JPS5941847A - パタ−ン欠陥の表示装置 - Google Patents
パタ−ン欠陥の表示装置Info
- Publication number
- JPS5941847A JPS5941847A JP57153251A JP15325182A JPS5941847A JP S5941847 A JPS5941847 A JP S5941847A JP 57153251 A JP57153251 A JP 57153251A JP 15325182 A JP15325182 A JP 15325182A JP S5941847 A JPS5941847 A JP S5941847A
- Authority
- JP
- Japan
- Prior art keywords
- image
- pattern
- standard
- chip
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H10P74/00—
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57153251A JPS5941847A (ja) | 1982-08-31 | 1982-08-31 | パタ−ン欠陥の表示装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57153251A JPS5941847A (ja) | 1982-08-31 | 1982-08-31 | パタ−ン欠陥の表示装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5941847A true JPS5941847A (ja) | 1984-03-08 |
| JPS6314496B2 JPS6314496B2 (enExample) | 1988-03-31 |
Family
ID=15558365
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57153251A Granted JPS5941847A (ja) | 1982-08-31 | 1982-08-31 | パタ−ン欠陥の表示装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5941847A (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6147635A (ja) * | 1984-08-14 | 1986-03-08 | Nippon Jido Seigyo Kk | パタ−ンの欠陥検査装置に用いるパタ−ンの判定方法 |
| JPS62127987A (ja) * | 1985-11-28 | 1987-06-10 | Yokogawa Electric Corp | プリント板パタ−ン検査方法 |
| US6831998B1 (en) | 2000-06-22 | 2004-12-14 | Hitachi, Ltd. | Inspection system for circuit patterns and a method thereof |
-
1982
- 1982-08-31 JP JP57153251A patent/JPS5941847A/ja active Granted
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6147635A (ja) * | 1984-08-14 | 1986-03-08 | Nippon Jido Seigyo Kk | パタ−ンの欠陥検査装置に用いるパタ−ンの判定方法 |
| JPS62127987A (ja) * | 1985-11-28 | 1987-06-10 | Yokogawa Electric Corp | プリント板パタ−ン検査方法 |
| US6831998B1 (en) | 2000-06-22 | 2004-12-14 | Hitachi, Ltd. | Inspection system for circuit patterns and a method thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6314496B2 (enExample) | 1988-03-31 |
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