JPS59112500A - 半導体メモリ装置 - Google Patents

半導体メモリ装置

Info

Publication number
JPS59112500A
JPS59112500A JP57223622A JP22362282A JPS59112500A JP S59112500 A JPS59112500 A JP S59112500A JP 57223622 A JP57223622 A JP 57223622A JP 22362282 A JP22362282 A JP 22362282A JP S59112500 A JPS59112500 A JP S59112500A
Authority
JP
Japan
Prior art keywords
spare
output
gate circuit
memory device
semiconductor memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57223622A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6310520B2 (enrdf_load_stackoverflow
Inventor
Kazuhiro Shimotori
下酉　和博
Kazuyasu Fujishima
一康 藤島
Hideyuki Ozaki
尾崎　英之
Hideji Miyatake
秀司 宮武
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP57223622A priority Critical patent/JPS59112500A/ja
Publication of JPS59112500A publication Critical patent/JPS59112500A/ja
Publication of JPS6310520B2 publication Critical patent/JPS6310520B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/006—Identification

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP57223622A 1982-12-18 1982-12-18 半導体メモリ装置 Granted JPS59112500A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57223622A JPS59112500A (ja) 1982-12-18 1982-12-18 半導体メモリ装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57223622A JPS59112500A (ja) 1982-12-18 1982-12-18 半導体メモリ装置

Publications (2)

Publication Number Publication Date
JPS59112500A true JPS59112500A (ja) 1984-06-28
JPS6310520B2 JPS6310520B2 (enrdf_load_stackoverflow) 1988-03-07

Family

ID=16801088

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57223622A Granted JPS59112500A (ja) 1982-12-18 1982-12-18 半導体メモリ装置

Country Status (1)

Country Link
JP (1) JPS59112500A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60254499A (ja) * 1984-05-31 1985-12-16 Fujitsu Ltd 記憶装置の作動状態の検査を行うことができる、冗長機能を有する半導体集積回路装置
JPH03142799A (ja) * 1989-10-27 1991-06-18 Nec Ic Microcomput Syst Ltd 半導体メモリ回路

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60254499A (ja) * 1984-05-31 1985-12-16 Fujitsu Ltd 記憶装置の作動状態の検査を行うことができる、冗長機能を有する半導体集積回路装置
JPH03142799A (ja) * 1989-10-27 1991-06-18 Nec Ic Microcomput Syst Ltd 半導体メモリ回路

Also Published As

Publication number Publication date
JPS6310520B2 (enrdf_load_stackoverflow) 1988-03-07

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