JPS59170754A - 露点計 - Google Patents

露点計

Info

Publication number
JPS59170754A
JPS59170754A JP4514983A JP4514983A JPS59170754A JP S59170754 A JPS59170754 A JP S59170754A JP 4514983 A JP4514983 A JP 4514983A JP 4514983 A JP4514983 A JP 4514983A JP S59170754 A JPS59170754 A JP S59170754A
Authority
JP
Japan
Prior art keywords
dew point
output
temperature
measured
mirror surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4514983A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0376412B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Sakae Fukuda
福田 榮
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TOKYO HIKARI DENSHI KOGYO KK
Original Assignee
TOKYO HIKARI DENSHI KOGYO KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TOKYO HIKARI DENSHI KOGYO KK filed Critical TOKYO HIKARI DENSHI KOGYO KK
Priority to JP4514983A priority Critical patent/JPS59170754A/ja
Publication of JPS59170754A publication Critical patent/JPS59170754A/ja
Publication of JPH0376412B2 publication Critical patent/JPH0376412B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means
    • G01N25/56Investigating or analyzing materials by the use of thermal means by investigating moisture content
    • G01N25/66Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point
    • G01N25/68Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point by varying the temperature of a condensing surface

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
JP4514983A 1983-03-16 1983-03-16 露点計 Granted JPS59170754A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4514983A JPS59170754A (ja) 1983-03-16 1983-03-16 露点計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4514983A JPS59170754A (ja) 1983-03-16 1983-03-16 露点計

Publications (2)

Publication Number Publication Date
JPS59170754A true JPS59170754A (ja) 1984-09-27
JPH0376412B2 JPH0376412B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1991-12-05

Family

ID=12711220

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4514983A Granted JPS59170754A (ja) 1983-03-16 1983-03-16 露点計

Country Status (1)

Country Link
JP (1) JPS59170754A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7736051B2 (en) 2004-03-30 2010-06-15 Yamatake Corporation Thermoelectric device and mirror surface state detection device
JP2012177553A (ja) * 2011-02-25 2012-09-13 Hioki Ee Corp 鏡面冷却式露点計

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56154652A (en) * 1980-03-28 1981-11-30 Eg & G Inc Dew point hygrometer with continuous equalizer
JPS57101952U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1980-12-15 1982-06-23
JPS57108144U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1980-12-25 1982-07-03

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56154652A (en) * 1980-03-28 1981-11-30 Eg & G Inc Dew point hygrometer with continuous equalizer
JPS57101952U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1980-12-15 1982-06-23
JPS57108144U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1980-12-25 1982-07-03

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7736051B2 (en) 2004-03-30 2010-06-15 Yamatake Corporation Thermoelectric device and mirror surface state detection device
JP2012177553A (ja) * 2011-02-25 2012-09-13 Hioki Ee Corp 鏡面冷却式露点計

Also Published As

Publication number Publication date
JPH0376412B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1991-12-05

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