JPS59227970A - Abrasive - Google Patents

Abrasive

Info

Publication number
JPS59227970A
JPS59227970A JP10275883A JP10275883A JPS59227970A JP S59227970 A JPS59227970 A JP S59227970A JP 10275883 A JP10275883 A JP 10275883A JP 10275883 A JP10275883 A JP 10275883A JP S59227970 A JPS59227970 A JP S59227970A
Authority
JP
Japan
Prior art keywords
abrasive
abrasive material
resin
powder
synthetic resin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10275883A
Other languages
Japanese (ja)
Other versions
JPS6121982B2 (en
Inventor
Takashi Miyatani
孝 宮谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP10275883A priority Critical patent/JPS59227970A/en
Publication of JPS59227970A publication Critical patent/JPS59227970A/en
Publication of JPS6121982B2 publication Critical patent/JPS6121982B2/ja
Granted legal-status Critical Current

Links

Abstract

PURPOSE:To provide an abrasive which effectively removes fins formed in the production of a molding such as semiconductor without causing damage to the molding, prepd. by adding a rigid abrasive in powder to a synthetic resin in granules. CONSTITUTION:A rigid abrasive in powder (e.g. glass powder having an average praticle diameter of about 0.1mm. is mixed in an amt. of about 1-100vol% into a synthetic resin soln. (e.g. unsatd. polyester resin soln.) and a hardener is added thereto. The cured resin is crushed and classified to obtain a polygonal abrasive 7 with such a structure that rigid abrasive in powder 6 is attached to the surface and incorporated in the interior of a synthetic resin compsn. in particle 5 having an average diameter of about 0.5-1mm.. When the abrasive 7 impinges upon a workpiece, cracking occurs readily from the rigid abrasive powder 6 as starting point and growth of cracks eventually lead to partial coming-off of the resin compsn. and formation of new sharp edges, thus preventing lowering of a fin- removing ability of the abrasive over a long period.

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明は研磨材に関し、特に合成樹脂のパリ除去に適し
た研磨材に関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to an abrasive material, and particularly to an abrasive material suitable for removing pars from synthetic resins.

〔発明の技術的背景とその問題点〕[Technical background of the invention and its problems]

例えば、ICやLSIなどの半導体装置の製造工程にお
いて、半導体素子がマウントされたリードフレームを成
形用金型内に収納した後、この金型内にエポキシ樹脂を
注入して第1図に示すようにリードフレーム(1)上の
半導体1子(図示せず)が樹脂層(2)で封止された半
導体モールド成形品(3)を成形している。しかしなが
ら、かかるモールド成形時においては樹脂層(2)付近
のリードフレーム(1)上及びリードフレーム(1)の
リード間に樹脂パリ(4)・・・が発生するため、成形
後の後加工として樹脂パリ(4)・・・の除去工程を必
要とする。とのようなことから、従来においてはアルミ
ナ、炭化珪素、ガラスピーズ等の硬質ωF暦材、又はク
ルミ殻等の軟質研磨材を前記リードフレーム(1)の樹
脂パリ(4)・・・に高速噴射し、この樹脂パリ(4)
・・・を破壊して除去している。しかしながら、硬質研
磨材を用いた場合、その硬度は1(几C70以上である
のに対しエポキシ樹脂の硬度はH几M100前後であり
、研磨材の方がエポキシ樹脂に比べてはるかに硬く、か
つ比重も4倍以上と太きいため、樹脂71月4)・・・
の除去に際し、モールド成形品(3)の表面に傷を伺け
て外観を損ねると共に、モールド成形品(3)の偏部か
ら水分が浸透し、牛導体累子の信頼性に悪影響を及ぼす
という問題があった。他方、軟質イσf暦材を用いた場
合、研磨力が弱いため、硬質研磨材を用いる場合よシも
高圧で加圧噴射する必要がある。その結果、リードフレ
ーム(1)の曲げを生じる恐れがあるばかりか、ランニ
ングコストの高j舜化を招く欠点があった。まだ軟質研
Ws材を用いた場合、この研磨材とモールド成形品(3
)とが接触することVCよ)静電気が発生し、この静電
気により研磨材の破砕粉がモールド成形品(3)表面に
強固に刺着するため、はんだのぬれ性が低下し、後工程
での半[1]コートやめっきにおいて外観不良を招いた
り、リードフレーム(1)の腐食の発生原因となる。
For example, in the manufacturing process of semiconductor devices such as ICs and LSIs, a lead frame on which a semiconductor element is mounted is housed in a mold for molding, and then epoxy resin is injected into the mold as shown in Figure 1. A semiconductor molded product (3) is formed in which a single semiconductor (not shown) on a lead frame (1) is sealed with a resin layer (2). However, during such mold forming, resin particles (4) are generated on the lead frame (1) near the resin layer (2) and between the leads of the lead frame (1), so it is necessary to perform post-processing after molding. Removal step of resin particles (4) is required. For this reason, in the past, hard ωF materials such as alumina, silicon carbide, and glass beads, or soft abrasive materials such as walnut shells were applied to the resin pad (4) of the lead frame (1) at high speed. Inject this resin Paris (4)
...is destroyed and removed. However, when a hard abrasive material is used, its hardness is 1 (C70 or higher), whereas the hardness of epoxy resin is around H C70, and the abrasive material is much harder than epoxy resin. Because the specific gravity is more than 4 times thicker, resin 71 month 4)...
When removing the molded product (3), the surface of the molded product (3) was damaged and its appearance was damaged, and moisture penetrated from uneven parts of the molded product (3), which adversely affected the reliability of the conductor. There was a problem. On the other hand, when a soft abrasive material is used, the abrasive force is weak, so it is necessary to spray at a high pressure even when a hard abrasive material is used. As a result, there was a drawback that not only the lead frame (1) might be bent, but also the running cost would increase. If soft abrasive Ws material is still used, this abrasive material and molded product (3
) Static electricity is generated, and this static electricity causes the crushed powder of the abrasive to firmly stick to the surface of the molded product (3), reducing the wettability of the solder and causing damage in the subsequent process. This may cause poor appearance in semi-[1] coat or plating, and cause corrosion of the lead frame (1).

〔発明の目的〕[Purpose of the invention]

本発明は、上記事情を勘案してなされたもので、例えば
半導体などのモールド成形品の成形時に樹脂パリを効率
的に除去できるとともに、モールド成形品の損傷を招く
ことがない研磨材を提供しようとするものである。
The present invention has been made in consideration of the above circumstances, and it is an object of the present invention to provide an abrasive material that can efficiently remove resin debris during the molding of molded products such as semiconductors, and does not cause damage to the molded products. That is.

〔発明の概要〕[Summary of the invention]

本発明の研磨材は、合成樹脂粒状物に例えばガラスピー
ズなどの粉体状の硬質研磨材を保持させたものである。
The abrasive material of the present invention is made by holding a powdery hard abrasive material such as glass beads in synthetic resin granules.

上記合成樹脂粒状物としては、尿素樹脂、メラミン樹脂
、ポリエステル樹脂、アルキッド樹脂、エポキシ樹脂等
の熱硬化性樹脂、又はポリアミド、ポリカーボネート、
ポリスチレンなどの熱可塑性樹脂を用いることができる
。とりわけ、熱硬化性樹脂を用いた場合、噴射加工時の
衝撃により鋭いエツジが不断に杓生されるので樹脂パリ
除去に適している。こうした合成樹脂粒状物の粒径は、
研磨材の用途によシ自由に選定し得るが、例えばモール
ド成形品の樹脂パリ除去に用いる場合には平均粒径(一
つの粒子の最大径と最小径の和のl/2)で0.5〜1
.Q mynの範囲内においてピークをもつものが望ま
しい。また、この合成樹脂粒状物の形状は、球状、多角
体等任煮である。
The synthetic resin particles include thermosetting resins such as urea resin, melamine resin, polyester resin, alkyd resin, and epoxy resin, or polyamide, polycarbonate,
Thermoplastic resins such as polystyrene can be used. In particular, when a thermosetting resin is used, it is suitable for removing resin particles because sharp edges are constantly created by the impact during the injection process. The particle size of these synthetic resin particles is
The abrasive can be freely selected depending on its purpose, but for example, when used for removing resin particles from molded products, the average particle diameter (l/2 of the sum of the maximum diameter and minimum diameter of one particle) is 0. 5-1
.. It is desirable to have a peak within the range of Q myn. The shape of the synthetic resin particles may be arbitrary, such as spherical or polygonal.

一方、粉体状の硬質研磨材は、合成樹脂粒状物より研磨
能力が大きく、合成樹脂粒状物単独の場合よシも研磨能
力を向上させるだめのものである。
On the other hand, a powdery hard abrasive material has a greater polishing ability than a synthetic resin granule, and can improve the polishing ability even more than the synthetic resin granule alone.

このような硬質研磨材としては、平均粒径がQ、1mm
前後(粒子2Jlt150)のガラスピーズが好適して
いる。
As such a hard abrasive material, the average particle size is Q, 1 mm.
Glass beads of front and back (particles 2Jlt150) are suitable.

このような粉体状硬質研磨材の合成樹脂粒状物への混合
割合は、体積比で1〜ioo体積%であって、最適範囲
としては5〜30体積%である。
The mixing ratio of such a powdery hard abrasive material to the synthetic resin granules is 1 to 100% by volume, and the optimum range is 5 to 30% by volume.

本発明における研磨材は、合成樹脂粒状物に粉体状の硬
質研磨材を保持させたものであるが、具体的には以下に
示す2種類のものがある。
The abrasive material in the present invention is made by holding a hard abrasive material in the form of a powder in synthetic resin granules, and specifically there are two types of abrasive materials shown below.

■粉体状硬Xイυ+磨材が合成樹脂粒状物の表面のみ々
らず内部にも分散して混在している研磨材。
■An abrasive material in which powdered hard XIυ+ abrasive material is dispersed and mixed not only on the surface of synthetic resin granules but also inside them.

■粉体状硬質研磨材が合成樹脂粒状物の表面にのみ付着
している@磨材。
■Powdered hard abrasive material is attached only to the surface of synthetic resin granules @Abrasive material.

〔発明の実施例〕[Embodiments of the invention]

以下、本発明の一実施例を図面を参照して詳述する。 Hereinafter, one embodiment of the present invention will be described in detail with reference to the drawings.

まず、不飽和ポリエステル樹脂液に平均粒径Q、1mm
以下のガラスピーズを添加し、攪拌して均一に混合した
後、硬化剤を加えて不飽和ポリエステル硬化物を生成し
た。つづいて、この硬化物をクラッシャ、ハンマー等に
より粗粉砕した後、ボールミル ロールミル又は衝撃粉
砕機等を用いて粗粒子を微粉砕した。この後、做粒子を
篩にょシ分級して第2図に示す如(HRM 100で平
均粒径が0.3朋前後の塊状の合成樹脂粒状物(5)の
表面及び内部にガラスピーズ(6)・・・が25体績%
付着、混在した多角体状の研磨材(力を得た。
First, add an average particle size Q of 1 mm to the unsaturated polyester resin liquid.
The following glass peas were added and stirred to mix uniformly, and then a curing agent was added to produce an unsaturated polyester cured product. Subsequently, this cured product was coarsely pulverized using a crusher, a hammer, etc., and then the coarse particles were pulverized using a ball mill, a roll mill, an impact pulverizer, or the like. After that, the particles were classified through a sieve and glass beads (6 )...is 25 performance%
Adhesive, mixed polygonal abrasives (gained strength).

つぎに、第3図に図示する湿式プラスト装置を用いて前
記研磨材による半導体モールド成形品の樹脂パリ除去を
説明する。まず、加圧室(8)内に設置したホッパ(9
)内に研磨材(7)・・・と水(+0)と’!i=1:
9の比率で収容する。つづいて、第1のポンプ(11)
を作動してQfN材(力・・・を水(IcI)と共に吸
い込み、これをホッパ(9)底部へ強制的に送給するこ
とにより攪拌し、研磨材(7)・・・を均一に分散させ
てスラリーを調整した。ついで、第2のポンプ(1りを
作動させて、スラリーを吸上げてガン(13)に導入し
、これを空気導入管ttaからの圧縮空気により分散加
速して水。
Next, the removal of resin pars from a semiconductor molded product using the abrasive material will be explained using the wet-type plast apparatus shown in FIG. First, the hopper (9) installed in the pressurization chamber (8)
) inside the abrasive (7)... and water (+0) and '! i=1:
Accommodate at a ratio of 9. Next, the first pump (11)
The QfN material (force...) is sucked in together with water (IcI), and this is forcibly fed to the bottom of the hopper (9), stirring it and uniformly dispersing the abrasive material (7)... Then, the second pump (1) was activated to suck up the slurry and introduce it into the gun (13), which was then dispersed and accelerated by compressed air from the air introduction pipe tta to convert it into water. .

研磨材及び空気の三相高速噴射流05)として加工室(
8)内に搬送された半導体モールド成形品(図示せず)
に向って噴射させる。このように噴射流がモールド成形
品に噴射されると、紀4図に示すように研磨材(力がモ
ールド成形品(3)のリードフレーム(1)上及びリー
ドフレーム(1)のリード間に付着した樹脂パリ(4)
に衝突する。樹脂パリ(4)は、熱硬化性のエポキシ樹
脂からなり、脆く破壊され易いため、ガラスピーズ(6
)・・・により研磨力が強イヒされた研F<’ji材(
力による衝う3力及びこの衝牝力に伴なう振動によシ、
樹脂パリ(4)にクラック([6)が発生する。しかし
て、前記樹脂パリ(4)のクラック0())に水が浸入
し、浸入した水はリードフレーム(1)と+’y’41
1Thfバ1月4)の界面に入シ、樹脂71月4)をリ
ードフレーム(11に対して浮かすように作用するため
、樹脂バIJ (aは容易に剥離する。更に、研磨材(
刀が憎I脂バリ(4)のクラック06)・・・に何度も
衝突するため、前記浸入した水による樹脂パリ(4)の
浮上げ作用と相俟って樹脂パリ(4)が完全に除去され
る。とりわけ、本実施例の研磨材(7)は、研磨力が合
成樹脂単独の場合よりも強化されているので、リードフ
レームのリード間にはさまっている厚さ1〜10μmか
ら50μm前後の樹脂パリも除去できる。しかも、本実
施例の研磨材(力は、被加工物に衝突した際に、ガラス
ピーズ(6)・・・を起点としてクラックが生じ易く、
ついには、クラックが成長して、一部が脱落し、新しい
鋭利なエツジが容易に生じる。つまり、本実施例の研磨
材(力は、鋭いエツジの新生作用(自主発刃作用)を有
しているので、樹脂パリの除去能力を長期間にわたって
維持することができる。
The processing chamber (
8) Semiconductor molded product transported inside (not shown)
Spray it towards. When the jet stream is injected onto the molded product in this way, as shown in Fig. Adhered resin particles (4)
collide with Resin Paris (4) is made of thermosetting epoxy resin and is brittle and easily broken, so glass beads (6
) The polishing force of the polished F<'ji material (
Due to the three forces of force and the vibrations accompanying this force,
Cracks ([6) occur in the resin pad (4). Water entered the crack 0()) of the resin pad (4), and the water entered the lead frame (1) and the +'y'41
1 Thf is inserted into the interface of the resin 71 (4) and acts to float it relative to the lead frame (11), so the resin bar IJ (a) is easily peeled off.Furthermore, the abrasive (
Because the sword collides with the crack 06) of the greasy burr (4) many times, the resin burr (4) is completely removed due to the lifting effect of the resin burr (4) caused by the infiltrated water. will be removed. In particular, the abrasive material (7) of this example has stronger abrasive power than the case of synthetic resin alone, so it can also remove the resin particles with a thickness of 1 to 10 μm to about 50 μm that are sandwiched between the leads of the lead frame. Can be removed. Moreover, when the abrasive material (force) of this example collides with the workpiece, cracks are likely to occur starting from the glass beads (6)...
Eventually, the crack will grow and some will fall off, easily creating new sharp edges. In other words, since the abrasive material of this embodiment has the action of generating sharp edges (self-sharpening action), the ability to remove resin particles can be maintained for a long period of time.

ちなみに、ガラスピーズ(6)・・・を含む本実施例の
研磨材(力と、ガラスピーズ(6)・・・を含1ない同
樹脂製の研磨材とを用いて、噴射圧力、噴射流量、噴射
時間が同一の条件で樹脂パリが付着した100個の試験
片についてパリ取りを行ない、何個完全にパリ取シされ
たかを調べた。その結果、ガラスピーズを含まない研磨
材は、100個のうち20〜30個の試験片については
樹脂パリが残存していたが、本実施例の研磨材(7)の
場合は1.00個の試験片全部について完全に樹脂パリ
が除去された。換言すれば、従来の研磨材及び本実施例
の研磨材を用いて100個の試験片全部について完全に
樹脂パリが除去するまでの処理時間を比較すると、本実
施例の研磨材(7)の方が約20%処理時間を短縮でき
る。したがって、三相高速噴射流09の噴出圧力をこと
さら高くしなくとも、樹脂パリ(4)を完全に除去でき
るため、1貝射rtu51によるリードフレームの曲り
を防止できる。才だ、本実施例の研磨材(力は、本体が
合成樹脂からなっているので、アルミナ、炭化珪素等の
硬質研磨材単独の場合に比べて、半導体モールド成形品
(3)及びパリ取りに用いる治具に付着、埋入しにくく
なり、後工程での洗浄処理により容易にパリや研磨側を
除去できる。その結果、はんだのぬれ性が害されること
なく半田コートやメッキ後の外観不良や使用中の腐蝕発
生を防止できる。さらに、ガラスピーズ(6)・・・と
合成付・[脂粒状物(5)とは、一体的に結合している
ので、長期間の使用によシ研暦材の全体量が不足しても
、これらガラスピーズと合成樹脂粒状物とを一定の割合
に配合して補給する必要がなく、そのままの状態で、供
給できる利点を有する。
Incidentally, using the abrasive material (force) of this example containing glass beads (6) and the abrasive material made of the same resin that does not contain glass beads (6), the injection pressure and injection flow rate were Deburring was performed on 100 test pieces with resin particles attached under the same conditions for the injection time, and it was determined how many pieces were completely removed.As a result, it was found that the abrasive material that does not contain glass beads Resin particles remained in 20 to 30 of the test pieces, but in the case of the abrasive material (7) of this example, resin particles were completely removed from all 1.00 test pieces. In other words, when comparing the processing time required to completely remove the resin particles from all 100 test pieces using the conventional abrasive material and the abrasive material of this example, the abrasive material of this example (7) The processing time can be reduced by about 20%. Therefore, the resin paris (4) can be completely removed without increasing the ejection pressure of the three-phase high-speed injection flow 09, and the lead frame by single-shell injection RTU51 can be The abrasive material of this example is able to prevent bending.Since the main body is made of synthetic resin, the abrasive material of this example is stronger than the case of a single hard abrasive material such as alumina or silicon carbide. ) and the jig used for deburring, making it difficult to embed or embed, and the deburrs and polished side can be easily removed by cleaning in the post-process.As a result, solder coating and plating can be performed without impairing solder wettability. It can prevent later appearance defects and corrosion during use.Furthermore, since the glass beads (6) and the synthetic fat particles (5) are integrally bonded, they can be used for a long period of time. Even if the total amount of research material is insufficient for use, there is no need to mix and replenish the glass beads and synthetic resin granules in a fixed ratio, and there is an advantage that the material can be supplied as is.

なお、不発明の研磨材は上記実施例のものに限らず、第
5図に示す如く合成樹脂粒状物(5)表面全体にガラス
ピーズα訃・・を接着剤(18)によシ付着させた研磨
材(7′)を用いてもよい。このVI研磨材(力は、例
えば0.3闘前後の平均粒径の合成樹脂粒状物(5)を
いったん接着剤溶液中にディッピングするか、或いは同
粒状物(5)に接着剤溶液をスプレーするかした後、ガ
ラスピーズ粉体と混合することにより製造し得る。かか
る第5図図示の研磨材(7)においても、前記実施例と
同様、パリ取り性能の向上や洗浄の容易化等の効果を有
する。上記接着剤08)としては、シリコーン樹脂又は
エポキシ樹脂が好適している。後者のエポキシ樹脂を用
いてガラスピーズt1η・・・を接着した場合は、ガラ
スピーズ(17)・・・は、合成樹脂粒状物(5)に強
固に固着されているので、研磨加工にともなってガラス
ピーズfi71・・・が合成樹脂粒状物(5)よシ離脱
する際にクラックが発生し、発生したクランクを起点と
して新しい切刃が新生する自主発刃作用、を有している
ので研暦力を長期間にわたって一定水準に維持すること
ができる。
Incidentally, the uninvented abrasive material is not limited to the one in the above embodiment, but as shown in FIG. An abrasive material (7') may also be used. This VI abrasive material (for example, the synthetic resin granules (5) with an average particle size of around 0.3 mm are dipped in an adhesive solution, or the same granules (5) are sprayed with an adhesive solution. The abrasive material (7) shown in FIG. As the adhesive 08), silicone resin or epoxy resin is suitable. When the glass beads t1η... are bonded using the latter epoxy resin, the glass beads (17)... are firmly fixed to the synthetic resin granules (5), so they are not easily bonded to each other during the polishing process. When the glass beads fi71... separate from the synthetic resin granules (5), a crack occurs, and a new cutting edge is generated starting from the generated crank. Force can be maintained at a constant level for a long period of time.

また、前記実li市例と同様に、補給が容易である利点
を有する。一方、接着剤(18)としてシリコーン樹脂
を用いた場合、接着力は、エポキシ樹脂よシ小ている。
Also, like the above-mentioned commercial example, it has the advantage of being easy to replenish. On the other hand, when silicone resin is used as the adhesive (18), the adhesive strength is lower than that of epoxy resin.

さらに、他の実施例として、ガラスピーズとともに、合
成樹脂粒状物のo、o o i〜1重量%の範囲で、ポ
リオキシエチレンアルキルエーテル類。
Furthermore, as another example, polyoxyethylene alkyl ethers are added to the synthetic resin particles in an amount of o, o o i to 1% by weight, together with glass peas.

ポリオキシエチレンアルキルエステル類等の界面活性剤
をガラスピーズとともに保持されてもよい。
Surfactants such as polyoxyethylene alkyl esters may also be retained with the glass beads.

保持形態は、合成樹脂本体の表面にのみ膜状に付着させ
てもよいし、微粒子状に合成樹脂本体の内部及び表面に
混在させてもよい。このようにすることによシ、合成樹
脂本体にガラスピーズが混在している・ことによる効果
と合わせて、スラリーの表面張力を低下させて樹脂パリ
に生じたクラックへの浸透性を向上させてパリ取り除去
効果を促進させるとともに、モールド成形品の帯電を防
止して、パリや研磨屑の洗浄処理を容易化させることが
できる。また、第6図に示すように、ワイヤカット状の
合成樹脂粒状物(]窃の吠面に接着剤を介してガラスピ
ーズ(2G・・・を被着させた研磨材(7)を用いても
、前記実施例と同様の効果を奏する。本発明に係る研磨
材は上記実施例の如く半導体モールド〔発明の効果〕 以上詳述した如く、本発明によれば半導体モールド及び
その他4成形品の成形時に発生した樹脂パリ等を、この
成形品の損傷を招くことなく、容易かつ迅速に除去でき
ると共に1樹脂パリ除去後のモールド成形品の洗浄を容
易に行なうことができる等顕著な効果を奏する。
The holding form may be attached only to the surface of the synthetic resin body in the form of a film, or may be mixed in the form of fine particles inside and on the surface of the synthetic resin body. By doing this, together with the effect of glass beads being mixed in the synthetic resin body, the surface tension of the slurry is lowered and its permeability into cracks that occur in the resin layer is improved. In addition to promoting the deburring effect, it is possible to prevent charging of the molded product and facilitate the cleaning process for deburring and polishing debris. In addition, as shown in Fig. 6, an abrasive material (7) with glass beads (2G... The abrasive material according to the present invention can be applied to semiconductor molds and other four molded products as described in detail above. Resin particles generated during molding can be easily and quickly removed without causing damage to the molded product, and the molded product can be easily cleaned after removing the resin particles. .

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は半導体モールド成形品を示す平面図、第2図は
本発明の一実施例を示す研磨材の断面図、第3図は第2
図の研磨材によるブラスト処理に用いられる湿式プラス
ト装置の一形jコ―を示す説明図、(1)・・・リード
フレーム     (2)・・・樹 脂層、(3)・・
・半導体モールド成形品、(4)・・・樹脂パリ、(5
)・・・合成樹脂粒状物、 (6)、(lη、婚・ガラ
スピーズ、(9) ’・・・ホ ッ パ、      
QO)・・・水、(Ll)、 (12) =−ポンプ、
    (131・・if 7、(15)・・・三相高
速噴射流、  (t6)・・・クラック。 代理人 弁理士  則 近 麓 佑 (ほか1名) ず 1 図 T20   下50
Fig. 1 is a plan view showing a semiconductor molded product, Fig. 2 is a sectional view of an abrasive material showing an embodiment of the present invention, and Fig. 3 is a plan view showing a semiconductor molded product.
An explanatory diagram showing a type of wet blasting equipment used for blasting with the abrasive material shown in the figure, (1)...Lead frame (2)...Resin layer, (3)...
・Semiconductor molded product, (4)... Resin Paris, (5
)...Synthetic resin granules, (6), (lη, glass beads, (9) '...hopper,
QO)...Water, (Ll), (12) =-pump,
(131...if 7, (15)...Three-phase high-speed jet flow, (t6)...Crack. Agent Patent attorney Nori Chika Fumoto Yu (and 1 other person) Zu 1 Figure T20 Lower 50

Claims (5)

【特許請求の範囲】[Claims] (1)合成側屈粒状物と、この合成樹11¥fね状物に
保持された粉体状硬質研磨材とを具備することを特徴と
する研磨材。
(1) An abrasive material comprising a synthetic side bending granular material and a powdery hard abrasive material held in the synthetic wood 11¥f granular material.
(2)粉体状硬質研磨材は合成わ1罷粒状物の表面に付
着していることを特徴とする特許d11求の範囲第1項
記載の研磨材。
(2) The abrasive material according to item 1 of the scope of patent d11, characterized in that the powdery hard abrasive material is attached to the surface of a synthetic grain granule.
(3)粉体状硬質研磨材は合既俯脂粒状物の表面のみな
らず内部にも分散して混任していることを特徴とする特
許請求の範囲第1項記載のイσ[磨材。
(3) The powdery hard abrasive material is dispersed and mixed not only on the surface of the combined fat granules but also in the interior thereof. Material.
(4)合成イシj脂粒状物は熱硬化性樹脂により形成さ
れていることを特徴とする特d′f請求の範囲第1項及
至第3項記載の研磨材。
(4) The abrasive material according to claims 1 to 3, wherein the synthetic grain particles are made of a thermosetting resin.
(5)粉体状硬質イυ1麿材はガラスピース″であるこ
とを特徴とする特許請求の範囲第1項及至第3項記載の
研磨材。
(5) The abrasive material according to claims 1 to 3, wherein the powdery hard material is a glass piece.
JP10275883A 1983-06-10 1983-06-10 Abrasive Granted JPS59227970A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10275883A JPS59227970A (en) 1983-06-10 1983-06-10 Abrasive

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10275883A JPS59227970A (en) 1983-06-10 1983-06-10 Abrasive

Publications (2)

Publication Number Publication Date
JPS59227970A true JPS59227970A (en) 1984-12-21
JPS6121982B2 JPS6121982B2 (en) 1986-05-29

Family

ID=14336096

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10275883A Granted JPS59227970A (en) 1983-06-10 1983-06-10 Abrasive

Country Status (1)

Country Link
JP (1) JPS59227970A (en)

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6288568A (en) * 1985-10-16 1987-04-23 Mitsui Toatsu Chem Inc Abrasive
JPH03166060A (en) * 1989-11-24 1991-07-18 Mitsui Toatsu Chem Inc Composite projection material for blasting
JPH04115870A (en) * 1990-09-05 1992-04-16 Sony Corp Injection type work device for free composite abrasive grain
JPH10225534A (en) * 1997-02-17 1998-08-25 Yokohama Rubber Co Ltd:The Manufacture of golf ball
JPH10232099A (en) * 1997-02-19 1998-09-02 Genden Koji Kk Method and device for grinding and sweeping internal surface of tube
JP2000079563A (en) * 1998-09-02 2000-03-21 Yunipetsuku:Kk Pipe grinding method and grinding material
JP2000127045A (en) * 1998-10-20 2000-05-09 Sinto Brator Co Ltd Projection material for sand blast
WO2000045994A1 (en) * 1999-02-01 2000-08-10 Bridgestone Corporation Grinding beads and beads production method and device therefor
JP2003170603A (en) * 2001-09-26 2003-06-17 Fuji Photo Film Co Ltd Method and apparatus for manufacturing liquid drop jet head
JP2003306664A (en) * 2002-04-12 2003-10-31 Mitsuboshi Belting Ltd Resin composite abrasive material
JP2004001231A (en) * 2003-08-19 2004-01-08 Kamei Tekkosho:Kk Abrasive material
JP2004243464A (en) * 2003-02-13 2004-09-02 Toshiba Corp Polishing method of large-sized parts and abrasive grain for use in it
JP2005179604A (en) * 2003-12-22 2005-07-07 Polyplastics Co Abrasive material and method for reclaiming metal parts of molding machine
JP2008168117A (en) * 2006-12-12 2008-07-24 Akiyama Seisakusho:Kk Suturing needle, and manufacturing method for suturing needle
JP2009078106A (en) * 2006-10-10 2009-04-16 Akiyama Seisakusho:Kk Suture needle, and method for manufacturing suture needle
JP2011121120A (en) * 2009-12-08 2011-06-23 Sintokogio Ltd Projection material for blasting and method of manufacturing the same
JP2018145225A (en) * 2017-03-01 2018-09-20 日揮触媒化成株式会社 Polishing material and production method thereof

Cited By (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6288568A (en) * 1985-10-16 1987-04-23 Mitsui Toatsu Chem Inc Abrasive
JPH03166060A (en) * 1989-11-24 1991-07-18 Mitsui Toatsu Chem Inc Composite projection material for blasting
JPH04115870A (en) * 1990-09-05 1992-04-16 Sony Corp Injection type work device for free composite abrasive grain
JPH10225534A (en) * 1997-02-17 1998-08-25 Yokohama Rubber Co Ltd:The Manufacture of golf ball
JPH10232099A (en) * 1997-02-19 1998-09-02 Genden Koji Kk Method and device for grinding and sweeping internal surface of tube
JP2000079563A (en) * 1998-09-02 2000-03-21 Yunipetsuku:Kk Pipe grinding method and grinding material
JP2000127045A (en) * 1998-10-20 2000-05-09 Sinto Brator Co Ltd Projection material for sand blast
JP3626098B2 (en) * 1999-02-01 2005-03-02 株式会社ブリヂストン Beads for grinding, bead manufacturing method and manufacturing apparatus
WO2000045994A1 (en) * 1999-02-01 2000-08-10 Bridgestone Corporation Grinding beads and beads production method and device therefor
JP2003170603A (en) * 2001-09-26 2003-06-17 Fuji Photo Film Co Ltd Method and apparatus for manufacturing liquid drop jet head
JP2003306664A (en) * 2002-04-12 2003-10-31 Mitsuboshi Belting Ltd Resin composite abrasive material
JP2004243464A (en) * 2003-02-13 2004-09-02 Toshiba Corp Polishing method of large-sized parts and abrasive grain for use in it
JP2004001231A (en) * 2003-08-19 2004-01-08 Kamei Tekkosho:Kk Abrasive material
JP2005179604A (en) * 2003-12-22 2005-07-07 Polyplastics Co Abrasive material and method for reclaiming metal parts of molding machine
JP2009078106A (en) * 2006-10-10 2009-04-16 Akiyama Seisakusho:Kk Suture needle, and method for manufacturing suture needle
JP2008168117A (en) * 2006-12-12 2008-07-24 Akiyama Seisakusho:Kk Suturing needle, and manufacturing method for suturing needle
JP2011121120A (en) * 2009-12-08 2011-06-23 Sintokogio Ltd Projection material for blasting and method of manufacturing the same
JP2018145225A (en) * 2017-03-01 2018-09-20 日揮触媒化成株式会社 Polishing material and production method thereof

Also Published As

Publication number Publication date
JPS6121982B2 (en) 1986-05-29

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