JPS5919823A - 回転体のシエル温度自動記録装置 - Google Patents
回転体のシエル温度自動記録装置Info
- Publication number
- JPS5919823A JPS5919823A JP57129571A JP12957182A JPS5919823A JP S5919823 A JPS5919823 A JP S5919823A JP 57129571 A JP57129571 A JP 57129571A JP 12957182 A JP12957182 A JP 12957182A JP S5919823 A JPS5919823 A JP S5919823A
- Authority
- JP
- Japan
- Prior art keywords
- kiln
- temperature
- shell
- coating
- recording device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/0022—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiation of moving bodies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/04—Casings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/04—Casings
- G01J5/047—Mobile mounting; Scanning arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0806—Focusing or collimating elements, e.g. lenses or concave mirrors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0808—Convex mirrors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0813—Planar mirrors; Parallel phase plates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0879—Optical elements not provided otherwise, e.g. optical manifolds, holograms, cubic beamsplitters, non-dispersive prisms or particular coatings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/48—Thermography; Techniques using wholly visual means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/80—Calibration
- G01J5/808—Calibration using linearising circuits
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Radiation Pyrometers (AREA)
- Arrangements For Transmission Of Measured Signals (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57129571A JPS5919823A (ja) | 1982-07-27 | 1982-07-27 | 回転体のシエル温度自動記録装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57129571A JPS5919823A (ja) | 1982-07-27 | 1982-07-27 | 回転体のシエル温度自動記録装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5919823A true JPS5919823A (ja) | 1984-02-01 |
| JPH0262808B2 JPH0262808B2 (enExample) | 1990-12-26 |
Family
ID=15012759
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57129571A Granted JPS5919823A (ja) | 1982-07-27 | 1982-07-27 | 回転体のシエル温度自動記録装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5919823A (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04115128A (ja) * | 1990-09-05 | 1992-04-16 | Toshiba Corp | 走査式温度監視装置 |
| CN104567352A (zh) * | 2015-01-20 | 2015-04-29 | 合肥鼎锐测控技术有限公司 | 回转窑热交换装置内部筒体红外测温扫描装置 |
| WO2024079019A3 (de) * | 2022-10-13 | 2024-09-26 | Maag Germany Gmbh | Verfahren und vorrichtung zur berührungslosen temperaturbestimmung eines fördergutstroms sowie granuliereinrichtung mit einer solchen berührungslosen temperaturbestimmungsvorrichtung |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5776424A (en) * | 1980-10-29 | 1982-05-13 | Nippon Denki Sanei Kk | Measuring apparatus of temperature distribution of infrared ray |
-
1982
- 1982-07-27 JP JP57129571A patent/JPS5919823A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5776424A (en) * | 1980-10-29 | 1982-05-13 | Nippon Denki Sanei Kk | Measuring apparatus of temperature distribution of infrared ray |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04115128A (ja) * | 1990-09-05 | 1992-04-16 | Toshiba Corp | 走査式温度監視装置 |
| CN104567352A (zh) * | 2015-01-20 | 2015-04-29 | 合肥鼎锐测控技术有限公司 | 回转窑热交换装置内部筒体红外测温扫描装置 |
| WO2024079019A3 (de) * | 2022-10-13 | 2024-09-26 | Maag Germany Gmbh | Verfahren und vorrichtung zur berührungslosen temperaturbestimmung eines fördergutstroms sowie granuliereinrichtung mit einer solchen berührungslosen temperaturbestimmungsvorrichtung |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0262808B2 (enExample) | 1990-12-26 |
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