JPS59225038A - 生体帰還装置 - Google Patents
生体帰還装置Info
- Publication number
- JPS59225038A JPS59225038A JP58102058A JP10205883A JPS59225038A JP S59225038 A JPS59225038 A JP S59225038A JP 58102058 A JP58102058 A JP 58102058A JP 10205883 A JP10205883 A JP 10205883A JP S59225038 A JPS59225038 A JP S59225038A
- Authority
- JP
- Japan
- Prior art keywords
- frequency
- brain waves
- training
- waves
- brain
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58102058A JPS59225038A (ja) | 1983-06-07 | 1983-06-07 | 生体帰還装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58102058A JPS59225038A (ja) | 1983-06-07 | 1983-06-07 | 生体帰還装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59225038A true JPS59225038A (ja) | 1984-12-18 |
| JPH0518574B2 JPH0518574B2 (enExample) | 1993-03-12 |
Family
ID=14317164
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58102058A Granted JPS59225038A (ja) | 1983-06-07 | 1983-06-07 | 生体帰還装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59225038A (enExample) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0686762A (ja) * | 1992-09-07 | 1994-03-29 | Kanebo Ltd | 脳波を用いた生理状態評価方法及び装置 |
| US5963329A (en) * | 1997-10-31 | 1999-10-05 | International Business Machines Corporation | Method and apparatus for measuring the profile of small repeating lines |
| US6898537B1 (en) | 2001-04-27 | 2005-05-24 | Nanometrics Incorporated | Measurement of diffracting structures using one-half of the non-zero diffracted orders |
| US6949462B1 (en) | 2002-04-04 | 2005-09-27 | Nanometrics Incorporated | Measuring an alignment target with multiple polarization states |
| US6982793B1 (en) | 2002-04-04 | 2006-01-03 | Nanometrics Incorporated | Method and apparatus for using an alignment target with designed in offset |
| US6992764B1 (en) | 2002-09-30 | 2006-01-31 | Nanometrics Incorporated | Measuring an alignment target with a single polarization state |
| US7061615B1 (en) | 2001-09-20 | 2006-06-13 | Nanometrics Incorporated | Spectroscopically measured overlay target |
| US7115858B1 (en) | 2000-09-25 | 2006-10-03 | Nanometrics Incorporated | Apparatus and method for the measurement of diffracting structures |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5636941A (en) * | 1979-09-04 | 1981-04-10 | Matsushita Electric Industrial Co Ltd | Returning device for living body |
-
1983
- 1983-06-07 JP JP58102058A patent/JPS59225038A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5636941A (en) * | 1979-09-04 | 1981-04-10 | Matsushita Electric Industrial Co Ltd | Returning device for living body |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0686762A (ja) * | 1992-09-07 | 1994-03-29 | Kanebo Ltd | 脳波を用いた生理状態評価方法及び装置 |
| US5963329A (en) * | 1997-10-31 | 1999-10-05 | International Business Machines Corporation | Method and apparatus for measuring the profile of small repeating lines |
| US7115858B1 (en) | 2000-09-25 | 2006-10-03 | Nanometrics Incorporated | Apparatus and method for the measurement of diffracting structures |
| US6898537B1 (en) | 2001-04-27 | 2005-05-24 | Nanometrics Incorporated | Measurement of diffracting structures using one-half of the non-zero diffracted orders |
| US7061615B1 (en) | 2001-09-20 | 2006-06-13 | Nanometrics Incorporated | Spectroscopically measured overlay target |
| US6949462B1 (en) | 2002-04-04 | 2005-09-27 | Nanometrics Incorporated | Measuring an alignment target with multiple polarization states |
| US6982793B1 (en) | 2002-04-04 | 2006-01-03 | Nanometrics Incorporated | Method and apparatus for using an alignment target with designed in offset |
| US7230705B1 (en) | 2002-04-04 | 2007-06-12 | Nanometrics Incorporated | Alignment target with designed in offset |
| US7236244B1 (en) | 2002-04-04 | 2007-06-26 | Nanometrics Incorporated | Alignment target to be measured with multiple polarization states |
| US6992764B1 (en) | 2002-09-30 | 2006-01-31 | Nanometrics Incorporated | Measuring an alignment target with a single polarization state |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0518574B2 (enExample) | 1993-03-12 |
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