JPS5940783Y2 - Device for detecting soldering quality of chip parts - Google Patents
Device for detecting soldering quality of chip partsInfo
- Publication number
- JPS5940783Y2 JPS5940783Y2 JP40679U JP40679U JPS5940783Y2 JP S5940783 Y2 JPS5940783 Y2 JP S5940783Y2 JP 40679 U JP40679 U JP 40679U JP 40679 U JP40679 U JP 40679U JP S5940783 Y2 JPS5940783 Y2 JP S5940783Y2
- Authority
- JP
- Japan
- Prior art keywords
- soldering
- soldered
- imaging device
- quality
- chip component
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
【考案の詳細な説明】
この考案は、リード線のない、いわゆるチップ部品の半
田付けの良否の検出装置に関するものである。[Detailed Description of the Invention] This invention relates to a device for detecting the quality of soldering of so-called chip components without lead wires.
近年、テレビジョン受像機やラジオ受信機などのいわゆ
る家電製品の電子回路に使用する抵抗、コンデンサ、ダ
イオードなどにおいて、リード線がなく、その大きさも
従来品の数分の一程度に小さくなった、いわゆるチップ
部品が使用されるようになってきた。In recent years, resistors, capacitors, diodes, etc. used in the electronic circuits of so-called home appliances such as television receivers and radio receivers no longer have lead wires, and their sizes have become about a fraction of the size of conventional products. So-called chip parts have come into use.
このようなチップ部品の大きさはいろいろあるが、家電
製品に使用される代表的なものは、長さが約3.2mm
、幅約1.6閣、厚み約0.7mmの長方形で、その両
端部に電極があって、この電極部とプリント基板の銅箔
部とを半田付で接続し、電子回路を構している。There are various sizes of such chip components, but the typical ones used in home appliances are approximately 3.2 mm in length.
It is a rectangle with a width of about 1.6mm and a thickness of about 0.7mm, and has electrodes at both ends.The electrodes are connected to the copper foil part of the printed circuit board by soldering to form an electronic circuit. There is.
この種のチップ部品の接続に際し、従来は、熟練した作
業者が目視で半田付の不良箇所を発見したり、あるいは
導通試験器の先端の尖った検出用ピンをプリント基板の
銅箔パターン部とチップ部品の電極部との間に当てて半
田付の不良箇所を検出していたが、前者の方法は見落し
があったり、作業者の疲労も多く能率が悪い。Conventionally, when connecting these types of chip components, skilled workers visually discovered defective soldering points, or used a sharp detection pin on a continuity tester to connect the copper foil pattern on the printed circuit board. It used to be used to detect defective soldering by applying it between the electrodes of chip components, but the former method is inefficient because it often misses things and causes a lot of worker fatigue.
後者の方法は検出用ピンの接触不良が多く、検出の信頼
度に難点がある。In the latter method, there are many contact failures of the detection pins, and the reliability of detection is low.
この考案は、このような従来の問題をなくすために考案
したものであり、以下、図面に従って詳細に説明する。This invention was devised to eliminate such conventional problems, and will be explained in detail below with reference to the drawings.
第1図はこの考案の装置によってチップ部品の半田付の
良否を検出する場合の側面図であり、1はプリント基板
、2,2′はプリント基板上の銅箔パターン、3はとの
銅箔パターン2,2′間に接続されるチップ部品、4,
4′はチップ部品の電極部、5,5’、6はこのチップ
部品の電極4゜4’ とMlパターン2,2′とを接続
するための半田(半田付部分)である。Fig. 1 is a side view of the device of this invention used to detect the quality of soldering of chip components. 1 is a printed circuit board, 2 and 2' are copper foil patterns on the printed circuit board, and 3 is a copper foil on the other side. a chip component connected between patterns 2 and 2';4;
4' is an electrode portion of the chip component, and 5, 5', and 6 are solder (soldering portions) for connecting the electrode 4.4' of this chip component and the Ml patterns 2, 2'.
7はプリント基板1に半田付されたチップ部品3の半田
付部分5.5’tたは6に斜めに光線を当てる光源、8
はその半田付部分5,5’tたは6の反射光を検出する
ためのチップ部品の電極端部付近数咽の範囲を拡大撮像
するテレビジョンカメラ等の撮像装置であり、これら光
源7および撮像装置8は図示しない移動装置によって上
記半田付部分に対して相対的にその上方で移動するよう
になっている。7 is a light source that applies a beam of light obliquely to the soldered portion 5.5't or 6 of the chip component 3 soldered to the printed circuit board 1;
is an imaging device such as a television camera that takes an enlarged image of a several-dimensional area near the electrode end of a chip component in order to detect the reflected light from the soldered portion 5, 5't or 6, and these light sources 7 and The imaging device 8 is moved relative to and above the soldered portion by a moving device (not shown).
なお、上記の相対的に移動するとは、プリント基板1側
を固定させて光源および撮像装置8を移動させるか、寸
たはこれと反対に、光源7および撮像装置8側を固定し
てプリント基板1側を移動させることである。Note that the above-mentioned relative movement means either fixing the printed circuit board 1 side and moving the light source and the imaging device 8, or conversely, fixing the light source 7 and the imaging device 8 side and moving the printed circuit board. The first step is to move the first side.
捷た、光源7はその光源が半田付部分に対して斜めにチ
ップ部品側から当たるように配置され、また、撮像装置
8は、具体的には拡大鏡付のテレビジョンカメラあるい
はイメージセンサで、光の変化を電気信号の変化に変換
した上で、適当な判別回路(図示せず)を設け、その判
別回路の出力によって図示しない表示装置や印字装置や
警報器を駆動するようにする。The light source 7 is arranged so that the light source hits the soldered part diagonally from the chip component side, and the imaging device 8 is specifically a television camera with a magnifying glass or an image sensor. After converting changes in light into changes in electrical signals, an appropriate discrimination circuit (not shown) is provided, and the output of the discrimination circuit drives a display device, a printing device, or an alarm device (not shown).
次にその作用を説明すると、第1図Aにおいては、チッ
プ部品3の図における左側の半田付部分には何らかの原
因で、チップ部品3の電極4と銅箔パターン2とは接続
されておらず、半田5と半田5′との間にギャップGが
存在する。Next, to explain the effect, in FIG. 1A, the electrode 4 of the chip component 3 and the copper foil pattern 2 are not connected to the soldered part on the left side of the chip component 3 for some reason. , a gap G exists between the solder 5 and the solder 5'.
このギャップGは普通数拾ミクロンから数百ミクロンで
、肉眼では見落し易い。This gap G is usually several tens of microns to several hundred microns, and is easily overlooked by the naked eye.
斗た、右側の半田付部分は良好な場合で、電極4′から
銅箔パターン2′へ向って半田6が斜めに付いている。The soldered portion on the right side is in good condition, and the solder 6 is attached obliquely from the electrode 4' to the copper foil pattern 2'.
そこで、第1図Aのように、光源7および撮像装置8を
図のように配置し、矢印Aに示すように、プリント基板
1に半田付されたチップ部品3の右側の半田付部分6の
数咽の範囲を見ると、第2図に示すように、その半田付
部分6における反射光の明るさの変化が急でないことが
撮像装置8によって検出され、これによって、半田付が
良好であることがわかる。Therefore, as shown in FIG. 1A, the light source 7 and the imaging device 8 are arranged as shown in the figure, and as shown by the arrow A, the soldered portion 6 on the right side of the chip component 3 soldered to the printed circuit board 1 is Looking at the range of several degrees, the imaging device 8 detects that the change in the brightness of the reflected light at the soldered portion 6 is not sudden, as shown in FIG. 2, and this indicates that the soldering is good. I understand that.
一方、第1図Bの左側は半田付が不良の場合で、拡大鏡
で見ると、半田が付いていないギャップGは凹んでいる
ため、光源Iからの光線を右斜上から当てると、第3図
に示すように、上記ギャップGでは反射光は急に暗く検
出され、すなわち、反射光の明るさの変化が急であるこ
とが撮像装置8によって検出され、これによって、半田
付が不良であることがわかる。On the other hand, the left side of Fig. 1B shows a case where the soldering is defective. When viewed with a magnifying glass, the gap G with no solder is concave, so when the light beam from the light source I is applied from diagonally above the right side, As shown in FIG. 3, the reflected light suddenly becomes dark in the gap G, that is, the imaging device 8 detects that the brightness of the reflected light changes suddenly, and this indicates that the soldering is defective. I understand that there is something.
例えば抵抗チップやコンデンサチップの様な電極が2つ
ある部品の半田付部分を見る場合、左側の半田付を見る
時は光線を斜め右上方から当て、右側の半田付を見る時
は光線を斜め左上方から当てると検出が容易である。For example, when looking at the soldered part of a component with two electrodes, such as a resistor chip or a capacitor chip, when looking at the soldering on the left side, shine the light diagonally from the upper right, and when looking at the soldering on the right side, shine the light beam diagonally. It is easier to detect if you hit it from the upper left.
なお、光源および撮像装置を固定させてむき、チップ部
品が半田付されたプリント基板を、自由に動かせ得るテ
ーブル上に乗せて、各半田付部分が撮像装置の下方に来
るように上記テーブルを自動的に動かせるようにすれば
自動的に半田付不良を検出することができる。In addition, the light source and imaging device are fixed, the printed circuit board to which the chip components are soldered is placed on a freely movable table, and the table is automatically moved so that each soldered part is below the imaging device. By making it possible to move the target, it is possible to automatically detect soldering defects.
また、撮像装置の視野は、半田付部分において半径0.
6 mm程度の円形の範囲が適当である。Further, the field of view of the imaging device has a radius of 0.
A circular range of about 6 mm is appropriate.
この考案は、以上のように、プリント基板に半田付され
たチップ部品の半田付部分に斜めに光線を当てる光源と
、その半田付部分の反射光を検出する撮像装置と、これ
らの光源および撮像装置を上記半田付部分に対して順次
移動させる移動装置とよりなり、上記半田付部分の半田
付の良否による反射光の検出の相異によって半田付の良
否を検出するように構成したことを特徴とするチップ部
品の半田付良否の検出装置を提供したので、従来は作業
者が肉眼で半田付の不良を探がしたり、あるいは導通試
験器の先端の尖った検出ピンをプリント基板の銅箔パタ
ーンとチップ部品の電極部との間に当てて半田付の不良
を探していたが、この考案のチップ部品の半田付良否の
検出装置によって、自動的に、かつ、正確に半田付の不
良箇所を検出することができ、昔た、作業性も向上させ
ることができる。As described above, this idea consists of a light source that applies a beam of light obliquely to the soldered part of a chip component soldered to a printed circuit board, an imaging device that detects the reflected light from the soldered part, and a combination of these light sources and the imaging device. It is characterized by a moving device that sequentially moves the device relative to the soldering portion, and configured to detect whether the soldering is good or bad based on the difference in detection of reflected light depending on the quality of the soldering in the soldering portion. Since we have provided a device for detecting the soldering quality of chip components, conventionally, workers had to look for soldering defects with their naked eyes, or they could use the sharp detection pin of a continuity tester to detect soldering defects by touching the copper foil of a printed circuit board. Previously, we used to search for defective soldering by applying the sensor between the pattern and the electrode of the chip component, but this device for detecting the defective soldering of chip components automatically and accurately detects the location of the defective soldering. can be detected, and work efficiency can also be improved.
第1図A、Bはこの考案の半田付良否の検出装置により
半田付不良の検出を行なう概略図、第2図釦よび第3図
は撮像装置による半田付部分の反射光の明るさの変化を
示すものである。
1・・・プリント基板、2,2′・・・銅箔パターン、
3・・・チップ部品、4,4′・・・電極、5.5’
、6・・・半田付部分、1・・・光源、8・・・撮像
装置、G・・・ギャップ。Figures 1A and B are schematic diagrams of how the soldering quality detection device of this invention detects soldering defects. Figures 2 and 3 are diagrams showing changes in the brightness of reflected light from the soldered area by an imaging device. This shows that. 1... Printed circuit board, 2, 2'... Copper foil pattern,
3... Chip component, 4,4'... Electrode, 5.5'
, 6...Soldering part, 1...Light source, 8...Imaging device, G...Gap.
Claims (1)
めに光線を当てる光源と、その半田付部分の反射光を検
出する撮像装置と、これらの光源および撮像装置を上記
半田付部分に対して順次移動させる移動装置とよりなり
、上記半田付部分の半田付の良否による反射光の検出の
相異によって半田付の良否を検出するように構成したこ
とを特徴とするチップ部品の半田付良否の検出装置。A light source that applies a beam of light diagonally to the soldered part of a chip component soldered to a printed circuit board, an imaging device that detects the reflected light from the soldered part, and a light source and imaging device that sequentially illuminate the soldered part. Detecting the quality of soldering of a chip component, comprising a moving device for moving the soldered part, and configured to detect the quality of soldering based on the difference in detection of reflected light depending on the quality of soldering of the soldered part. Device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP40679U JPS5940783Y2 (en) | 1979-01-09 | 1979-01-09 | Device for detecting soldering quality of chip parts |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP40679U JPS5940783Y2 (en) | 1979-01-09 | 1979-01-09 | Device for detecting soldering quality of chip parts |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55101082U JPS55101082U (en) | 1980-07-14 |
JPS5940783Y2 true JPS5940783Y2 (en) | 1984-11-20 |
Family
ID=28801641
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP40679U Expired JPS5940783Y2 (en) | 1979-01-09 | 1979-01-09 | Device for detecting soldering quality of chip parts |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5940783Y2 (en) |
-
1979
- 1979-01-09 JP JP40679U patent/JPS5940783Y2/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS55101082U (en) | 1980-07-14 |
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