JPS595722 A JP S595722A JP 11444782 A JP11444782 A JP 11444782A JP 11444782 A JP11444782 A JP 11444782A JP S595722 A JPS595722 A JP S595722A
- Authority
- JP
- Japan
- Prior art keywords
- zinc oxide
- oxide film
- electrode structure
- thin film
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 title claims abstract description 86
- 239000011787 zinc oxide Substances 0.000 title claims abstract description 43
- 239000010409 thin film Substances 0.000 title claims description 31
- 238000000034 method Methods 0.000 abstract description 7
- 238000010894 electron beam technology Methods 0.000 abstract description 5
- 238000009792 diffusion process Methods 0.000 abstract description 4
- 238000004544 sputter deposition Methods 0.000 abstract description 4
- 238000010897 surface acoustic wave method Methods 0.000 abstract description 2
- 229910000942 Elinvar Inorganic materials 0.000 abstract 1
- 239000010410 layer Substances 0.000 description 13
- 239000000758 substrate Substances 0.000 description 6
- 230000010355 oscillation Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000005452 bending Methods 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 230000001747 exhibiting effect Effects 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 238000005422 blasting Methods 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005566 electron beam evaporation Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 229910000464 lead oxide Inorganic materials 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- YEXPOXQUZXUXJW-UHFFFAOYSA-N oxolead Chemical compound [Pb]=O YEXPOXQUZXUXJW-UHFFFAOYSA-N 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
- 238000007738 vacuum evaporation Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
- H03H9/13—Driving means, e.g. electrodes, coils for networks consisting of piezoelectric or electrostrictive materials
- H03H9/131—Driving means, e.g. electrodes, coils for networks consisting of piezoelectric or electrostrictive materials consisting of a multilayered structure
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11444782A JPS595722A (ja) | 1982-06-30 | 1982-06-30 | 酸化亜鉛薄膜の電極構造 |
| US06/509,028 US4445066A (en) | 1982-06-30 | 1983-06-29 | Electrode structure for a zinc oxide thin film transducer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11444782A JPS595722A (ja) | 1982-06-30 | 1982-06-30 | 酸化亜鉛薄膜の電極構造 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS595722A true JPS595722A (ja) | 1984-01-12 |
| JPH0115207B2 JPH0115207B2 (cs) | 1989-03-16 |
Family
ID=14637956
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11444782A Granted JPS595722A (ja) | 1982-06-30 | 1982-06-30 | 酸化亜鉛薄膜の電極構造 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS595722A (cs) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0860943B1 (en) * | 1997-02-20 | 2003-05-07 | Murata Manufacturing Co., Ltd. | Surface acoustic wave device |
| US7280180B2 (en) | 2002-03-19 | 2007-10-09 | Lg.Philips Lcd Co., Ltd. | Liquid crystal display panel with first and second dummy UV sealants and method for fabricating the same |
-
1982
- 1982-06-30 JP JP11444782A patent/JPS595722A/ja active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0860943B1 (en) * | 1997-02-20 | 2003-05-07 | Murata Manufacturing Co., Ltd. | Surface acoustic wave device |
| US7280180B2 (en) | 2002-03-19 | 2007-10-09 | Lg.Philips Lcd Co., Ltd. | Liquid crystal display panel with first and second dummy UV sealants and method for fabricating the same |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0115207B2 (cs) | 1989-03-16 |
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