JPS61243303A - Visual inspection system for mounted substrate - Google Patents
Visual inspection system for mounted substrateInfo
- Publication number
- JPS61243303A JPS61243303A JP8448585A JP8448585A JPS61243303A JP S61243303 A JPS61243303 A JP S61243303A JP 8448585 A JP8448585 A JP 8448585A JP 8448585 A JP8448585 A JP 8448585A JP S61243303 A JPS61243303 A JP S61243303A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- light
- visual inspection
- brightness
- projected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 title abstract 5
- 238000011179 visual inspection Methods 0.000 title 1
- 238000005286 illumination Methods 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical means
Abstract
PURPOSE:To accurately detect the mounting position of a part to be mounted to a surface by using such illuminating means as to image the profile portion of a part mounted to a substrate in high brightness as compared with the other portion and detecting the position of the highly bright portion. CONSTITUTION:A parallel light beam is projected on a substrate with an inclination and the illumination of the light beam is restricted to a specific direction to the utmost when the substrate is viewed from above. By adopting such an illumination system, only the light beam projected on the edge portion of a chip part 10 is inputted to a TV camera. In result, the output of the TV camera 21 has an image with a high level of brightness only in the portion shown by a thick full line in the accompanying drawing. By detecting the position of the highly bright portion, the mounting position or attitude of the part on the substrate is recognized.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8448585A JPS61243303A (en) | 1985-04-22 | 1985-04-22 | Visual inspection system for mounted substrate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8448585A JPS61243303A (en) | 1985-04-22 | 1985-04-22 | Visual inspection system for mounted substrate |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61243303A true JPS61243303A (en) | 1986-10-29 |
Family
ID=13831950
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8448585A Pending JPS61243303A (en) | 1985-04-22 | 1985-04-22 | Visual inspection system for mounted substrate |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61243303A (en) |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62239040A (en) * | 1986-04-11 | 1987-10-19 | Tokyo Electron Ltd | Inspection system for fitting state of electronic component |
JPS63173489A (en) * | 1987-01-13 | 1988-07-18 | Omron Tateisi Electronics Co | Packaged substrate inspection instrument |
JPS6457106A (en) * | 1987-08-28 | 1989-03-03 | Tdk Corp | Optical method for inspecting appearance of chip component and automatic appearance sorter |
JPH0221249A (en) * | 1988-07-08 | 1990-01-24 | Matsushita Electric Ind Co Ltd | Appearance inspection for electronic component |
JPH0221247A (en) * | 1988-07-08 | 1990-01-24 | Matsushita Electric Ind Co Ltd | Detection of inside-out inversion for electronic component |
JPH0221246A (en) * | 1988-07-08 | 1990-01-24 | Matsushita Electric Ind Co Ltd | Appearance inspection for electronic component |
JPH0244236A (en) * | 1988-08-03 | 1990-02-14 | Matsushita Electric Ind Co Ltd | Appearance inspection for electronic component with lead |
JPH02243914A (en) * | 1989-03-16 | 1990-09-28 | Yorozu Jidosha Kogyo Kk | Three-dimensional coordinate measuring instrument |
JP2008298489A (en) * | 2007-05-29 | 2008-12-11 | Saki Corp:Kk | Inspection system of inspection object |
JP2012169575A (en) * | 2011-02-17 | 2012-09-06 | Panasonic Corp | Electronic component and manufacturing method of the same |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5999205A (en) * | 1983-06-16 | 1984-06-07 | Sumitomo Electric Ind Ltd | Apparatus for measuring deviation of composite metallic tape |
-
1985
- 1985-04-22 JP JP8448585A patent/JPS61243303A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5999205A (en) * | 1983-06-16 | 1984-06-07 | Sumitomo Electric Ind Ltd | Apparatus for measuring deviation of composite metallic tape |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62239040A (en) * | 1986-04-11 | 1987-10-19 | Tokyo Electron Ltd | Inspection system for fitting state of electronic component |
JPS63173489A (en) * | 1987-01-13 | 1988-07-18 | Omron Tateisi Electronics Co | Packaged substrate inspection instrument |
JPS6457106A (en) * | 1987-08-28 | 1989-03-03 | Tdk Corp | Optical method for inspecting appearance of chip component and automatic appearance sorter |
JPH0221249A (en) * | 1988-07-08 | 1990-01-24 | Matsushita Electric Ind Co Ltd | Appearance inspection for electronic component |
JPH0221247A (en) * | 1988-07-08 | 1990-01-24 | Matsushita Electric Ind Co Ltd | Detection of inside-out inversion for electronic component |
JPH0221246A (en) * | 1988-07-08 | 1990-01-24 | Matsushita Electric Ind Co Ltd | Appearance inspection for electronic component |
JPH0244236A (en) * | 1988-08-03 | 1990-02-14 | Matsushita Electric Ind Co Ltd | Appearance inspection for electronic component with lead |
JPH02243914A (en) * | 1989-03-16 | 1990-09-28 | Yorozu Jidosha Kogyo Kk | Three-dimensional coordinate measuring instrument |
JP2008298489A (en) * | 2007-05-29 | 2008-12-11 | Saki Corp:Kk | Inspection system of inspection object |
JP2012169575A (en) * | 2011-02-17 | 2012-09-06 | Panasonic Corp | Electronic component and manufacturing method of the same |
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