JPS5956170A - 伝達関数測定器 - Google Patents

伝達関数測定器

Info

Publication number
JPS5956170A
JPS5956170A JP16737182A JP16737182A JPS5956170A JP S5956170 A JPS5956170 A JP S5956170A JP 16737182 A JP16737182 A JP 16737182A JP 16737182 A JP16737182 A JP 16737182A JP S5956170 A JPS5956170 A JP S5956170A
Authority
JP
Japan
Prior art keywords
peak
input
spectrum
frequency
average
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16737182A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0339270B2 (enrdf_load_stackoverflow
Inventor
Takahiro Yamaguchi
隆弘 山口
Masayuki Ogawa
政行 小川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Takeda Riken Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp, Takeda Riken Industries Co Ltd filed Critical Advantest Corp
Priority to JP16737182A priority Critical patent/JPS5956170A/ja
Publication of JPS5956170A publication Critical patent/JPS5956170A/ja
Publication of JPH0339270B2 publication Critical patent/JPH0339270B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP16737182A 1982-09-24 1982-09-24 伝達関数測定器 Granted JPS5956170A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16737182A JPS5956170A (ja) 1982-09-24 1982-09-24 伝達関数測定器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16737182A JPS5956170A (ja) 1982-09-24 1982-09-24 伝達関数測定器

Publications (2)

Publication Number Publication Date
JPS5956170A true JPS5956170A (ja) 1984-03-31
JPH0339270B2 JPH0339270B2 (enrdf_load_stackoverflow) 1991-06-13

Family

ID=15848468

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16737182A Granted JPS5956170A (ja) 1982-09-24 1982-09-24 伝達関数測定器

Country Status (1)

Country Link
JP (1) JPS5956170A (enrdf_load_stackoverflow)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2604528A1 (fr) * 1986-09-25 1988-04-01 France Etat Procede et dispositif de determination numerique de l'amplitude de la fonction de transfert entree-sortie d'un quadripole
US4744041A (en) * 1985-03-04 1988-05-10 International Business Machines Corporation Method for testing DC motors
US4885708A (en) * 1987-11-20 1989-12-05 Advantest Corporation Apparatus and method for measuring frequency response function
JP2005308510A (ja) * 2004-04-21 2005-11-04 Agilent Technol Inc 位相雑音測定装置および位相雑音測定システム
JP2005308509A (ja) * 2004-04-21 2005-11-04 Agilent Technol Inc 位相雑音を測定する方法および位相雑音測定装置
JP2005308511A (ja) * 2004-04-21 2005-11-04 Agilent Technol Inc 位相雑音を測定する方法および位相雑音測定装置

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4744041A (en) * 1985-03-04 1988-05-10 International Business Machines Corporation Method for testing DC motors
FR2604528A1 (fr) * 1986-09-25 1988-04-01 France Etat Procede et dispositif de determination numerique de l'amplitude de la fonction de transfert entree-sortie d'un quadripole
US4885708A (en) * 1987-11-20 1989-12-05 Advantest Corporation Apparatus and method for measuring frequency response function
JP2005308510A (ja) * 2004-04-21 2005-11-04 Agilent Technol Inc 位相雑音測定装置および位相雑音測定システム
JP2005308509A (ja) * 2004-04-21 2005-11-04 Agilent Technol Inc 位相雑音を測定する方法および位相雑音測定装置
JP2005308511A (ja) * 2004-04-21 2005-11-04 Agilent Technol Inc 位相雑音を測定する方法および位相雑音測定装置

Also Published As

Publication number Publication date
JPH0339270B2 (enrdf_load_stackoverflow) 1991-06-13

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