JPS59181450A - スキヤンライン型動的観察装置 - Google Patents
スキヤンライン型動的観察装置Info
- Publication number
- JPS59181450A JPS59181450A JP58056695A JP5669583A JPS59181450A JP S59181450 A JPS59181450 A JP S59181450A JP 58056695 A JP58056695 A JP 58056695A JP 5669583 A JP5669583 A JP 5669583A JP S59181450 A JPS59181450 A JP S59181450A
- Authority
- JP
- Japan
- Prior art keywords
- scanning
- sampling
- signal
- specific phase
- image signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Closed-Circuit Television Systems (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58056695A JPS59181450A (ja) | 1983-03-31 | 1983-03-31 | スキヤンライン型動的観察装置 |
| CA000447362A CA1208763A (en) | 1983-03-31 | 1984-02-14 | Scan line type dynamic observation apparatus |
| EP84300963A EP0121309B1 (en) | 1983-03-31 | 1984-02-15 | Scan line type dynamic observation apparatus |
| DE8484300963T DE3482154D1 (de) | 1983-03-31 | 1984-02-15 | Dynamisches zeilenraster-beobachtungsgeraet. |
| US06/818,391 US4713687A (en) | 1983-03-31 | 1986-01-13 | Scan line type dynamic observation apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58056695A JPS59181450A (ja) | 1983-03-31 | 1983-03-31 | スキヤンライン型動的観察装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59181450A true JPS59181450A (ja) | 1984-10-15 |
| JPH0423375B2 JPH0423375B2 (enExample) | 1992-04-22 |
Family
ID=13034587
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58056695A Granted JPS59181450A (ja) | 1983-03-31 | 1983-03-31 | スキヤンライン型動的観察装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59181450A (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63119149A (ja) * | 1986-11-05 | 1988-05-23 | Shimadzu Corp | 疲労試験機 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS576664A (en) * | 1980-03-04 | 1982-01-13 | Repa Feinstanzwerk Gmbh | Automatic rewinder for safety belt |
-
1983
- 1983-03-31 JP JP58056695A patent/JPS59181450A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS576664A (en) * | 1980-03-04 | 1982-01-13 | Repa Feinstanzwerk Gmbh | Automatic rewinder for safety belt |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63119149A (ja) * | 1986-11-05 | 1988-05-23 | Shimadzu Corp | 疲労試験機 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0423375B2 (enExample) | 1992-04-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4223220A (en) | Method for electronically imaging the potential distribution in an electronic component and arrangement for implementing the method | |
| US5254857A (en) | Fast scanning electron microscope (FSEM) | |
| US4713687A (en) | Scan line type dynamic observation apparatus | |
| US4125772A (en) | Scanning electron microscope with eddy-current compensation | |
| JPS59181450A (ja) | スキヤンライン型動的観察装置 | |
| Potter et al. | A Flying‐Spot Scanner | |
| JP3383175B2 (ja) | 走査型顕微鏡の像表示方法および走査型顕微鏡 | |
| JPS59182371A (ja) | スキャンライン型動的観察装置 | |
| JPS631700B2 (enExample) | ||
| JPS6362142A (ja) | 表面分析装置 | |
| JPS5478075A (en) | Sample image display device | |
| JPH0574183B2 (enExample) | ||
| JPS5842938B2 (ja) | 走査形電子顕微鏡 | |
| JPH08227681A (ja) | 走査型透過電子顕微鏡 | |
| KR830002860Y1 (ko) | 주사전자현미경 및 그 유사장치의 주사상 관찰장치 | |
| JPH0896737A (ja) | 電子顕微鏡 | |
| SU1092606A1 (ru) | Видеоконтрольное устройство дл растрового электронного микроскопа | |
| JPS5951540A (ja) | 電圧コントラストの像表示装置 | |
| JPS55126954A (en) | Scanning electron microscope | |
| SU920894A1 (ru) | Сканирующее устройство воспроизведени изображени образца | |
| JPS59224038A (ja) | 荷電粒子線走査型分析装置 | |
| JPH041458B2 (enExample) | ||
| JPH02220342A (ja) | 荷電粒子線装置 | |
| JPS593021B2 (ja) | 走査電子顕微鏡等用電子線偏向装置 | |
| JPS606070B2 (ja) | 走査電子顕微鏡 |