JPS59142837A - Mass production type vapor-phase growing apparatus - Google Patents
Mass production type vapor-phase growing apparatusInfo
- Publication number
- JPS59142837A JPS59142837A JP1676283A JP1676283A JPS59142837A JP S59142837 A JPS59142837 A JP S59142837A JP 1676283 A JP1676283 A JP 1676283A JP 1676283 A JP1676283 A JP 1676283A JP S59142837 A JPS59142837 A JP S59142837A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- electrode
- electrodes
- reaction chamber
- substrates
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Physical Or Chemical Processes And Apparatus (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】
の製造に用いられるような一つの反応室内で多数の基板
上に同時に薄膜をプラズマCVD法で生成する東産型気
相成長装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a Tosan type vapor phase growth apparatus that simultaneously forms thin films on a large number of substrates by plasma CVD in one reaction chamber, such as those used in the production of.
プラズマCVD法による気相成長装置としては、水平に
配置した一方の電極上の基板に平板電極を対向させ、両
電極間に電圧を印加してグロー放電を発生させて反応ガ
スを分解し、基板上に反応ガスの成分の一つの薄膜を生
成するものが知られている。しかし、この場合には反応
室の内壁に堆積した副生成物の膜が剥離し、基板に付着
して膜の欠陥になるおそれがある。また多数の基板を一
つの反応室内で同時に処理する場合は、反応室が大きな
面積を占有することKなるので量産装置には適しない。In a vapor phase growth apparatus using the plasma CVD method, a flat plate electrode is placed opposite the substrate on one of the horizontally arranged electrodes, and a voltage is applied between both electrodes to generate a glow discharge to decompose the reactant gas. Those that produce a thin film of one of the components of the reactant gas on top are known. However, in this case, there is a risk that the film of byproducts deposited on the inner wall of the reaction chamber may peel off and adhere to the substrate, resulting in defects in the film. Furthermore, when a large number of substrates are processed simultaneously in one reaction chamber, the reaction chamber occupies a large area, which is not suitable for mass production equipment.
そこで第1図に示すように反応室1の内部に熱電極2の
両面に接触して加熱される基板3とそれに対向する電極
4とを平行に、かつ鉛直に多数交互に配列して落下物が
付着しないようにし、ガス導入口5から低圧で反応ガス
を導入し、熱電極2と電極4の間に電圧を印加する装置
も考案されているが、室内のガスの流れは線6が示す通
りで、主流は基板3および電極4の上方空間を通り抜け
、各基板コ3には均一に肖たらないため、膜のばらつき
が大きい。Therefore, as shown in FIG. 1, a large number of substrates 3, which are heated by contacting both surfaces of a thermal electrode 2, and electrodes 4, which are opposed to the substrates 3, are alternately arranged in parallel and vertically inside the reaction chamber 1 to avoid falling objects. A device has also been devised in which the reactant gas is introduced at low pressure from the gas inlet 5 and a voltage is applied between the heating electrode 2 and the electrode 4 to prevent the gas from adhering. Since the main flow passes through the space above the substrate 3 and the electrode 4 and does not uniformly apply to each substrate 3, the film has large variations.
本発明はこれに対して多数の基板上に良質の膜を均一に
生成することができる量産型気相成長装置を提供するこ
とを目的とする。In response to this problem, the present invention aims to provide a mass-production type vapor phase growth apparatus that can uniformly produce high-quality films on a large number of substrates.
この目的は、−列にかつそれぞれ鉛直に配置される基板
を支持する電極およびそれに平行に等しい間隔を置いて
対向する電極の多数を収容する反応室の一対の対向する
内壁のそれぞれが基板と対向電極のうちの一方の一辺を
固定し、他方の一辺との間に間隔を置き、他の一対の対
向する内壁が基板および対向電極の他の二辺との間に僅
かな間隔を有することによって達成される。This purpose consists of - a pair of opposing inner walls of a reaction chamber containing a plurality of electrodes supporting the substrate and parallel thereto and equally spaced opposing electrodes arranged in rows and each vertically, each facing the substrate; By fixing one side of one of the electrodes and leaving a space between it and the other side, and by having the other pair of opposing inner walls have a slight space between the substrate and the other two sides of the opposing electrode. achieved.
以下図を引用して本発明の実施例について説明する。第
2図において第1図と共通の部分には同一の符号が付さ
れている。絶縁性の反応室1の底面11に一列に等しい
間隔をおいて熱電FJ(サセプタ)2が鉛直に立てられ
、その両面に方形の基板3が取り付けられている。基板
3に等間隔で対向する方形の電極4−は反応室1の天井
12から鉛直に吊されている。電極4と底面11との間
には間隔Xが、熱電極2および基板3と天井12との間
には間隔yが存在する。基板3と電極4の第2図の紙面
に垂直な方向の幅は反応室の側壁間の内法にほぼ等しく
されており、従って排気ロアから真空排気しカス導入口
5から反応ガス、例えばシランを導入した場合、反応ガ
スは線8の示す通りに電極4と基板3の間を通り抜けて
排気ロアに達する。従って各基板3には反応ガスの同じ
流れが当たることKなるので、熱電極2と電極4の間に
電圧を印加してグロー放電を発生させた場合に基板上に
均一なアモルファスシリコン膜が生成する。Embodiments of the present invention will be described below with reference to the drawings. In FIG. 2, parts common to those in FIG. 1 are given the same reference numerals. Thermoelectric FJs (susceptors) 2 are vertically erected in a row on the bottom surface 11 of an insulating reaction chamber 1 at equal intervals, and rectangular substrates 3 are attached to both sides of the thermoelectric FJs (susceptors) 2. Rectangular electrodes 4- facing the substrate 3 at equal intervals are suspended vertically from the ceiling 12 of the reaction chamber 1. There is a distance X between the electrode 4 and the bottom surface 11, and a distance y between the thermal electrode 2 and the substrate 3 and the ceiling 12. The width of the substrate 3 and the electrode 4 in the direction perpendicular to the plane of the paper in FIG. 2 is approximately equal to the width between the side walls of the reaction chamber. When the reactant gas is introduced, the reaction gas passes between the electrode 4 and the substrate 3 as shown by the line 8 and reaches the exhaust lower. Therefore, each substrate 3 is exposed to the same flow of reactive gas, so when a voltage is applied between the thermal electrode 2 and the electrode 4 to generate a glow discharge, a uniform amorphous silicon film is formed on the substrate. do.
さらに間隔x、yならびに基板3と電極間の間隔Zが等
しくなるように設計すれば、流路のコンダクタンスがほ
ぼ一定となり、ガスの流れはよりスムーズで一様となっ
て、−1−ばらつきの少ない良質の膜が形成される。Furthermore, if the spacing x, y and the spacing Z between the substrate 3 and the electrodes are designed to be equal, the conductance of the flow path will be almost constant, the gas flow will be smoother and more uniform, and -1- variation will be reduced. A low quality film is formed.
土の実施例と逆に、電極を反応室の底面に、基板および
サセプタを天井に固定しても、あるいは反応室の対向す
る側壁にそれぞれを固定しても同じ効果が得られること
は勿論である。Of course, the same effect can be obtained by fixing the electrode to the bottom of the reaction chamber and the substrate and susceptor to the ceiling, or by fixing each to the opposite side walls of the reaction chamber, contrary to the soil example. be.
以上述べたように、本発明は反応室内に多数の基板と対
向電極をジグザグ配置してその間に反応ガス流路を形成
し、反応ガスがむらなく基板と接触するように構成した
もので、基板上に生成される膜の均一化が得られ、才た
反応ガスの流れがスムーズであるため電極と基板の間隔
を小さくすることができ、処理量の増大と膜の良質化が
可能になる。従って本発明による装置は特に安価で性能
の良いアモルファスシリコン太陽電池の量産に対して極
めて有効である。As described above, the present invention is configured such that a large number of substrates and counter electrodes are arranged in a zigzag manner in a reaction chamber, and a reaction gas flow path is formed between them so that the reaction gas comes into contact with the substrates evenly. The film formed on the substrate can be made uniform, and the flow of the reaction gas is smooth, so the distance between the electrode and the substrate can be reduced, making it possible to increase the throughput and improve the quality of the film. Therefore, the apparatus according to the present invention is extremely effective particularly for mass production of inexpensive and high-performance amorphous silicon solar cells.
第1図は立型配置量産型気相成長装置の従来例の断面図
、第2図は本発明の一実施例の断面図である。
1・・・反応室、2・・・熱電極(サセプタ)、3・・
基板、4・・・電極、X・・・電極と反応室底面との間
隔、y・・基板(熱電極)と天井との間隔、1z・・・
電極と基板との間隔。
り′1 凹
?2(2)FIG. 1 is a sectional view of a conventional example of a vertically arranged mass-produced vapor phase growth apparatus, and FIG. 2 is a sectional view of an embodiment of the present invention. 1... Reaction chamber, 2... Thermal electrode (susceptor), 3...
Substrate, 4... Electrode, X... Distance between electrode and bottom of reaction chamber, y... Distance between substrate (thermal electrode) and ceiling, 1z...
Distance between electrode and substrate. ri'1 concave? 2(2)
Claims (1)
等しい間隔を置いて対向する電極の多数を一列にかつそ
れぞれ鉛直に配置し、互いに対向する電極間にそれぞれ
電圧を印加してグロー放電を発生させ、反応ガスを分解
してその成分を基板上に堆積させるものにおいて:反応
室の一対の対向する内壁のそれぞれが基板支持電極と対
向電極のうちの一方の一辺を固定し、他方の電極の一辺
との間に間隔を置き、他の一対の対向する内壁が基板支
持%r、極および対向電極の他の二辺との間に僅かな間
隔を有することを特徴とする一緻産型気相成長装置。 2、特許請求の範囲第1項記載の装置において、基板お
よび対向電極間の間隔と、基板および対向電極の一辺と
反応室の内壁との間隔がほぼ等しいことを特徴とする量
産型気相成長装置。[Scope of Claims] J) An electrode supporting the substrate and a large number of electrodes facing the substrate at equal intervals are arranged in a line in a row and each vertically, and a voltage is applied between each of the electrodes facing each other. in which a glow discharge is generated to decompose a reactant gas and its components are deposited on a substrate: a pair of opposing inner walls of the reaction chamber each fixing one side of one of the substrate supporting electrode and the counter electrode. The electrode is spaced apart from one side of the other electrode, and the other pair of opposing inner walls have a slight space between the substrate supporting electrode and the other two sides of the opposing electrode. One-shot production type vapor phase growth equipment. 2. The mass-produced vapor phase growth apparatus according to claim 1, characterized in that the distance between the substrate and the counter electrode and the distance between one side of the substrate and the counter electrode and the inner wall of the reaction chamber are approximately equal. Device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1676283A JPS59142837A (en) | 1983-02-03 | 1983-02-03 | Mass production type vapor-phase growing apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1676283A JPS59142837A (en) | 1983-02-03 | 1983-02-03 | Mass production type vapor-phase growing apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS59142837A true JPS59142837A (en) | 1984-08-16 |
Family
ID=11925236
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1676283A Pending JPS59142837A (en) | 1983-02-03 | 1983-02-03 | Mass production type vapor-phase growing apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59142837A (en) |
-
1983
- 1983-02-03 JP JP1676283A patent/JPS59142837A/en active Pending
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4452828A (en) | Production of amorphous silicon film | |
JPH02114530A (en) | Thin film formation device | |
JPS63187619A (en) | Plasma cvd system | |
JPS62500624A (en) | Reactor equipment for semiconductor wafer processing | |
JPS6342115A (en) | Manufacture of film | |
JPS62139876A (en) | Formation of deposited film | |
JPS59142837A (en) | Mass production type vapor-phase growing apparatus | |
JPS5914633A (en) | Plasma cvd apparatus | |
JPS63190173A (en) | Plasma treating device | |
JPH0766139A (en) | Chemical vapor deposition system | |
TWI409358B (en) | Plasma enhanced chemical vapor deposition device | |
JPS5843508A (en) | Mass-production type film fabricating device | |
JP2000068215A (en) | Method for growing vapor phase thin film and device therefor | |
JPS6171625A (en) | Vertical cvd device | |
JPH0338730B2 (en) | ||
JPH06818Y2 (en) | Substrate support apparatus for CVD apparatus | |
JPH0622980Y2 (en) | Substrate support device in CVD device | |
JP2562686B2 (en) | Plasma processing device | |
JPS59167013A (en) | Plasma cvd equipment | |
JPH0590939U (en) | Plasma CVD equipment | |
JPH05156455A (en) | Film forming device | |
JPS6314423A (en) | Device for manufacturing semiconductor thin film | |
JPH0513004Y2 (en) | ||
JPS60177180A (en) | Plasma cvd device | |
JPH0341722A (en) | Thin-film manufacturing apparatus |