JPS59184445A - 電界離脱イオン化装置を有する質量分析計 - Google Patents

電界離脱イオン化装置を有する質量分析計

Info

Publication number
JPS59184445A
JPS59184445A JP58057325A JP5732583A JPS59184445A JP S59184445 A JPS59184445 A JP S59184445A JP 58057325 A JP58057325 A JP 58057325A JP 5732583 A JP5732583 A JP 5732583A JP S59184445 A JPS59184445 A JP S59184445A
Authority
JP
Japan
Prior art keywords
mass
mass spectrometer
sample
emitter
ionization
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58057325A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0343743B2 (enExample
Inventor
Kouzou Miishi
御石　浩三
Toshiya Kubodera
窪寺　俊也
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP58057325A priority Critical patent/JPS59184445A/ja
Publication of JPS59184445A publication Critical patent/JPS59184445A/ja
Publication of JPH0343743B2 publication Critical patent/JPH0343743B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP58057325A 1983-03-31 1983-03-31 電界離脱イオン化装置を有する質量分析計 Granted JPS59184445A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58057325A JPS59184445A (ja) 1983-03-31 1983-03-31 電界離脱イオン化装置を有する質量分析計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58057325A JPS59184445A (ja) 1983-03-31 1983-03-31 電界離脱イオン化装置を有する質量分析計

Publications (2)

Publication Number Publication Date
JPS59184445A true JPS59184445A (ja) 1984-10-19
JPH0343743B2 JPH0343743B2 (enExample) 1991-07-03

Family

ID=13052417

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58057325A Granted JPS59184445A (ja) 1983-03-31 1983-03-31 電界離脱イオン化装置を有する質量分析計

Country Status (1)

Country Link
JP (1) JPS59184445A (enExample)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54113486U (enExample) * 1978-01-23 1979-08-09
JPS5743321U (enExample) * 1980-08-23 1982-03-09

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54113486U (enExample) * 1978-01-23 1979-08-09
JPS5743321U (enExample) * 1980-08-23 1982-03-09

Also Published As

Publication number Publication date
JPH0343743B2 (enExample) 1991-07-03

Similar Documents

Publication Publication Date Title
US5382793A (en) Laser desorption ionization mass monitor (LDIM)
US5510613A (en) Spatial-velocity correlation focusing in time-of-flight mass spectrometry
JPH0673297B2 (ja) 質量分析におけるイオンのレーザー放出のための器具および方法
US6580069B1 (en) Atom probe
JPS5958749A (ja) 複合対物および放射レンズ
JPS6251144A (ja) 質量分析計
JPS59184445A (ja) 電界離脱イオン化装置を有する質量分析計
JPH05121030A (ja) イオンビームを用いて電位測定を行うイオンビーム装置及び方法
JPS6352428B2 (enExample)
JPH1090226A (ja) ペプチドのアミノ酸配列決定方法
JPH0378739B2 (enExample)
JP3303587B2 (ja) 質量分析装置及びイオン源
JPH0830695B2 (ja) 液体クロマトグラフ・質量分析装置
JPS5812704B2 (ja) 電界脱離イオン源
JP3264993B2 (ja) イオン注入装置
JPH0351052B2 (enExample)
JPS60121663A (ja) レ−ザ−励起イオン源
JP2554129Y2 (ja) ビームファインダ付きファラデーカップ装置
JPH0317093B2 (enExample)
JPH0665022B2 (ja) 飛行時間型質量分析計
JPS6240150A (ja) 飛行時間型質量分析計
JPH0610609Y2 (ja) 飛行時間型質量分析器のイオン・パルス発生装置
JP2915115B2 (ja) 大気圧イオン化質量分析装置
JPH01173562A (ja) 質量分析装置
JPH0124342B2 (enExample)