JPS61243303A - Visual inspection system for mounted substrate - Google Patents

Visual inspection system for mounted substrate

Info

Publication number
JPS61243303A
JPS61243303A JP8448585A JP8448585A JPS61243303A JP S61243303 A JPS61243303 A JP S61243303A JP 8448585 A JP8448585 A JP 8448585A JP 8448585 A JP8448585 A JP 8448585A JP S61243303 A JPS61243303 A JP S61243303A
Authority
JP
Japan
Prior art keywords
substrate
light
visual inspection
brightness
projected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8448585A
Other languages
Japanese (ja)
Inventor
Kiyoo Takeyasu
Original Assignee
Hitachi Denshi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Denshi Ltd filed Critical Hitachi Denshi Ltd
Priority to JP8448585A priority Critical patent/JPS61243303A/en
Publication of JPS61243303A publication Critical patent/JPS61243303A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical means

Abstract

PURPOSE:To accurately detect the mounting position of a part to be mounted to a surface by using such illuminating means as to image the profile portion of a part mounted to a substrate in high brightness as compared with the other portion and detecting the position of the highly bright portion. CONSTITUTION:A parallel light beam is projected on a substrate with an inclination and the illumination of the light beam is restricted to a specific direction to the utmost when the substrate is viewed from above. By adopting such an illumination system, only the light beam projected on the edge portion of a chip part 10 is inputted to a TV camera. In result, the output of the TV camera 21 has an image with a high level of brightness only in the portion shown by a thick full line in the accompanying drawing. By detecting the position of the highly bright portion, the mounting position or attitude of the part on the substrate is recognized.
JP8448585A 1985-04-22 1985-04-22 Visual inspection system for mounted substrate Pending JPS61243303A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8448585A JPS61243303A (en) 1985-04-22 1985-04-22 Visual inspection system for mounted substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8448585A JPS61243303A (en) 1985-04-22 1985-04-22 Visual inspection system for mounted substrate

Publications (1)

Publication Number Publication Date
JPS61243303A true JPS61243303A (en) 1986-10-29

Family

ID=13831950

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8448585A Pending JPS61243303A (en) 1985-04-22 1985-04-22 Visual inspection system for mounted substrate

Country Status (1)

Country Link
JP (1) JPS61243303A (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62239040A (en) * 1986-04-11 1987-10-19 Tokyo Electron Ltd Inspection system for fitting state of electronic component
JPS63173489A (en) * 1987-01-13 1988-07-18 Omron Tateisi Electronics Co Packaged substrate inspection instrument
JPS6457106A (en) * 1987-08-28 1989-03-03 Tdk Corp Optical method for inspecting appearance of chip component and automatic appearance sorter
JPH0221249A (en) * 1988-07-08 1990-01-24 Matsushita Electric Ind Co Ltd Appearance inspection for electronic component
JPH0221247A (en) * 1988-07-08 1990-01-24 Matsushita Electric Ind Co Ltd Detection of inside-out inversion for electronic component
JPH0221246A (en) * 1988-07-08 1990-01-24 Matsushita Electric Ind Co Ltd Appearance inspection for electronic component
JPH0244236A (en) * 1988-08-03 1990-02-14 Matsushita Electric Ind Co Ltd Appearance inspection for electronic component with lead
JPH02243914A (en) * 1989-03-16 1990-09-28 Yorozu Jidosha Kogyo Kk Three-dimensional coordinate measuring instrument
JP2008298489A (en) * 2007-05-29 2008-12-11 Saki Corp:Kk Inspection system of inspection object
JP2012169575A (en) * 2011-02-17 2012-09-06 Panasonic Corp Electronic component and manufacturing method of the same

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5999205A (en) * 1983-06-16 1984-06-07 Sumitomo Electric Ind Ltd Apparatus for measuring deviation of composite metallic tape

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5999205A (en) * 1983-06-16 1984-06-07 Sumitomo Electric Ind Ltd Apparatus for measuring deviation of composite metallic tape

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62239040A (en) * 1986-04-11 1987-10-19 Tokyo Electron Ltd Inspection system for fitting state of electronic component
JPS63173489A (en) * 1987-01-13 1988-07-18 Omron Tateisi Electronics Co Packaged substrate inspection instrument
JPS6457106A (en) * 1987-08-28 1989-03-03 Tdk Corp Optical method for inspecting appearance of chip component and automatic appearance sorter
JPH0221249A (en) * 1988-07-08 1990-01-24 Matsushita Electric Ind Co Ltd Appearance inspection for electronic component
JPH0221247A (en) * 1988-07-08 1990-01-24 Matsushita Electric Ind Co Ltd Detection of inside-out inversion for electronic component
JPH0221246A (en) * 1988-07-08 1990-01-24 Matsushita Electric Ind Co Ltd Appearance inspection for electronic component
JPH0244236A (en) * 1988-08-03 1990-02-14 Matsushita Electric Ind Co Ltd Appearance inspection for electronic component with lead
JPH02243914A (en) * 1989-03-16 1990-09-28 Yorozu Jidosha Kogyo Kk Three-dimensional coordinate measuring instrument
JP2008298489A (en) * 2007-05-29 2008-12-11 Saki Corp:Kk Inspection system of inspection object
JP2012169575A (en) * 2011-02-17 2012-09-06 Panasonic Corp Electronic component and manufacturing method of the same

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