JPS59229480A - スパツタリング装置 - Google Patents
スパツタリング装置Info
- Publication number
- JPS59229480A JPS59229480A JP10275783A JP10275783A JPS59229480A JP S59229480 A JPS59229480 A JP S59229480A JP 10275783 A JP10275783 A JP 10275783A JP 10275783 A JP10275783 A JP 10275783A JP S59229480 A JPS59229480 A JP S59229480A
- Authority
- JP
- Japan
- Prior art keywords
- target
- electrode
- substrate
- film
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004544 sputter deposition Methods 0.000 title claims description 18
- 239000000758 substrate Substances 0.000 claims description 46
- 239000010409 thin film Substances 0.000 claims description 10
- 238000000151 deposition Methods 0.000 claims description 3
- 150000002500 ions Chemical class 0.000 claims description 3
- 230000008021 deposition Effects 0.000 abstract description 3
- 239000010408 film Substances 0.000 description 30
- 239000000203 mixture Substances 0.000 description 15
- 238000009826 distribution Methods 0.000 description 7
- 238000000034 method Methods 0.000 description 7
- 230000015572 biosynthetic process Effects 0.000 description 6
- 239000000470 constituent Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 229910052681 coesite Inorganic materials 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/225—Oblique incidence of vaporised material on substrate
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10275783A JPS59229480A (ja) | 1983-06-10 | 1983-06-10 | スパツタリング装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10275783A JPS59229480A (ja) | 1983-06-10 | 1983-06-10 | スパツタリング装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59229480A true JPS59229480A (ja) | 1984-12-22 |
| JPS6361387B2 JPS6361387B2 (enrdf_load_stackoverflow) | 1988-11-29 |
Family
ID=14336072
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10275783A Granted JPS59229480A (ja) | 1983-06-10 | 1983-06-10 | スパツタリング装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59229480A (enrdf_load_stackoverflow) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05287524A (ja) * | 1992-04-09 | 1993-11-02 | Anelva Corp | マグネトロンスパッタリング用ターゲット |
| JPH0616461U (ja) * | 1992-01-29 | 1994-03-04 | ライボルト アクチエンゲゼルシヤフト | カソードスパッタリング装置用ターゲット |
| US5919345A (en) * | 1994-09-27 | 1999-07-06 | Applied Materials, Inc. | Uniform film thickness deposition of sputtered materials |
| JP2001064770A (ja) * | 1999-06-24 | 2001-03-13 | Ulvac Japan Ltd | スパッタリング装置 |
| SG85732A1 (en) * | 1999-10-28 | 2002-01-15 | Applied Komatsu Technology Inc | Tilted sputtering target with shield to block contaminants |
| JP2011061063A (ja) * | 2009-09-11 | 2011-03-24 | Sharp Corp | アルミニウム含有窒化物中間層の製造方法、窒化物層の製造方法および窒化物半導体素子の製造方法 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5776185A (en) * | 1980-10-30 | 1982-05-13 | Ulvac Corp | Sputtering device |
| JPS57141930A (en) * | 1981-02-27 | 1982-09-02 | Hitachi Ltd | Device for formation of thin film |
-
1983
- 1983-06-10 JP JP10275783A patent/JPS59229480A/ja active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5776185A (en) * | 1980-10-30 | 1982-05-13 | Ulvac Corp | Sputtering device |
| JPS57141930A (en) * | 1981-02-27 | 1982-09-02 | Hitachi Ltd | Device for formation of thin film |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0616461U (ja) * | 1992-01-29 | 1994-03-04 | ライボルト アクチエンゲゼルシヤフト | カソードスパッタリング装置用ターゲット |
| JPH05287524A (ja) * | 1992-04-09 | 1993-11-02 | Anelva Corp | マグネトロンスパッタリング用ターゲット |
| US5919345A (en) * | 1994-09-27 | 1999-07-06 | Applied Materials, Inc. | Uniform film thickness deposition of sputtered materials |
| JP2001064770A (ja) * | 1999-06-24 | 2001-03-13 | Ulvac Japan Ltd | スパッタリング装置 |
| SG85732A1 (en) * | 1999-10-28 | 2002-01-15 | Applied Komatsu Technology Inc | Tilted sputtering target with shield to block contaminants |
| JP2011061063A (ja) * | 2009-09-11 | 2011-03-24 | Sharp Corp | アルミニウム含有窒化物中間層の製造方法、窒化物層の製造方法および窒化物半導体素子の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6361387B2 (enrdf_load_stackoverflow) | 1988-11-29 |
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