JPS59116040A - 物体の断層撮影方法および装置 - Google Patents

物体の断層撮影方法および装置

Info

Publication number
JPS59116040A
JPS59116040A JP58239597A JP23959783A JPS59116040A JP S59116040 A JPS59116040 A JP S59116040A JP 58239597 A JP58239597 A JP 58239597A JP 23959783 A JP23959783 A JP 23959783A JP S59116040 A JPS59116040 A JP S59116040A
Authority
JP
Japan
Prior art keywords
axis
radiation
radiation source
film
sensitive surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58239597A
Other languages
English (en)
Japanese (ja)
Inventor
アンリ・アモリイ
フランシス・ルルモン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Publication of JPS59116040A publication Critical patent/JPS59116040A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph

Landscapes

  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP58239597A 1982-12-20 1983-12-19 物体の断層撮影方法および装置 Pending JPS59116040A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8221319 1982-12-20
FR8221319A FR2538114A1 (fr) 1982-12-20 1982-12-20 Procede et dispositif de tomographie a film

Publications (1)

Publication Number Publication Date
JPS59116040A true JPS59116040A (ja) 1984-07-04

Family

ID=9280273

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58239597A Pending JPS59116040A (ja) 1982-12-20 1983-12-19 物体の断層撮影方法および装置

Country Status (3)

Country Link
EP (1) EP0115721A1 (enExample)
JP (1) JPS59116040A (enExample)
FR (1) FR2538114A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7099432B2 (en) 2003-08-27 2006-08-29 Matsushita Electric Industrial Co., Ltd. X-ray inspection apparatus and X-ray inspection method

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19542762C2 (de) * 1995-11-16 1998-01-22 Joerg Dr Habersetzer Tomographieverfahren und Anordnung zur Erzeugung von großflächigen Tomogrammen
DE102010010723B4 (de) 2010-03-09 2017-05-04 Yxlon International Gmbh Verwendung einer Laminographieanlage
CN116583744A (zh) * 2020-12-07 2023-08-11 斯格瑞公司 使用透射x射线源的高产量3D x射线成像系统

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE693374C (de) * 1938-06-27 1940-07-12 C H F Mueller Akt Ges Verfahren zur Herstellung von Koerperschnittbildern mittels Roentgenstrahlen
DE972794C (de) * 1952-01-15 1959-09-24 Johann Dumer Geraet zur roentgenographischen Darstellung von Koerperschnitten
BE533316A (enExample) * 1953-11-14
FR1511590A (fr) * 1966-12-12 1968-02-02 G Pi Giprozdrav Installation pour les investigations par rayons x, notamment en tomographie
US4000425A (en) * 1975-08-01 1976-12-28 Craig Dwin R Apparatus for producing axial tomograms
GB1582833A (en) * 1976-04-28 1981-01-14 Emi Ltd Radiography

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7099432B2 (en) 2003-08-27 2006-08-29 Matsushita Electric Industrial Co., Ltd. X-ray inspection apparatus and X-ray inspection method

Also Published As

Publication number Publication date
EP0115721A1 (fr) 1984-08-15
FR2538114A1 (fr) 1984-06-22
FR2538114B1 (enExample) 1985-05-10

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