JPS59218937A - パタ−ン検出装置 - Google Patents
パタ−ン検出装置Info
- Publication number
- JPS59218937A JPS59218937A JP58092304A JP9230483A JPS59218937A JP S59218937 A JPS59218937 A JP S59218937A JP 58092304 A JP58092304 A JP 58092304A JP 9230483 A JP9230483 A JP 9230483A JP S59218937 A JPS59218937 A JP S59218937A
- Authority
- JP
- Japan
- Prior art keywords
- wiring
- filter
- light
- irradiation means
- wiring surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
Landscapes
- Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58092304A JPS59218937A (ja) | 1983-05-27 | 1983-05-27 | パタ−ン検出装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58092304A JPS59218937A (ja) | 1983-05-27 | 1983-05-27 | パタ−ン検出装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59218937A true JPS59218937A (ja) | 1984-12-10 |
JPH0436335B2 JPH0436335B2 (enrdf_load_stackoverflow) | 1992-06-15 |
Family
ID=14050667
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58092304A Granted JPS59218937A (ja) | 1983-05-27 | 1983-05-27 | パタ−ン検出装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59218937A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61278737A (ja) * | 1985-06-03 | 1986-12-09 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | 螢光性基板上の薄膜中の欠陥検出方法 |
KR100880858B1 (ko) | 2007-08-09 | 2009-01-30 | 한기수 | 피씨비 양면 동시 노광기 광원 구조 |
-
1983
- 1983-05-27 JP JP58092304A patent/JPS59218937A/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61278737A (ja) * | 1985-06-03 | 1986-12-09 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | 螢光性基板上の薄膜中の欠陥検出方法 |
KR100880858B1 (ko) | 2007-08-09 | 2009-01-30 | 한기수 | 피씨비 양면 동시 노광기 광원 구조 |
Also Published As
Publication number | Publication date |
---|---|
JPH0436335B2 (enrdf_load_stackoverflow) | 1992-06-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4816686A (en) | Method and apparatus for detecting wiring patterns | |
JP3817427B2 (ja) | 半導体の構成 | |
JP2796316B2 (ja) | 欠陥または異物の検査方法およびその装置 | |
KR900002578B1 (ko) | 프린트 기판 페턴 검사방법 및 그 장치 | |
KR890001413A (ko) | 다층 프린트 배선기판의 스루 홀 보이드의 검사방법 및 그 장치 | |
JPS59218937A (ja) | パタ−ン検出装置 | |
JPS6080745A (ja) | 異物自動検出装置 | |
JPS6319855B2 (enrdf_load_stackoverflow) | ||
JP2519363B2 (ja) | プリント基板における配線パタ―ンの欠陥検査方法 | |
JPH0436336B2 (enrdf_load_stackoverflow) | ||
JPS60135805A (ja) | パタ−ン検出方法及びその装置 | |
KR100576392B1 (ko) | 비전 검사 장치 | |
JPS603507A (ja) | 配線パタ−ン検出装置 | |
JPH037881B2 (enrdf_load_stackoverflow) | ||
JP2830430B2 (ja) | 異物検査装置 | |
JPH0331219B2 (enrdf_load_stackoverflow) | ||
JP3410013B2 (ja) | 欠陥または異物の検査方法及びその装置 | |
JPS608705A (ja) | パタ−ン検出装置 | |
JPH0536795A (ja) | 欠陥検査装置 | |
JPH0414281B2 (enrdf_load_stackoverflow) | ||
JPH03239954A (ja) | パターン部材の検査方法および検査装置 | |
JPS62276442A (ja) | プリント基板検査装置 | |
JPS63298105A (ja) | スリット光源装置 | |
JPH05196435A (ja) | パターン検出方法 | |
JP2024027506A (ja) | 画像取得装置、基板検査装置、画像取得方法および基板検査方法 |